Signal Integrity Solutions

Find Problems Now, Prevent Problems Next Time A New Perspective on the Design Process

In all evolving technologies, you Agilent is constantly researching hundreds of channels simulta- eventually reach a point where you new ways to assist design engi- neously with a logic analyzer must change your way of thinking to neers and has developed a and eye diagram feature, eye go past a certain level. The methods comprehensive set of tools that scan. An oscilloscope or bit and rules of thumb you have used will keep signal integrity problems error ratio tester (BERT) help under control as you move into characterize jitter. in the past are no longer adequate. higher-speed designs. Instead of To move forward, you must step relying on guessing and the old rules Signal integrity is no longer back and look at the design process of thumb, you can measure critical something to be looked at just from a new perspective. components and create accurate once at the beginning of a project To move to the next level in high-speed models to simulate and verify your when laying out the device or new designs before committing board. Everyone must be aware digital design, with sub-nanosecond them to hardware. Once the hard- of signal integrity and evaluate edge rates and slim design margins, ware is built, you can accurately it throughout the project, and you must add additional problem measure the physical layer to must have the proper tools to solving tools to your trusty toolbox. validate the signal paths prior to accomplish this sometimes The ubiquitous oscilloscope, though installing components. daunting task. The challenging important, requires complementary high-speed digital designs of software and/or instrumentation to When the components are first today’s data rates require careful adequately address today’s difficult installed, you can use pulse use of a wide variety of engineer- signal integrity and jitter issues. generators to test your system ing tools. It is important for with live signals. High-speed designers to learn these new tools scopes and active probes enable effectively to avoid multiple you to see what is going on. Once re-design efforts. the system is running, you can monitor the signal integrity of

2 www.agilent.com/find/si The breadth of tools available from characterize the physical layer also be used to ensure that errors Agilent Technologies enables signal of your design. After you are are within the required range. integrity evaluation throughout the satisfied with the results, you can Finally, when all of the signals entire design process. You can use install components and bring the have been checked, the entire sys- a vector network analyzer (VNA) system up. Capable pulse pattern tem can be tested with Agilent’s or time domain reflectometer generators can provide live signals protocol analyzers and exercisers. (TDR) for device and inter- to stimulate portions of the system You can stress your design with connect characterization. The as you bring it up. For jitter very specific and controllable measurement data is used to characterization, use the histogram worst-case scenarios to give you enhance your model database mode of the oscilloscope or the the confidence that your system so that design simulation will bathtub curve from a BERT. is ready to ship. produce accurate results. For those who do not want to invest When the system is running, you Agilent has the knowledge, tools, in the equipment and expertise can use eye diagrams to validate and methods to help you move to for characterization, Agilent can signal quality. The eye diagram the next level in system perform- provide device characterization can be acquired with a scope ance by addressing all of the signal and modeling services. when you want to see a few integrity issues. You may have to signals, or with a unique, signal look at the signal integrity problem Once the device or board is integrity-aware logic analyzer if from a different perspective, but created, a wide variety of tools you want to check hundreds of with Agilent’s help, you will not from Agilent enable you to signals in a short time. BERTs can be looking at it alone.

DESIGNDESIGN SIMULATIONSIMULATIONDEVICE DEVICE && BOARDBOARDSYSTEM SYSTEM

Link to Model Devices & Prototype Bring-Up System Integration Database Interconnect Characterization Test & Functional Characterization & Validation Validation

PHYSICAL LAYER LINK LAYER

Passive Interconnect Measurements Active Live Signal Measurements IMPEDANCE, CROSSTALK... VOLTAGE, JITTER, BER, TIMING, PACKETS...

Device Characterization and Modelling Services Serial/Parallel BERT Protocol Analyzer & 81133/4 Pulse Pattern Generator Exerciser

Physical Layer Test System 16700 Series Logic System w/Eye Scan & Soft Touch Probes (PLTS) ADS 86100 Infiniium DCA

SPICE/IBIS 54855 6 GHz Infiniium Oscilloscope 86100 PNA with Series TDR VNA InfiniiMax Probing System

Figure 1. Agilent Technologies helps you address signal integrity and jitter issues throughout the entire design process.

www.agilent.com/find/jitter 3 Oscilloscopes and Probes

Prototype Characterization Bring-Up Test

When you suspect a signal As an experienced scope user, you When you are developing even integrity-related problem, the know that your measurements are faster systems that have edge rates first instrument you grab is an only as good as your probing less than 40 ps, you will need a oscilloscope. The scope is the system. And as bandwidth scope with significant bandwidth. best instrument for finding out increases, it’s increasingly The 86100C Infiniium DCA-J what a signal looks like. It will important to ask the question: accepts modules that provide up continue to be an important tool am I measuring my circuit or my to 80-GHz of electrical bandwidth. for understanding signal integrity scope probe? Nothing is more A remote sampling head for the problems, but it is only one of frustrating than chasing down an 86100C allows the user to minimize many tools that are now required. apparent design problem, only to bandwidth loss due to long cables. find that it was caused by an You will need a scope that can inferior scope probe. Testing today’s high-speed serial accurately measure sub 50 ps buses is simplified with application edge rates. The Infiniium 80000 Together, the newest Infiniium software for the Infiniium 80000 Series provides up to 13 GHz scopes and the innovative Series oscilloscopes. Perform mask bandwidth and an intuitive InfiniiMax high-performance testing and characterize serial data Windows® interface that makes probing systems offer an streams that employ embedded it easy to analyze signals and end-to-end measurement system clocks and 8b/10b encoding. get the information you need. It with unmatched performance, Verify compliance to standards can characterize critical signal accuracy and connectivity. such as PCI Express, Serial ATA, parameters, such as setup and InfiniiMax II probes, with up to DVI, and Gigabit Ethernet. hold time violations, edge rates, 13 GHz bandwidth, can measure overshoot, and jitter. differential and single-ended Characterizing jitter is easy using signals. Their flexibility supports the Infiniium 80000 Series real- even the most demanding time oscilloscope or 86100C mechanical access Infiniium DCA-J with the optional requirements without jitter analysis software that sacrificing performance. include histogram, spectrum, and The result is measurements random/deterministic jitter you can trust and better (RJ/DJ) separation capabilities. insight into circuit behavior.

Figure 3. The Agilent 86100 DCA-J is a digital communications analyzer, a wide-bandwidth oscilloscope, a jitter analyzer, and a Figure 2. The Agilent 80000 Series Oscilloscopes and InfiniiMax II time-domain reflectometer. Series probes deliver a high-performance 13 GHz end-to-end measurement system.

4 www.agilent.com/find/si Logic Analysis System

Prototype Characterization Bring-Up Test System Integration & Functional Validation

Hundreds of signal traces moving data along wide data paths at high speeds can present quite a challenge to the high-speed digital designer. The interaction of these hundreds of signal lines keeps signal integrity in the forefront. You must validate the signal integrity of each signal path in order to be fully confident of your design.

The typical method for validating all of the signals is to use a 2- or 4-channel scope and measure eye diagrams. This can take a considerable amount of time and is often deleted from the project as many back-end tests fall victim to sliding schedules. The ideal alternative to making hundreds of Figure 4. View the eye diagrams of many eye-diagram measurements with a channels simultaneously with a logic scope is a novel technology called analyzer and spot sub-nanosecond “eye scan.” problems faster than conventional methods. With eye scan, you can have the same eye-diagram capability in a logic analyzer that you have in your scope, and cover up to 340 loading to preserve your system’s layout issues. With less than channels at a time. Eye scan gives signal integrity. It has an equivalent 0.7 pF capacitive loading, you you a rapid, comprehensive bandwidth of 2.33 GHz when can maintain tight timing margins overview across hundreds of using eye scan. with the soft touch probe signals simultaneously. Eye scan is attached to your board. available in the Agilent 1680/1690 On your next project, use Agilent’s Series standalone logic analyzers innovative, time-saving eye scan and the 16950A, 16760A, 16750 technology for a comprehensive Series, and 16740 Series logic overview of the system’s signal analyzer modules for the 16900 integrity. Immediately spot Series logic analysis systems. If problems and identify the eye scan finds a bad signal and offending signals. Use the time you need more detail, you can you gain to check out signal take a closer look by making a integrity under all conditions. time-correlated measurement between the logic analyzer and an Quality measurements start at the Agilent oscilloscope. probe tips. Agilent’s soft touch probes meet the demand for The Agilent 16760A provides a accuracy and reliability while 1.5-Gb/s state acquisition rate and providing connectorless contact 128-M sample memory depth. It with your device. Available in Figure 5. Agilent’s soft touch probes can acquire differential signals single-ended and differential combine high-density, low loading and with a probing system that versions, the contact approach differential capability into a reliable presents only 0.7-pF capacitive also minimizes multi-layer board space-saving package.

www.agilent.com/find/jitter 5 TDR, VNA, Physical Layer Test System (PLTS)

Devices & Interconnect Characterization

TDR/TDT A TDR combines a sampling oscilloscope with a step generator capable of launching a fast edge into the Device Under Test (DUT). The time, location and magnitude of the reflected wave (TDR) provide an easy to interpret display of impedance discontinuities vs. distance. The transmitted wave (TDT) enables you to measure propagation delay and signal deterioration due to system loss and reflections. Measurement errors due to cables, fixtures and probes can be removed through a calibration technique unique to the Agilent 86100C DCA-J/TDR, called Normalization.

The Agilent 86100C Infiniium High-speed system design starts Measurement-based models DCA-J and 54754A Differential with the physical structure. The increase your confidence by TDR module provide an intuitive extreme data rates on the latest providing real-world data to tool for debug, analysis and model high-speed, differential buses are your time domain or frequency extraction. Excess inductance equivalent to sending microwave domain simulator. and capacitance measurements signals through copper structures. determine the location and First-pass success demands a Process variations, connector magnitude of discontinuities. systematic approach to design wear and silicon aging erode When not in TDR mode, the and validation. Microwave signal integrity margins. The 86100C DCA-J operates as a engineers have addressed similar more accurately you know the wide-bandwidth oscilloscope with design challenges by breaking transmission and reflection over 80 GHz coverage, depending down the system to model each properties of your channel, the upon the module used. component separately, then less design margin is required. together as a complete channel. For resolution of even smaller This successful approach is Two choices are available to discontinuities, Agilent’s 86100C now applied to high-speed design and extract measurement- DCA-J works seamlessly digital design. based models with either a Time with Picosecond Pulse Lab’s Domain Reflectometer (TDR) or a Source Enhancement Module. Accurate simulations require 4-port Vector Network Analyzer Measurements can be performed accurate component models. You (VNA). Each have unique for single-ended and differential can modify existing models or advantages and both produce measurements with edge speeds rely on supplied libraries but the similar results. TDRs are more under 10 ps and resolutions at a most accurate method is to affordable and familiar while fraction of a millimeter. This measure actual components. VNAs produce more accurate and solution also works well with traceable results. Agilent-developed normalization techniques.

6 www.agilent.com/find/si 4-Port Vector Network Analyzer (VNA) Physical Layer Test System (PLTS) parameters, as well as mode conversion analysis, which is A VNA uses stimulus/response The Agilent PLTS provides used to understand EMI. Both to characterize the DUT. A sine confidence in your design through Serial ATA and PCI Express have wave is transmitted into the complete characterization and adopted the S parameter DUT while tuned receivers are model extraction of your DUT. DD21 (input differential insertion loss) swept in lockstep, providing PLTS supports both the TDR and as a required measurement to both reflection and transmission VNA measurement platforms, ensure channel compliance. This properties. VNAs offer greater providing instrument control parameter indicates the quality of measurement resolution and including setup, error correction, the high-speed serial channel (see accuracy than a TDR through acquisition and data transfer — Figure 8). calibration and fixture removal thus reducing the difficult and techniques that have been refined time-consuming process of Guided setup and calibration through years of demanding measuring differential structures methodologies ensure that the microwave applications. VNA to a few keystrokes and reducing data you capture accurately results are calibrated using the chance of error. reflects your DUT. Export VNA frequency domain artifacts — or TDR data to simulators that each measurement is accurate, Many high data rate standards accept S-parameters, such as repeatable and traceable to require characterizing input Agilent’s Advanced Design System industry standards. differential insertion loss, return (ADS). loss, impedance and near/far end VNA measurements are often crosstalk. PLTS provides direct expressed as Scattering measurement of these Parameters (or S-Parameters) that can be translated into time- domain views. S-Parameters are S- Time well established as the best Parameters Domain Data technique to characterize the Agilent N 1900 Series manner in which a component Physical Layer Test System (PLTS) modifies a digital signal.

Agilent PNA Series Agilent 86100 DCA Vector Network Time Domain Analyzers Reflectometer Figure 7. The Agilent PLTS system enables you Device to control, measure and Under Test compare data from both TDR and VNAs.

0

Figure 8. The proposed

(dB) SDD21 compliance mask Figure 6. Gather accurate measurements for model for the Channel Electrical

DD21 ISI Loss > 4 dB extractions and comprehensive physical-layer S Interface (CEI) working characterizations with the Agilent 86100C -11.4 group for the Optical DCA-J/TDR, PNA Series VNA, and PLTS system. Sample Compliance Interconnect Internetworking Forum -15 312.5 MHz 1.5625 GHz 3.125 GHz (OIF).

www.agilent.com/find/jitter 7 Pulse Pattern Generator

Prototype Characterization Bring-Up Test

Figure 9. The Agilent 81133/4 pulse pattern generator enables the precise characterization of devices and minimizes the influence of jitter injection by the source with superior signal performance up to 3.35 GHz.

While bringing a system up, it validating high-speed clock sys- input allows you to add jitter to is often necessary to stimulate a tems. The graphical user interface the clock or data signals. The eye portion of the system before the enables you to easily set up very can be distorted with the variable entire system is running. A pulse/ complex signals. From generating crossover function. pattern generator can provide PRBS to adding jitter to your the stimulus signals used by a clock or data, the 81134A gives Other features include LVDS levels scope to make eye diagrams. The you the required signals. and a remote graphical user inter- generator must also allow you to face and SCPI commands for stress the system by adding control- With the capability of easily remote handling and programming. lable jitter to the stimulus signal. uploading any data pattern up to 12 Mbit, a real life data pattern The 81134A pulse pattern generator is easily created. is a high-performance and easy-to- use pulse and data-pattern source The fast rise times, low jitter, and for characterizing the physical full parameter flexibility provide layer as well as verifying and just the signal you need, especially in high-speed systems where timing is critical. Performance can be evaluated with eye-diagram measurements with PRBS from 2 5-1 to 2 31 -1. The delay control

8 www.agilent.com/find/si ADS, Serial/Parallel BERT, Protocol Analyzers

Link to Model Database Devices and Interconnect Characterization Prototype Characterization Bring-Up Test System Integration & Functional Validation

Other tools that supplement for detailed insight Agilent’s broad coverage of signal for design verification integrity include ADS software that includes Spectral for simulation, BERTs for Jitter Decomposition, determining bit error ratios, and BERT scan including protocol analyzers and exercisers RJ/DJ separation, Fast for full system stress and test. Eye Mask, Output Level, Q-factor and The Advanced Design System Eye Contour (ADS) software from Agilent Figure 10. BER Scan includes measurements. For EEsof EDA provides the design RJ/DJ separation. jitter tolerance testing the BERT environment, models, and pattern generators can inject jitter simulation technologies you need into the device under test. to design sub-nanosecond circuits the system, you can verify that and interconnects. ADS has a wide your system has an error ratio Once you know that the system range of simulation tools and that is low enough to meet your transfers data properly, you can use libraries, including a multilayer design goals. Serial BERTs are protocol analyzers and exercisers interconnect library that enables ideal for characterizing single-lane to verify the entire system. These you to accurately model and transceiver ports, while multi-port instruments enable you not only to analyze high-speed interconnect protocols or serializer or debug and validate your system, problems before your design deserializer can be verified with but also to stress the system with is fabricated. This can be Parallel BERTs. All Agilent worst-case traffic in a controlled accomplished with the built-in high-performance BERTs offer a and repeatable fashion in a libraries, an electromagnetic comprehensive measurement suite realistic system-level environment. planar simulator, or measured data supplied by the PLTS, VNA or a TDR.

This tool also allows you to simulate differential S-parameters, eye patterns, noise, jitter, group delay, skew, ground bounce, via inductance, and coupling effects all on a common platform for greater productivity.

Bit error ratio testers (BERTs) enable you to accurately characterize the data quality of your system under various timing and level conditions. By generating a known pattern of data, sending it through your system, and then Figure 11. Quality simulations from ADS EDA software accurately track comparing it to the data leaving real-world measurements.

www.agilent.com/find/jitter 9 Device Characterization and Modeling Services (available in North America only)

Link to Model Database Devices and Interconnect Characterization

Not only does Agilent provide you with the tools and training neces- sary to make the measurements you need, Agilent also provides a signal integrity measurement service that gives you the signal integrity data you need. This service can provide impedance characterization of high-speed interconnects and accurate models for your simulations. Crosstalk, reflected and transmitted losses can be measured. Lossy trans- mission line models can be derived from measurements that enable designers to accurately predict not only interconnect-induced ringing and reflections, but also amplitude loss, jitter, eye-diagram degradation, and crosstalk.

A qualified Agilent engineer, using the appropriate equipment, can make the following measurements at your site or in an Agilent lab: • High-speed interconnect imped- ance measurements • SPICE model generation and validation from actual measure- ments of printed and flexible circuit boards, cables, cable assemblies, and connectors • Frequency-dependent loss modeling, insertion, and return- loss analysis

This is a complete service that alleviates the need for you to purchase the necessary equipment and software and to acquire the expertise to make such measure- ments. This requires you to provide only the components, prototypes, or test fixtures to be used in the measurement.

For more information about Agilent’s professional engineering services (available in North America only), log onto www.agilent.com/find/si-services.

10 www.agilent.com/find/si Signal Integrity Channel Partners

Channel Partner Offering(s) / Capabilities

Model ExtractionElectronic Enclosure/Mechanical& DesignVerificationModeling/SimulationJitter CharacterizationDesignOperational ToolsProbing Characterization/Simulation ProductsFixtures/FixturingSI Education & Training Partner for Success Bogatin Enterprises, LLC X www.bethesignal.com Agilent Channel Partners are industry experts with world- Cascade Microtech, Inc. X renowned expertise in Signal www.cascademicrotech.com Integrity. Their experience FuturePlus Systems XX combined with Agilent measure- www.futureplus.com ment tools can enable you to address both your technical and GigaTest Labs XX XXX business constraints, providing www.gigatest.com what is needed to keep your Inter-Continental Microwave X high-speed digital products on www.icmicrowave.com the competitive “leading edge”. MicroTest X www.microtst.org See table on the right for more detail about Agilent’s Northeast Systems Associates XXX XX X Channel Partners. www.nesa.com

Related Literature 86100C Agilent Infiniium DCA-J Color Brochure 5988-5235EN Infiniium 80000 Series Oscilloscopes & Data Sheet 5989-1487EN InfiniiMax II Probes 16900 Series Logic Analysis Systems Color Brochure 5989-0420EN Soft Touch Connectorless Photo Card 5988-8128EN Logic Analyzer Probes 81133 and 81134 3.35 GHz Data Sheet 5988-5549EN Pulse Pattern Generators Serial/Parallel BERTs Color Brochure 5988-9514EN Physical Layer Test Systems (PLTS) Product Overview 5988-5288EN EEsof EDA Color Brochure 5988-3326EN Jitter Solutions for Telecom, Enterprise, and Digital Designs Color Brochure 5988-9592EN The Many Faces of Digital Jitter Color Poster 5989-0830EN

www.agilent.com/find/jitter 11 www.agilent.com

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