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Bruker AFM Training Notebook

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Bruker AFM Training Notebook SPM Training Notebook 004-130-000 (standard) 004-130-100 (cleanroom) Copyright © 2003 Bruker All rights reserved. Document Revision History: SPM Training Notebook Revision Date Section(s) Affected Reference Approval Rev. E 10/27/2003 Content and Format Update N/A C. Kowalski Rev. D 08/05/2003 Overall Content and Format Update N/A L. Burrows Rev. C 07/30/2003 Content Update N/A L. Burrows Rev. B 08/01/1998 Format Update N/A C. Fitzgerald Rev. A 05/09/1997 Initial Release N/A J. Thornton Notices: The information in this document is subject to change without notice. NOWARRANTY OF ANY KIND IS MADE WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. No liability is assumed for errors contained herein or for incidental or consequential damages in connection with the furnishing, performance, or use of this material. This document contains proprietary information which is protected by copyright. No part of this document may be photocopied, reproduced, or translated into another language without prior written consent. Copyright: Copyright © 2003 Bruker. All rights reserved. Trademark Acknowledgments: The following are registered trademarks of Bruker Instruments Inc. All other trademarks are the property of their respective owners. Product Names: NanoScope® MultiMode™ Dimension™ BioScope™ Atomic Force Prof ler™ (AFP™) Dektak® Software Modes: TappingMode™ Tapping™ TappingMode+™ LiftMode™ AutoTune™ TurboScan™ Fast HSG™ PhaseImaging™ DekMap 2™ HyperScan™ StepFinder™ SoftScan™ Hardware Designs: TrakScan™ StiffStage™ Hardware Options: TipX® Signal Access Module™ and SAM™ Extender™ TipView™ Interleave™ LookAhead™ Quadrex™ Software Options: NanoScript™ Navigator™ FeatureFind™ Miscellaneous: NanoProbe® Table of Contents 1.0 History and Definitions in SPMs . 3 1.1 History . 3 1.2 Definitions . 3 1.3 Other forms of SPM: . 4 2.0 Scanning Tunneling Microscope . 5 2.1 Applications . 7 3.0 Contact Mode AFM . 8 4.0 TappingMode AFM . 10 5.0 Non-contact Mode AFM . 11 6.0 Advantages and Disadvantages of Contact Mode AFM, TappingMode AFM, and Non-contact Mode AFM . 12 6.1 Contact Mode AFM . 12 6.2 TappingMode AFM . 12 6.3 Non-contact Mode AFM . 13 7.0 Piezoelectric Scanners: How They Work. 14 8.0 Piezoelectric Scanners: Hysteresis and Aging . 16 8.1 Hysteresis . 16 8.2 Aging . 18 9.0 Piezoelectric Scanners: Creep and Bow. 19 9.1 Creep . 19 9.2 Bow . 20 10.0 Probes. 21 10.1 Silicon Nitride . 21 10.2 Silicon. 22 11.0 Types of SPM Probes . 23 11.1 Contact Mode Probes . 23 11.2 TappingMode Probes . 23 11.3 Probes for Other SPM Techniques . 23 12.0 Atomic Force Microscopy- Beam Deflection Detection . 25 Rev. E SPM Training Notebook 1 13.0 SPM Configurations . 26 14.0 Abbreviated Instructions for Dimension Series AFMs . 29 14.1 Mode of Operation . 29 14.2 Align the Laser . 29 14.3 Adjust the Photodetector. 29 14.4 Locate Tip. 29 14.5 Focus Surface . 30 14.6 Cantilever Tune (TappingMode Only) . 30 14.7 Set Initial Scan Parameters. 30 14.8 Engage . 30 14.9 Adjust Scan Parameters . 31 14.10 Set Desired Scan Size, Scan Angle, and Offsets . 31 15.0 Abbreviated Instructions for the MultiMode AFM . 32 15.1 Mode of Operation . 32 15.2 Mount Probe . 32 15.3 Select Scanner . 32 15.4 Mount Sample . 32 15.5 Place Optical Head on Scanner . 32 15.6 Align Laser and Tip-Sample Approach (2 Methods) . 33 15.7 Adjust Photodiode Signal . 34 15.8 Cantilever Tune (TappingMode Only) . 34 15.9 Set Initial Scan Parameters. 34 15.10 Engage . 34 15.11 Adjust Scan Parameters . 35 15.12 Set Desired Scan Size, Scan Angle, and Offsets . 35 16.0 Realtime Operation . 36 16.1 Setpoint. 36 16.2 Integral Gain. 37 16.3 Scan Rate . 38 16.4 Other Important Parameters . 39 17.0 Force Curves . 42 18.0 Offline Operation . 44 18.1 File Handling . 44 18.2 Image Analysis . 44 18.3 Filters . 47 19.0 Tip Shape Issues . 53 19.1 Resolution Issues . 56 20.0 Typical Image Artifacts . 58 21.0 Calibration. 62 2 SPM Training Notebook Rev. E SPM Training Notebook This Notebook is intended to be used as an introduction by the f rst-time user of Bruker NanoScope Scanning Probe Microscopes (SPM). For further information, please consult the Command Reference Manual and/or the appropriate NanoScope manual. Specif cally, this manual covers the following: • History and Def nitions in SPMs: Page 3 • Scanning Tunneling Microscope: Page 5 • Contact Mode AFM: Page 8 • TappingMode AFM: Page 10 • Non-contact Mode AFM: Page 11 • Advantages and Disadvantages of Contact Mode AFM, TappingMode AFM, and Non-contact Mode AFM: Page 12 • Piezoelectric Scanners: How They Work: Page 14 • Piezoelectric Scanners: Hysteresis and Aging: Page 16 • Piezoelectric Scanners: Creep and Bow: Page 19 • Probes: Page 21 • Types of SPM Probes: Page 23 • Atomic Force Microscopy- “Beam Def ection” Detection: Page 25 • SPM Conf gurations: Page 26 • Abbreviated Instructions for Dimension Series AFMs: Page 29 • Abbreviated Instructions for the MultiMode AFM: Page 32 • Realtime Operation: Page 36 • Force Curves: Page 42 Rev. E Scanning Probe Microscope Training Notebook 1 • Off ine Operation: Page 44 • Tip Shape Issues: Page 53 • Typical Image Artifacts: Page 58 • Calibration: Page 62 2 Scanning Probe Microscope Training Notebook Rev. E History and Definitions in SPMs 1.0 History and Definitions in SPMs 1.1 History Scanning Tunneling Microscope (STM) •Developed in 1982 by Binning, Rohrer, Gerber, and Weibel at IBM in Zurich,.
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