In situ characterization of nanoscale contaminations adsorbed in air using atomic force microscopy Jesús S. Lacasa1, Lisa Almonte1,2 and Jaime Colchero*1 Full Research Paper Open Access Address: Beilstein J. Nanotechnol. 2018, 9, 2925–2935. 1Centro de Investigación en Óptica y Nanofísica (CIOyN), doi:10.3762/bjnano.9.271 Departamento Física, Facultad de Química, Campus Espinardo, Universidad de Murcia, 30100 Murcia, Spain and 2Electrical Received: 05 September 2018 Engineering and Biological Science, University of Notre Dame, Notre Accepted: 01 November 2018 Dame, Indiana 46556, USA Published: 23 November 2018 Email: Associate Editor: J. Frommer Jaime Colchero* -
[email protected] © 2018 Lacasa et al.; licensee Beilstein-Institut. * Corresponding author License and terms: see end of document. Keywords: atomic force microscopy; cantilever; contact potential; electrostatic forces; force spectroscopy; Hamaker constant; Kelvin probe microscopy; surface contamination; tip cleaning; tip–sample interaction; van der Waals interaction Abstract Under ambient conditions, surfaces are rapidly modified and contaminated by absorbance of molecules and a variety of nanoparti- cles that drastically change their chemical and physical properties. The atomic force microscope tip–sample system can be consid- ered a model system for investigating a variety of nanoscale phenomena. In the present work we use atomic force microscopy to directly image nanoscale contamination on surfaces, and to characterize this contamination by using multidimensional spectrosco- py techniques. By acquisition of spectroscopy data as a function of tip–sample voltage and tip–sample distance, we are able to de- termine the contact potential, the Hamaker constant and the effective thickness of the dielectric layer within the tip–sample system.