Organizing Committee SENSORDEVICES 2010

SENSORDEVICES Advisory Chairs Petre Dini, IARIA / Concordia University, Canada Vittorio Ferrari, Università di Brescia, Italy Elena Gaura, Coventry University, United Kingdom Sergey Yurish, Universitat Politècnica de Catalunya - Barcelona,

SENSORDEVICES 2010 Industry Liaison Chairs George Abramchuck, Measurement Technology & Advanced Applications -Toronto, Canada Arvind K. Srivastava, NanoSonix Inc., USA Aurel Ymeti, OSTENDUM-Enschede, The Netherlands Qing Zhu, FUJIFILM Dimatix, Inc. - Santa Clara, USA

SENSORDEVICES 2010 Research/Industry Chairs Tan Yen Kheng, National University of Singapore, Singapore Michele Penza, ENEA/ Brindisi Research Center, Italy Martin Pumera, Nanyang Technological University (NTU), Japan John L. Schmalzel, NASA (IPA) / Rowan University, USA Raluca - Ioana Stefan-van Staden, National Institute of Research for Electrochemistry and Condensed Matter, Bucharest, Romania Alberto Yúfera, Centro Nacional de Microelectronica (CNM-CSIC) - Sevilla, Spain

SENSORDEVICES 2010 Technical Program Committee George Abramchuck, Measurement Technology & Advanced Applications -Toronto, Canada Francisco Javier Arcega Solsona, University of , Spain Selcuk Atalay, Inonu University-Malatya, Turkey Vygantas Augutis, Kaunas University of Technology, Lithuania Faruk Bagci, University of Augsburg, Germany Karabi Biswas, Indian Institute of Technology - Kharagpur, India Mounir Bousbia-Salah, University of Annaba, Algeria James Brusey, Coventry University, United Kingdom Jaime Calvo-Gallego, , Spain Luigi Campanella, University La Sapienza, Italy Vítor Carvalho, Minho University, Portugal Danny Chung, Chung Yuan Christian University, Taiwan Rodrigo P.B. Costa-Felix, INMETRO, Brazil Yaping Dan, Harvard University, School of Engineering and Applied Science, Cambridge, USA Petre Dini, IARIA / Concordia University, Canada Alexandar Djordjevich, City University of Hong Kong, Hong Kong Snezana Djuric, University of Novi Sad, Serbia Hua Dong, University of California at Davis, USA Stefan Enderle, qfix robotics, GmbH Germany Hector Erives, New Mexico Tech (NMT), USA Vittorio Ferrari, Università di Brescia, Italy

xiixi Elena Gaura, Coventry University, United Kingdom Hao Gong, University of Singapore, Singapore Graça Maria Henriques Minas, Universidade do Minho - Guimaraes, Portugal Wilmar Hernandez, Universidad Politecnica de , Spain Liudi Jiang, University of Southampton - Highfield, United Kingdom Ding Jianning, Jiangsu Polytechnic University, China Tan Yen Kheng, National University of Singapore, Singapore Ganesh Krishnamoorthy, University of Texas at Austin, USA Arun Kumar, University of South Florida, USA Xian-Fang Li, Central South University - Changsha, China Aihua Liu, University of Oklahoma, USA Songqin Liu, Southeast University, Nanjing, China Carlos Lodeiro Espino, University of , Spain Jerzy Lukaszewicz, Nicholas Copernicus University - Torun, Poland Hamed Sadeghian Marnani, Delft University of Technology, The Netherlands Gerard C.M. Meijer, Delft University of Technology, The Netherlands Mahmoud Moghavvemi, University of Malaya, Malaysia Esteban Molina Flores, Benemirita Universidad Autonoma de Puebla, Mexico Gaidi Mounir, Centre de Recherche et de technologies de l'Energie (CRTEn) Technopole Borj Cédria, Tunisia Subhas Chandra Mukhopadhyay, Massey University, Palmerston North, New Zealand Lalchand A. Patil, North Maharashtra University, India Michele Penza, ENEA/ Brindisi Research Center, Italy Robert J. Prance, University of Sussex - Brighton, United Kingdom Martin Pumera, National Institute for Materials Science - Biomaterials Center / International Center for Materials Nanoarchitectonics (MANA) - Tsukuba, Japan K. Rajanna, Indian Institute of Science - Bangalore, India Càndid Reig, , Spain Maria Teresa Restivo, , Portugal K. Sapozhnikova, D. I. Mendeleyev Institute for Metrology - St. Petersburg, Russia Yuriy S. Shmaliy, Guanajuato University - Palo-Blanco, Mexico John L. Schmalzel, NASA (IPA) / Rowan University, USA Inamuddin Siddiqui, Aligarh Muslim University, India Subodh Kumar Singhal, National Physical Laboratory - New Delhi, India Arvind K. Srivastava, NanoSonix Inc., USA Nickolaj Starodub, National University of Life and Environmental Sciences of Ukraine/ T. Shevchenko Kiev State University of Ukraine, Ukraine Raluca-Ioana Stefan-van Staden, National Institute of Research for Electrochemistry and Condensed Matter, Bucharest, Romania Raman Suri, Head-Biosensor Group/Institute of Microbial Technology - Chandigarh, India Roman Szewczyk, Industrial Research Institute for Automation and Measurements (PIAP), Poland R. Taymanov, D. I. Mendeleyev Institute for Metrology - St. Petersburg, Russia Gui Yun Tian, University of Newcastle upon Tyne - Newcastle, United Kingdom Antonio Valente, UTAD - University of Trás-os-Montes and Alto Douro, Portugal Manuela Vieira, ISEL, Portugal Dongfang Yang, National Research Council Canada - London, Canada Xiaoling Yang, University of Illinois at Urbana-Champaign, USA Aurel Ymeti, OSTENDUM-Enschede, The Netherlands Alberto Yúfera, Centro Nacional de Microelectronica (CNM-CSIC) - Sevilla, Spain Sergey Yurish, Universitat Politècnica de Catalunya - Barcelona, Spain

xiiixii Cyrus Zamani, Universitat de Barcelona, Spain Weiping Zhang, Institute of Micro and Nano Science and Technology/ Shanghai Jiao Tong University, China Xueji Zhang, EMBA / World Precision Instruments, Inc. USA; University of South Florida, USA Qitao Zhao, University of Texas at Arlington, USA Qing Zhu, FUJIFILM Dimatix, Inc. - Santa Clara, USA

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