ToF-SIMS: Surface Analysis by Mass Spectrometry 1 10Molecular dynamics simulations, the theoretical partner to static SIMS experiments Barbara J. Garrison Department of Chemistry, Penn State University, University Park, PA 16802, USA. E-mail:
[email protected] 10.1 Introduction Secondary ion mass spectrometry (SIMS) is a wonderful technique for providing mass spectrometric information of molecules on surfaces as demonstrated in other arti- cles in this volume. For example, positive and negative SIMS spectra of an alkanethiol overlayer adsorbed on a metal substrate shown in Figure 1 exhibit numerous identifiable peaks.1a The parent thiolate mass (M) is discernable from peaks in the negative spectrum, although metal ions are attached. There is a characteristic pattern of pairs of peaks at + + CnH2n – 1 and CnH2n + 1 , which indicates an alkane chain. In addition, there are peaks such as – + AuS and Au(CH2)2 that do not readily provide useful information. Naturally, we would like to understand the fundamental events that give rise to the spectrum shown in Figure 1, especially if such an understanding would help interpret spectra. In addition, a fundamental understanding allows one to think about possible new applications as well as limitations of the technique. So, what is the conceptual under- standing of phenomena in a SIMS experiment? One often hears the phrase that the primary ion establishes a collision cascade in the solid. To me a collision cascade implies a sophisticated pool game as shown in Figure 2 for an Ar atom striking a film of alkanethiolate molecules adsorbed on a Au surface.2 From this animation and many more animations with different initial position of Ar hits, a visual picture of the process begins to emerge.