Article Analysis of Resonant Soft X-ray Reflectivity of Anisotropic Layered Materials Luca Pasquali 1,2,3,* , Nicola Mahne 2, Angelo Giglia 2, Adriano Verna 4, Lorenzo Sponza 5, Raffaella Capelli 1,2,3, Matteo Bonfatti 1, Francesco Mezzadri 1 , Emanuele Galligani 1 and Stefano Nannarone 2 1 Dipartimento di Ingegneria ‘E. Ferrari’, Università di Modena e Reggio Emilia, via Vivarelli 10, 41125 Modena, Italy;
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[email protected] (E.G.) 2 Istituto Officina Dei Materiali—Consiglio Nazionale Delle Ricerche (IOM-CNR), Strada Statale 14, Km. 163.5 in AREA Science Park, Basovizza, 34149 Trieste, Italy;
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[email protected] (S.N.) 3 Department of Physics, University of Johannesburg, P.O. Box 524, Auckland Park 2006, South Africa 4 Dipartimento di Scienze, Università degli Studi Roma Tre, Via della Vasca Navale 84, 00146 Roma, Italy;
[email protected] 5 Laboratoire d’Etude Des Microstructures (LEM), Unitè Mixte de Reserche (UMR) 104 Centre National de la Recherche Scientifique (CNRS)—ONERA, 29 Av. de la Division Leclerc, FR-92322 Chatillon CEDEX, France;
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[email protected]; Tel.: +39-059-205-6223 Abstract: We present here a method for the quantitative prediction of the spectroscopic specular reflectivity line-shape in anisotropic layered media. The method is based on a 4 × 4 matrix formalism and on the simulation from the first principles (through density functional theory—DFT) of the anisotropic absorption cross-section.