Role of the Normal Polarization in the Far-Field Subwavelength Imaging by a Dielectric Microsphere Or Microcylinder

Total Page:16

File Type:pdf, Size:1020Kb

Role of the Normal Polarization in the Far-Field Subwavelength Imaging by a Dielectric Microsphere Or Microcylinder Role of the normal polarization in the far-field subwavelength imaging by a dielectric microsphere or microcylinder R. Heydarian1, C. R. Simovski1;2 1 Department of Electronics and Nano-Engineering, Aalto University, P.O. Box 15500, FI-00076 Aalto, Finland 2 Faculty of Physics and Engineering, ITMO University, 199034, Birzhevaya line 16, Saint-Petersbug, Russia E-mail: [email protected] January 2020 Abstract. Role of the normal polarization in the far-field subwavelength imaging granted by a dielectric microsphere or microcylinder is discussed and the hypotheses explaining this experimental fact are suggested. One of these hypotheses is confirmed by exact numerical simulations. This mechanism of the magnifying superlens operation is based on the excitation of creeping waves at a curved dielectric interface by a normally polarized dipole. The set of creeping waves after their ejection from the surface creates an imaging beam which may mimic either a Bessel beam or a Mathieu beam depending on the microparticle radius. This mechanism corresponds to the asymmetric coherent illumination. arXiv:2001.08135v4 [physics.optics] 7 Apr 2020 2 1. Introduction several scienrific groups have explored this field since 2011 (see e.g. in [16, 15, 9, 18, 19]). In Nanoimaging of objects in real time { beyond [15] a direct lateral resolution on the level δ = scanning the substantial areas with strongly λ/6 was complemented by the interferometric submicron tips connected to cantilevers { is resolution δ = λ/10 in the normal direction. a very important branch of nanophotonics. Also, in this work it was shown via simulations A lot of top-level studies has been done in that two dipoles located at the surface of a this field recently and pioneering techniques glass microsphere of the dimensionless radius were developed, such as stimulated emission kR = 60 with the gap δ = λ/6 between them depletion [1], awarded by the Nobel prize can be resolved (in simulations) if and only if in chemistry (2014). However, in spite they are excited with nearly opposite phases. of advantages of this method, there are To have opposite phases is impossible for two applications, especially in the biomedicine, small closely located scatterers illuminated where fluorescent labels in the object area are by a plane wave. Moreover, the dielectric prohibited (see e.g. in [2]). Label-free optical scatterers resolved in [15] with the gap δ = nanoimaging still evokes a keen interest, and λ/6 were illuminated by an incoherent light. so-called superlenses (see e.g. in [4]) are still Further, the resolution δ = λ/15 was achieved a subject of an intensive research. In the using a glass MP for two plasmonic scatterers present work, we concentrate on a technique [16]. The theory of these papers could not which seems to be the most affordable and explain these experimental results. straightforward type of superlens - dielectric However, in order to properly exploit spherical or cylindrical microlens. a novel technique, one obviously needs to In work [3] it was experimentally revealed understand its physics. Initially, the authors that a simple glass microsphere operates as a of [3] assumed that this imaging is related far-field magnifying superlens { a device which with the phenomenon of so-called photonic creates a far-field magnified image of an object nanojet (PNJ) [5]. The PNJ maintains a with its subwavelength details detectable by slightly subwavelength ((0:3 − 0:5)λ) effective a conventional microscope. The imaged area width along a path that extends more than 2λ is rather small (several square microns) and behind the MP . In works [6, 7, 8] it was shown centered by the optical axis of the microscope that the PNJ is a non-resonant phenomenon passing through the microsphere center. Even and results from the constructive interference few square microns is an area much larger of cylindrical or spherical harmonics excited than the object field of a scanning near-field inside the MP by a plane wave. For the optical microscope (SNOM). Therefore, this (relative to the ambient) refractive index of technique promises a much faster imaging of the MP n = 1:4 − 2 a whatever MP radius the whole substrate than the use of SNOM. A from R = λ to R = 20λ corresponds to a direct analogue of the spherical or cylindrical sufficient amount of spatial harmonics which dielectric microparticle (MP) operating in the experience the constructive interference at the superlens regime is a metamaterial hyperlens rear extremity of the MP. The studies also [11, 12, 13, 14]. However, dielectric MPs are have shown that in the near vicinity of the available on the market and are incomparably rear edge point the package of evanescent cheaper than the hyperlenses. Therefore, waves is excited that grants to the waist 3 of the wave beam a high local intensity. PNJ model of a 2D MP superlens does not Authors of [3] assumed: since a plane wave work (it was clearly proved in [17]) why it will excites these evanescent waves in a MP, the work for the 3D superlens? evanescent waves excited by a closely located In works [18, 19] resonant mechanisms subwavelength scatterer should reciprocally of subwavelength imaging by a dielectric convert into propagating waves and form a MP were analyzed. One was related to PNJ. However, further studies (see e.g. in whispering gallery resonances, another { to [16, 15, 9, 10, 18, 19, 17] etc.) have shown that the Mie resonances. In both cases, the a scatterer located near a MP does not produce wave packages responsible for subwavelength a PNJ behind it. Moreover, in work [17] it was hot spots inside the particle experience the noticed that the explanation of the superlens leakage and partial (quite weak) conversion functionality of a dielectric MP via the into propagating waves. Two other resonant evanescent waves [9, 10] is disputable because mechanisms were recently reported in works in presence of evanescent waves the reciprocity [20] and [21]. However, all these resonant principle is not reducible to the inversion of the mechanisms do not explain why a dielectric wave propagation. Really, in both focusing and microsphere operates as a far-field superlens emitting schemes, the evanescent waves decay in a broad frequency range. In work [22] in the same directions { from the rear point a broadband subwavelength resolution in the of the sphere. Therefore, the evanescent waves incoherent light was theoretically obtained for responsible for the subwavelength width of the a glass MP. However it was as modest as PNJ waist in the focusing scheme cannot be δ = λ/4 and demanded the use of an exotic linked to those excited by the imaged object in microscope with a solid immersion lens as an the emitting scheme. To confirm this point in objective. This microscope has the f-number [17] the exact simulations of the point-spread smaller than unity. It obviously implies the function for the structures from [3, 15, 9, 10] reduction of the diffraction-limited image size were done and the subwavelength imaging of a point source compared to the finest size was absent, though the PNJ in the reciprocal granted by a usual microscope δ ≈ 0:5λ case manifested the subwavelength waist. The [26]. This size is the radius of the Airy only difference in these simulations from the circle in the image plane and it is equal to experiments and theoretical speculations in the finest possible resolution of a microscope the cited works was replacement of the 3D [26]. For microscopes with small f-numbers MP (sphere) by the 2D one (cylinder) that the Airy circle radius (and finest resolution) also implies the 2D dipole source (dipole line δ = λ/4 does not require additional imaging parallel to the cylinder axis). One may devices [27]. However, in all experiments believe that the 3D geometry grants specific with microspheres offering the subwavelength mechanisms of superlens operation compared resolution the standard microscopes were used. to the 2D one. However, this belief does not Moreover, the resolution was noticeably finer disable the argument against the explanation than δ = λ/4 predicted in [22] as a limit value. of the MP superlens operation involving the In the present paper, we suggest a PNJ and reciprocity. Moreover, the PNJ is hypothesis that the superlens operation of a formed by a dielectric MP in both 3D and 2D dielectric MP is related to its capacity to geometries with similar efficiency [8]. If the create a diffraction-free wave beam. This 4 property should be common for both 2D and dipoles transmits through the MP as it is 3D geometries. The imaging beam results described in work [17] and represents a weakly from the emission of a dipole source (a small directive wave beam experiencing the Abbe scatterer) which is polarized normally to the diffraction (the angular beam width grows surface of a MP. There are at least two with the distance). mechanisms which result in the formation of For a normally polarized dipole, the the diffraction-free beam by a dielectric MP. situation depicted in Fig. 1(b) is different. The first one is an incoherent mechanism The corresponding image dipole is in phase and corresponds to the creation of a radially with the real one and the two dipole sources polarized Gaussian beam. The second one { real and imaginary can be united into a demands the illumination by a laser light and dipole effectively located at the interface. In the nonzero phase shift between two dipoles this case the imaging beam turns out to be in order to resolve them. This mechanism of almost diffraction-free. Fig. 1(b) illustrates a subwavelength imaging results in either Bessel simplistic model of the imaging beam { that or Mathieu imaging beam.
Recommended publications
  • Phase Retrieval Without Prior Knowledge Via Single-Shot Fraunhofer Diffraction Pattern of Complex Object
    Phase retrieval without prior knowledge via single-shot Fraunhofer diffraction pattern of complex object An-Dong Xiong1 , Xiao-Peng Jin1 , Wen-Kai Yu1 and Qing Zhao1* Fraunhofer diffraction is a well-known phenomenon achieved with most wavelength even without lens. A single-shot intensity measurement of diffraction is generally considered inadequate to reconstruct the original light field, because the lost phase part is indispensable for reverse transformation. Phase retrieval is usually conducted in two means: priori knowledge or multiple different measurements. However, priori knowledge works for certain type of object while multiple measurements are difficult for short wavelength. Here, by introducing non-orthogonal measurement via high density sampling scheme, we demonstrate that one single-shot Fraunhofer diffraction pattern of complex object is sufficient for phase retrieval. Both simulation and experimental results have demonstrated the feasibility of our scheme. Reconstruction of complex object reveals depth information or refraction index; and single-shot measurement can be achieved under most scenario. Their combination will broaden the application field of coherent diffraction imaging. Fraunhofer diffraction, also known as far-field diffraction, problem12-14. These matrix complement methods require 4N- does not necessarily need any extra optical devices except a 4 (N stands for the dimension) generic measurements such as beam source. The diffraction field is the Fourier transform of Gaussian random measurements for complex field15. the original light field. However, for visible light or X-ray Ptychography is another reliable method to achieve image diffraction, the phase part is hardly directly measurable1. with good resolution if the sample can endure scanning16-19. Therefore, phase retrieval from intensity measurement To achieve higher spatial resolution around the size of atom, becomes necessary for reconstructing the original field.
    [Show full text]
  • Fraunhofer Diffraction Effects on Total Power for a Planckian Source
    Volume 106, Number 5, September–October 2001 Journal of Research of the National Institute of Standards and Technology [J. Res. Natl. Inst. Stand. Technol. 106, 775–779 (2001)] Fraunhofer Diffraction Effects on Total Power for a Planckian Source Volume 106 Number 5 September–October 2001 Eric L. Shirley An algorithm for computing diffraction ef- Key words: diffraction; Fraunhofer; fects on total power in the case of Fraun- Planckian; power; radiometry. National Institute of Standards and hofer diffraction by a circular lens or aper- Technology, ture is derived. The result for Fraunhofer diffraction of monochromatic radiation is Gaithersburg, MD 20899-8441 Accepted: August 28, 2001 well known, and this work reports the re- sult for radiation from a Planckian source. [email protected] The result obtained is valid at all temper- atures. Available online: http://www.nist.gov/jres 1. Introduction Fraunhofer diffraction by a circular lens or aperture is tion, because the detector pupil is overfilled. However, a ubiquitous phenomenon in optics in general and ra- diffraction leads to losses in the total power reaching the diometry in particular. Figure 1 illustrates two practical detector. situations in which Fraunhofer diffraction occurs. In the All of the above diffraction losses have been a subject first example, diffraction limits the ability of a lens or of considerable interest, and they have been considered other focusing optic to focus light. According to geo- by Blevin [2], Boivin [3], Steel, De, and Bell [4], and metrical optics, it is possible to focus rays incident on a Shirley [5]. The formula for the relative diffraction loss lens to converge at a focal point.
    [Show full text]
  • Fraunhofer Diffraction with a Laser Source
    Second Year Laboratory Fraunhofer Diffraction with a Laser Source L3 ______________________________________________________________ Health and Safety Instructions. There is no significant risk to this experiment when performed under controlled laboratory conditions. However: • This experiment involves the use of a class 2 diode laser. This has a low power, visible, red beam. Eye damage can occur if the laser beam is shone directly into the eye. Thus, the following safety precautions MUST be taken:- • Never look directly into the beam. The laser key, which is used to switch the laser on and off, preventing any accidents, must be obtained from and returned to the lab technician before and after each lab session. • Do not remove the laser from its mounting on the optical bench and do not attempt to use the laser in any other circumstances, except for the recording of the diffraction patterna. • Be aware that the laser beam may be reflected off items such as jewellery etc ______________________________________________________________ 26-09-08 Department of Physics and Astronomy, University of Sheffield Second Year Laboratory 1. Aims The aim of this experiment is to study the phenomenon of diffraction using monochromatic light from a laser source. The diffraction patterns from single and multiple slits will be measured and compared to the patterns predicted by Fourier methods. Finally, Babinet’s principle will be applied to determine the width of a human hair from the diffraction pattern it produces. 2. Apparatus • Diode Laser – see Laser Safety Guidelines before use, • Photodiode, • Optics Bench, • Traverse, • Box of apertures, • PicoScope Analogue to Digital Converter, • Voltmeter, • Personal Computer. 3. Background (a) General The phenomenon of diffraction occurs when waves pass through an aperture whose width is comparable to their wavelength.
    [Show full text]
  • Huygens Principle; Young Interferometer; Fresnel Diffraction
    Today • Interference – inadequacy of a single intensity measurement to determine the optical field – Michelson interferometer • measuring – distance – index of refraction – Mach-Zehnder interferometer • measuring – wavefront MIT 2.71/2.710 03/30/09 wk8-a- 1 A reminder: phase delay in wave propagation z t t z = 2.875λ phasor due In general, to propagation (path delay) real representation phasor representation MIT 2.71/2.710 03/30/09 wk8-a- 2 Phase delay from a plane wave propagating at angle θ towards a vertical screen path delay increases linearly with x x λ vertical screen (plane of observation) θ z z=fixed (not to scale) Phasor representation: may also be written as: MIT 2.71/2.710 03/30/09 wk8-a- 3 Phase delay from a spherical wave propagating from distance z0 towards a vertical screen x z=z0 path delay increases quadratically with x λ vertical screen (plane of observation) z z=fixed (not to scale) Phasor representation: may also be written as: MIT 2.71/2.710 03/30/09 wk8-a- 4 The significance of phase delays • The intensity of plane and spherical waves, observed on a screen, is very similar so they cannot be reliably discriminated – note that the 1/(x2+y2+z2) intensity variation in the case of the spherical wave is too weak in the paraxial case z>>|x|, |y| so in practice it cannot be measured reliably • In many other cases, the phase of the field carries important information, for example – the “history” of where the field has been through • distance traveled • materials in the path • generally, the “optical path length” is inscribed
    [Show full text]
  • Monte Carlo Ray-Trace Diffraction Based on the Huygens-Fresnel Principle
    Monte Carlo Ray-Trace Diffraction Based On the Huygens-Fresnel Principle J. R. MAHAN,1 N. Q. VINH,2,* V. X. HO,2 N. B. MUNIR1 1Department of Mechanical Engineering, Virginia Tech, Blacksburg, VA 24061, USA 2Department of Physics and Center for Soft Matter and Biological Physics, Virginia Tech, Blacksburg, VA 24061, USA *Corresponding author: [email protected] The goal of this effort is to establish the conditions and limits under which the Huygens-Fresnel principle accurately describes diffraction in the Monte Carlo ray-trace environment. This goal is achieved by systematic intercomparison of dedicated experimental, theoretical, and numerical results. We evaluate the success of the Huygens-Fresnel principle by predicting and carefully measuring the diffraction fringes produced by both single slit and circular apertures. We then compare the results from the analytical and numerical approaches with each other and with dedicated experimental results. We conclude that use of the MCRT method to accurately describe diffraction requires that careful attention be paid to the interplay among the number of aperture points, the number of rays traced per aperture point, and the number of bins on the screen. This conclusion is supported by standard statistical analysis, including the adjusted coefficient of determination, adj, the root-mean-square deviation, RMSD, and the reduced chi-square statistics, . OCIS codes: (050.1940) Diffraction; (260.0260) Physical optics; (050.1755) Computational electromagnetic methods; Monte Carlo Ray-Trace, Huygens-Fresnel principle, obliquity factor 1. INTRODUCTION here. We compare the results from the analytical and numerical approaches with each other and with the dedicated experimental The Monte Carlo ray-trace (MCRT) method has long been utilized to results.
    [Show full text]
  • Chapter 14 Interference and Diffraction
    Chapter 14 Interference and Diffraction 14.1 Superposition of Waves.................................................................................... 14-2 14.2 Young’s Double-Slit Experiment ..................................................................... 14-4 Example 14.1: Double-Slit Experiment................................................................ 14-7 14.3 Intensity Distribution ........................................................................................ 14-8 Example 14.2: Intensity of Three-Slit Interference ............................................ 14-11 14.4 Diffraction....................................................................................................... 14-13 14.5 Single-Slit Diffraction..................................................................................... 14-13 Example 14.3: Single-Slit Diffraction ................................................................ 14-15 14.6 Intensity of Single-Slit Diffraction ................................................................. 14-16 14.7 Intensity of Double-Slit Diffraction Patterns.................................................. 14-19 14.8 Diffraction Grating ......................................................................................... 14-20 14.9 Summary......................................................................................................... 14-22 14.10 Appendix: Computing the Total Electric Field............................................. 14-23 14.11 Solved Problems ..........................................................................................
    [Show full text]
  • This Is a Repository Copy of Ptychography. White Rose
    This is a repository copy of Ptychography. White Rose Research Online URL for this paper: http://eprints.whiterose.ac.uk/127795/ Version: Accepted Version Book Section: Rodenburg, J.M. orcid.org/0000-0002-1059-8179 and Maiden, A.M. (2019) Ptychography. In: Hawkes, P.W. and Spence, J.C.H., (eds.) Springer Handbook of Microscopy. Springer Handbooks . Springer . ISBN 9783030000684 https://doi.org/10.1007/978-3-030-00069-1_17 This is a post-peer-review, pre-copyedit version of a chapter published in Hawkes P.W., Spence J.C.H. (eds) Springer Handbook of Microscopy. The final authenticated version is available online at: https://doi.org/10.1007/978-3-030-00069-1_17. Reuse Items deposited in White Rose Research Online are protected by copyright, with all rights reserved unless indicated otherwise. They may be downloaded and/or printed for private study, or other acts as permitted by national copyright laws. The publisher or other rights holders may allow further reproduction and re-use of the full text version. This is indicated by the licence information on the White Rose Research Online record for the item. Takedown If you consider content in White Rose Research Online to be in breach of UK law, please notify us by emailing [email protected] including the URL of the record and the reason for the withdrawal request. [email protected] https://eprints.whiterose.ac.uk/ Ptychography John Rodenburg and Andy Maiden Abstract: Ptychography is a computational imaging technique. A detector records an extensive data set consisting of many inference patterns obtained as an object is displaced to various positions relative to an illumination field.
    [Show full text]
  • 4. Fresnel and Fraunhofer Diffraction
    13. Fresnel diffraction Remind! Diffraction regimes Fresnel-Kirchhoff diffraction formula E exp(ikr) E PF= 0 ()θ dA ()0 ∫∫ irλ ∑ z r Obliquity factor : F ()θθ= cos = r zE exp (ikr ) E x,y = 0 ddξ η () ∫∫ 2 irλ ∑ Aperture (ξ,η) Screen (x,y) 22 rzx=+−+−2 ()()ξ yη 22 22 ⎡⎤11⎛⎞⎛⎞xy−−ξη()xy−−ξ ()η ≈+zz⎢⎥1 ⎜⎟⎜⎟ + =+ + ⎣⎦⎢⎥22⎝⎠⎝⎠zz 22 zz ⎛⎞⎛⎞xy22ξη 22⎛⎞ xy ξη =++++−+z ⎜⎟⎜⎟⎜⎟ ⎝⎠⎝⎠22zz 22 zz⎝⎠ zz E ⎡⎤k Exy(),expexp=+0 ()ikz i() x22 y izλ ⎣⎦⎢⎥2 z ⎡⎤⎡⎤kk22 ×+−+∫∫ exp⎢⎥⎢⎥ii()ξ ηξ exp()xyη ddξη ∑ ⎣⎦⎣⎦2 zz E ⎡⎤k Exy(),expexp=+0 ()ikz i() x22 y r izλ ⎣⎦⎢⎥2 z ⎡⎤⎡⎤kk ×+−+exp iiξ 22ηξexp xyη dξdη ∫∫ ⎢⎥⎢⎥() () Aperture (ξ,η) Screen (x,y) ∑ ⎣⎦⎣⎦2 zz ⎡⎤⎡⎤kk22 =+−+Ci∫∫ exp ⎢⎥⎢⎥()ξ ηξexp ixydd()η ξη ∑ ⎣⎦⎣⎦2 zz Fresnel diffraction ⎡⎤⎡⎤kk E ()xy,(,)=+ C Uξ ηξηξηξηexp i ()22 exp−i() x+ y d d ∫∫ ⎣⎦⎣⎦⎢⎥⎢⎥2 zz k 22 ⎧ j ()ξη+ ⎫ Exy(, )∝F ⎨ U()ξη , e2z ⎬ ⎩⎭ Fraunhofer diffraction ⎡⎤k Exy(),(,)=−+ C Uξη expi() xξ y η dd ξ η ∫∫ ⎣⎦⎢⎥z =−+CU(,)expξ ηξθηθξη⎡⎤ ik sin sin dd ∫∫ ⎣⎦()ξη Exy(, )∝F { U(ξ ,η )} Fresnel (near-field) diffraction This is most general form of diffraction – No restrictions on optical layout • near-field diffraction k 22 ⎧ j ()ξη+ ⎫ • curved wavefront Uxy(, )≈ F ⎨ U()ξη , e2z ⎬ – Analysis somewhat difficult ⎩⎭ Curved wavefront (parabolic wavelets) Screen z Fresnel Diffraction Accuracy of the Fresnel Approximation 3 π 2 2 2 z〉〉[()() x −ξ + y η −] 4λ max • Accuracy can be expected for much shorter distances for U(,)ξ ηξ smooth & slow varing function; 2x−=≤ D 4λ z D2 z ≥ Fresnel approximation 16λ In summary, Fresnel diffraction is … 13-7.
    [Show full text]
  • Numerical Techniques for Fresnel Diffraction in Computational
    Louisiana State University LSU Digital Commons LSU Doctoral Dissertations Graduate School 2006 Numerical techniques for Fresnel diffraction in computational holography Richard Patrick Muffoletto Louisiana State University and Agricultural and Mechanical College, [email protected] Follow this and additional works at: https://digitalcommons.lsu.edu/gradschool_dissertations Part of the Computer Sciences Commons Recommended Citation Muffoletto, Richard Patrick, "Numerical techniques for Fresnel diffraction in computational holography" (2006). LSU Doctoral Dissertations. 2127. https://digitalcommons.lsu.edu/gradschool_dissertations/2127 This Dissertation is brought to you for free and open access by the Graduate School at LSU Digital Commons. It has been accepted for inclusion in LSU Doctoral Dissertations by an authorized graduate school editor of LSU Digital Commons. For more information, please [email protected]. NUMERICAL TECHNIQUES FOR FRESNEL DIFFRACTION IN COMPUTATIONAL HOLOGRAPHY A Dissertation Submitted to the Graduate Faculty of the Louisiana State University and Agricultural and Mechanical College in partial fulfillment of the requirements for the degree of Doctor of Philosophy in The Department of Computer Science by Richard Patrick Muffoletto B.S., Physics, Louisiana State University, 2001 B.S., Computer Science, Louisiana State University, 2001 December 2006 Acknowledgments I would like to thank my major professor, Dr. John Tyler, for his patience and soft-handed guidance in my pursual of a dissertation topic. His support and suggestions since then have been vital, especially in the editing of this work. I thank Dr. Joel Tohline for his unwavering enthusiasm over the past 8 years of my intermittant hologram research; it has always been a source of motivation and inspiration. My appreciation goes out to Wesley Even for providing sample binary star system simulation data from which I was able to demonstrate some of the holographic techniques developed in this research.
    [Show full text]
  • Diffraction I Single-Slit Diffraction
    Lecture 22 (Diffraction I Single-Slit Diffraction) Physics 2310-01 Spring 2020 Douglas Fields Single-Slit Diffraction • As we have already hinted at, and seen, waves don’t behave as we might have expected from our study of geometric optics. • We can see interference fringes even when we only have a single slit! • To understand this phenomena, we have to go back to Huygens’ Principle and phasor diagrams. Doesn’t have to be a slit… • Any obstruction can cause an interference pattern. Single-Slit Diffraction • Because real slits have finite width, then there is not just a single source of Huygens wavelets, but many (infinite?). • As we saw with the two-slit problem, the geometry of the problem is much easier when we go to the limit that the distance to the screen (where the interference pattern is viewed) is much larger than the width of the slit. – Fraunhofer or far-field diffraction. Fraunhofer diffraction of circular • When this isn’t the case, you still aperture get diffraction, it just looks different. – Fresnel or near-field diffraction. "Circular Aperture Fresnel Diffraction high res" by Gisling - "Airy-pattern2" by Epzcaw - Own work. Licensed under CC Own work. Licensed under CC BY-SA 3.0 via Commons - BY-SA 3.0 via Commons - https://commons.wikimedia.org/wiki/File:Circular_Aperture_F https://commons.wikimedia.org/wiki/File:Airy-pattern2.jpg#/m resnel_Diffraction_high_res.jpg#/media/File:Circular_Apertur edia/File:Airy-pattern2.jpg e_Fresnel_Diffraction_high_res.jpg Fresnel and Fraunhofer Diffraction • The only distinction is the distance between the slit and the screen. • In Fraunhofer diffraction the distance is large enough to consider the rays to be parallel.
    [Show full text]
  • Chapter 11. Fraunhofer Diffraction
    ChapterChapter 11.11. FraunhoferFraunhofer Diffraction Diffraction Last lecture • Numerical aperture of optical fiber • Allowed modes in fibers • Attenuation • Modal distortion, Material dispersion, Waveguide dispersion This lecture • Diffraction from a single slit • Diffraction from apertures : rectangular, circular • Resolution : diffraction limit • Diffraction from multiple-slits DiffractionDiffraction regimesregimes Fraunhofer diffraction • Specific sort of diffraction – far-field diffraction – plane wavefront – Simpler maths FraunhoferFraunhofer DiffractionDiffraction Fresnel Diffraction • This is most general form of diffraction – No restrictions on optical layout • near-field diffraction • curved wavefront – Analysis difficult Obstruction Screen FresnelFresnel DiffractionDiffraction 11-1.11-1. FraunhoferFraunhofer Diffraction Diffraction fromfrom aa SingleSingle SlitSlit • Consider the geometry shown below. Assume that the slit is very long in the direction perpendicular to the page so that we can neglect diffraction effects in the perpendicular direction. Δ r0 The contribution to the electric field amplitude Δ at point P due to the wavelet emanating from the element ds in the slit is given by dE ⎛⎞0 r dEP =−⎜⎟exp ⎣⎦⎡⎤ i() krω t 0 ⎝⎠r Let r== r0 for the source element ds at s 0. Then for any element ⎛ dE ⎞ dE = 0 exp ikr⎡⎤+Δ −ω t P ⎜⎟⎜ ⎟ {}⎣⎦()0 ⎝ ()r0 +Δ ⎠ why? We can neglect the path differenceΔ in the amplitude term,. but not in the phase term We letdE0 = EL d s,, where EL is the electric field amplitude assumed uniform over
    [Show full text]
  • Chapter 15S Fresnel-Kirchhoff Diffraction Masatsugu Sei Suzuki Department of Physics, SUNY at Binghamton (Date: January 22, 2011)
    Chapter 15S Fresnel-Kirchhoff diffraction Masatsugu Sei Suzuki Department of Physics, SUNY at Binghamton (Date: January 22, 2011) Augustin-Jean Fresnel (10 May 1788 – 14 July 1827), was a French physicist who contributed significantly to the establishment of the theory of wave optics. Fresnel studied the behaviour of light both theoretically and experimentally. He is perhaps best known as the inventor of the Fresnel lens, first adopted in lighthouses while he was a French commissioner of lighthouses, and found in many applications today. http://en.wikipedia.org/wiki/Augustin-Jean_Fresnel ______________________________________________________________________________ Christiaan Huygens, FRS (14 April 1629 – 8 July 1695) was a prominent Dutch mathematician, astronomer, physicist, horologist, and writer of early science fiction. His work included early telescopic studies elucidating the nature of the rings of Saturn and the discovery of its moon Titan, the invention of the pendulum clock and other investigations in timekeeping, and studies of both optics and the centrifugal force. Huygens achieved note for his argument that light consists of waves, now known as the Huygens–Fresnel principle, which became instrumental in the understanding of wave-particle duality. He generally receives credit for his discovery of the centrifugal force, the laws for collision of bodies, for his role in the development of modern calculus and his original observations on sound perception (see repetition pitch). Huygens is seen as the first theoretical physicist as he was the first to use formulae in physics. http://en.wikipedia.org/wiki/Christiaan_Huygens ____________________________________________________________________________ Green's theorem Fresnel-Kirchhhoff diffraction Huygens-Fresnel principle Fraunhofer diffraction Fresel diffraction Fresnel's zone Fresnel's number Cornu spiral ________________________________________________________________________ 15S.1 Green's theorem First we will give the proof of the Green's theorem given by (2 2 )d ( ) da .
    [Show full text]