DOCSLIB.ORG

Symposium on Optical Fiber Measurements, 2000

Total Page：16

File Type：pdf, Size：1020Kb

Download full-text PDF Read full-text
Symposium on Optical Fiber Measurements, 2000 NIST Special Publication 953 Technical Digest Symposium on Optical Fiber Measurements, 2000 Sponsored by the National Institute of Standards and Technology in cooperation with the IEEE Lasers and Electro-Optics Society and the Optical Society of America ji^^^ mmrn N I St C E HiiU N I A L QC National Institute of Standards and Technology • Technology Administration • U.S. Department of Commerce 100 .IJ57 m.953 2000 C.^ m TiiTnw in rhe National Institute of Standards and Technology was established in 1988 by Congress to "assist industry in the development of technology . needed to improve product quality, to modernize manufacturing processes, to ensure product reliability . and to facilitate rapid commercialization ... of products based on new scientific discoveries." NIST, originally founded as the National Bureau of Standards in 1901, works to strengthen U.S. industry's competitiveness; advance science and engineering; and improve public health, safety, and the environment. One of the agency's basic functions is to develop, maintain, and retain custody of the national standards of measurement, and provide the means and methods for comparing standards used in science, engineering, manufacturing, commerce, industry, and education with the standards adopted or recognized by the Federal Government. As an agency of the U.S. Commerce Department's Technology Administration, NIST conducts basic and applied research in the physical sciences and engineering, and develops measurement techniques, test methods, standards, and related services. The Institute does generic and precompetitive work on new and advanced technologies. NIST's research facilities are located at Gaithersburg, MD 20899, and at Boulder, CO 80303. Major technical operating units and their principal activities are listed below. For more information contact the Publications and Program Inquiries Desk, 301-975-3058. Office of the Director Physics Laboratory • National Quality Program • Electron and Optical Physics • International and Academic Affairs • Atomic Physics • Optical Technology Technology Services • Ionizing Radiation • Standards Services • Time and Frequency' • Technology Partnerships • Quantum Physics' • Measurement Services • Technology Innovation Materials Science and Engineering • Information Services Laboratory • Intelligent Processing of Materials Advanced Technology Program • Ceramics • • Economic Assessment Materials Reliability' • Information Technology and Applications • Polymers • • Chemical and Biomedical Technology Metallurgy • • Materials and Manufacturing Technology NIST Center for Neutron Research • Electronics and Photonics Technology Manufacturing Engineering Manufacturing Extension Partnership Laboratory Program • Precision Engineering • Automated Production Technology • Regional Programs • Intelligent Systems • National Programs • Fabrication Technology • Program Development • Manufacturing Systems Integration Electronics and Electrical Engineering Building and Fire Research Laboratory Laboratory • Microelectronics • Structures • Law Enforcement Standards • Building Materials • Electricity • Building Environment • Semiconductor Electronics • Fire Safety Engineering • Electromagnetic Fields' • Fire Science • Electromagnetic Technology' • Optoelectronics' Information Technology Laboratory • Mathematical and Computational Sciences^ Technology Chemical Science and • Advanced Network Technologies Laboratory • Computer Security • Biotechnology • Information Access and User Interfaces • Physical and Chemical Properties^ • High Performance Systems and Services • Analytical Chemistry • Distributed Computing and Information Services • Process Measurements • Software Diagnostics and Conformance Testing • Microanalysis Science Surface and • Statistical Engineering 'At Boulder, CO 80303. ^Some elements at Boulder, CO. NIST Special Publication 953 Technical Digest Symposium on Optical Fiber Measurements, 2000 Digest of a symposium sponsored by the National Institute of Standards and Technology Nisr in cooperation with the IEEE Lasers and Electro-Optics Society and the Optical Society of America September 26-28, 2000 National Institute of Standards and Technology Boulder, Colorado 80303 Edited by OSA P.A. Williams Optical Society of America G- W, Day September 2000 f> 111 U.S. Department of Commerce Norman Y. Mineta, Secretary Technology Administration Dr. Cheryl L. Shavers, Under Secretary ofCommercefor Technology National Institute of Standards and Technology Raymond G. Kammer, Director Certain commercial entities, equipment, or materials may be identified in this document in order to describe an experimental procedure or concept adequately. Such identification is not mtended to imply recommendation or endorsement by the National Institute of Standards and Technology, nor is it intended to imply that the entities, materials, or equipment are necessarily the best available for the purpose. National Institute of Standards and Technology Special Publication 953 Natl. Inst. Stand. Technol. Spec. Publ. 953, 195 pages (September 2000) CODEN: NSPUE2 U.S. GOVERNMENT PRINTING OFFICE WASHINGTON: 2000 For sale by the Superintendent of Documents U.S. Government Printing Office Washington, DC 20402-9325 Preface This year, SOFM is two decades old. After all these years, fiberoptic metrology is not only still important, but we are seeing a rise in metrology needs for the technologies resulting from fiber optics - components, integrated optics and fiber systems. Accordingly, we are pleased to see a significant number of component measurement papers in this year's Symposium. The majority of this year's papers fall into one of three categories: dispersion, components and nonlinear optics. Dispersion is the largest category, containing two sessions of polarization-mode dispersion, a session of chromatic dispersion and a session for group-delay measurements on fiber Bragg gratings. Component papers include grating metrology as well as receiver and amplifier characterization. Nonlinear measurements fill two sessions with measurements of nonlinear coefficient and effective area. And, with all of this, it is nice to see original work still going on in fibers - we find a full session of papers relating to novel (engineered) fibers. This year we have 44 papers (9 invited and 35 contributed), with strong international participation (slightly more than half originating outside the United States). Happy reading. Paul Williams Gordon Day Boulder, Colorado September 2000 Except where attributed to NIST authors, the content of individual sections of this volume has not been reviewed or edited by the National Institute of Standards and Technology. NIST therefore accepts no responsibility for comments or recommendations therein. The mention of trade names in this volume is in no sense an endorsement or recommendation by the National Institute of Standards and Technology. iii SYMPOSIUM COMMITTEE G.W. Day, NISI, General Chair P.A. Williams, NIST, Program Chair M. Artiglia, CSELT A.J. Barlow, PerkinElmer Optoelectronics J. Benson, NPL S.C. Fleming, University of Sydney D.L. Franzen, NIST N. Gisin, University of Geneva M. Hackert, Coming, Inc. T.A. Hanson, Coming, Inc. J. Jackel, Telcordia Technologies H. Nagai, Amitsu W.A. Reed, Lucent Technologies G.W. Schinn, EXFO C. Shaar,GNNettest K.K. Wong, Codeon Corporation iv CONTENTS PREFACE iii SYMPOSIUM COMMITTEE iv Characterisation of Photonic Crystal Fibres (invited) T.A. Birks, J.C. Knight, B.J. Mangan, A. Ortigosa-Blanch, P. St.J. Russell, University of Bath 1 Characterization of the Guiding Properties of a Bragg Type Photonic-Band-Gap Fiber P. Roy, F. Brechet, P. Leproux, J. Marcou, D. Pagnoux, Institut de Recherche en Communications Optiques et Microondes 7 Ultra-Broad Supercontinuum Generation in Tapered Telecommunications Fibres T.A. Birks, W.J. Wadsworth, P. St.J. Russell, University of Bath 11 A Simple Servo Controlled Scanning Reflectance Measurement Method for Determining the Refractive Index Profile of a Waveguide Y. Park, N.H. Seong, Y.C. Youk, U.C. Peak, D.Y. Kim, Kwangju Institute of Science and Technology 15 Characterizing the Filter Response of Optical Routers (invited) Chellappan Narayanan, Gail Bogert, Lucent Technologies . 19 Saturated Optogalvanic Transition in Krypton at 1 564 nm David A. Humphreys, National Physical Laboratory 25 Characterization of Multimode Fiber for 10 Gbps Operation (invited) John S. Abbott, Coming, Inc 29 Short Pulse, Small Spot Size, Central Launch in Multimode Fibres: Comparison Between Measurement and Computation M.J.N, van Stralen, Plasma Optical Fibre B.V.; B.P. de Hon, M. Bingle, Eindhoven University of Technology; F.J. Achten, Plasma Optical Fibre B.V. 35 Measurement of the Non-Linear Index of Refraction, Nj (invited) Dan L. Philen, Lucent Technologies, Bell Laboratories 39 Measurement Conditions of Nonlinear Refractive Index nj for Various Single-Mode Fibers by CW Dual-Frequency Method Kazuhide Nakajima, Takuya Omae, Masaharu Ohashi, NTT Access Network Service Systems Laboratories 45 V KDD Nonlinear Coefficient Round Robin Measurements for Various Dispersion Shifted Fibers in Japan and UK Yoshinori Namihira, KDD R&D Laboratories, Inc 49 Kerr Coefficient for Chaotic Light in Optical Fiber S.M. Pietralunga, P. Martelli, M. Ferrario, CoreCom; M. Martinelli, Politecnico di Milano 53 Estimation of the Polarization Coupling Length in Standard Telecom Fibers from Measurements of Nonlinear Polarization Rotation C. Vinegoni, M. Wegmiiller, N. Gisin, University of Geneva , 57 A Comparison of Three
Load more

Recommended publications
  • Optical Gyroscopes: Sensing Rotation Without Moving Parts Abstract
    Abstract The desire for accurate navigation has been one of the great technology drivers since ancient times. Astronomy, timekeeping, magnetic sensors, the GPS system, MEMs, and spinning- mass gyroscopes are all familiar methods to measure position. The sensing of rotation by Optical Gyroscopes: optical means was first demonstrated by Sagnac in 1913, and in 1925 Michelson and Gale measured the rotation of the Earth with a 2km loop interferometer. The Sagnac effect was relegated to being a physics curiosity, until the 1960s and the advent of the laser and optical Sensing Rotation fiber. One of the great achievements of navigation engineering was the harnessing of the Sagnac effect, to make practical and extremely sensitive yet rugged optical rotation sensors. Without Moving Parts The Sagnac effect is very small, and it is necessary to measure on the order of one part out of 1020 to reach high-accuracy requirements. The design and manufacturing of practical optical gyroscopes is a tour-de-force of physics and engineering. Basic concepts such as symmetry, relativity, and reciprocity, and considerable interdisciplinary effort are needed in order to create a design such that every perturbation cancels out except rotation. Optical gyroscopes, Robert Dahlgren and their research and production contracts, were an early driver for many ultra-high- performance optical technologies. Such commonplace items as low-scatter mirrors, ultrasonic Silicon Valley Photonics, Ltd. machining of glass, lithium niobate integrated optics, polarization-maintaining fiber, superluminescent and narrow-linewidth lasers found their first major applications and customers in these sensors. Presented to the IEEE SCV Preceding Image: Monolithic Ring Laser Gyro (MRLG).
    [Show full text]
  • Crosspolarization and Depolarization in Ellipsometry at Inner Boundaries
    Crosspolarization and Depolarization in Ellipsometry at Inner Boundaries • Introduction and Motivation • In optics we never measure the fields! • Decoherence • Temporal and Spatial • Depolarization • Temporal • Depolarization Kurt Hingerl & Razvigor Ossikovski • Spatial University Linz & Ecole Polytechnique • Summary [email protected] Opt. Lett. 41, 219, (2016), Opt. Lett. 41, 4044, (2016), Paul Dirac „Quantum Mechanics“: ~ 1935 “each photon then interferes only with itself. Interference between different photons never occurs.” Albert Einstein to his friend Michael Besso 1954: “All these fifty years of conscious brooding have brought me no nearer to the answer to the question, 'What are light quanta?' Nowadays every Tom, Dick and Harry thinks he knows it, but he is mistaken.” R. Feynman QED- the strange theory matter and light, 1985 When a photon comes down, it interacts with electrons throughout the glass, not just on the surface. The photon and electrons do some kind of dance, the net result of which is the same as if the photon hit only on the surface. W.E. Lamb 1995, Appl. Phys B “Photons cannot be localized in any meaningful manner, and they do not behave at all like particles, whether described by a wave function or not." Roy Glauber „Nobel lecture: Quantum Mechanics“: 2005 “….if we get a click in a detector, we know that at that very moment the photon is just there….” What does depolarization mean? Partial state of polarization produced by the interaction of polarized light and an optical element (depolarizer). Case 1 Case 2 Two phase system: semi-infinite material & air Totally polarized Depolarization E r 22s sin ( ) cos( ) sin ( ) Ei r pp a : tan ei Ersrs 2 2 sin ( ) cos( ) sin ( ) Ei s a Case 1: For nondepolarising system fully equivalent Mueller matrix formalism Jones formalism Sin Sout M Sout M Sin Ex v s MMMM s v out J v in 00 11 12 13 14 E y s MMMM s 11 21 22 23 24 .
    [Show full text]
  • Polarization (Waves)
    Polarization (waves) Polarization (also polarisation) is a property applying to transverse waves that specifies the geometrical orientation of the oscillations.[1][2][3][4][5] In a transverse wave, the direction of the oscillation is perpendicular to the direction of motion of the wave.[4] A simple example of a polarized transverse wave is vibrations traveling along a taut string (see image); for example, in a musical instrument like a guitar string. Depending on how the string is plucked, the vibrations can be in a vertical direction, horizontal direction, or at any angle perpendicular to the string. In contrast, in longitudinal waves, such as sound waves in a liquid or gas, the displacement of the particles in the oscillation is always in the direction of propagation, so these waves do not exhibit polarization. Transverse waves that exhibit polarization include electromagnetic [6] waves such as light and radio waves, gravitational waves, and transverse Circular polarization on rubber sound waves (shear waves) in solids. thread, converted to linear polarization An electromagnetic wave such as light consists of a coupled oscillating electric field and magnetic field which are always perpendicular; by convention, the "polarization" of electromagnetic waves refers to the direction of the electric field. In linear polarization, the fields oscillate in a single direction. In circular or elliptical polarization, the fields rotate at a constant rate in a plane as the wave travels. The rotation can have two possible directions; if the fields rotate in a right hand sense with respect to the direction of wave travel, it is called right circular polarization, while if the fields rotate in a left hand sense, it is called left circular polarization.
    [Show full text]
  • Stitching Type Large Aperture Depolarizer for Gas Monitoring Imaging Spectrometer
    The International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences, Volume XLII-3, 2018 ISPRS TC III Mid-term Symposium “Developments, Technologies and Applications in Remote Sensing”, 7–10 May, Beijing, China STITCHING TYPE LARGE APERTURE DEPOLARIZER FOR GAS MONITORING IMAGING SPECTROMETER Xiaolin Liu*, Ming Li, Ning An, Tingcheng Zhang, Guili Cao, Shaoyuan Cheng Beijing Institute of Space Mechanics & Electricity, Beijing Key Laboratory of Advanced Optical Remote Sensing Technology, China – (mojiexiaolin, 13521820892, anningji, tczhang1217, bitlitian,csycf) @163.com Commission III, WG III/8 KEY WORDS: Polarization, Depolarizer, Muller matrix, Imaging Spectrometer, Stitching, Numerical Analysis ABSTRACT: To increase the accuracy of radiation measurement for gas monitoring imaging spectrometer, it is necessary to achieve high levels of depolarization of the incoming beam. The preferred method in space instrument is to introduce the depolarizer into the optical system. It is a combination device of birefringence crystal wedges. Limited to the actual diameter of the crystal, the traditional depolarizer cannot be used in the large aperture imaging spectrometer (greater than 100mm). In this paper, a stitching type depolarizer is presented. The design theory and numerical calculation model for dual babinet depolarizer were built. As required radiometric accuracies of the imaging spectrometer with 250mm×46mm aperture, a stitching type dual babinet depolarizer was design in detail. Based on designing the optimum structural parmeters，the tolerance of wedge angle， refractive index, and central thickness were given. The analysis results show that the maximum residual polarization degree of output light from depolarizer is less than 2%. The design requirements of polarization sensitivity is satisfied. 1.
    [Show full text]
  • Longitudinal Polarization Periodicity of Unpolarized Light Passing Through a Double Wedge Depolarizer
    Longitudinal polarization periodicity of unpolarized light passing through a double wedge depolarizer 1 2, 3 Juan Carlos G. de Sande, Massimo Santarsiero, ∗ Gemma Piquero, and Franco Gori2 1Departamento de Circuitos y Sistemas, Universidad Polit´ecnica de Madrid, 28031 Madrid, Spain 2Dipartimento di Fisica, Universit`aRoma Tre, and CNISM, via della Vasca Navale 84, I-00146 Roma, Italy 3Departamento de Optica,´ Universidad Complutense de Madrid, 28040 Madrid, Spain ∗santarsiero@fis.uniroma3.it Abstract: The polarization characteristics of unpolarized light passing through a double wedge depolarizer are studied. It is found that the degree of polarization of the radiation propagating after the depolarizer is uniform across transverse planes after the depolarizer, but it changes from one plane to another in a periodic way giving, at different distances, unpolarized, partially polarized, or even perfectly polarized light. An experiment is performed to confirm this result. Measured values of the Stokes parameters and of the degree of polarization are in complete agreement with the theoretical predictions. © 2012 Optical Society of America OCIS codes: (260.5430) Polarization; (030.1640) Coherence (240.5440); Polarization- selective devices. References and links 1. J. P. McGuire and R. A. Chipman, “Analysis of spatial pseudodepolarizers in imaging systems,” Opt. Eng. 29, 1478–1484 (1990). 2. S. C. McClain, R. A. Chipman, and L. W. Hillman “Aberrations of a horizontal/vertical depolarizer,” Appl. Opt. 31, 2326–2331 (1992). 3. M. El Sherif, M.S. Khalil, S. Khodeir, and N. Nagib, “Simple depolarizers for spectrophotometric measurements of anisotropic samples,” Opt. & Laser Technol. 28, 561-563 (1996). 4. G. Biener, A. Niv, V. Kleiner, and E.
    [Show full text]
  • Optical Recirculaton Depolarizer and Method of Depolarizing Light
    Patentamt Europaisches ||| || 1 1| || || || || || || || || ||| || (19) J European Patent Office Office europeen des brevets (11) EP 0 877 265 A1 (12) EUROPEAN PATENT APPLICATION (43) Date of publication:ation: (51) |nt. CI.6: G02B 6/34 11 .11 .1 998 Bulletin 1 998/46 (21) Application number: 98201367.4 (22) Date of filing: 28.04.1998 (84) Designated Contracting States: (72) Inventor: Paisheng, Shen AT BE CH CY DE DK ES Fl FR GB GR IE IT LI LU Fremont, CA 94539 (US) MCNLPTSE Designated Extension States: (74) Representative: AL LT LV MK RO SI Wharton, Peter Robert Urquhart-Dykes & Lord (30) Priority: 01.05.1997 US 847177 Inventions House Valley Court, Canal Road (71) Applicant: Bradford BD1 4SP (GB) Alliance Fiber Optics Products Inc. Sunnyvale, CA 94086 (US) (54) Optical recirculaton depolarizer and method of depolarizing light (57) An optical depolarizer (82) and method of depolarizing light is described. An input light beam is split into two beams. One split beam is recirculated 92 94-. through a birefringent medium (12) and looped back to ~\ ._ i — , f* be recombined with the input light. This allows a ( 7\ 96 weighted averaging of the different polarization states \ that result from birefringence in the recirculation path of ^"^^^ ^-uh the recirculated beam. The depolarizer (82) is formed as-. / from single mode fiber optic cables and fused single — v^c mode fiber couplers (84,86,88,90). Each fiber coupler f? ^"^-us (84,86,88,90) has an input pair of fibers and an output \l pair of fibers. One of the output fibers is coupled to one ^ — of the input fibers to form a recirculation loop.
    [Show full text]
  • Quartz-Wedge Achromatic Depolarizers
    Quartz-Wedge Achromatic Depolarizers http://www.thorlabs.com/newgrouppage9.cfm?objectgroup_id=870&pn... Search Search ( 0) $ Dollar ▼ ENGLISH ▼ Create an Account | Log In Products Home Rapid Order Services The Company Contact Us My Thorlabs >>Polarization Optics >>Polarizers >>Quartz-Wedge Achromatic Depolarizers Quartz-Wedge Achromatic Depolarizers Related Items ► Randomizes the Polarization of a Linearly Polarized Input Beam ► Effective with Monochromatic and Broadband Light ► Available with AR Coatings DPU-25-A DPU-25-C DPU-25-A Depolarizer DPU-25 DPU-25-B Mounted in an SM1 Lens Tube Overview Graphs Quartz vs. LCP Tutorial Damage Thresholds Documents Feedback Features General Specifications Optic Axis Alignment Not Required Substrate Quartz Crystal Ideal for Broadband Light Sources and Large Diameter (>6 mm) Monochromatic Beams Air-Gap Design Allows for use with High-Power Beams Uncoated (190 - 2500 nm) Available Uncoated (190 - 2500 nm) or with One of Three AR Coatings -A Coating (350 - 700 nm) Coatings 350 - 700 nm (-A Coating) -B Coating (650 - 1050 nm) 650 - 1050 nm (-B Coating) -C Coating (1050 - 1700 nm) 1050 - 1700 nm (-C Coating) Outer Diameter 1" (25.4 mm) Thorlabs' Quartz-Wedge Achromatic Depolarizers convert a polarized beam of light into a pseudo-random polarized beam of light. The term Thickness 7.35 mm (0.289") pseudo-random is used since the transmitted beam doesn't become unpolarized; instead the polarization of the beam is randomized. Linearly polarized light from a monochromatic source that is transmitted through a quartz-wedge depolarizer will have a polarization that varies spatially. Clear Aperture >Ø21.59 mm Linearly polarized light from a broadband source that is transmitted through a quartz-wedge depolarizer will have a polarization that varies spatially Surface Flatness λ/10 @ 633 nm as well as with wavelength.
    [Show full text]
  • Monochromatic Depolarizer Based on Liquid Crystal
    crystals Article Monochromatic Depolarizer Based on Liquid Crystal Paweł Mar´c* , Noureddine Bennis, Anna Spadło , Aleksandra Kalbarczyk , Rafał W˛egłowski, Katarzyna Garbat and Leszek R. Jaroszewicz Faculty of New Technologies and Chemistry, Military University of Technology, 2 gen. S. Kaliskiego St., 00-908 Warsaw, Poland * Correspondence: [email protected]; Tel.: +48-261-839-424 Received: 24 May 2019; Accepted: 22 July 2019; Published: 28 July 2019 Abstract: Polarization is a very useful parameter of a light beam in many optical measurements. Improvement of holographic systems requires optical elements which need a diffused and depolarized light beam. This paper describes a simple monochromatic depolarizer based on a pure vertically aligned liquid crystal without pretilt. In this work we present an extended description of depolarizer by analyzing its electro-optic properties measured in spatial and time domains with the use of crossed polarizers and polarimetric configurations. Crossed polarizers set-up provides information on spatial and temporal changes of microscopic textures while polarimetric measurement allows to measure voltage and time dependence of degree of polarization. Three different thicknesses, i.e., 5 µm, 10 µm and 15 µm have been manufactured in order to analyze another degree of freedom for this type of depolarizer device based on a liquid crystals’ material. Consideration of the light scattering capability of the cell is reported. Keywords: depolarization; liquid crystals; Mueller matrices 1. Introduction Depolarized light is very useful in optical measurements continuously finding application as for example spatial diffused phase element in holography [1]. Commercially used light sources are polarized or at least partially polarized.
    [Show full text]
  • Measuring Ultra-Low PMD with High Reliability
    VIAVI Solutions Application Note Measuring Ultra-Low PMD with High Reliability By Vincent Lecoeuche, PhD and Gregory Lietaert, Product Marketing Introduction Polarization mode dispersion (PMD) has concerned fiber/equipment manufacturers and service providers (Telco or multiple-system operators [MSOs]) for some time. However, increased transmission speeds and the related PMD-dependent limits have driven field measurement interests from identifying high-PMD values to performing reliable and repeatable high-resolution PMD measurements. The Requirements Advanced Fiber Specifications With every enhancement made over the past few years, fiber and cable manufacturers have significantly improved the performance of fiber and cabling designs and greatly reduced PMD. They have developed processes for manufacturing optical fibers with ultra low PMD. This ultra low PMD can further be preserved because of modern cabling design. Leading manufacturers now specify the Link Design Value (LDV), which could be less than 0.04 ps/√km, when the cable is installed in the field. Link Design Value1 LDV provides a useful design parameter for calculating the worst-case amount of PMD a fiber contributes toward the overall system PMD for a link. LDV, also referred to as PMDQ, is a term developed in standards bodies used to evaluate the impact of fiber-related PMD where cabled fibers are deployed in concatenated sections. The LDV is the worst-case PMD of the end-to-end link made up of randomly chosen cable sections spliced together and, therefore, represents the worst-case PMD of a fiber path in a deployed cable span. PMD standards suggest calculating LDV from nominally 20 to 24 sections with a maximum cumulative distribution Q of nominally 0.001 to 0.0001, which implies that 0.1 percent or 0.01 percent of all spans (made up of concatenated sections) would be above this level of PMD.
    [Show full text]
  • Epoxy Free Assemblies Optical Bonding Technology High Damage
    nqa ISO 9001 U K A S QUALITY R e g i s t e r e d MANAGEMENT 015 Epoxy Free Assemblies C A T Innovation Of High Power Optics Optical Bonding Technology A L O High Damage Threshold G 2 0 Crystals & Optical components 1 5 - 2 0 1 6 Dayoptics,Inc 6 Yangqi Branch 8 Jinshan Fuwan Park, Fuzhou, Fujian,350008,China Tel:+(86)591-83215681 Fax:+(86)591-83215359 E-mail:[email protected] www.dayoptics.com Dayoptronics Co.,Ltd 008,Jinshui West Road,Ningxiang High-tech Zone,Changsha,Hunan,410600,China Tel:+(86)731-87051588 Fax:+(86)731-87051788 E-mail:[email protected] COMPANY PROFILE THE COMPANY THE STRENGTH Dayoptics has been dedicated to serving the high power laser community during the past decade. Our complete line The extremely high quality, ultra-low cost, mass production, of High Power PBS, High Power Glan Laser Polarizers, and high power waveplates, etc, offer our customers just-in-time delivery and the satisfactory service are the key satisfactory one-stop shopping. Understand the high power laser application is the recent and future trend; our points which enable Dayoptics to go from strength to engineers keep on exploring new technologies to meet the increasing marketing demand. “ Innovation of high strength. power optics” is not just a slogan, but an action in our daily working. Based on rich production experience and strong engineering support, Dayoptics continuously creates innovative ideas for optics. MARKETPLACE As a manufacturer of crystal and optical products which are widely used in semiconductor, electronics, optics, laser and telecommunication, Dayoptics excels at manufacturing reliable high-quality products at very competitive prices.
    [Show full text]
  • Technical Digest: Symposium on Optical Fiber Measurements, 2004
    NIST Special Publication 1024 Technical Digest: Symposium on Optical Fiber Measurements, 2004 Sponsored by the National Institute of Standards and Technology in cooperation with the IEEE Lasers and Electro-Optics Society and the Optical Society of America NIST Special Publication 1024 Technical Digest: Symposium on Optical Fiber Measurements, 2002 Digest of a symposium sponsored by the National Institute of Standards and Technology in cooperation with the IEEE Lasers and Electro-Optical Society and the Optical Society of America September 28-30, 2004 National Institute of Standards and Technology Boulder, Colorado 80305 Edited by P. A. Williams G. W. Day September 2004 U.S. Department of Commerce Donald L. Evans, Secretary Technology Administration Phillip J. Bond, Under Secretaryfor Technology National Institute of Standards and Technology Arden L. Bement, Jr., Director National Institute of Standards and Technology Special Publication 1024 Natl. Inst. Stand. Technol. Spec. Publ. 1024, pages (September 2004) CODEN: NSPUE2 U.S. GOVERNMENT PRINTING OFFICE WASHINGTON: 2004 For sale by the Superintendent of Documents, U.S. Government Printing Office Internet: bookstore.gpo.gov Phone: (202) 512-1 800 Fax: (202) 5 1 2-2250 Mail: Stop SSOP, Washington, DC 20402-0001 PREFACE »0C!« ' Welcome to SOFM 2004, the quarter-of-a-century mark for this meeting that has taken place every other year since 1980. Since that time, SOFM has provided this glimpse of what's going on in the area of measurements relating to optoelectronics. This year, we again see a broad range of topics including wavelength metrology, nonlinear measurements, OTDR improvements, fiber index characterization, fiber Bragg grating measurement techniques, and PMD.
    [Show full text]
  • Application of Spectroscopic Ellipsometry and Mueller Ellipsometry to Optical Characterization E
    Application of Spectroscopic Ellipsometry and Mueller Ellipsometry to Optical Characterization E. Garcia-Caurel1, A. De Martino1, J-P. Gaston2, L.Yan3 1LPICM, CNRS-Ecole Polytechnique, Palaiseau, France 2HORIBA Scientific, Chilly-Mazarin, France 3HORIBA Scientific, Edison, NJ, USA This article aims to provide a brief overview of both established and novel ellipsometry techniques, as well as their applications. Ellipsometry is an indirect optical technique in that information about the physical properties of a sample is obtained through modeling analysis. Standard ellipsometry is typically used to characterize optically isotropic bulk and/or layered materials. More advanced techniques like Mueller ellipsometry, also known as polarimetry in literature, are necessary for the complete and accurate characterization of anisotropic and/or depolarizing samples which occur in many instances, both in research and “real life” activities. In this article we cover three main areas of subject: basic theory of polarization, standard ellipsometry and Mueller ellipsometry. Section I is devoted to a short and pedagogical introduction of the formalisms used to describe light polarization. The following section is devoted to standard ellipsometry. The focus is on the experimental aspects, including both pros and cons of commercially available instruments. Section III is devoted to recent advances in Mueller ellipsometry. Applications examples are provided in sections II and III to illustrate how each technique works. Keywords: Polarization; Ellipsometry; Thin Films; Mueller matrix INTRODUCTION The use of polarized light to characterize the optical properties of materials, either in bulk or thin film format, has enjoyed great success over the past decades. The different methods of generating and analyzing the polarization properties of light is traditionally called Ellipsometry.
    [Show full text]