Nanophotonics Enhanced Coverslip for Phase Imaging in Biology Lukas Wesemann1,2, Jon Rickett1, Jingchao Song1, Jieqiong Lou1, Elizabeth Hinde1, Timothy J
Total Page:16
File Type:pdf, Size:1020Kb
Wesemann et al. Light: Science & Applications (2021) 10:98 Official journal of the CIOMP 2047-7538 https://doi.org/10.1038/s41377-021-00540-7 www.nature.com/lsa LETTER Open Access Nanophotonics enhanced coverslip for phase imaging in biology Lukas Wesemann1,2, Jon Rickett1, Jingchao Song1, Jieqiong Lou1, Elizabeth Hinde1, Timothy J. Davis1 and Ann Roberts 1,2 Abstract The ability to visualise transparent objects such as live cells is central to understanding biological processes. Here we experimentally demonstrate a novel nanostructured coverslip that converts phase information to high-contrast intensity images. This compact device enables real-time, all-optical generation of pseudo three-dimensional images of phase objects on transmission. We show that by placing unstained human cancer cells on the device, the internal structure within the cells can be clearly seen. Our research demonstrates the significant potential of nanophotonic devices for integration into compact imaging and medical diagnostic devices. Introduction Theinventionofthephase-contrastmicroscopebyFrits Phase-contrast microscopy has had a profound impact on Zernike14 earned him the Nobel Prize for Physics in 1953. biology, enabling weakly absorbing microscopic organisms The invention came from Zernike’sanalysisofthephase to be observed without staining or fixing1. Recently, profile of light that he describesasasumofplanewaves fi 15 1234567890():,; 1234567890():,; 1234567890():,; 1234567890():,; nanostructured thin- lm devices have been developed with travelling in different directions . The absence of intensity the potential to replace the bulky optics used in traditional contrast results from an ideal convolution of all the plane phase-contrast microscopes. These devices perform mathe- wave components, such that a perturbation to any one of matical operations on wavefields, such as first- and second- them disrupts the convolution creating contrast. The same – order differentiation2 4, and have been used to enhance the concept underpins X-ray phase-contrast imaging with dif- – edges of features in optical amplitude and phase images5 13. fracting crystals that modify the components of the incident – Unlike edge-detection that is easily performed digitally, wave according to their angles of incidence16 18. Similarly, phase visualisation requires processing prior to or at the phase contrast arises on wave propagation far from a phase point of measurement. Here we demonstrate a thin-film object where the propagating wave components experience device, a nanophotonics enhanced coverslip (NEC), that different phase shifts and interfere19, an effect exploited in – generates high-contrast images of pure phase objects on the transport of intensity method20 23. More generally, the transmission. We discuss the underlying principle and phase-contrast mechanism spatially filters the light in an demonstrate the device experimentally by imaging the optical system and can be described by an optical transfer internal structure of human cancer cells (HeLa). Our work function24. highlights the potential of nanophotonic devices in highly The optical transfer function (OTF), which maps the compact phase-imaging systems. incident light field to the transmitted light, can be used to understand how a nanophotonic device can create phase 25 contrast . Consider a simple one-dimensional OTF MðkxÞ that depends on the projection kx of the incident wavevector Correspondence: Lukas Wesemann ([email protected])or across the surface of the device. A pure phase wavefield E(x, ϕ Ann Roberts ([email protected]) z = 0) = ei (x) incident on the surface at z = 0isexpanded 1School of Physics, University of Melbourne, Melbourne, VIC 3010, Australia R ikxx 2ARC Centre of Excellence for Transformative Meta-Optical Systems, School of as a sum of plane waves Eðx; 0Þ¼ aðkxÞe dkx.The Physics, University of Melbourne, Melbourne, VIC 3010, Australia © The Author(s) 2021 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a linktotheCreativeCommons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/. Wesemann et al. Light: Science & Applications (2021) 10:98 Page 2 of 6 ϕ intensity of this wave I(x,0) = |ei (x)|2 = 1showsnocontrast. interference and inhibiting transmission. Changing the ThenanophotonicdevicemodiR fiesthewaveinFourierspace incidence angle alters the phase relationship between the ikxx according to Emðx; 0Þ¼ aðkxÞMðkxÞe dkx.Closeto beams leading to incomplete cancellation of the transmitted = kx 0 it is alwaysP possible to expand the OTF in a power light. In this way, the device blocks the unscattered light Mð Þ¼ 1 n series kx n¼0 mnkx .Thetermm0 multiplies that from a sample but progressively transmits all other com- part of the wave unperturbed by the sample whereas the ponents as their incidence angles, or equivalently their fi term m1 linear in kx ÂÃrepresents theR rst derivative spatial frequencies, increase. iϕðxÞ ikxx of the phase profile, d e =dx ¼ ikxaðkxÞe dkx ¼ We fabricated the NEC with the geometry in Fig. 1b, using iϕðxÞ ie dϕðxÞ=dx.Whenmn = 0foralln ≠ 1theintensity electron beam lithography (see ‘Methods’ section) and I = |dϕ(x)/dx|2 exhibits phase contrast proportional to characterised its response numerically and experimentally. phase gradients in the wavefield. In this way, a spatial- The grating was overcoated with PMMA to inhibit oxidation frequency filter converts phase differences into intensity and to avoid contamination by the sample. The waveguide contrast. Likewise, higher-order terms in kx lead to combi- thicknessissuchthatitsupportsonlythefundamental nations of higher-order phase derivatives that also yield waveguidemode.Theoperationofthedevicewasmodelled contrast.ThisissimilartoZernike’s method in whichpffiffiffiffiffiffiffi the using the finite element method (FEM) in COMSOL Mul- filtering property is such that m0 = 1andmn ¼ i ¼ À1 tiphysics that includes the polarisation dependence. The for n > 0 that shifts the phase of the diffracted wave by 90°15. optical properties for silver were taken from Johnson and 27 Christy and the refractive index of a TiO2 thin-film similar Results to that used in the waveguide layer was measured experi- Our nanophotonic device exploits the contrast-forming mentally yielding a value nwg = 2.25 at λ = 633 nm. The properties of spatial-frequency filters to reject the calculated electric field distribution for normally incident unscattered wave components from a sample but transmit light polarised parallel to the stripes (Fig. 1b) shows the those components with non-zero phase gradients. Sensi- standing waveguide mode and no transmission. The spec- tivity to propagation direction is achieved with a buried trum (Fig. 1c) has a broad resonance at λ = 650 nm where waveguide that samples and interferes each wavefront transmission is inhibited. At this wavelength, the OTF over a large distance across the surface (Fig. 1a). (Fig. 1d) also shows that normally incident light is blocked Light is coupled into and out of the waveguide by a dif- but that the intensity of light transmitted increases with fraction grating, composed of metal stripes, where the increasing spatial-frequency kx across the surface for s- grating is diffracting into only the higher refractive index of polarisation, as required for phase-contrast imaging. In the waveguide layer26. Light incident between the stripes is addition, the device exhibits a phase transfer function that diffracted into three beams—a zero-order diffracted beam varies within a limited range of approximately π/2, which is (n = 0) that propagates in the incident direction and two important to avoid artefacts in processed images. Here we first-order beams (n = ±1)trappedinthewaveguide.On focus our discussion on s-polarised illumination, where the reaching the metal stripes, the n = ±1 beams reflect with a device exhibits stronger angular sensitivity than for p- π phase shift and diffract to reform the original zero-order polarisation. High-pass spatial-frequency filtering using this beam. This reformed beam propagates in parallel with the device is also reproduced by the simple model in the Sup- incident light but out of phase, resulting in destructive plementary Information, which supports our understanding. abcz d 1 1 1 1 PMMA p Ag t2 2 0.8 0.8 0.8 0.5 d k TiO2 t1 NEC 0.6 0.6 0.6 rad] kz SiO2 0 x incident light Emax 0.4 0.4 abs(t) 0.4 Reflectance kx –0.5 arg(t) [ y Ag Ag Ag Ag Z Ey Transmittance |t| 0.2 0.2 0.2 Y 0 0 –1 E 0 X min 610 620 630 640 650 660 670 680 –0.1 –0.05 0 0.05 0.1 [nm] kx/k0 Fig. 1 The nanophotonics enhanced coverslip (NEC) and simulations of its performance. a A sketch of the NEC showing the geometry and the incident wave vectors. b A cross-section used in a FEM simulation and the calculated electric field distribution (ŷ component) for normally incident light at a wavelength λ = 650 nm, showing the standing wave induced in the waveguide. The design parameters are t1 = 100 nm, t2 = 40 m, d = 200 nm and p = 400 nm. c The calculated frequency response for transmission and reflection of normally incident light identifying the resonance at λ = 650 nm. d The calculated complex optical transfer function for s-polarised light Mðkx Þ at the resonance wavelength λ = 650 nm, expressed as a modulation transfer function jjMðkxÞ and a phase transfer function arg Mðkx Þ Wesemann et al. Light: Science & Applications (2021) 10:98 Page 3 of 6 Input 1 1 a LP c d b 0.9 ky=0 0.8 0.8 1 2 | | ) ) x 0.7 x =0 x H(k H(k 0.6 0.6 | k | y-pol NA=0.4 y NEC 0.5 0.4 0.4 Norm.