Atomic Force Microscopy Based Infrared (AFM–IR) Spectroscopy and Nuclear Resonance Vibrational Spectroscopy Comparative Study
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Neutron Instrumentation
Neutron Instrumentation Oxford School on Neutron Scattering 5th September 2019 Ken Andersen Summary • Neutron instrument concepts – time-of-flight – Bragg’s law • Neutron Instrumentation – guides – monochromators – shielding – detectors – choppers – sample environment – collimation • Neutron diffractometers • Neutron spectrometers 2 The time-of-flight (TOF) method distance Δt time Diffraction: Bragg’s Law Diffraction: Bragg’s Law Diffraction: Bragg’s Law Diffraction: Bragg’s Law Diffraction: Bragg’s Law Diffraction: Bragg’s Law λ = 2d sinθ Diffraction: Bragg’s Law λ = 2d sinθ 2θ Reflection: Snell’s Law incident reflected n=1 θ θ’ refracted n’<1 Reflection: Snell’s Law incident reflected n=1 θ θ’ refracted θ’=0: critical angle of total n’<1 reflection θc Reflection: Snell’s Law incident reflected n=1 θ θ’ refracted θ’=0: critical angle of total n’<1 reflection θc cosθc = n' n = n' Nλ2b n' = 1− ⇒ θc = λ Nb/π 2π ≈ − 2 cosθc 1 θc 2 Reflection: Snell’s Law incident reflected n=1 θ θ’ refracted θ’=0: critical angle of total n’<1 reflection θc cosθc = n' n = n' 2 for natural Ni, Nλ b n' = 1− ⇒ θc = λ Nb/π 2π θc = λ[Å]×0.1° cosθ ≈ 1− θ2 2 c c -1 Qc = 0.0218 Å Neutron Supermirrors Courtesy of J. Stahn, PSI Neutron Supermirrors Courtesy of J. Stahn, PSI Neutron Supermirrors Courtesy of J. Stahn, PSI Neutron Supermirrors λ Reflection: θc(Ni) = λ[Å] × 0.10° c λ 1 Multilayer: θc(SM) = m × λ[Å] × 0.10° λ 2 λ 3 λ 4 } d 1 } d 2 } d3 } d4 18 Neutron Supermirrors λ Reflection: θc(Ni) = λ[Å] × 0.10° c λ 1 Multilayer: θc(SM) = m × λ[Å] × 0.10° λ 2 -
Neutron Spin Echo Spectroscopy
Neutron Spin Echo Spectroscopy Peter Fouquet [email protected] Institut Laue-Langevin Grenoble, France Oxford Neutron School 2017 What you are supposed to learn in this tutorial 1. The length and time scales that can be studied using NSE spectroscopy 2. The measurement principle of NSE spectroscopy 3. Discrimination techniques for coherent, incoherent and magnetic dynamics 4. To which scientific problems can I apply NSE spectroscopy? NSE-Tutorial Mind Map Quantum Mechanical Model Resonance Spin-Echo Classical Model Measurement principle “4-point Echo” NSE spectroscopy Instrument Frustrated Components Magnets Bio- molecules Time/Space Map NSE around Surface the globe Diffusion Science Cases Paramagnetic Spin Echo Experiment planning and Interpretation Diffusion Glasses Polymers Models Coherent and Incoherent Scattering Data Treatment The measurement principle of neutron spin echo spectroscopy (quantum mechanical model) • The neutron wave function is split by magnetic fields • The 2 wave packets arrive at magnetic coil 1 magnetic coil 2 polarised sample the sample with a time neutron difference t • If the molecules move between the arrival of the first and second wave packet then coherence is lost • The intermediate scattering t λ3 Bdl function I(Q,t) reflects this ∝ loss in coherence strong wavelength field integral dependence Return The measurement principle of neutron spin echo spectroscopy Dynamic Scattering NSE spectra for diffusive motion Function S(Q,ω) G(R,ω) I(Q,t) = e-t/τ Fourier Transforms temperature up ⇒ τ down Intermediate VanHove -
High Resolution Spectroscopy with the Neutron Resonance Spin Echo Method
High Resolution Spectroscopy with the Neutron Resonance Spin Echo Method vorgelegt von Diplom-Physiker Felix Groitl aus Erlangen von der Fakultät II - Mathematik und Naturwissenschaften der Technischen Universität Berlin zur Erlangung des akademischen Grades Doktor der Naturwissenschaften Dr. rer. nat. genehmigte Dissertation Promotionsausschuss: Vorsitzender: Prof. Dr. M. Kneissl Gutachter: Prof. Dr. D. A. Tennant Gutachter: Prof. Dr. P. Böni Gutachter: Dr. K. Habicht Tag der wissenschaftlichen Aussprache: 18.12.2012 Berlin 2013 D 83 Abstract The first part of this thesis is dedicated to explore new territory for high resolution Neu- tron Resonance Spin Echo (NRSE) spectroscopy beyond measuring lifetimes of elementary excitations. The data analysis of such experiments requires a detailed model for the echo amplitude as a function of correlation time. The model also offers guidance for planning NRSE experiments in terms of a sensible choice of parameters and allows predicting quan- titatively the information content of NRSE spectroscopy for line shape analysis or energy level separation. Major generalizations of the existing formalism, developed in this thesis, allow for violated spin echo conditions, arbitrary local gradient components of the dispersion surface and detuned parameters of the background triple axis spectrometer (TAS) giving rise to important additional depolarizing effects, which have been neglected before. Fur- thermore, the formalism can now be applied to any crystal symmetry class. The model was successfully tested by experiments on phonons in a high quality single crystal of Pb and the results demonstrate the stringent necessity to consider second order depolarization effects. The formalism was subsequently extended to analyze mode doublets. As a major step for- ward, detuning effects for both modes are taken into account here. -
Recent Applications of Advanced Atomic Force Microscopy in Polymer Science: a Review
polymers Review Recent Applications of Advanced Atomic Force Microscopy in Polymer Science: A Review Phuong Nguyen-Tri 1,2,*, Payman Ghassemi 2, Pascal Carriere 3, Sonil Nanda 4 , Aymen Amine Assadi 5 and Dinh Duc Nguyen 6,7 1 Institute of Research and Development, Duy Tan University, Da Nang 550000, Vietnam 2 Département de Chimie, Biochimie et Physique, Université du Québec à Trois-Rivières (UQTR), Trois-Rivières, QC G8Z 4M3, Canada; [email protected] 3 Laboratoire MAPIEM (EA 4323), Matériaux Polymères Interfaces Environnement Marin, Université de Toulon, CEDEX 9, 83041 Toulon, France; [email protected] 4 Department of Chemical and Biological Engineering, University of Saskatchewan, Saskatoon, SK S7N 5A2, Canada; [email protected] 5 ENSCR—Institut des Sciences Chimiques de Rennes (ISCR)—UMR CNRS 6226, Univ Rennes, 35700 Rennes, France; [email protected] 6 Faculty of Environmental and Food Engineering, Nguyen Tat Thanh University, 300A Nguyen Tat Thanh, District 4, Ho Chi Minh City 755414, Vietnam; [email protected] 7 Department of Environmental Energy Engineering, Kyonggi University, Suwon 16227, Korea * Correspondence: [email protected]; Tel.: +819-376-5011 (ext. 4505) Received: 5 March 2020; Accepted: 13 May 2020; Published: 17 May 2020 Abstract: Atomic force microscopy (AFM) has been extensively used for the nanoscale characterization of polymeric materials. The coupling of AFM with infrared spectroscope (AFM-IR) provides another advantage to the chemical analyses and thus helps to shed light upon the study of polymers. This paper reviews some recent progress in the application of AFM and AFM-IR in polymer science. -
Quantum Limit in Subnanometre-Gap Tip-Enhanced Nanoimaging of Few
Quantum limit in subnanometre-gap tip-enhanced nanoimaging of few-layer MoS2 Yingchao Zhang1,2*, Dmitri V. Voronine1,3*#, Shangran Qiu1,2, Alexander M. Sinyukov1, Mary Hamilton3, Alexei V. Sokolov1,3, Zhenrong Zhang3 and Marlan O. Scully1,3,4# 1Texas A&M University, College Station, TX 77843, USA 2Xi’an Jiaotong University, Xi’an, Shaanxi 710049, China 3Baylor University, Waco, TX 76798, USA 4Princeton University, Princeton, New Jersey 08544, USA Two-dimensional (2D) materials beyond graphene such as transition metal dichalcogenides (TMDs) have unique mechanical, optical and electronic properties with promising applications in flexible devices, catalysis and sensing. Optical imaging of TMDs using photoluminescence and Raman spectroscopy can reveal the effects of structure, strain, doping, defects, edge states, grain boundaries and surface functionalization. However, Raman signals are inherently weak and so far have been limited in spatial resolution in TMDs to a few hundred nanometres which is much larger than the intrinsic scale of these effects. Here we overcome the diffraction limit by using resonant tip-enhanced Raman scattering (TERS) of few-layer MoS2, and obtain nanoscale optical images with ~ 20 nm spatial resolution. This becomes possible due to electric field enhancement in an optimized subnanometre-gap resonant tip-substrate configuration. We investigate the limits of signal enhancement by varying the tip-sample gap with sub-Angstrom precision and observe a quantum quenching behavior, as well as a Schottky-Ohmic transition, for subnanometre gaps, which enable surface mapping based on this new contrast mechanism. This quantum regime of plasmonic gap-mode enhancement with a few nanometre thick MoS2 junction may be used for designing new quantum optoelectronic devices and sensors. -
LCLS: the First Experiments
LCLS THE FIRST EXPERIMENTS September 2000 ii Table of Contents First Scientific Experiments for the LCLS .....................................................v Atomic Physics Experiments ..........................................................................1 Plasma and Warm Dense Matter Studies......................................................13 Structural Studies on Single Particles and Biomolecules .............................35 Femtochemistry.............................................................................................63 Studies of Nanoscale Dynamics in Condensed Matter Physics....................85 X-ray Laser Physics ....................................................................................101 Appendix 1: Committee Members..............................................................113 iii iv First Scientific Experiments for the LCLS The Scientific Advisory Committee (SAC) for the Linac Coherent Light Source (LCLS) has selected six scientific experiments for the early phase of the project. The LCLS, with proposed construction in the 2003-2006 time frame, has been designed to utilize the last third of the existing Stanford Linear Accelerator Center (SLAC) linac. The linac produces a high-current 5- 15 GeV electron beam that is bunched into 230 fs slices with a 120 Hz repetition rate. When traveling through a sufficiently long (of order of 100 m) undulator, the electron bunches will lead to self amplification of the emitted x-ray intensity constituting an x-ray free electron laser (XFEL). If funded as proposed, the LCLS will be the first XFEL in the world, operating in the 800-8,000 eV energy range. The emitted coherent x-rays will have unprecedented brightness with 1012-1013 photons/pulse in a 0.2-0.4% energy bandpass and an unprecedented time structure with a design pulse length of 230 fs. Studies are under way to reduce the pulse length to tens of femtoseconds. This document presents descriptions of the early scientific experiments selected by SAC in the spring of 2000. -
Curved-Mechanical Characteristic Measurements of Transparent Conductive Film-Coated Polymer Substrates Using Common-Path Optical Interferometry
coatings Article Curved-Mechanical Characteristic Measurements of Transparent Conductive Film-Coated Polymer Substrates Using Common-Path Optical Interferometry Bor-Jiunn Wen * and Jui-Jen Hsu Department of Mechanical and Mechatronic Engineering, National Taiwan Ocean University, Keelung 20224, Taiwan; [email protected] * Correspondence: [email protected] Abstract: This study proposes a method for measuring curved-mechanical characteristics based on a whole-folding test for transparent conductive film-coated polymer substrates using common- path optical interferometry. Accordingly, 80-, 160-, and 230-nm indium tin oxide films coated on 40 × 40 mm 125-µm-thick polyethylene terephthalate (PET) substrates, and monolayer graphene films coated on 40 × 40 mm 250-µm-thick PET substrates are inspected and analyzed under the curving conditions of 50-, 30-, 20-, and 10-mm radii before and after an 11,000 whole-folding cycle test based on a 10-mm folding radius. This study utilizes the changes in the phase retardations of transparent conductive film-coated polymer substrates under different curving conditions before and after 11,000 whole-folding cycles to analyze the substrates’ residual stress characteristics that were the direct result of manufacturing process parameters. The results from this study of curved-mechanical characteristic measurements of flexible transparent conductive substrates can provide designers Citation: Wen, B.-J.; Hsu, J.-J. Curved-Mechanical Characteristic with improved product development and can assist manufacturers in improving the manufacturing Measurements of Transparent design of enhanced coating processes. Conductive Film-Coated Polymer Substrates Using Common-Path Keywords: curved-mechanical characteristic measurements; whole-folding test; transparent Optical Interferometry. Coatings 2021, conductive film-coated polymer substrate; common-path optical interferometry 11, 766. -
External Control of Electron Temperature in Ultra-Cold Plasmas
Colby College Digital Commons @ Colby Honors Theses Student Research 2007 External Control of Electron Temperature in Ultra-cold Plasmas Roy O. Wilson Colby College Follow this and additional works at: https://digitalcommons.colby.edu/honorstheses Part of the Astrophysics and Astronomy Commons Colby College theses are protected by copyright. They may be viewed or downloaded from this site for the purposes of research and scholarship. Reproduction or distribution for commercial purposes is prohibited without written permission of the author. Recommended Citation Wilson, Roy O., "External Control of Electron Temperature in Ultra-cold Plasmas" (2007). Honors Theses. Paper 231. https://digitalcommons.colby.edu/honorstheses/231 This Honors Thesis (Open Access) is brought to you for free and open access by the Student Research at Digital Commons @ Colby. It has been accepted for inclusion in Honors Theses by an authorized administrator of Digital Commons @ Colby. External Control of Electron Temperature in Ultra-cold Plasmas Roy O.Wilson Honors Thesis Colby College Department of Physics and Astronomy May 2007 Abstract This thesis discusses progress towards achieving external control of the elec- tron temperature and the Coulomb coupling parameter of ultra-cold plasmas. Using a Littman dye laser, we create the plasma by partially photoionizing a dense, cold sample of rubidium atoms in a magneto-optical trap (MOT). At a controllable time delay, we excite neutral atoms in the plasma to a specific Ry- dberg state using a narrow bandwidth pulsed dye laser. We have made progress towards optimizing and quantifying the achievable Rydberg atom density by us- ing mm-wave spectroscopy to control the evolution of a cold dense Rydberg sam- ple to plasma and have also begun preliminary investigations of plasma electron temperature measurements. -
Polymer Characterization with the Atomic Force Microscope
Chapter 4 Polymer Characterization with the Atomic Force Microscope U. Maver, T. Maver, Z. Peršin, M. Mozetič, A. Vesel, M. Gaberšček and K. Stana-Kleinschek Additional information is available at the end of the chapter http://dx.doi.org/10.5772/51060 1. Introduction 1.1. Atomic force microscopy Atomic force microscopy is a powerful characterization tool for polymer science, capable of revealing surface structures with superior spatial resolution [1]. The universal character of repulsive forces between the tip and the sample, which are employed for surface analysis in AFM, enables examination of even single polymer molecules without disturbance of their integrity [2]. Being initially developed as the analogue of scanning tunneling microscopy (STM) for the high-resolution profiling of non-conducting surfaces, AFM has developed into a multifunctional technique suitable for characterization of topography, adhesion, mechanical, and other properties on scales from tens of microns to nanometers [3]. 1.2. The technique A schematic representation of the basic AFM setup is shown in Figure 1. Using atomic force microscopy (AFM), a tip attached to a flexible cantilever will move across the sample surface to measure the surface morphology on the atomic scale. The forces between the tip and the sample are measured during scanning, by monitoring the deflection of the cantilever [1]. This force is a function of tip sample separation and the material properties of the tip and the sample. Further interactions arising between the tip and the sample can be used to investigate other characteristics of the sample, the tip, or the medium in-between [4]. 1.2.1. -
Bibliography on Atomic Energy Levels and Spectra, July 1975 Through
T F ,<* ° Co NBS SPECIAL PUBLICATION 363 SUPPLEMENT 2 U.S. DEPARTMENT OF COMMERCE / National Bureau of Standards Bibliography on Atomic Energy Levels and Spectra July 1975 through June 1979 NATIONAL BUREAU OF STANDARDS The National Bureau of Standards' was established by an act ot Congress on March 3, 1901. The Bureau's overall goal is to strengthen and advance the Nation's science and technology and facilitate their effective application for public benefit. To this end, the Bureau conducts research and provides: (1) a basis for the Nation's physical measurement system, (2) scientific and technological services for industry and government, (3) a technical basis for equity in trade, and (4) technical services to promote public safety. The Bureau's technical work is per- formed by the National Measurement Laboratory, the National Engineering Laboratory, and the Institute for Computer Sciences and Technology. THE NATIONAL MEASUREMENT LABORATORY provides the national system ot physical and chemical and materials measurement; coordinates the system with measurement systems of other nations and furnishes essential services leading to accurate and uniform physical and chemical measurement throughout the Nation's scientific community, industry, and commerce; conducts materials research leading to improved methods of measurement, standards, and data on the properties of materials needed by industry, commerce, educational institutions, and Government; provides advisory and research services to other Government agencies; develops, produces, and -
High Resolution Laser Spectroscopy of Cesium and Rubidium
HIGH RESOLUTION LASER SPECTROSCOPY OF CESIUM AND RUBIDIUM MOLECULES WITH OPTICALLY INDUCED COHERENCE A Dissertation by HUI CHEN Submitted to the O±ce of Graduate Studies of Texas A&M University in partial ful¯llment of the requirements for the degree of DOCTOR OF PHILOSOPHY August 2006 Major Subject: Physics HIGH RESOLUTION LASER SPECTROSCOPY OF CESIUM AND RUBIDIUM MOLECULES WITH OPTICALLY INDUCED COHERENCE A Dissertation by HUI CHEN Submitted to the O±ce of Graduate Studies of Texas A&M University in partial ful¯llment of the requirements for the degree of DOCTOR OF PHILOSOPHY Approved by: Co-Chairs of Committee, Marlan O. Scully M. Suhail Zubairy Committee Members, George R. Welch Vladimir A. Sautenkov Goong Chen Head of Department, Edward Fry August 2006 Major Subject: Physics iii ABSTRACT High Resolution Laser Spectroscopy of Cesium and Rubidium Molecules with Optically Induced Coherence. (August 2006) Hui Chen, B.S.; M.S., University of Science and Technology of China; M.S., Texas A&M University Co{Chairs of Advisory Committee: Dr. Marlan O. Scully Dr. M. Suhail Zubairy This work is devoted to the study of the quantum coherent e®ects in diatomic molecu- lar systems by using high resolution laser spectroscopy. In particular, we have studied the rubidium diatomic molecular gaseous medium's absorption spectrum with high resolution single mode laser spectroscopy. The derived electronic and rotational vi- brational constants were used in the backward Raman ampli¯cation experiment of Rb diatomic molecule. Both experimental results and theoretical calculation con- ¯rms that there is strong backward directionally dependent radiation. This e®ect can further be utilized in remote detection of chemical material. -
Detection of Some Elements in Sand (Reddish Orange and Black) By
Sudan University of Science and Technology College of Graduate Studies Detection of Some Elements in Sand (Reddish Orange and Black) by Using X-Ray Fluorescence Device الكشف عن بعض العناصر في الرمل )البرتقالي المحمر واﻷسود( بإستخدام جهاز اﻷشعة السينية المتوهجة Thesis submitted in partial fulfillment for requirement of the degree of master in physics By Ghada Osman khalf Allah Ahmed Supervisor Dr. Rawia Abdelgani Eobaid Mohammed January 2020 1 اﻵية ﭧﭐﭨﭐ ﱡﭐ ﲻ ﲼ ﲾﲽ ﲿ ﳀ ﳁ ﳂ ﳃ ﳄ ﳅ ﳆ ﳇ ﳈ ﳉ ﳊ ﱠ صدق اهلل العظيم سورة اﻹسراء I Dedication To the precious spirit … my mother To my continues supporter … my father To everyone who stood beside me and extended a helping, to my brothers, sisters and friends II Acknowledgement My great Thank and my love to Allah who helps me to prepare this research. I would like to thank the supervisor, Dr. Rawia Abdelgani Alobaid. I offer all Thanks, appreciation and respect to Mr. Mohammed Abdelaziz Mohammed Elhassan for his benevolence and patience. III Abstract This research deals with one of the applications of spectroscopy, which is the detection of some components of sand and the concentrations of these elements using X-ray fluorescence technology and comparison between them. Where sand samples were taken from Bara north Kordofan region (red-orange, black) from surface and depth (30cm, 70cm). It was found that the elements present on the surface of the red-orange sample are: Silicon (Si), Zirconium (Zr), Thorium (Th), Titanium (Ti), and their concentrations respectively (18.5%- 3.1%- 4.8%- 6.2%).