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Reflectometry
1. Introduction & Theory
Implementation of Optical Interferometry and Spectral Reflectometry for High Fidelity Thin Film Measurements
Introduction to Neutron Reflectometry
Erratum to ''Spectroscopic Ellipsometry and Reflectometry from Gratings
Reflectometry Involves Measurement of the Intensity of a Beam of Electromagnetic Radiation Or Particle Waves Reflected by a Planar Surface Or by Planar Interfaces
Neutron Reflectometry
Beam Profile Reflectometry: a New Technique for Thin Film Measurements
Application of Spectroscopic Ellipsometry and Mueller Ellipsometry to Optical Characterization E
NEUTRON REFLECTOMETRY: a PROBE for MATERIALS SURFACES the Following States Are Members of the International Atomic Energy Agency
Bidirectional Reflectometry. Part II. Bibliography on Scattering by Reflection from Surfaces
Neutron Reflectometry Combined with Complementary Techniques to Solve Complex Soft Matter Problems at the Air/Water Interface
An Introduction to Neutron Reflectometry
Neutron Reflectometry
Nanolayer Analysis by Neutron Reflectometry, In: Imae, T
Reflectometry Involves Measurement of the Intensity of a Beam Of
Semiconductor Microelectronics and Nanoelectronics Programs Iii Low Concentration Humidity Standards
Determination of Refractive Index, Thickness, and the Optical Losses of Thin Films from Prism-Film Coupling Measurements Julien Cardin, Dominique Leduc
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