IEEE Reliability Society http://www.ieee.org/society/rs

Vol. 48, No. 2, April 2002 (ISSN 1059-8642) President’s Message

CONTENTS

President’s Message In mid February, I attended the Organizational Units Series of meet- 1 ings covering all of the Units that are involved in the management of

Editor’s Column the IEEE. As your Society President, I am a voting member of the 3 Technical Activities Board (TAB), as are all Society

Chapter News and Council Presidents and the Division Directors. 3 Motions come out of various standing committees or from the TAB itself, are discussed, and are voted upon. AdCom Meeting Minutes 6 Those motions that are approved for recommendation are passed to the IEEE Board of Directors for final ap- TechOps Status Report 8 proval. The motions can include policy changes, task- ing of Headquarters, tasking of Societies and Standards News Councils, establishment of a new incentive or product 13 with resources funded, etc. Your Reliability Society is Educational Activities Update fortunate this year as we have two former Reliability 24 Society Presidents attending TAB with me. Loretta Meeting Notices Arellano is our Division VI Director and Dick Doyle is the Regional 17 Activities Board (RAB) to TAB Representative. Technical Magazine Section: If you haven’t taken the time to look into the IEEE and its organiza- tion, I encourage you to review and understand how the various organi- zational pieces fit together. The IEEE is a complex international 22 non-profit organization that operates on a global basis. The IEEE is the world’s largest technical professional society and is devoted to advanc- ing the theory and practice of electrical and electronics engineering and computer science. The IEEE serves engineers, scientists, and other pro- fessionals in approximately 150 countries. IEEE as an international pro- fessional organization is made up of approximately 400,000 members, spread across 10 geographic regions, organized in 298 sections, support- ing 1156 Student Branches, almost 1300 Chapters, 37 Technical Soci- eties, and 4 Technical Councils involving 31 Societies in at least 1 Council. The IEEE is a well-recognized and respected organization. The Societies are the revenue engines for IEEE and represent about 65 percent of IEEE income. The Societies publish 105 of the IEEE’s 115 different publications. Society members make up 75 percent of the subscribers, which translates to 822,800 subscribers. Societies also sponsor 90 percent of the IEEE conferences. As you can see, Societies are major participants in the IEEE, including your Society.

In January on the Saturday before RAMS (the annual international Editor: Reliability and Maintainability Symposium), the first AdCom meeting Dave Franklin Associate Editor: continued on page 5 John Healy Business Manager: Bob Gauger IEEE RELIABILITY SOCIETY OFFICERS President Nominations and Awards Software Reliability Dennis Hoffman ([email protected]) K. P. LaSala ([email protected]) S. J. Keene ([email protected]) Vice President - Membership Fellows Ann Miller ([email protected] A. N. Campbell ([email protected]) T. L. Regulinski ([email protected]) Standards & Definitions Vice President - Publications Finance Y. Lord Dr. Robert J. Loomis, Jr R. A. Kowalski ([email protected]) ([email protected] T. L. Brogan ([email protected]) Historian ([email protected] Vice President - Meetings A. Plait ([email protected]) Testing & Screening John Healy ([email protected]) Academic Education H. A. Chan ([email protected]) Vice President - Technical Operations Dr. Robert J. Loomis, Jr William R. Tonti [email protected] ([email protected]) Warranty Vacant Secretary Jeff Voas ([email protected]) TECHNICAL OPERATIONS Treasurer Vice President Systems Committees R. A. Kowalski ([email protected]) William R. Tonti [email protected] (8 committees) Technology Committees Aerospace & Defense Systems STANDING COMMITTEES (12 committees) D. L. Franklin ([email protected]) Standards and Definitions CAD/CAE Automotive Systems T. Brogan Janasak ([email protected]) C. Aladekugbe ([email protected]) ([email protected]) Human Interface Technology B. Dodson ([email protected]) Y. Lord K. P. La Sala ([email protected]) ([email protected]) Consumer Electronics International Reliability F. Shenkelberg ([email protected]) Meetings Organization Joseph R Fragola ([email protected]) John Healy ([email protected]) Energy Systems Mechanical Reliability M. Lively ([email protected]) General Membership R. L. Doyle ([email protected]) A. N. Campbell ([email protected]) Industrial Systems Microelectronic Technologies H. Yajima ([email protected]) Chapters Alan Street ([email protected]) L. Arellano ([email protected]) T. A. Rost ([email protected]) Information Technology & Academic Education Committee Communications Reliability Design J. Healy ([email protected]) M. Abramo ([email protected]) M. Roush ([email protected]) Professional Development Medical Systems Reliability Methodology Vacant M. Abramo ([email protected]) C. K. Hansen ([email protected]) Constitution and Bylaws Sensor Systems System Safety K. P. La Sala ([email protected]) K. P. LaSala ([email protected]) Takehisa Kohda ([email protected]~u.ac.jp)

All RS newsletter inputs should be sent to: The schedule for submittals is: Editor: Dave Franklin Newsletter Articles Due Ads Due 23309 Park Colombo, Calabasas, CA 91302 January November 8 December 8 Tel: +1 818 586 9683 April February 8 March 8 E-mail: [email protected] July May 8 June 8 Associate Editor: John Healy October August 8 September 8 [email protected] IEEE Reliability Society Newsletter (ISSN 1059-8642) is pub- Business Manager: R. Gauger lished four times a year in January, April, July and October by [email protected] the Reliability Society of the Institute of Electrical and Elec- tronic Engineers, Inc. Headquarters: 3 Park Avenue, 17th Floor, ADVERTISING RATES New York, NY 10016-5997. Sent at a cost of $1.00 per year to All copy that contains graphics or special fonts must be cam- each member of the Reliability Society. Printed in U.S.A. Peri- era-ready or delivered on computer disk and be received by the odicals postage paid at New York, NY and at additional mailing due dates indicated. offices. Postmaster: Send changes to Reliability Society News- Ad Size One Time 2-3 4+ letter, IEEE, 445 Hoes Lane, Piscataway NJ 08854. Full Page $400 375 350 ©2002 IEEE. Permission to copy without fee all or part of any Half Page $300 280 260 material without a copyright notice is granted provided that the Third Page (vertical) $240 225 210 copies are not made or distributed for direct commercial advan- Quarter Page $205 190 180 tage, and the title of the publication and its date appear on each Eighth Page $120 110 100 copy. To copy material with a copyright notice requires specific permission. Please direct all inquiries or requests to IEEE Copy- Discounted per issue rates are shown for ads run in more than rights and Permissions Office. one issue.

I Editor’s Column IIIIIIIIIIIIIIIII We want to hear from you, please sub- day of tutorials on August 25. To find out example by putting a link to the confer- mit your articles, comments or question more about the conference, please log ence in your society conference activities by email if possible. onto http://ewh.ieee.org/tc/nanotech/ page. I would especially appreciate it if Thanks, nano2002/. Deadline for paper abstract you can place the conference announce- Dave Franklin submission is due by March 31. Regis- ment in your societies newsletter, maga- Editor tration information will be put on the zine, or transactions. The Call for Papers web soon. is in the website. Dear member society Presidents As a member sponsoring society of I look forward to seeing you at the of IEEE Nanotechnology Council: the Nanotechnology Council, your mem- conference. As you may know, the second IEEE bers would be interested in participating Cliff Lau conference on nanotechnology, in nanotechnology activities. I would IEEE-NANO’2002 General Chair IEEE-NANO’2002, will be held in very much appreciate it if you can publi- Nanotechnology Council Washington DC on August 26-28, with a cize this conference to your members, for President-elect

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for, analyze, and interpret the results of Jeff Clark reliability modeling problems. Chair, Boston Chapter Walter E Willing Our March monthly meeting was held [email protected] at the Waters Corporation in Milford, Massachusetts. Waters is the world’s Jefferson D Bronfeld leading supplier of high performance liq- See Boston Chapter activities. uid chromatography instrumentation and Jeffery A Clark consumables, as well as thermal analysis The Boston Chapter opened the New and mass spectrometry products. Reli- Year in January with a monthly meeting ability Engineering Manager Richard on the “SHARPE Graphical User Inter- Cass gave a presentation on “Waters Ap- Frank D Straka face (GUI).” SHARPE, the Symbolic Hi- proach to Mechanical Reliability erarchical Automated Reliability and Testing,” which included a guided tour of Performance Evaluator, is a popular soft- their reliability lab, machine shop, and Regards, ware tool for solving complex reliability assembly area. Vincent Lalli, Chair and availability models. It was developed We will close our 2001-02 activity [email protected] by Professor Kishor Trivedi at Duke Uni- year in May with a Spring Lecture Series versity. Chapter AdCom member Joe on “Analyzing Statistical Data.” Joe Dzekevich of Raytheon demonstrated the Dzekevich put together this three-eve- new GUI, which simplifies construction ning course based on the book Basic Sta- of the models solved by SHARPE. tistics, Tools for Continuous In February, we held a related Improvement by Kiemele, Schmidt, and Donald Butler monthly meeting on “Applied System Berdine. Topics to be covered include: IEEE Dallas Section Chair Reliability Modeling.” Over the past few data plots; organizing data for statistical [email protected] years, the Boston Chapter covered vari- programs; descriptive statistics; “P”, the ous reliability analysis tools and tech- “voice of the data”; T, paired, grouped, niques in its meetings. The focus of this and non-parametric tests; two-way cross Samuel J Keene meeting was how to apply those tools tabulation; linear regression and ANOVA and techniques to real-world problems. for DOE; and residual analysis. Chapter member Dr. Michael Elbert of For more information on Boston Compaq Computer Corporation shared Chapter activities, please visit our web Shuichi Fukuda, Chair his experience and expertise on how to site at http://www.channel1.com/users/ Chair, Japan Chapter approach, select methods and metrics ieee/home.html. [email protected]

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where he helps manage the technology search and development of technology pro- needs for 5,000 students, 150 faculty, and grams in software systems. She has lead re- In February we heard “Information 35 staff. Mr. Smith has daily contact with search and development activities in Architecture on the Wild, Wild Web: Im- students, most notably as the faculty ad- information security for real-time systems proving the Structure, Presentation, Ac- visor to the Management Information for the last 10 years. She was a Principal In- cessibility, and Semantics of Our Systems Association student organiza- vestigator and the lead system security en- Electronic Content” given by Wayne tion and as a frequent guest lecturer in the gineer for numerous technology programs, Smith, Director, Office of Information College. He has some enterprise-wide in- including the DARPA-funded PROSE de- Technology, College of Business and volvement as well, including network velopment for high performance comput- Economics, California State University, and server management, implementation ers and the Information Assurance Northridge, [email protected] of ERP (Peoplesoft) systems, developing Reliability Model program and is Program Deciphering the W3C alphabet soup custom DSS/OLAP solutions, classroom Manager for several research programs in (XML, CSS, SVG, DOM, SOAP, RDF, multimedia design, strategic planning embedded systems information technol- WAI, P3P, etc.) for publishing stan- and change management, and IT profes- ogy. She was also Principal Investigator on dards-based documents on the World sional development. the Secure Avionics Architecture Concept Wide Web is rapidly becoming a full time In the past two years, Mr. Smith has Development Program, to define the sys- job. Moreover, each of the “document” been involved in doing pro bono work for tem security requirements for the Joint standards has subtle technological, archi- other government agencies, including the Strike Fighter Weapon System. tectural, design, and organizational Los Angeles Police Department, the Los David L Franklin touchpoints. Understanding the genesis, Angeles County Office of Education, and [email protected] direction, and status of each of the W3C Santa Monica College, in the area of hir- standards is increasingly critical in a ing and selecting quality IT professionals highly interconnected world. and executives. Mr. Smith is a licensed Probably the most ambitious initiative amateur radio operator and is active in yet is the one to build the “Semantic several religious and charitable organiza- Web”— that is, to embedded clarity, con- tions in the San Fernando Valley. In 2002 the Twin Cities chapter had sistency, and mutually reinforced seman- held meetings in January, February and tic meaning on the Web. This March 6, 2002 Subject: Trends in March. The January 15 th. meeting was presentation will summarize these activi- Information Security, Speaker: on the topic of “Accelerated Life Testing” ties and discuss what future “information Roberta Gotfried, Raytheon by James McLinn, Reliability Consultant architectures” IT professionals will be Company, Electronic Systems, and hosted by StorageTek. Thirty-Four building for their organizations. [email protected] people attended. The February 19 meet- Mr. Smith has been involved with com- The field of computer security began ing was at Unysis with Gerald Pattison of puters since 1975. He graduated with a over 20 years ago in the form of a highly Physical Electronics speaking upon Bachelor’s of Science degree in Manage- formal discipline aimed at protecting “Product Development and Reliability” ment Information Systems from Califor- confidentiality of government classified with 29 people attending. Steve Theissen nia State University, Northridge (CSUN) information as the use of computers grew. of mentor spoke in March on the topic of in 1984, and is currently a doctoral student Since that time, computer security has “ESD and Reliability” before a crowd of in the School of Information Science at evolved as an engineering discipline 20 at StorageTek. Meetings are planned Claremont Graduate University. He has through a series of incarnations, each one for April and May. held various positions at CSUN including addressing a new set of objectives and James McLinn full-time lecturer in the Department of Ac- new sets of threats - all the time trying to Chapter Chair counting and MIS. Mr. Smith co-founded keep up with the rapidly changing world [email protected] and taught in the desktop technology pro- of computing and information systems. gram of the CSUN Continuing Education Now, privacy and cyber terrorism have program in 1986. He has been a network taken a pre-eminent place in the field, Vacant manager at a large UC campus and has with much wider public awareness. also taught Financial and Managerial Ac- This talk will review the evolution of counting at a local community college. the field of information security, look at From 1991 to 1994, Mr. Smith supervised recent trends in information security and a team of programmers who designed and look at what might lie ahead. Fausto Fantini developed a major magazine imposition Ms. Roberta Gotfried is currently Direc- database and layout computer application tor of Information Assurance Programs for for a Fortune 125 printing firm. Raytheon Electronic Systems and Chair of Dear Dr. Almuhtadi and Mr. Mr. Smith is currently the Director of the Raytheon-wide Information Security Abdullah: Technology in the College of Business and Information Management TIG. She On behalf of the IEEE Executive Di- Administration and Economics at CSUN has over 20 years of experience leading re- rector, Dan Senese, it is a pleasure to in-

I IIIIIIIIIIIIIIIIIIIIIIIIIIIII form you that the requirements of the Dr. Ong was the Chapter chair in 1999 IEEE Bylaws have been met, and the Fulvio E. Oliveto, Chairperson and 2000. change in status of the Reliability/Power Philadelphia Section Dr. M.K. Radhakrishnan Engineering Society joint Chapter of the (856) 914-7298 Chapter Chair, IEEE Rel/CPMT/ED Ottawa Section has been approved. The Chapter, Singapore Chapters will now be the Reliability So- e-mail : [email protected] ciety Chapter and the Power Engineering Society Chapter of the Ottawa Section. Chapter Chairman: The effective date of this Chapter change Michael V. Frank is 16 January, 2002. [email protected] Michael E Parten At this time we are recording Dr. R.L. Doyle, Secretary Almuhtadi as the Chair of the Power En- IN REPLY gineering Society Chapter, and Mr. (858) 459-6504 Abdullah as the Reliability Society Chap- REFER TO RLD:00801 Mauro Ciappa ter Chair. When an election has been [email protected] Switzerland Chapter Chair held, please use the enclosed Officer email: Confirmation form to report the officers to IEEE. If we can assist you in any way Vacant in the planning of the Chapter activities Walter W Zessner please let us know. We extend our best wishes for the suc- cessful operation of this Chapter. (ED/Reliability/CPMT Joint Chap- Sincerely, ter) Cecelia Jankowski Kenneth P La Sala Managing Director Regional Activities Please note that, M.K. Radhakrishnan Wahab Almuhtadi is the Chapter Chair from 2001 onwards.

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President’s sium) in Dallas. Society dues, publication mittee outputs are of direct benefit to our page counts, and non-member publication members — that is you and I. Message fees were discussed and established for Get involved. Participate. continued from page 1 2003, as this information must be supplied There are plenty of ways and areas to to IEEE by June 2002. Additional revenue match your interests. You can become in- of 2002 was held in Seattle. The newly sources were discussed, as were educa- volved in your local chapter, establish a elected AdCom members and Society Of- tional products. The AdCom continues to chapter in your area, get involved in one ficers were introduced and became, with focus on ways of providing benefit to its of the Technical Operations committees, the other AdCom members, the adminis- members as well as ways of being a career help develop IEEE reliability standards trative function to guide and manage your benefit to you. and best practices, or run for election as Society. There are 18 elected AdCom an AdCom member. Get involved and ex- members with six members elected each Society Participation ercise your technical and / or administra- year. This approach allows your Society to As a continuing ending message, the tive skills. If you are not sure how to get have an influx of new members each year Reliability Society is your Society. Your involved, contact your local chapter offi- while allowing a smooth transition. Soci- Society depends on volunteer services, so cers or your national officers. They will ety Officers are elected from the AdCom it can continue to function. Your Society be more than happy to answer your ques- and serve one-year terms. is very fortunate that volunteers do con- tions and to guide you. Your AdCom addressed Society fi- tinue to come forward, get involved, and Have a great year, nances at the second AdCom meeting held contribute. But there is much that isn’t Dennis Hoffman in April on the Saturday before the IRPS getting done, especially in our Technical (International Reliability Physics Sympo- Operation committees, and these com- [email protected]

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Seattle, Washington 7/21/01 Status: Contract signed. Survey Special Assignment completed, but has not been approved by John Healy January 26, 2002 ADCOM for sending to RS members. ½ 8) Continue working on Article for the In attendance: status: Working Final draft in process. IEEE institute. Status as of 01/01/02. Not Norm Schneidewind, Martin Shooman, 3) Membership to review IES mem- completed bership program, Millennium for Suc- John Healy, Scott Abrams, Dennis President’s Report Hoffman, Tom Brogan, Loretta Arellano, cess, material to see what that D. Hoffman Christain Hansen, Ann Campbell, Ted organization is doing to retain and cap- Dennis reviewed the history of the RS, Freeman, David Franklin, Bob Loomis, ture members and possibly develop some its down and up swings. Dennis reviewed Tom Fagan, Ann Miller, Joseph Fragola, ideals for RS. (Institute of Environmental the target goal of how to make Society Alan Street, Koichi Inoue, Bill Tonti, Bob Sciences) 01/02/02 Status: Carried to membership more valuable to its mem- Gauger, Dick Doyle, Ken LaSala, Dick Ann Campbell, to be reconstituted. bers. This is one of the main themes in the Kowalski, Yvonne Lord, Jeffrey Voas TechOps EXCOM report described below. 8:00 Koichi Inoue Nov TAB Meeting Report Call to Order 4) Ops Manual needs to be reviewed L. Arellano / D. Doyle D. Hoffman by old and new Tech Ops VPs to assure Comments: TAB: Technical Activities Agree to Agenda - D. Hoffman job descriptions are covered and are ade- Board is a meeting of all Society presidents. Introduced new AdCom class mem- quate. 01/01/02 TBD for next ADCOM. Dick Doyle represented RS. IEEE lost bers, approve President appointments, 5) Review and make a recommenda- $22M in operating expenses in 2001. The and introduce officers - D. Hoffman. The tion at the Jan 2001 AdCom meeting on action activities were: Presidents agreed to group introduced themselves for all new Council sponsorship. Basically, are we drop the TAB/RAB (regional activities and current members. getting our money’s worth? Review board) reorganization for 1 year. A budget Council involvement, along with travel In the anticipation that RS will rewrite showing a $3M loss for 2002 was approved. the Bylaws, Ken recommends that the 2 and other liabilities, and make pro / con n Reliability Marketing Action Plan - most recent full term past presidents will recommendation. 7/21/2001 Status: In A. Street be made ex-officio with voting rights as Process, conclusions to be presented at n Alan’s Theme: Who are we trying to of the date 1/01/02. AdCom approved the October ADCOM. reach? recommendation for the draft Bylaws. ref: IEEE sponsors councils. IEEE pro- n Joint chapters do very well. e.g. Sin- Dennis Hoffman brought to the floor vides seed money, they operate financially gapore is a joint RS/EDS chapter. the appointed positions. For 2002 Dennis independent therein. We have 4 councils n Individual tech disciplines are best recommended: Secretary Dr. Jeff Voas, Nano-Technology, Sensors Council,(at a handled by tech ops. Treasurer Dr. Dick Kowalski, Trans Edi- device type level) Intelligent Transporta- n Mechanics of Publicity: www sites, tor Dr. Way Kuo, Newsletter Editor Da- tion Systems council, SuperConductivity e-mail lists, conferences, trade press vid Franklin. The appointments were council (Not supported by RS ). All other articles, chapter presentations. approved unanimously by ADCOM. the other 3 are supported. Recommenda- n Survey is a starting point; Action item tion: Continue on present track. to all: send random thoughts to Alan 8:40-9:10 Next, discussion by Ken/Marty on how Minutes Approval Publications to infuse this in college curricula. Marty J. Voas / B. Tonti Bob Loomis indicates that this can be integrated in a Bill Reviewed the Action items. The 6) Overview papers (2-3 pages in length) in the Newsletter and to build a lecture. David commented on quality vs. motion was then made to accept the July reliability. We allowed ASQ to certify reli- and October minutes. The minutes were backlog. Put call for such papers in Newsletter. 01/01/02 status: Closed. ability engineers and eat our lunch. Ann unanimously approved. M. discussed the software video. Result of 7) Work with RAMS in providing a discussion: We will wait for the survey re- ACTION ITEM SUMMARY CD-ROM for 2002, and eliminating the sults and then take further action Membership hard-copy RS mailing. 01/01/02 Status: Ann Campbell New RAMS Proceedings Editor made Treasurers Report 1) VP Membership to develop a suit- using a CD-ROM to risky for the 2002 able membership form for the Transac- RAMS. However, the 2003 RAMS GC R. Kowalski tions and the Newsletter. has been informed that the RS will be pur- FY01 Results & FY02 Budget 2) Send the Reliability Society Survey chasing CDs instead of Hardcopy. Status Three separate budgets are in process, to our membership no later than 2/2002, Closed past, current, and future years. Income

I IIIIIIIIIIIIIIIIIIIIIIIIIIIII sources emanate from membership fees, ideas for next ADCOM meeting. Bob maintain the r07 e-mail for our 3K mem- APP (All Periodical package), and mentioned that we also do special sec- bers. non-member transaction fees (e.g. a li- tions in a standard issue of the transac- PACE Report - B. Gauger for M. brary), meetings and symposiums. tions. Abramo. Loretta described Bob’s in- volvement for the PACE annual reward to Meetings Newsletter Status - D. Franklin, There is a magazine section of the newsletter. be delivered to Bob in May for his 10 J. Healy / J. Voas John Healy will take this over when it years of involvement. A motion carried Sponsored Conferences Report, New grows large enough. Ann requested that unanimously that Bob has a budget not to Sponsorships, and Meeting location plan- Dave e-mail a reminder when the mate- exceed $2000.00 at the award PACE con- ning. Joe will send out meeting request rial for the newsletter is due. Dave men- ference to make up any delta between proposal. Dick Doyle presented Nano tioned, “just send it”. Loretta suggested PACE and out of pocket expenses. Technology conference status. Dick that we keep a deadline in order to obtain Logo Development Status - C. Doyle will write a review for the RS news- chapter reports / schedules on a timely Hansen, Net: Go to Christian with your letter. A motion unanimously passed to basis. Dave will work on this! He men- vote or additional idea. send Bill to ASEE conference for ABET tioned that the Chapters themselves do training in June for ABET, not to exceed not report on a schedule. Technical Operations $1200.00. Sam presented ISSRE post Advertising Status for T-Rel & News- B. Tonti / K. Inoue mortem. 130 people attended. Keynote letter - B. Gauger. Transactions provides Technical Operations Report, A mo- was Motorola Global Services exec. approx $4K/yr. Newsletter has about tion unanimously carried to allow ATRto Fevzi Belli presented a discussion on $6.5K/yr. Bob mentioned a bartered ad- be reprinted by RAC and Japan’s Union Paterborn Germany AdCom meeting. vertisement with DTIC. Bob stated that of Scientists and Engineers. Standards Main airport is in Hanover. IEEE is not very this is a good win-win system. Status - Y. Lord, T. Brogan, Council Re- active at the University, but IEEE Germany T-SM Status - M. Abramo. Marsha re- ports: Sensors (LaSala), ITS (Kaufman), is active. Of the 18K students, about 9K mains as the T-SM representative. She Nanotechnology, (Campbell), IEEE students are engineering students. The conducted a first meeting in the manage- Voting Machine Standard Team Status - journal equivalent to IEEE is “VED”. 1K ment of T-SM. It is the number one cited J. Healy students are EE, 2K students are CS. journal in manufacturing type compa- Bill Made the motion to add 3 commit- Joe discussed the chapter in Milan It- nies. Possibly a telecom will take place tees, Eric Snyder of Sandia Technologies aly, and it is coming together. (Enrico this summer. They are discussing a semi- for committee on WLR, Danielle Tanner Zio). Not the best tourist place, but great conductor society forming. of Sandia Nat. Labs for MEM’s technolo- restaurants, close to the Ferrari plant, Video Tutorial Status - S. Keene. gies, Eric Vogeland J. Seuhle of NIST for transportation friendly. The polytechnic There was a taping in December. IEEE is dielectrics, and Jody Van Horn of IBM University is good, population approx. not encouraging the production of any for product burn-in. Motion is tabled, Bill 12K. Reliability department is strong. videos. They would like to provide infor- to come back in April with interest and Tutorials would be well received. mation that is attractive to universities. proposed activity. Weather is not good in the fall. 2 airports i.e. On-Line resources. Bill discussed the initiatives for Tech are nearby. Bus and possibly train service Ops: T-DMR Status - A. Campbell / B. is available. It is the industrial center of It- Tonti. 3rd edition was just published. 4th n Education for members / potential aly. A straw man vote chose Italy as the edition will be out in March. The total members: By seminars, both paid first choice. number of paper submitted 2001: 32, and free e.g. TPC comm. chairs to Publications Number accepted 2001: 21, Number re- place “public” knowledge on RS web site to be used by all in outside R. Loomis jected 2001: 2, In revision: 9, Invited: 7, Contributed 23, Average 7 papers / issue lectures. Lectures at high schools, Overview & Web site update - R. colleges, chapters, companies. Loomis, T-Rel Performance in 2001, for 2001, Submission to first decision: Plans for 2002 - W. Kuo, Database Pro- average of 57 days (publish at first deci- n Publish chapter reports e.g. in ject Status - W. Kuo. Bob indicates the sion) T-DMR, The institute. project is complete. This will be demon- n Encourage actual publications in out- strated tomorrow (1/27/02) at the associ- Membership side journals. e.g. RAMS to T-DMR. ate editors meeting. Joe Fragola indicates Ann Campbell A motion carried to create a new com- that the most useful transactions were Membership Report / Brochure / Ac- mittee on six sigma, acting chair is Sam those that are special issues. Marty dis- tion Plan - Ann Campbell, Membership Keene. Bill asked for a new editor of the cussed the non-practical transactions is- Development Retreat (March 8-10, 2002) ATR and Thanked Christian Hansen for sues, and perhaps a special issue would Coverage Plan, Chapters Report / Action his superb job as editor, and expressed his solve this problem. Bob will remain a fo- Plan - L. Arellano. Loretta recommended regret that Christian nolonger had the cal point for special issue inclusions. Ac- that Ann attend Sections Congress ‘02 in time tto devote to the task. Scott Abrams tion Item: ADCOM to send Bob new Washington D.C. Dave volunteered to agreed to take over the ATR editing.

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John Healy: new team, voting stan- Div VI Highlights beled as an RS seminar / short course. dards. (Give it to Jeff). (Voting machine The seminar is a 3 day venture. Joe and standards group). If you want to be on the Old Business Bill will work out a plan under tech ops. team, contact John (see listing in front of None other than that covered in the re- Appointment Terms / General Discus- newsletter). ports sion - J. Fragola Working Item: Have Tom and Yvonne Junior Past President’s Report New Business A motion to fund the graphics artist work with Norm. RS/CSEE/IEEE and ap- K. LaSala proach AIAA with the recommendation Nominations Committee Report, $3K to work on a minimum of 3 logo de- signs passed. Christian Hansen will pro- 5:00 Adjourn Awards and Medals Report / AdHoc 6:30 Banquet Committee. One note: Engineer of the ceed. Please e-mail Christian any ideas year is actual the annual award. By Laws that you have. & Constitution Change Status Course Sponsorship Proposal / Gen- eral Topic Discussion. Proposal for a Senior Past President’s Report course on probabilistic risk assessment L. Arellano with RS sponsorship of a seminar to be la-

TechOps Status Report

rial position, formerly held by [email protected] January 2002-April 2002 Christian Hansen. Tech Ops editor: Scott Abrams William R. Tonti, VP 2. New VP’s Principle of TechOps Man- [email protected] TechOps agement: The TechOps Committee Meeting As incoming VP I would like to con- CAD / CAE: Keith Janasak, was held on January 27, 2000 in Seattle, tinue with the strategy of Dr. Inoue, Chair: Washington preceding the annual RAMS whereby quarterly tech ops reports are used The Reliability CAD/CAE Tech Ops convention. Dr. Koichi Inoue former VP to keep everyone abreast of current topics, Committee’s objective is be a conduit of of Technical Operations introduced Dr. and also used to help each chair organize information for today’s R&M CAE tools William Tonti as the incoming VP. their respective annual technology report. and future emerging R&M CAE direc- Attendees: Total 20, *Koichi Inoue, In addition, as Dr Inoue has previously put tion. The committee plans to become vis- *John Healy, *Tom Brogan, *Yvonne in place, these reports or lack therein are to ible through the RAMs conference by Lord, *Christian Hansen, *Keith Janasak, be used to sunset inactive committees. offering an R&M CAE Track . This will Dennis Hoffman, *Ken Lasala, *Norm Additionally as incoming VP I am re- include papers, tool vendor exhibits, tool Schneidewind, Dick Kowalski, *Dave questing each tech ops committee initiate overview presentations and demonstra- Franklin, *Hiroshi Yajima, *Scott Abrams a (or multiple) state of the art modular tions, and tutorials, pending participant ,*Dick Doyle, Bob Gauger, *Takehisa short course that the Reliability Society feedback. Kohda, *Ann Campbell, *Alan Street, Ted through Technical Operations can use to Consumer Electronics: Fred Freeman, *Sam Keene, Bill Tonti educate the engineering community at * Technical Operations chair or com- large, as well as universities, colleges and Schenkelberg, Chair: mittee member secondary schools. These short courses The Consumer Electronics committee will be organized on the RS web site, with continues to grow, and is actively seeking Meeting Agenda: a suite of abstracts that may be viewed by additional members. In 2002 this com- 1. Call to order by Koichi Inoue / Intro- the public. The technical presentations mittee plans to publish on “ What can be duction of Tech Ops chairs, and in- would be stored in a protected area, only done in the product development process coming VP viewable by the Technical Operations to minimize the chance of a product 2. TechOps year-end (2001) reports chairs and authors. catching fire?” VP TechOps report by Koichi Inoue 3. The following is a brief summary of the Human Interface technology 3. New VP’s 2001 goals Technical Operations Chairs Reports Committee: Dr. Kenneth P. 4. Tech Ops Chairs Summary Reports: presented at the annual tech ops meet- ing, or sent via e-mail: (Note: This in- LaSala, Chair: Meeting Minutes: formation is taken from the written The Human Interface Technology 1. TechOps Restructuring: Refer to at- material electronically sent to the VP Committee activities for 2001 consisted of tached summary by Scott Abrams, tech ops, and the tech ops editor) i.e.: assembling the HIT Committee contribu- who has accepted the Tech Ops edito- 4. VP Tech Ops: Bill Tonti tion to the Reliability Society Annual Tech-

I IIIIIIIIIIIIIIIIIIIIIIIIIIIII nical Report, preliminary discussions on posium held in Hong Kong Mladen Vouk, Sensors Committee: Dr. Kenneth committee terms of reference, incremental Jeffrey Voas, Ann Miller, Joanne Betcha P. LaSala, acting Chair: additions to the Web page, review of plans Dugan, and Sam Keene produced a fourth In June ’02, the IEEE SENSORS con- for a reliability conference in China and re- Software related video tutorial, “De- ference will be held in Orlando, FL. To ferral of the subject to the Reliability Soci- veloping Fault Tolerant Software”.For date, the first three sensor journal issues ety AdCom, and introductory discussions 2002 Dr. Schneidewind proposed devel- have been mailed to subscribers about a human reliability standard. For oping a cooperative working relationship 2002 these activities shall be continued. on software standards with CS. Plans are TC Committee: H. Anthony to develop another tutorial on Software Chan, Chair: Industrial Systems Committee: aspects of system security and risk miti- In 2001, efforts were put in place so Dr. Hiroshi Yajima, Chair: gation, and to complete the Software Re- that RAMS would incorporate a tutorial For 2001, this committee was estab- liability Chapter for the McGraw Hill’s and a technical session on stress testing lished, having the objectives: Handbook for Electrical Engineers”. Ad- and screening. This is now an integral n Survey of reliability technology at ditionally the committee will investigate part of the RAMS program. For 2002 specific plant industries and troubles. developing greater initiatives in Software plans include to develop test and screen- n Survey of reliability issues in real and System Risk Mitigation. ing standards processes. plant failure. Presently, the following committee n Start up survey of reliability issues in Standards & Definitions: chairs were present at the TECH Ops organization and risk management. Co-Chairs Yvonne Lord, Tom meeting, but I am missing a summary re- n For 2002 the committee plans are: Brogan: port. Please send me your 2001 results n Survey of reliability issues in orga- The Standards & Definitions Commit- and 2002 plans via e-mail. nization and risk management. tee continued support of the SCC37 Reli- 1) International Reliability: n Survey of reliability status and trend ability Prediction IEEE 1413.1 Working Joseph R. Fragola () at plant industry Group during 2001. The WG held four 2) Microelectronic Technologies: n Selection of new committee members. (4) face-to-face meetings and nearly 20 Alan Street ([email protected]) Mechanical Reliability teleconferences. Currently the document 3) Aerospace & Defense Systems: is in the pre-balloting stage and is being Dave Franklin () Committee: Mr. Richard L. Doyle, worked with the IEEE editor to resolve 4) Information Technology & Communi- Chair: formatting inconsistencies. cations: For 2001, the committee: prepared The 2002 Plans are continued support John Healy ([email protected]) and gave a tutorial presentation to the and monitor the progress of the IEEE Singapore Chapter. The presentation was SCC 37 on Reliability Prediction (1413.1 The following committees are active, on “Thermal Analysis of Integrated Cir- Working Group) and support the ballot- but a chair did not attend the Tech Ops cuits and Small Systems”. In cooperation ing process. annual meeting. Please send me your with the Nanotechnologies Council, the 2001 results and 2002 plans via e-mail. committee chaired two sessions at the System safety Committee: 1)Automotive Systems: 2001 Nanotechnologies Conference. Dr. Takehisa Kohda, Chair: Clement Aladekugbe () In 2002 the committee plans to publish In 2001 advanced highway cruise sup- 2) Energy Systems: an RS newsletter article, and to hold a mem- port systems (AHS) covering advanced Mark Lively ([email protected]) bership meeting to establish the strengths safety vehicles were evaluated. Typical and weaknesses of the committee, and de- hazards newly introduced in these sys- The Following committees are Inac- velop plans to utilize the present strengths, tems were identified and risks generated tive, and do not have a chair: and to improve on the weaknesses. by the hazards were estimated. These re- 1) Reliability Design: Reliability Committee and ATR sults are published in transactions/con- 2) Warranty: Editor: Christian Hansen, Chair: ference papers and proceedings. 3) Medical Systems: For 2001, The Annual Technology The 2002 plans to examine a general framework for the safety design of com- Report (ATR) was completed and sub- AdCom Meeting Agenda mitted to Dave Franklin. Plans are to pub- plex systems from the viewpoint of risk lish IEEE-RS Newsletter, the RAC management. The introduction of advance IRPS – Dallas – April 2002 Journal, and the Journal of the Japanese information technology in various fields Union of Scientists and Engineers. such as chemical plants, nuclear plants, Saturday’s Meeting airplanes, and automobile, makes the sys- 8:30 Welcome Software Relibility: Dr. Samuel tem difficult to confirm the safety in the Hoffman Keene, Chair: design stage. In addition the technical 8:40 Minutes Approval In 2001 the committee members par- committee plans to develop a web page for Voas (Keene) ticipated significantly in the International discussions among technical members as 9:00 Treasurer Report – 2001 Software Reliability Engineering Sym- well as communication to RS members. and YTD 2002

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Kowalski ISSRE’ 2001 Highlights 9:20 VP Pubs Status Report ISSRE’2001 was sponsored by both Loomis IEEE Computer Society and IEEE Reli- 9:40 VP Tech Ops Status Report ability Society. It began with a day of Tu- Tonti Marsha Abramo, Tim Drummond, torials, followed by three days of the core 10:00 VP Membership Status Report and Dick Doyle were present and repre- conference. The core conference in- Campbell sented the Reliability Society at the First cluded the Industry Day to host presenta- 10:20 VP Meetings Report ever IEEE Nanotechnology Conference tions from Industry, followed by 2 days of Healy held 28-30 Oct 2001 at the Outrigger Ho- multiple tracks by refereed papers, panels 10:40 Jr Past President Report tel in Maui, Hawaii. All three members of and fast abstracts. On the Tutorials Day 10:40 By-Laws & our Team chaired 2 sessions each during the first Workshop on Software Assess- Constitution Changes the conference. It was a very valuable ex- ment (WOSA) was also be held. LaSala perience for all 180 participants that at- The lure of Hong Kong and the great 11:10 New Award tended. The conference was well run and work of ISSRE’2001 program committee LaSala financially successful. to encourage submissions resulted in a 11:20 Treasurer Report – 2002 The 2nd Annual IEEE substantial increase in submitted papers and 2003 Budget Nanotechnology Conference will be held over last year. We had close to 100 sub- Kowalski August 26-28, 2002 at the Washington missions for refereed regular papers, 11:40 IEEE Tax Impact Hilton in Washington, DC with Dr. Clif- from which we accepted 38 papers, giv- Hoffman / Kowalski ford Lau and Conference Chairman. ing us an acceptance rate slightly lower 12:00 Lunch At the Hawaii Conference a than 40%, which was among the lowest 1:00 Society Members / Nanotechnology AdCom meeting was acceptance rates in the past ISSREs. Subsidize / Discussion held (27 Oct 2001) with Marsha In addition to refereed regular papers, Hoffman / All Abramo, Tim Drummond, and Dick ISSRE’2001 highlights four excellent 2:00 Revenue Development Doyle in attendance. At the meeting keynote speakers. They are: Terrence Hoffman Dennis Hoffman’s Email approving the Heng, Senior VP, Motorola; Steve 2:30 Membership / Chapter Plans Council’s C&BL (with reservations) McConnell, CEO, Construx Software; Campbell was placed on the view graph showing Kalyana Rao, Executive VP and CTO, 3:00 Pubs Plans the RS position of requesting an Ex- Satyam Computers Services Ltd.; and Loomis panded Field of Interest. Reliability is Dalibor F. Vrsalovic, President, Intel 3:30 Conference / Seminar Plans now included in the present Topics of On-line Services Inc. There were also 14 Healy interest. Also in the same email was the Industry Presentations from US Airforce, 4:00 Tech Ops Plans request to have 2 members from each NIST, Motorola, IBM Research, Cisco Tonti society on the council (a primary and al- Systems, Korea Advanced Institute, 4:30 Discussion ternate) with only one vote per society. Hitachi Ltd, and Sony Corporation, etc. All Pencil changes were made on that In addition, 4 panel sessions, 21 Fast Ab- 5:00 Adjourn change and accepted unanimously. The stracts, and 13 Student Poster papers Reliability Society has appointed Ann were presented in ISSRE’2001. Most of Sunday Meeting Campbell as our primary representative these contents appeared in an 8:30 Call to Order and Ken La Sala as our alternate repre- ISSRE’2001 Supplementary Proceed- Hoffman sentative. ings. In conclusion, ISSRE’2001 pro- 8:35 IEEE Awards Board The IEEE Nanotechnologies Coun- gram included 100 presentations of Holton cil has been officially sanctioned by various disciplines and topics surround- 9:05 Discussion the IEEE Board of Directors at their ing the subject of software reliability en- All last meeting (February 17, 2002) in gineering. 9:15 Singapore Chapter Status Report Tempe, Arizona. The Reliability Soci- The rich contents and variety of Pey ety is one of 19 IEEE societies repre- ISSRE’2001 program had attracted 9:30 2003 RS Pricing sented on the Council and is playing a widespread supports from both the acad- Kowalski very active roll. emy and the industry. A total of 12 orga- 9:45 Discussion We have established many good al- nizations had jointly supported the All liances in the fast growing conference. They are: The Chinese Uni- 10:00 Consolidate / Agree upon Nanotechnologies Council. RS needs versity of Hong Kong, The Hong Kong Society Plans to continue our involvement and help Polytechnic University, The University Voas (Keene) shape its future. of Hong Kong, Sino Software Research Discussion Sincerely, Institute, Hong Kong University of Sci- All Richard Doyle, RS Past President ence and Technology, Hong Kong Pro- 12:00 Adjourn and Lunch Email: [email protected] ductivity Council, Hong Kong Computer

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Society, Software Dioxide, Honeywell, n It was a good idea to eliminate Tools than 0.5 minute per year of total downtime IBM, Motorola and Word Wide Web Fair - we don’t have critical mass to (i.e. better than six 9’s in total system avail- Consortium. make it work well. ability) as specified in Telecordia ‘s About 130 attendees had participated n Review and comments on the sub- GR-929-CORE. This paper establishes a in ISSRE’2001. This marked a high level mitted paper are professional and framework for improving switching plat- of attendance (close to previous excellent. However, the presenta- form software fault tolerance while meet- ISSRE’2001 attendance level) compar- tion files should also be reviewed to ing the needs of fast-time-to-market via the ing with other IEEE sponsored confer- guarantee the quality of presenta- use of a very common component of mod- ences after the 911 event. tions. ern microprocessor called memory man- At the same time, a post-conference ISSRE’2001 is a showcase of the dedi- agement unit (MMU) and provides a survey reflected the following encourag- cated hard work done by the ISSRE’2001 modeling and analytical method for evalu- ing responses from the attendees : Program Committee in the previous year. ating different implementation alternatives. 1. Positive feedbacks were received on It helps to lay the groundwork for the suc- Finally, the paper presents examples based meals, organization and registration cess of ISSRE’2002 that is held in Year on modeling a 3G Wireless switching plat- arrangements, etc. 2002. form, to illustrate the effectiveness of using 2. 3/4 of the attendees who filled out the the proposed method. Modeling results survey were first-time newcomers to Selected ISSRE Abstracts to show more than 200 times improvement ISSRE, indicating a significant in- demonstrate the value of the can be achieved with use of MMU. crease of new bloods to the Software conference Cheung, S.C., S.T. Chanson, and Z. Xu, Reliability community as it was for the Belli, F., “Finite-State Testing of “Toward Generic Timing Tests for Distrib- first time held in Asia. Graphical User Interfaces” uted Multimedia Software Systems” 3. Over 85% of the respondents will rec- Based on finite-state automata (FSA) While multimedia software applica- ommend the conference to their col- and equivalent regular expressions, the tions are becoming popular, few works ex- leagues or will attend the conference paper introduces a holistic view of fault ist on testing this important class of next time. modeling that can be carried out as a com- software, especially with respect to its 4. High compliments were received on plementary step to system modeling, re- temporal properties. Traditional software the quality of Keynote speakers’ pre- vealing much rationalization potential. testing techniques mainly deal with func- sentations with some commented that Appropriate formal notions will be used tional correctness and cannot be directly ISSRE’2001 has the best set of Ple- to introduce efficient algorithms to sys- applied to testing timing properties. In this nary/Keynote speakers at any confer- tematically generate and select test cases. paper, we present a framework for testing ence they have attended. The completeness of the test can be deter- the generic temporal relations of media A short listed comment from the re- mined exploiting the link coverage of the objects in distributed multimedia software spondents are directly quoted below: state transition diagram of the FSA that systems (DMSS). The temporal relations n The organizers did a wonderful job. models both the desired and undesired are based on Allen ‘s basic binary tempo- The best conferences I have at- behavior of the system under test; this en- ral relations between two objects and ex- tended in the past 5 years are ables a precise scalability of the test and tended to cover multiple number of ISSRE2001 and ISSRE 2000. analysis process, leading to a better objects in different streams. We have de- n Technical staff did a wonderful job cost-effectiveness The elements of the veloped techniques for test case genera- arranging the presentation equip- approach will be narrated by realistic ex- tion and test result analysis based on a ment. The conference was smooth amples which will be used also to validate distributed tester architecture. A prototype and comfortable throughout the the approach. system has been built to test a DEC HPAS week. Chang, S-J. and P.T.Z. Kapauan, multimedia presentation system which is a n I really got what I need to know. “Modeling and Analysis of Using Mem- typical multimedia system supporting n I wanted to learn about the topic ory Management Unit to Improve Soft- W3C ‘s SMIL standard Detailed discus- from the software side and found the ware Reliability” sion on practical issues and illustration conference very interesting. Voice and data convergence, voice over with a number of actual tests are given. n Unexpected to get a good overview packets and 3G Wireless demand rapid Experimental results have shown that our of our current “state of the art”. My evolvability for switching systems to suc- framework is effective in detecting timing expectations were met. ceed in the global marketplace. To succeed, errors. The techniques and methodology n Best set of plenary / keynote speak- a switching platform ‘s software architec- are general and can be applied to other ers at any conference I have attended ture must be able to quickly absorb new DAISS with only minor modification. over 20 years. technologies and respond to new market Goseva-Popstojanova K, A.P. Mathur, n Hotel was great, especially for the needs. This presents a new challenge to and K.S. Trivedi, “Comparison of Archi- price. The service is as good as I switching software architects because a tecture-Based Software Reliability have ever seen. switching platform must also be able to Models” n Session chairs did a good job in time meet very stringent reliability require- Many architecture-based software re- control. ments. One such requirement is no more liability models have been proposed in

I IIIIIIIIIIIIIIIIIIIIIIIIIIIII the past without any attempt to establish a based on the actual field data indicates the Testing Graphical User lnterfaces relationship among them. The aim of this methodology worked well for our appli- (GUls) is difficult, involving many states, paper is to fill this gap. First, the unifying cation. inputs and events. We have previously re- structural properties of the models are ex- Jin, H, and P. Santhanam, “An Ap- ported a new method for testing GUls that hibited and the theoretical relationship is proach to Higher Reliability Using Soft- is scalable and concentrates on user se- established. Then, the estimates provided ware Components” quences of GUl objects and selections by the models are compared using an em- The general belief that component re- that collaborate, called complete interac- pirical case study. The program chosen use improves software reliability is based tion sequences (CIS) and that produce the for the case study consists of almost on the assumption that the prior usage has desired response for the user called the 10,000 lines of C code divided into sev- exposed the potential software faults. In responsibility. In this paper we will ex- eral components. The faulty version of reality, this is not necessarily true due to tend this approach by investigating the the program was obtained by reinserting the inherent differences in the environ- use of memory tools to detect missing ef- the faults discovered during integration ments and usage of the component. To fects and CIS sequences, investigating in- testing and operational usage and the cor- achieve a high reliability for a compo- teractions between CIS sequences, and rect version was used as an oracle. A set of test cases was generated randomly ac- nent-based software system, we need re- providing empirical studies of five differ- cordingly to the known operational pro- liable components that interoperate ent GUI systems. file. The results show that 1) all models properly in the new environment. In this Bassin, K., S. Biyani and P. give reasonably accurate estimations paper, we present a unified approach to Santhanam, “Evaluating the Software compared to the actual reliability and do an evaluation of the interoperability of TestStrategy for 2000 Sydney Olympics” 2)faults present in the components influ- components. This involves a generic and systematic capture of the component be- The 2000 summer Olympic Games ence both components reliabilities and event was a major information technol- the way components interact. havior that expresses the various assump- tions made by the designers about ogy challenge. With a fixed deadline for Jeske, D.R., X. Zhang, and L. Pham, completion, its inevitable dependency on “Accounting for Realities when Esti- components and their interconnections software systems and immense scope, the mating the Field Failure Rate of Soft- explicitly. With the information captured testing and verification effort was critical ware” at a semantic level, this approach can de- to its success. One way in which success In this paper, we developed a method- tect potential mismatches between was assured was the use of innovative ology to predict the failure rate of soft- components in the new environment and ware in a field environment. The give guidance on how to resolve the mis- techniques using ODC based analysis to methodology accounts for some practical matches to fit components in the new evaluate planned a~zd executed test ac- limitations associated with software fail- context. The capture of this information tivities. These techniques were used to ure rate models including, 1) the likely in an appropriate format and an auto- verify that the plan was comprehensive, mismatch between test and field environ- mated analysis can show serious expo- yet efficient, and ensured that progress ments, 2) non-instantaneous fault re- sures to reliability in a component-based could be accurately’ measured. This pa- moval times, and 3) the effect of deferring system, before it is integrated. per describes some of these techniques bug fixes to future releases. A recent pro- White, L., H. Almezan, and N. and provides examples of the benefits de- ject illustrates the implementation of the Alzeidi, “User-Based Testing of GUI Se- rived. We also discuss the applicability of prediction methodology, and an analysis quences and Their Interactions” the techniques to other software projects.

2001 Annual Statistics of the IEEE are Now Available Online! – URL Correction The URL for the Annual Statistics of the IEEE was in- Access to the Annual Statistics of the IEEE is password correctly stated in the March 2002 issue of Chapter Briefs. protected. You can access the data using the same web ac- You can find the report at the correct address: count used to access papers and articles on IEEE Xplore?. If http://www.ieee.org/secrpt. This report includes a break- you do not already have a web account, you can register for down of Membership by Society and Grade, Region, Section one at: http://www.ieee.org/web/accounts/ and Chapter. A particularly useful tool for Chapter develop- For more information regarding Chapter Development ment efforts can be found in Section C, Table 3. This table Opportunities, please contact April Nakamura at +1 732 562 provides counts of Members for each Society in each Sec- 3846, e-mail: [email protected]. tion. This may be useful if you are looking to increase your Chapter’s membership by becoming a joint Chapter.

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IEEE P1616 WORKING GROUP More Than 130 Manufacturers, Elec- http://memcentral.standards. - CALL FOR VOLUNTEERS tion Officials and Others Aim to Make ieee.org/sa/member/sanews/archives/ Motor Vehicle Event Data Recorders VotingMore Reliable, Secure and Acces- news15-Mar-02.html#appointments (MVEDRs) sible. For more information, go to: Options for Standards Support of Our The IEEE P1616 standard will pro- http://memcentral.standards. Volunteer Working Groups http:// vide a minimum data subset that will al- ieee.org/sa/member/sanews/archives/ memcentral.standards.ieee.org/sa/ low uniformity and enhance the value of news15-Mar-02.html#voting member/sanews/archives/ crash data extensibility to provide for NEWS news15-Mar-02.html#support growth and product differentiation that Highlights of the IEEE Board of Direc- will be openly shared with the public, in- IEEE-SA UNVEILS NEW tors Meeting http://memcentral.standards. dustry and government. For more on this CORPORATE AND ieee.org/sa/member/sanews/archives/ story, go to http://memcentral.standards. INTERNATIONAL AWARDS news15-Mar-02. html#bod ieee.org/sa/member/sanews/archives/ IEEE-SA Awards and Recognition news15-Mar-02.html#1616 Committee (ArCom) is now seeking Awards Report http://memcentral. nominations for these prestigious standards.ieee.org/sa/member/sanews/ IEEE P830 WORKING GROUP - awards. The nomination deadline is 15 archives/news15-Mar-02.html#awards CALL FOR PARTICIPANTS May 2002. For a description of the Geographic Portal Rollout AND REVIEWERS awards and eligibility guidelines, go to: http://memcentral.standards.ieee.org/ Software Requirements Specifica- http://memcentral.standards. sa/member/sanews/archives/ tions ieee.org/sa/member/sanews/archives/ news15-Mar-02.html# The revision process is beginning for news15-Mar-02.html#awards geoport this standard. For the general goals and contact information, go to: http:// IEEE INTELLIGENT Federal Trade Commission Hearing memcentral.standards.ieee.org/sa/ TRANSPORTATION SYSTEMS http://memcentral.standards. member/sanews/archives/news15- DATA REGISTRY (ITS-DR) ieee.org/sa/member/sanews/archives/ Mar-02.html#830 SUBSCRIPTION FEE WAIVED news15-Mar-02.html#ftc FOR 2002 Joint Meeting with IEEE-SA Corporate IEEE COMPUTER SOCIETY This was made possible through fund- Members http://memcentral.standards. FORMS THE INFORMATION ing from the US Department of Transpor- ieee.org/sa/member/sanews/archives/ ASSURANCE STUDY GROUP tation Federal Highway Administration news15-Mar-02.html#corp CALL FOR VOLUNTEERS (US DOT FHWA).The ITS-DR is specif- Motions http://memcentral.standards. Employment of Common Criteria Pro- ically designed for the ITS Standards De- ieee.org/sa/member/sanews/archives/ tection Profiles is being considered for Key veloper, System Integrator, Application news15-Mar-02.html#motions Technology Areas including Operating Developer, Data Dictionary Developer, Systems; Storage Systems; Database Sys- Procuring Agency and others. It serves as INTERPRETATION REQUESTS tems; Firewalls; Biometrics; Smart Cards; an entry point into a comprehensive col- RESPONDED TO ON THE WEB Intrusion Detection Systems; Public Key lection of information devoted to the sup- Infrastructure; Virtual Private Networks; port of clear-cut interchange and reuse of - IEEE Standards Interpretation for Routers and Gateways; Web Browsers; data and data concepts among the various IEEE Std 802.3®, 2000 Edition, IEEE Telecommunications Switching Devices; functional areas of intelligent transporta- Standard for Carrier Sense Multiple Access and Applications. For more information, tion systems. For more information, go with Collision Detection (CSMA/CD) Ac- go to: http://memcentral.standards. to: http://memcentral.standards.ieee.org cess Method and Physical Layer Specifica- ieee.org/sa/member/sanews/archives/ /sa/member/sanews/archives/ tions For more on this story, go to news15-Mar-02.html#study news15-Mar-02.html#its http://standards.ieee.org/reading/ ieee/interp/802.3-2000/index.html UPDATE IEEE-SA BOARD OF IEEE Standards Interpretations for ENGINEERS AND GOVERNORS MEETING 24-26 IEEE Std 980-1994 IEEE Guide for Con- ELECTIONEERS JOIN IEEE FEBRUARY 2002 tainment and Control of Oil Spills in Sub- EFFORT TO CREATE NEW Piscataway, NJ, US stations. For more on this story, go to STANDARDS FOR VOTING 2002 Committee Appointments Made http://standards.ieee.org/reading/ EQUIPMENT by President Ben Johnson ieee/interp/980-1994.html

I I I IIIIIIIIIIIIIIIIIIIIIIIIIIIII Educational Activities Update

Harvard Business School IEEE EAB Teacher In velop and implement a pre-college Publishing Partners with Service Program Training teacher-training program. Included are IEEE Workshop online for suggestions on how to identify and reach Harvard Business School Publishing Engineers Week school officials; include the sessions as (HBSP) has joined the growing list of pre- part of a teacher’s professional develop- IEEE Section training for the IEEE Ed- miere university partners of IEEE. HBSP ment; and make sure that project ideas ucational Activities Board (EAB) Teacher provides selected online courses at a 10% conform to state (US) or national In-Service Program is now available on- discount for IEEE members. Currently (non-US) standards. line at www.ieee.org/eab/precollege/tispt/ thirteen courses in leadership, manage- index.htm. The program features engineers The presentations feature hands-on ment, and strategy are being offered to designing and presenting technologically activities that will allow teachers to take IEEE members along with one powerful oriented subject matter to the Sections’ lo- the activities and concepts back to the performance resource called Harvard cal teachers. Sections can have enormous classroom and teach it with assurance. ManageMentor [registered trademark]. impact in their hometowns by providing At present there are a list of topics and HBSP courses utilize Harvard Business engineering projects for teachers to use. two flyers that the Florida West Coast Review articles, interactive case studies One high school teacher, for instance, over Section used to entice teachers to the and expert feedback from instructors. Each the course of a year can influence over 125 In-Service Workshop posted at the course is self-contained with all the re- students. Fourteen Sections, from Regions sources you need provided for you online. website. As each Section reports on 1-8, have already been trained using these In one to two hours at your desktop, you their teacher workshops, the new topics Workshop materials. can acquire both new and classic business will be posted. The topics and flyers can concepts to apply immediately to your job. The site documentation is based on serve as examples for further discussion To assure your discount, enter through two in-person Workshops conducted in by the Section volunteers. the IEEE Educational Activities Board at 2001 by Douglas Gorham, EAB Pre-Col- Over 160 teachers in Florida have at- www.ieee.org/eab/verify/hbsp/verify.htm. lege Education Manager. Volunteers tended the sessions designed by the You must pre-register in order to access the trained at the Workshops are called Florida West Coast and Miami Sections. course list and see the demonstrations of “champions” of the program. They take Their response has been enthusiastic and the lead in implementing the Teachers’ each course. The pre-registration in no way gratifying, with feedback comments Workshops in their Section. Diane Col- obligates you to buy a course. ranging from “We need to do more of lier, an In-Service “champion” from the For more information about the Part- these programs” to “Now we know where Fort Worth, Texas (USA) Section who at- ners Program, see www.ieee.org/eab/ the resources are IEEE!” eduPartners.htm, or contact Jason Prue, tended one of the in-person sessions, For further information contact Douglas IEEE Educational Activities, at commented about the new site, “I have a [email protected]. contact at the Galveston, Texas Section Gorham, at [email protected]. Lynn Murison that is interested in the program. This Lynn Murison Outreach Administrator, IEEE Edu- will be excellent for explaining getting Outreach Administrator, cational Activities started to him.” IEEE Educational Activities ph: 1.732.562.6526 The online workshop is complete with ph: 1.732.562.6526 www.ieee.org/organizations/eab/ step-by-step instructions on how to de- www.ieee.org/organizations/eab/

I IIIIIIIIIIIIIIIIIIIIIIIIIIIII Meeting Notices

Dear Colleague: This advance e-mail of our first Call for mittee of the 2002 IRW cordially invites My name is Rolf Vollertsen,Commu- Papers is intended to give you the oppor- you to submit an abstract describing nications Chair of the IEEE 2002 Inte- tunity to start preparing an abstract your latest reliability related work. grated Reliability Workshop (IRW). while there is still some time. The com-

1st CALL FOR PAPERS IEEE 2002 International INTEGRATED RELIABILITY WORKSHOP October 21-24, 2002 Preferably, please e-mail your maxi- A few words about our Workshop http://www.irps.org/irw/ mum two-page abstract (incl. figures) or environment: Stanford Sierra Camp, Lake airmail (express mail preferred) it with 15 From the moment you arrive at the Tahoe, CA copies to either the Technical Program south shore of Fallen Leaf Lake, you real- Submission Deadline: July 5th, 2002 Chair or the Vice Technical Program ize that you are taking part in something Chair. If you send the proposal by e-mail, special. The IEEE Integrated Reliability The Integrated Reliability Workshop please send it as a MS Word document or Workshop (IRW) is quite a bit different focuses on ensuring semiconductor reli- .pdf file. Your proposal must include the from a typical technical conference. At- ability through component fabrication, de- name, affiliation, complete return ad- tendees stay in cabins without TVs or sign, characterization, and analysis tools. dress, telephone and telefax numbers, phones, dress is casual (suits, ties and It provides a unique environment for envi- and e-mail address for each author. Tele- high heels are shunned), affiliations are sioning, developing, and sharing reliabil- fax submissions will NOT be accepted. downplayed, and meals are served at the ity technology for present and future All submissions will be acknowledged lodge dining room, family-style. Atten- semiconductor applications. Hot reliabil- within three weeks. If you do not receive dees of the workshop are expected to ac- ity topics of the workshop are: Cu inter- acknowledgment of your submission, tively participate and you feel yourself connects, reliability of deep sub-micron, please contact the Technical Program drawn into technical discussions from the high speed, high frequency devices, new Chair. Visual aids for the ACCEPTED start. This peaceful setting, free from the dielectric systems, and reliability model- proposals are required by September 17, distractions and annoyances of modern ing & simulation. We invite you to submit 2002 for inclusion in the Presentation life, presents a terrific opportunity to re- a presentation proposal that addresses one Handout available at the workshop. A ally get to know your colleagues, includ- or more of the following topics: written version of your presentation is ing internationally renown experts, an due at the workshop for inclusion in the n WAFER LEVEL RELIABILITY opportunity not usually available at big- TESTS AND TEST APPROACHES Final Report. ger, more hectic reliability conferences. n IDENTIFICATION OF RELI- Mail to: Gennadi Bersuker Every aspect of this conference, from the ABILITY EFFECTS IRW 2002 Technical Program Chair isolated location to the format of the tech- n NEW OR EXISTING RELIABIL- nternational SEMATECH nical program to the Wednesday after- ITY CHARACTERIZATION AND 706 Montopolis Dr. noon off, is designed to get attendees to PREDICTION MODELS TO SHOW Austin, TX 78741-6499 interact and network. n RELIABILITY TEST STRUC- USA ADDITIONAL INFORMATION: TURES (512) 356-7045 More information including links and n CUSTOMER PRODUCT RELI- (512) 356-7640 (FAX) a complete downloadable version ABILITY REQUIREMENTS / [email protected] (.pdf) of the Call for Papers is available MANUFACTURER RELIABIL- .... or... on the IRW WebSite at www.irps.org/irw. ITY TASKS Alvin Strong We look forward to receiving your ab- n DESIGNING-IN RELIABILITY IRW 2002 Technical Program Vice stract and to meeting you in Tahoe! (CIRCUITS, PROCESSES, PROD- Chair Kind regards, UCTS) International Business Machines MD Rolf-P. Vollertsen Your submission should state clearly 1000 River Street (ZIP 967A) IRW 2002 Communication Chair and concisely the results of your work Essex Junction, VT 05452 Infineon Technologies NA Corp. and why they are significant. Representa- USA 1000 River Street (967A) tive data and/or figures that support your (802) 769-1326 Essex Junction, VT 05452 proposal are REQUIRED. You can sub- (802) 769-1220 Phone: +1 802 769 2823 mit your work as a paper or a poster. [email protected] Fax: +1 802 769 4304

I IIIIIIIIIIIIIIIIIIIIIIIIIIIII Preliminary Notice DSD’2002 EUROMICRO SYMPOSIUM ON DIGITAL SYSTEM DESIGN: Architecture, Methods, and Tools http://www.co.umist.ac.uk/ dsd2002 Dortmund, Germany, September 4 - 6, 2002

The Symposium on Digital System processor and memory architectures and n Special architectures and reconfig- Design addresses architectures and im- design, application specific processors, urable computing plementations of (embedded) digital sys- systems-on-a-chip, hardware/software n Specification and modelling tems, as well as efficient design methods co-design, circuit design, system valida- n Validation and tools. It is a discussion forum for the tion, and design automation. n Synthesis n System-on-a-chip research community working on The main areas of interest are: state-of-the-art investigations, develop- n Processor and memory architec- Check the DSD’2002 web site ment, and applications in digital systems, tures http://www.co.umist.ac.uk/dsd2002

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Relex PRISM Reflects Advances in Reliability Analysis

rate estimates using Bayesian analysis, advancement upon a predecessor prod- Greensburg, PA, January 24, 2002 predecessor data, and process grades. For uct, predecessor analysis can factor in the Relex Software Corporation, the world- example, early in the development phase field failure rate experience of the prede- wide leader in reliability analysis software, of a system, reliability estimates are based cessor product to improve the reliability has recently added the PRISM standard to on generic parts lists and default values for prediction for the new product. its powerful arsenal of supported reliability operational profiles and stresses. As test To account for process-related vari- prediction models. Originally developed and field data become available, Bayesian ability, the PRISM standard uses process by the Reliability Analysis Center (RAC) analysis uses this empirical data to modify grades. Answers to a series of questions for predicting Mean Time Between Fail- initial reliability predictions. for each of nine different processes—in- ures (MTBF) and analyzing system reli- ability, the PRISM standard has been “Integrating test and field data into pre- cluding design, part quality, manufactur- completely integrated into the Relex Reli- dictions provides for obtaining failure ing practices, and management ability Software Suite. rates that are more representative of indi- techniques—establish scores that are to- “Any failure information calculated vidual applications,” explained Van Fleet. taled and then translated into a quantita- by Relex PRISM is immediately avail- “Because specific variables that impact re- tive pi factor multiplier that impacts the able for use in other Relex modules,” said liability cannot be included and accounted predicted failure rate. “Because the fail- Kevin Van Fleet, Vice President of Relex for in generic models, Bayesian analysis ure rate a product experiences in the field Software Corporation. “Relex’s common incorporates empirical data to strengthen can depend upon the processes used by database ensures that Relex RBD, Relex the prediction foundation.” manufacturers, process grades adjust Fault Tree, Relex FMEA, and all other Similarly, predecessor analysis uses failure rate predictions by the pi factor Relex modules and reliability standards the reliability prediction of a predecessor multiplier calculated by Relex PRISM to can use the MTBF and reliability predic- product and its observed field failure rate increase accuracy,” said Van Fleet. tion values generated by Relex PRISM.” as the basis for estimating the reliability According to certified reliability engi- According to Van Fleet, Relex PRISM of a “new” product. Because a new prod- neers at Relex Software Corporation, the raises reliability analysis to a new level by uct is much more likely to be a marginal PRISM standard adopts a broader scope to providing for adjustments to base failure improvement rather than a revolutionary predicting reliability by accounting for the

I primary factors that influence the inability Reliability Handbook. NPRD allows for products are used by thousands of engi- of a system to perform its intended func- the selection of a single line item from me- neers in a variety of businesses around the tions. “When our engineers were imple- chanical and electro-mechanical parts globe. In business since 1986, Relex Soft- menting the PRISM standard within Relex, such as actuators, bearings, brakes, ware Corporation asserts that its mission is they quickly realized that Bayesian analy- clutches, gears, pumps, seals, springs, and to produce a superior line of high-quality sis, predecessor data, and process grades valves. EPRD, on the other hand, provides software tools for reliability analysis. could be and should be extended to all of for the selection of multiple line items Long-recognized for their user-friendly, the reliability standards that we support,” from electronic parts such as capacitors, state-of-the-art features, the modular tools said Van Fleet. “So now, when Relex diodes, integrated circuits, inductors, re- in the Relex Reliability Software Suite in- PRISM is licensed, all of its analytical tech- sistors, thyristors, transformers, and tran- clude an intuitive graphical user interface, niques for adjusting and optimizing base sistors. In addition to offering three support for scientific graphical charts, an failure rates can be used by Relex with any subtype levels for selecting an EPRD part, enhanced CAD interface, visual system other supported reliability standard, includ- Relex PRISM enables the entry of criteria modeling with redundancy support, com- ing MIL-HDBK-217 and Telcordia.” for part quality, environment, and pletely customizable output reports, exten- An additional incentive for licensing hermeticity (where applicable), and then sive parts libraries, and a comprehensive Relex PRISM is the ability to select parts automatically calculates the required online help system. For more information for analysis from the latest Nonelectronic merged failure rate. Having access to both on Relex Software Corporation, an Parts Reliability Data (NPRD) and Elec- NPRD and EPRD parts not only makes re- IS0-9001 and TickIt 2000 certified com- tronic Parts Reliability Data (EPRD) pub- liability analysis easier and faster but also pany, call 724.836.8800 or visit lished by RAC. Base failure rates for ensures that results are more accurate. www.relexsoftware.com. NPRD and EPRD parts can be used in reli- ability predictions whenever a reliability About Relex Software calculation model for a specific part type Corporation is not found in MIL-HDBK-217, Relex Software Corporation is a world Telcordia (Bellcore), or the Mechanical leader in reliability analysis software. Its

Dear Dr Samuel Keene, I read your article with great interest. management. My personal observations and the Manufacturing is at another coun- I came across implementation of Six (having worked in a design environment try (like in China) where Six Sigma is not Sigma with the following steps: Define, for some time) is that if the next in line understood or followed. Every thing that Measure, Analyse, Improve, Control. But don’t “believe” in Six Sigma, it is very is Six Sigma driven at the Development in a design environment where it is not difficult to push Six Sigma. In my discus- Center in another country will find diffi- easy to get many samples in early phase, I sion with speaker of Six Sigma, I learnt culty in see results. What is your view on learnt that that is other implementation that there is a certain strategy of ap- this observation? steps —- namely, IDOV ==> which proach, namely: (in order of merit) Best Regards, stands for: Identify, Design, Optimise 1. Manufacturing, Assembly, Supplier, LAM WENG KEEN and Validate. Packaging, etc. BCT Mainstream TV Development Is it possible to compare the differ- 2. Process, Engineering, etc. Know-how & Standard Design ences in approach and share your views in 3. Sales, Marketing, etc. (Special Project/Robust Design) the next issue of IEEE Reliability Society 4. Customer Philips Electronics Singapore Pte Ltd Newsletter? 5. Development Tel: (65) 3502730 It is also noted that to implement Six I see some truth in this strategy. If we 620A Lorong 1 Toa Payoh Sigma, we need to involvement of top start pushing Six Sigma at Development, Singapore 319762, Fax: (65) 2580892

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I Technical Magazine Section Device Design Methodology and Reliability Strategy for Deep Sub-micron Technology

William R. Tonti IBM Microelectronics, Essex Junction Vt.

Abstract sions. The first session describes MOSFET time zero design, This tutorial will discuss device and process optimization and the effect of hot carriers on this decision. PMOS-buried and techniques that may be employed in the design of present state of surface channel designs are contrasted; and a self-consistent the art bulk silicon technology. MOSFET performance and reli- substrate hot carrier design is described for NMOS transistors. ability issues are contrasted. Session II investigates the effect of shallow trench isolation on Many issues influence a MOSFET’s in-line process and field device reliability. Session III describes wafer burn-in screens; reliability. Ensuring a stable IC design is a great challenge and and session IV describes module-level burn-in. has many concerns associated with the scaling of lithographic William R. Tonti feature size. Some of the topics discussed below are investigated William R. Tonti received the B.S.E.E. with honor (1978) using present DRAM technology. Including process tolerances from Northeastern University. He then joined IBM in Essex and lifetime shifts during the design of a DRAM transfer device Junction, Vermont, where he presently is engaged in the devel- greatly influences MOSFET performance and reliability operat- opment of PowerPC microprocessor reliability strategies. Previ- ing point. Given an appropriate relationship for each occurrence, ously Dr. Tonti was a program manager in the wired a statistical design methodology ensures product stability. The communication space, and has also contributed to the Giga-bit device off-current ( Iso ) and on-current ( Ion ) trade-offs are the vertical cell DRAM technology development. He received an primary design goals of a given technology. Simple scaling (i.e. M.S.E.E. (1982) from the University of Vermont, an M.B.A. Ion ∝µ [C’ox/L]V, Iso ∝ µAe-VT /B) indicates both channel (1983) from St. Michael’s College, and a Ph.D. in Electrical En- length and/or gate oxide thickness may be used to improve gineering (1988) from the University of Vermont under the aus- on-current. Assuming this ratio of C’ox /L is increased and all pices of the IBM resident study program. Dr. Tonti is the 2002 other MOSFET design parameters remain constant, then VT International Reliability Physics Symposium General Chair- would decrease and lso would increase undesirably. Adding ad- man, and was the 2000 Integrated Reliability Workshop General ditional well/channel doping could be used to correct the design, Chairman. He has authored numerous contributed and invited but this may lead to an increased base VT tolerance, papers, and holds over 65 U.S. patents. Dr. Tonti is a member of source-to-substrate sensitivity, and substrate hot-carrier prob- tau beta pi, eta kappa nu, a senior member of IEEE, an advisory lems if not implemented in a manner that minimizes these ad- board member of the IEEE Transactions on Device and Material verse effects. There is an optimum doping profile, which Reliability, a recipient of the IEEE 3’rd millennium medal, and satisfies the above conditions. an ABET engineering curriculum evaluator. Dr. Tonti is a cur- Today’s state-of-the-art isolation technology is box-shaped rently a member of the Reliability Society ADCOM., and serves and commonly implemented as a trench filled with SiO2. This as their VP of Technical Operations. isolation tends to have a parasitic parallel device gated at the iso- lation edges. In some cases, Iso may be constrained by device (c) Copyright International Business Machines Corporation 1995, 2001 All edge count rather than total device width. Edge degradation Rights Reserved therefore becomes a mechanism to characterize in this isolation Printed in the United States of America 08-2001 technology. Wafer level and module level burn-in test methodol- All information contained in this document is subject to change without no- tice. The information contained in this document does not affect or change IBM ogies are important early-life screens used to disposition prod- product specifications or warranties. Nothing in this document shall operate as uct and improve overall yield by replacing circuit reliability an express or implied license or indemnity under the intellectual property rights failures with known good spare elements. Wafer burn-in stresses of IBM or third parties. All information contained in this document was obtained a chip for a short period of time, usually accessing and applying in specific environments, and is presented as an illustration. The results obtained in other operating environments may vary. accelerated test conditions to critical areas that cannot be highly THE INFORMATION CONTAINED IN THIS DOCUMENT IS PRO- accelerated at the module level. Test coverage at wafer burn-in is VIDED ON AN “AS IS” BASIS. In no event will IBM be liable for damages aris- 100%, and redundancy algorithms can be maximized prior to ing directly or indirectly from any use of the information contained in this module burn-in. Module burn-in can take on many forms: static, document. IBM Microelectronics Division dynamic, in-situ, or combinations of the above to achieve field 1580 Route 52, Bldg. 504 reliability-objectives. This course is organized into four ses- Hopewell Junction, NY 12533-6351

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