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Schedule of JEOL Posters and Papers at M&M 2013

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Schedule of JEOL Posters and Papers at M&M 2013 Schedule of JEOL Posters and Papers at M&M 2013 MONDAY 2:00 PM 37 A Look at Platinum Prints Using Variable Pressure/Environmental High Resolution Scanning Electron Microscopy ‐VP HR SEM; P Ravines; University at Buffalo; N Erdman; JEOL USA; R McElroy; Archive Studio ROOM 239 2:45 PM 10 Determination of Aberration Center of STEM Ronchigram for Fully Automated Aberration Correctors; T Sannomiya; Tokyo Institute of Technology; H Sawada, T Nakamichi, F Hosokawa; JEOL; Y Nakamura, Y Tanishiro, K Takayanagi; Tokyo Institute of Technology ROOM 240 3:00 PM 80 Strain Analysis of Semiconductor Device by Moiré Fringes in STEM Image; N Endo, Y Kondo; JEOL Ltd Poster # 26 3:00 PM 105 Development of a New High Throughput 120 kV‐TEM; Y Ikeda, T Kaneko, K Ichikawa, Y Tuzuku, K Tanaka, G Utsuno, T Naganuma, C Hamamoto; JEOL Ltd Poster # 51 TUESDAY 8:30 AM 159 (Invited) The Design and Performance of a Double Wien Filter Monochromator for Application in TEM; A Kirkland, J Warner, JS Kim, P Nellist; Oxford University; M Mukai, H Sawada, T Kaneyama, K Omoto, A Kimura, A Ikeda, J Zhou; JEOL Ltd ROOM 240 11:00 AM 257 (Invited) Measurement strategies for Quantification of Carbon in Steel using EPMA; PT Pinard, A Aretz; RWTH Aachen University; J Börder; JEOL Germany GmbH; J Donovan; University of Oregon; S Richter; RWTH Aachen University ROOM 244 2:30 PM 318 Bridging the Gap between EPMA and AEM: The Performance of High Resolution Field‐Emission Electron Microprobes in the Analysis of Geological Materials; JT Armstrong; Carnegie Institution of Washington; P McSwiggen; McSwiggen and Associates; C Nielsen; JEOL USA ROOM 244 3:00 PM 361 Development of a new type of thin film phase plate and its application for in situ observation; H Minoda, A Yada, Y Kawana; Tokyo University of Agriculture and Technology; H Iijima, Y Konyuuba; JEOL Poster # 113 3:00 PM 405 Construction of a SXES spectrometer for a conventional SEM; M Terauchi, S Koshiya, F Satoh; IMRAM, Tohoku Univ; H Takahashi, N Handa, T Murano; JEOL Ltd; M Koike, T Imazono; Quantum Beam Sciences, Japan Atomic Energy Agency; M Koeda, T Nagano, H Sasai, Y Oue, Z Yonezawa, S Kuramoto; SHIMADZU Corp Poster # 157 3:00 PM 420 Trace Element Analysis of Sulfur in a Japanese Sword; N Mori, R Kamiyama; JEOL Ltd; T Tanaka; National Institite for Materials Science, Japan; P McSwiggen; McSwiggen & Associates; H Onoders; JEOL Ltd; C Nielsen; JEOL USA Poster # 172 WEDNESDAY 8:30 AM 494 Ultra High Energy Resolution EELS Map Employing an Aberration‐corrected STEM Equipped with a Monochromator; M Mukai, E Okunishi, M Ashino, K Omoto, T Fukuda, A Ikeda, K Somehara, T Kaneyama; JEOL Ltd, Japan; T Saitoh, T Hirayama; Japan Fine Ceramics Center, Japan; Y Ikuhara; University of Tokyo, Japan ROOM 208 9:15 AM 500 (Invited) Low‐Voltage TEM/STEM for Atomic Resolution Imaging and Spectroscopy; K Suenaga; National Institute of Advanced Industrial Science, Japan; T Sasaki, H Sawada; JEOL, Ltd ROOM 240 9:00 AM 502 (Invited) Chemical State Mapping via Soft X‐rays using a Wavelength Dispersive Soft X‐ray Emission Spectrometer with High Energy Resolution; H Takahashi, N Handa, T Murano; JEOL Ltd; M Terauchi; Tohoku University, Japan; M Koike, T Imazono, N Hasegawa; Japan Atomic Energy Agency; M Koeda, T Nagano, H Sasai, Y Oue, Z Yonezawa, S Kuramoto; Shimadzu Corp ROOM 244 2:15 PM 617 Towards Sub‐Angström Ptychographic Diffractive Imaging; P Wang; Nanjing University; DJ Batey, JM Rodenburg; University of Sheffield; H Sawada; JEOL Ltd; AI Kirkland; University of Oxford ROOM 245 2:15 PM 641 Analytical Electron microscopy Investigation of Au/TiO2 Thin Films Deposited on the Glass Substrate; M Kawasaki; JEOL USA Inc; M‐J Chen, J‐R Yang; National Taiwan University; W‐A Chiou; University of Maryland; M Shiojiri; Kyoto Institute of Technology ROOM 206‐207 3:00 PM 702 EBSD Analysis of Materials Utilizing High Temperature Protochips Aduro System in FE‐SEM; N Erdman, M Shibata; JEOL USA Inc; D Gardiner, B Jacobs; Protochips Poster # 258 THURSDAY 10:00 AM 820 The Atmospheric Scanning Electron Microscope (ASEM) Observes the Critical Moment of Platelet Generation from Megakaryocytes in Solution; C Sato; National Institute of Advanced Industrial Science and Technology, Japan; H Nishiyama; JEOL, Ltd, Japan; Y Maruyama, T Ebihara; National Institute of Advanced Industrial Science and Technology, Japan; M Suga; JEOL, Ltd, Japan; M Yamamoto, H Motohashi; Tohoku University, Japan Poster # 316 4:45 PM 1019 Structural Analysis of Sulfonated Mesoporous Silica; T Maki; JEOL Ltd, Japan; Y Tominaga; Tokyo University of Agriculture and Technology, Japan ROOM 206‐207 .
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