Auditory P300 and N100 Components As Intermediate Phenotypes for Psychotic Disorder: Familial Liability and Reliability ⇑ Claudia J.P
Clinical Neurophysiology 122 (2011) 1984–1990 Contents lists available at ScienceDirect Clinical Neurophysiology journal homepage: www.elsevier.com/locate/clinph Auditory P300 and N100 components as intermediate phenotypes for psychotic disorder: Familial liability and reliability ⇑ Claudia J.P. Simons a,b, , Anke Sambeth c, Lydia Krabbendam a,e, Stefanie Pfeifer a, Jim van Os a,d, Wim J. Riedel c a Department of Psychiatry and Neuropsychology, Maastricht University, European Graduate School of Neuroscience, SEARCH, P.O. Box 616, 6200 MD Maastricht, The Netherlands b GGzE, Institute of Mental Health Care Eindhoven en de Kempen, P.O. Box 909, 5600 AX Eindhoven, The Netherlands c Department of Neuropsychology and Psychopharmacology, Faculty of Psychology and Neuroscience, Maastricht University, P.O. Box 616, 6200 MD Maastricht, The Netherlands d Visiting Professor of Psychiatric Epidemiology, King’s College London, King’s Health Partners, Department of Psychosis Studies, Institute of Psychiatry, UK e Centre Brain and Learning, Department of Psychology and Education, VU University Amsterdam, van der Boechorststraat 1, 1081 BT Amsterdam, The Netherlands article info highlights Article history: A reliable N100 latency delay was found in unaffected siblings of patients with a psychotic disorder. Accepted 28 February 2011 P300 amplitude and latency were not found to be affected in siblings. Available online 1 April 2011 Short-term test–retest reliability of N100 and P300 components were sound across patients, siblings and controls, with the main exception of N100 latency in patients. Keywords: Electroencephalography Event-related potentials abstract Psychoses Schizophrenia Objective: Abnormalities of the auditory P300 are a robust finding in patients with psychosis. The pur- Test–retest poses of this study were to determine whether patients with a psychotic disorder and their unaffected Relatives siblings show abnormalities in P300 and N100 and to establish test–retest reliabilities for these ERP com- ponents.
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