Signal Generation & Analysis

Total Page:16

File Type:pdf, Size:1020Kb

Signal Generation & Analysis SPECIAL ADVERTISING SECTION ® TECHNOLOGY LEADER SERIES Signal Generation & Analysis for W-i-d-e-b-a-n-d Aerospace/Defense Systems Choosing the right broadband measurement solution for your application The ever evolving need for improved radar resolution, high data rate of the unique test instrumentation communications, and robust interference immune reception is the driv- that is available to address the spe- ing force behind the increase in wide bandwidth signals used in modern cial needs of advanced aerospace/ Electronic Warfare (EW), MILitary COMmunications (MILCOMS), ELec- defense applications. tronic INTelligence (ELINT), and Direction Finding (DF) systems. New Architectures to Meet Finding instrumentation to and with the current state-of-the-art, the Challenge test these ever evolving wideband the wideband signal being generated Historically, these wideband test aerospace/defense systems can be a or analyzed may be in a digital form signal demands have required complex, challenge. Many of these advanced rather than an analog form. As signal custom-built test instrumentation. wideband systems are coherent multi- bandwidth exceeds 200 MHz, finding Agilent now offers test equipment channel designs, employing phased effective test equipment solutions for architectures with the features and array antennas that require multi-port today’s advanced RF system becomes interconnection ports needed to enable test capability. Both wideband signal increasingly difficult. advanced wideband multi-port micro- generation and analysis are needed, In this article, we look at some wave signal generation and analysis. Phased array Arbitrary Base-band I-Q modulation Performance waveform RF Out #N signal generator generator Arbitrary Base-band I-Q modulation 10MHz waveform Performance RF Out #2 ref. generator signal generator (N8241A) (E8267D) Distribution amplifier (Z5623AK08) Sync. Clock trigger Arbitrary Performance RF Out #1 waveform Base-band I-Q modulation signal generator MXI-4 generator (E8267D) (N8241A) LAN Phase coherent RF Out #1 Personal computer RF Out #2 Phase ajustable Figure 1: The Z2090B system can produce multiple modulated signal outputs that are phase coherent with precisely synchronized modulation patterns. This allows simulation of the spatial relationships of an arriving wave-front arriving at multiple antennas. TECHNOLOGY LEADER SERIES TECHNOLOGY LEADER SERIES To illustrate, let’s explore some of the specific test and analysis solutions Base-band I-Q beginning with signal generation. Arbitrary modulation 10MHz Performance waveform RF Out #2 ref. signal Wideband Signal Source Solutions generator generator N8241A Agilent’s Z2090B wideband signal ( ) (E8267D) source solution utilizes the low phase noise E8267D Performance Signal Generator (PSG) and the high-resolu- Sync. Clock tion N8241A arbitrary waveform trigger Performance generator. The unique N8241A leads Arbitrary Base-band I-Q signal RF Out #1 the industry with an amazing 15 bits waveform modulation MXI-4 generator of amplitude resolution at sample generator (E8267D) rates of 1.25 GS/s. (N8241A) Working together, the 44 GHz PSG LAN and high dynamic range N8241A arbitrary waveform generator deliver superb performance for a number of Personal difficult wideband applications. computer Phased Array & DF Testing Agile phased array antennas Figure 2: To generate entire spectral environments multiple N8241A arbitrary dominate new designs, many of which waveform generators can be up-converted to different frequency bands with the operate over wide bandwidths. Test- E8276D performance signal generators. ing the agile array’s ability to track a target hundreds of miles away often challenges of Phased Arrays and DF ing of modulated waveforms. requires a challenging test stimulus equipment. Architectural intercon- Phase offsets between multiple that is precisely phased across mul- nections have been provided to allow phase coherent signals from the 44 tiple channels to simulate an arriving multiple PSGs to be modulated with GHz E8267Ds are implemented using wave-front. multiple N8241A arbitrary waveform digitally synthesized modulation. This Similarly, some intelligence receiv- generators. The modulated outputs allows synthesis of complex signals ers use multiple phase coherent receiv- of the PSGs can then be connected to arriving at antenna ports with the ers to determine the bearing angle to a phase coherent array. This arrange- proper delays to simulate an arriving the signal emitter. ment can synthesize signal band- wave front. Testing these systems is difficult. widths up to 1 GHz from flexible Their wideband designs require pre- digital files defined in Agilent’s Signal Broadband EW Spectral Environments Bandwidth requirements for mili- As signal bandwidth exceeds 200 tary communications have also grown MHz, finding effective test equipment solutions over the years as systems move from for today’s advanced RF system becomes in- voice to bandwidth hungry high-reso- lution video. creasingly difficult. Aerospace/defense systems typi- cally function in complex RF spectral cisely phased signal inputs at multiple Studio modulation synthesis tool. environments, with jammers and input ports to simulate the spatial The Agilent Z5623A distribu- interferers that utilize many octaves of relationships of various emitters. tion amplifier, along with a common bandwidth. Compounding the growth Field-testing multi-port electronic 10 MHz reference locks the signal in data rate, many communications systems is often cost prohibitive as generators together to create a totally systems have gone to spread spectrum well, requiring expensive configura- phase coherent set of signal outputs. signals that frequency hop over huge tions of multiple airborne or surface The system further enables full bandwidths to reduce the probability assets spaced hundreds of miles apart. control over time, phase, ampli- of intercept and improve performance Responding to this demand, the tude and frequency. Synchronizing in messy signal environments. Agilent Z2090B system architecture the arbitrary waveform generator Generating gigahertz of spectral is uniquely capable of addressing the clocks together, allows precise tim- environment to test the robustness of TECHNOLOGY LEADER SERIES these data links can require extreme ity, coherency and the like, all present made. These unique capabilities are bandwidth capability. measurement challenges. ideal for comparing the phase differ- When confronted with the need For this reason, Agilent offers a ences between two different wideband to generate such a test environ- variety of signal analysis options for receiver channels. ment, multiple PSGs modulated with broadband system analysis and test. The VSA 90000A's unique wide- N8241A arbitrary waveform gen- band two-port measurement capabil- erators can be offset in frequency to Coherent Receiver Array ity makes it an effective measurement provide continuous signal bandwidths Measurements solution for advanced wideband greater than the 1 GHz available with Whether comparing the phase of multi-channel systems. a single PSG and N8241A system. arrival of two complex modulations For example, five PSGs and to resolve a bearing angle or charac- Software Defined Radios N8241As can generate up to 5 GHz terizing the spectral shape of an Ultra When considering broadband of spectrum to test a broad range of Wide Band (UWB) signal, the Infini- signal measurement capability, spectral situations. ium Oscilloscope offers a tremendous logic analyzers may not immedi- Furthermore, the N8241A's su- variety of wideband measurements. ately come to mind; however, with perior sequencing ability allows it to Agilent’s Infiniium 90000A series the ubiquitous trend to implement create complex signals using sequenc- oscilloscopes sample at rates up to 40 greater portions of complex systems ing of short repetitive signal snippets GS/s, providing analysis bandwidths in software defined hardware with without massive amounts of signal up to 13 GHz wide. Furthermore, ultra fast FPGA digital processing, memory. This important feature en- ables long or continuous play of wide bandwidth spectral environments, Field-testing multi-port electronic sys- without Tera bytes of high-speed tems is often cost prohibitive as well, requiring waveform storage memory. expensive configurations of multiple airborne or In addition, the N8241A incor- porates a built-in Direct Digital surface assets spaced hundreds of miles apart. Synthesis (DDS) feature that expands simulation capabilities without using the 90000A has the industry’s lowest increasingly the wideband signal is additional memory. noise floor, best phase noise per- digital rather than analog. The Z2090B can also be config- formance and the flattest frequency The Agilent analysis product line is ured to playback wideband signal response. unique in that the 89600A VSA soft- recordings taken from the field. These superior performance traits ware is available on a variety of hard- MILCOM engineers can employ the allow the multi-channel Infiniium ware platforms. Spectrum analyzers, Z2090B to analyze system responses oscilloscope to capture ultra narrow oscilloscopes and logic analyzers can to multi-path, interference and more, time domain events and conduct RF all host this powerful analysis tool. using either recorded or synthesized modulation analysis. The Agilent 16800 series logic ana- signals. The ‘VSA 90000A Ultra Wideband lyzers, for example, support measure- Advanced tools, like Signal Studio Signal Analyzer,’ bundles
Recommended publications
  • Spectrum Analyzer
    Test & Measurement Product Catalog 版权所有 仿冒必究 V01-15 Contents Digital Oscilloscope 3 DS6000 Series Digital Oscilloscope 4 MSO/DS4000 Series Digital Oscilloscope 6 DS4000E Series Digital Oscilloscope 8 MSO/DS2000A Series Digital Oscilloscope 10 MSO/DS1000Z Series Digital Oscilloscope 12 DS1000B Series Digital Oscilloscope 14 DS1000D/E Series Digital Oscilloscope 14 Bus Analysis Guide 16 Power Measurement and Analysis 16 Current & Active Probes 17 Probes & Accessories Guide 18 Spectrum Analyzer 19 DSA800/E Series Spectrum Analyzer 20 DSA700 Series Spectrum Analyzer 22 DSA1000/A Series Spectrum Analyzer 24 EMI Test System(S1210) 25 NFP-3 Near Field Probes 25 Common RF Accessories 26 RF Accessories Selection Guide 27 RF Signal Generator 28 DSG3000 Series RF Signal Generator 29 DSG800 Series RF Signal Generator 31 Function/Arbitrary Waveform Generator 33 DG5000 Series Function/Arbitrary Waveform Generator 34 DG4000 Series Function/Arbitrary Waveform Generator 36 DG1000Z Series Function/Arbitrary Waveform Generator 38 DG1000 Series Function/Arbitrary Waveform Generator 40 Digital Multimeter 41 DM3058 5½ Digits Digital Multimeter 41 DM3058E 5½ Digits Digital Multimeter 41 DM3068 6½ Digits Digital Multimeter 41 Data Acquisition/Switch System 43 M300 Series Data Acquisition/Switch System 43 Programmable DC Power Supply 45 DP800 Series Programmable DC Power Supply 46 DP700 Series Programmable DC Power Supply 48 Programmable DC Electronic Load 50 DL3000 Series Programmable DC Electronic Load 50 2 RIGOL Digital Oscilloscope Digital oscilloscope, an essential electronic equipment for By adopting the innovative technique “UltraVision”, R&D, manufacture and maintenance, is used by electronic DS6000 realizes deeper memory depth, higher waveform engineers to observe various kinds of analog and digital capture rate, real time waveform record and multi-level signals.
    [Show full text]
  • Frequency Domain Measurements: Spectrum Analyzer Or Oscilloscope?
    Keysight Technologies Frequency Domain Measurements: Spectrum Analyzer or Oscilloscope? Selection Guide Changes in test and measurement technologies are blurring the lines between platforms and giving engineers new options Introduction For generations, the rules for RF engineers were simple: frequency-domain measurements (output frequency, band power, signal bandwidth, etc.) were done by a spectrum analyzer, and time domain measurements (pulse width and repetition rate, signal timing, etc.) were done by an oscilloscope. As the digital revolution made signal processing techniques easier and more widespread, the lines between the two platforms began to blur. Oscilloscopes started incorporating Fast Fourier Transform (FFT) techniques that converted the time-domain traces to the frequency domain. Spectrum analyzers began capturing their data in the time domain and using post-processing to generate displays. Still, there were some clear distinctions between the two platforms. For example, oscilloscopes were limited in sample speed. They could see signals down to DC, but only up to a few GHz. Spectrum analyzers could see high into the microwave range, but they missed transient signals as they swept. What if you needed to see a signal in the time domain with a carrier frequency of 40 GHz or capture a complete wideband pulse in X-band? As technologies in EW, radar and communications move ahead, the demands on the test equipment become greater. As more possibilities have opened for RF and microwave equipment because of new digital processing technologies, they have also increased opportunities for test equipment. Spectrum analyzers and oscilloscopes can do much more than they could even a few years ago, and as they expand in capabilities, the lines between them become blurred and sometimes even erased.
    [Show full text]
  • TM 11-5099 D E P a R T M E N T O F T H E a R M Y T E C H N I C a L M a N U a L SPECTRUM ANALYZER AN/UPM-58 This Reprint Inclu
    TM 11-5099 DEPARTMENT OF THE ARMY TECHNICAL MANUAL SPECTRUM ANALYZER AN/UPM-58 This reprint includes all changes in effect at the time of publication; changes 1 through 3. HEADQUARTERS, DEPARTMENT OF THE ARMY MAY 1957 Changes in force: C 1, C 2, and C 3 TM 11-5099 C3 CHANGE HEADQUARTERS DEPARTMENT OF THE ARMY No. 3 } WASHINGTON, D.C., 4 May 1967 SPECTRUM ANALYZER AN/UPM-58 TM 11-5099, 28 May 1957, is changed as follows: Note. The parenthetical reference to previous Report of errors, omissions, and recommendations for changes (example: page 1 of C 2) indicate that pertinent Improving this manual by the individual user is material was published in that change. encouraged. Reports should be submitted .on DA Form Page 2, paragraph 1.1, line 6 (page 1 of C 2). Delete 2028 (Recommended Changes to DA Publications) and "(types 4, 6, 7, 8, and 9)" and substitute: (types 7, 8, and forwarded direct to Commanding General, U.S. Army 9). Paragraph 2c (page 1 of C 2). Delete subparagraph Electronics Command, ATTN: AMSEL-MR-NMP-AD, c and substitute: Fort Monmouth, N.J. 07703. c. Reporting of Equipment Manual Improvements. Page 77. Add section V after section 1V. Section V. DEPOT OVERHAUL STANDARDS 95.1. Applicability of Depot Overhaul Standards requirements for testing this equipment. The tests outlined in this chapter are designed to b. Technical Publications. The technical measure the performance capability of a repaired publication applicable to the equipment to be tested is equipment. Equipment that is to be returned to stock TM 11-5099.
    [Show full text]
  • Fieldfox Handheld Analyzers Configuration Guide
    FieldFox Handheld Analyzers 4/6.5/9/14/18/26.5/32/44/50 GHz This configuration guide describes configurations, options and accessories for the FieldFox A-Series family of portable analyzers. This guide should be used in conjunction with the technical overview and data sheet for a Included accessories complete description of the analyzers. The table on Page 3 titled “FieldFox A-Series Family and Options” shows a comparison of the functions available The following accessories are included with every in the FieldFox A-Series family of analyzers. FieldFox Note: Combination analyzer (combo) = Cable and antenna tester (CAT) + • AC/DC adapter Vector network analyzer (VNA) + Spectrum analyzer (SA) • Battery • Soft carrying case • LAN cable • Quick Reference Guide Find us at www.keysight.com Page 1 Table of Contents FieldFox A-Series Family and Options ......................................................................................................... 3 FieldFox RF and Microwave (Combination) Analyzers ................................................................................. 4 Analyzer models ........................................................................................................................................ 4 Analyzer options ........................................................................................................................................ 5 FieldFox RF and Microwave (Combination) Analyzer FAQs ........................................................................ 7 ERTA System Typical Configuration
    [Show full text]
  • Digital TV Signal Analyzer 1750
    Digital TV signal analyzer 1750 USER MANUAL ©Copyright 2011, Telemann No part of this document may be copied or replaced without the written consent of Telemann Corporation. Any content in this document is subject to change without notice. Table of Contents CHAPTER01.GETTING STARTED 1. FEATURES (1) 1750 enables user to measure the followings 6 (2) Portable digital TV signal analyzer 7 (3) The contents of this manual will describe the care and operation of 1750 7 2. SAFETY INSTRUCTIONS (1) GENERAL 8 (2) CIRCUMSTANCES 8 (3) INSTALLATION 8 (4) BATTERY CHARGE 9 (5) MAINTENANCE 9 3. UNIT OVERVIEW (1) FRONT VIEW 10 (2) BACK VIEW 11 (3) BOTTOM VIEW 11 (4) KEYPAD - EACH BUTTON’S NAME AND FUNCTION. 12 4. PREPARATION & INSTALLATION (1) INSTALLATIONS 14 (2) CHARGING BATTERY 16 (3) CABLE SPECIFICATIONS 17 CHAPTER02. SPECIFICATIONS 1. SIGNAL LEVEL MEASUREMENTS (1) C/N & MER/BER 23 (2) CHANNEL LEVEL 24 (3) CONSTELLATION 26 (4) CTB/CSO 28 (5) ANTENNA FOCUS 29 (6) DATA LOGGER 30 3 Digital TV signal analyzer 1750 2. SPECTRUM MEASUREMENTS (1) CHANNEL SWEEP 34 (2) FREQUENCY SPECTRUM 35 (3) TILT SWEEP 37 (4) REVERSE NOISE 38 (5) UPSTREAM SIGNAL GENERATOR - OPTION 38 3. SCAN (AUTO SEARCH) (1) FEATURES 42 (2) SCAN MODE 42 4. CHANNEL PLAN (1) CHANNEL PLAN 46 (2) CHANNEL CONFIG 47 (3) COMMON OPERATIONS 48 5. SUB-FUNCTIONS (1) COMMON OPERATIONS 52 (2) SUB-FUNCTIONS 57 6. SYSTEM CONFIGURATION (1) LANGUAGE 68 (2) CABLE LOSS 68 (3) AUTO TIMEOUT 68 (4) VIDEO SYNC 69 (5) CONSTELLATION 69 (6) CHANNEL EDIT 69 (7) LCD CONTRAST 69 (8) COMPANY & USER NAME 70 CHAPTER03.
    [Show full text]
  • HP 71400 Lightwave Signal Analyzer Application Note 371
    HP 71400 Lightwave Signal Analyzer Application Note 371 Measuring Modulated Light 2 Table of Contents Page Introduction 3 Chapter I. Generating, Detecting, and Displaying Modulated Light 4 Generating Modulated Light 4 Intensity Modulation Detection and Display 6 Intensity Noise Measurements 8 Relative Intensity Noise 11 Frequency Modulated Light 12 References 16 Chapter II. Using the Lightwave Signal Analyzer 17 System Description 17 Operation 18 Electrical Calibration 18 Connector Cleaning 18 Main Menu 19 User-Defined Menu 19 Operating Modes 20 Lightwave Modes 20 Bypass the Lightwave Input 21 Measurement Example 21 Chapter III. HP 71400C Measurement Examples 24 Modulated Laser Power 25 Detected Electrical Power 26 Low-level Signals 27 Relative Intensity Noise (RIN Lasr) 28 Relative Intensity Noise (RIN SYS) 30 Cable Reflections and Noise 31 Modulation Linearity of Laser Diode 32 Pulsed Laser Modulation Spectrum 33 PRBS Digital Modulation Spectrum 34 Frequency Response and Intensity Noise 35 Frequency Response with Tracking Generator 36 Linewidth of DFB Laser Diode 38 Chirp of a Modulated DFB Laser 40 FM Power Spectrum of a DFB Laser 41 Optical Heterodyne YAG Laser Spectrum 42 Photoreceiver Frequency Response 43 3 Introduction Modern fiber-optic communication systems need to modulate information onto infrared light. This allows propagation through optical fibers with the greatest possible fidelity. The quest for faster information transfer rates and greater propagation distances, as well as the development of microwave-frequency analog-modulated systems, has driven development toward the use of single-mode fibers. These fibers propagate light at wavelengths of 1300 and 1550 nanometers.* The sources and detectors of modulated light are key components in such systems.
    [Show full text]
  • Measurement Procedure and Test Equipment Used
    MOTOROLA INC. FCC ID: ABZ99FT4056 TEST SET-UP PROCEDURES AND TEST EQUIPMENT USED Pursuant to 47 CFR 2.947 Except where otherwise stated, all measurements are made following the Telecommunications Industries Association/Electronic Industries Association (TIA/EIA) “Land Mobile FM or PM Communications Equipment Measurement and Performance Standards” (TIA/EIA-603-A). This exhibit presents a brief summary of how the measurements were made, the required limits, and the test equipment used. The following procedures are presented with this application: 1) Test Equipment List 2) RF Power Output 3) Audio Frequency Response 4) Post Limiter Lowpass Filter Response 5) Modulation Limiting Characteristic 6) Occupied Bandwidth 7) Conducted Spurious Emissions 8) Radiated Spurious Emissions 9) Frequency Stability vs. Temperature and Voltage 10) Transient Frequency Behavior EXHIBIT 7 SHEET 1 OF 6 MOTOROLA INC. FCC ID: ABZ99FT4056 Test Equipment List Pursuant to 47 CFR 2.1033(c) The following test equipment was used to perform the measurements of the submitted data. The calibration of this equipment is performed at regular intervals. Transmitter Frequency: HP 5385A Frequency Counter with High-Stability Reference Temperature Measurement: HP 2804A Quartz Thermometer Transmitter RF Power: HP 435A Power Meter with HP 8482A Power Sensor DC Voltages and Currents: Fluke 8010A Digital Voltmeter Audio Responses: HP 8903B Audio Analyzer Deviation: HP 8901B Modulation Analyzer Transmitter Conducted Spurious and Harmonic Emissions: HP 8566B Spectrum Analyzer with HP 85685A Preselector Transmitter Occupied Bandwidth: HP 8591A Spectrum Analyzer Radiated Spurious and Harmonic Emissions: Radiated Spurious and Harmonic Emissions were performed by: Motorola Plantation OATS (Open Area Test Site) Lab 8000 West Sunrise Blvd.
    [Show full text]
  • Bitscope Micro Tips (DSO)
    jean-claude.feltes@education 1 Bitscope Micro tips (DSO) Understand Act On Touch Parameter settings Parameters can be set by • left clicking in a field and dragging up and down (continuous variation) • right clicking and selecting from a menu The trigger level and the cursors can be set by dragging See more of your curves by widening the display window: Use zoom for the same purpose. The scope window Time base Measured DC or bias Focus time = time / div voltage = time at the display Sampling frequency 200us / div This is weird! center relative to (Sample Rate) trigger point What does VA, VB exactly mean? As described in the manual, it is not clear! (See channel settings and jean-claude.feltes@education 2 appendix) Virtual instruments and Display Format Menu Virtual instruments The dual scope window is selected with the SCOPE button on the right, or the DUAL button. SCOPE: multiple channel oscilloscope DUAL: 2 channel sample linked oscilloscope Does this make any difference for the Bitscope micro? SCOPE: 1 channel activated by default, you have to activate the other one manually. DUAL: 2 channels activated by default. The VECTORSCOPE function is only availabel for DUAL. Other possibilities: MIXED: 2 analog channels, 6 digital channels displayed simultanuously LOGIC: 8 channel logic analyser The spectrum analyzer would be expected here, but it is found in the Capture control window. Display format menu Right klicking on the FORMAT field (default = OSCILLOSCOPE) gives the other possibilities: MIXED DOMAIN SCOPE = oscilloscope with 2 channel spectrum analyzer SPECTRUM ANYLYZER VECTORSCOPE PHASE ANALYZER For most time domain measurements, DUAL or SCOPE are the right choices.
    [Show full text]
  • Spectrum Analyzer
    Spectrum Analyzer GSP-9330 USER MANUAL ISO-9001 CERTIFIED MANUFACTURER This manual contains proprietary information, which is protected by copyright. All rights are reserved. No part of this manual may be photocopied, reproduced or translated to another language without prior written consent of Good Will company. The information in this manual was correct at the time of printing. However, Good Will continues to improve products and reserves the rights to change specification, equipment, and maintenance procedures at any time without notice. Good Will Instrument Co., Ltd. No. 7-1, Jhongsing Rd., Tucheng Dist., New Taipei City 236, Taiwan. Table of Contents Table of Contents SAFETY INSTRUCTIONS .................................................. 3 GETTING STARTED .......................................................... 8 GSP-9330 Introduction .......................... 9 Accessories .......................................... 12 Appearance .......................................... 14 First Use Instructions .......................... 26 BASIC OPERATION ........................................................ 38 Frequency Settings ............................... 41 Span Settings ....................................... 45 Amplitude Settings .............................. 48 Autoset ................................................ 62 Bandwidth/Average Settings ................ 64 Sweep .................................................. 70 Trace .................................................... 77 Trigger ................................................
    [Show full text]
  • RF Measurements Techniques
    Fritz Caspers Piotr Kowina Manfred Wendt 2015 The CERN Accelerator School Advanced Accelerator Physics Instructions NCBJ - Świerk National Centre for Nuclear Research Warsaw - Poland 27 September - 9 October 2015 RF Measurements Techniques Suggested measurements – overview Spectrum Analyzer test stand 1 © Measurements of several types of modulation (AM FM PM) in the time and frequency domain. © Superposition of AM and FM spectrum (unequal carrier side bands). © Concept of a spectrum analyzer: the superheterodyne method. Practice all the different settings (video bandwidth, resolution bandwidth etc.). Advantage of FFT spectrum analyzers. Spectrum Analyzer test stand 2 © Measurement of the TOI point of some amplifier (intermodulation tests). © Concept of noise figure and noise temperature measurements, testing a noise diode, the basics of thermal noise. © EMC measurements (e.g.: analyze your cell phone spectrum). © Nonlinear distortion in general concept and application of vector spectrum analyzers, spectrogram mode. © Measurement of the RF characteristic of a microwave detector diode (output voltage versus input power... transition between regime output voltage proportional input power and output voltage proportional input voltage). Spectrum Analyzer test stand 3 © Concept of noise figure and noise temperature measurements, testing a noise diode, the basics of thermal noise. © Noise figure measurements on amplifiers and also attenuators. © The concept and meaning of ENR numbers. © Noise temperature of the fluorescent tubes in the room using a satellite receiver Network Analyzer test stand 1 © Calibration of the Vector Network Analyzer. © Navigation in the Smith Chart. © Application of the triple stub tuner for matching. © Measurements of the light velocity using a trombone (constant impedance adjustable coax line) in the frequency domain.
    [Show full text]
  • A Guide to Calibrating Your Spectrum Analyzer
    A Guide to Calibrating Your Spectrum Analyzer Application Note Introduction As a technician or engineer who works with example, the test for noise sidebands that deter- electronics, you rely on your spectrum analyzer to mines whether the spectrum analyzer meets its verify that the devices you design, manufacture, phase noise specification often expresses the results and test—devices such as cell phones, TV broadcast in dBc, while analyzer specifications are typically systems, and test equipment—are generating the quoted in dBc/Hz. Consequently, the test engineer proper signals at the intended frequencies and must convert dBc to dBc/Hz as well as applying levels. For example, if you work with cellular radio several correction factors to determine whether the systems, you need to ensure that carrier signal spectrum analyzer is in compliance with specifications. harmonics won’t interfere with other systems For these reasons, spectrum analyzer calibra- operating at the same frequencies as the harmon- tion is a task best handled by skilled metrolo- ics; that intermodulation will not distort the infor- gists, who have both the necessary equipment mation modulated onto the carrier; that the device and an in-depth understanding of the procedures complies with regulatory requirements by operating involved. Still, it’s helpful for everyone who works at the assigned frequency and staying within the with spectrum analyzers to understand the value allocated channel bandwidth; and that unwanted of calibrating these instruments. This application emissions, whether radiated or conducted through note is intended both to help application engineers power lines or other wires, do not impair the opera- who work with spectrum analyzers understand the tion of other systems.
    [Show full text]
  • RF Performance Test Guidelines White Paper
    RF Performance Test Guidelines White Paper All rights reserved. Reproduction in whole or in part is prohibited without the prior written permission of the copyright holder. November 2008 RF Performance Test Guidelines White Paper Liability disclaimer Nordic Semiconductor ASA reserves the right to make changes without further notice to the product to improve reliability, function or design. Nordic Semiconductor ASA does not assume any liability arising out of the application or use of any product or circuits described herein. Life support applications These products are not designed for use in life support appliances, devices, or systems where malfunction of these products can reasonably be expected to result in personal injury. Nordic Semiconductor ASA cus- tomers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Nordic Semiconductor ASA for any damages resulting from such improper use or sale. Contact details For your nearest dealer, please see http://www.nordicsemi.no Receive available updates automatically by subscribing to eNews from our homepage or check our web- site regularly for any available updates. Main office: Otto Nielsens vei 12 7004 Trondheim Phone: +47 72 89 89 00 Fax: +47 72 89 89 89 www.nordicsemi.no Revision History Date Version Description November 2008 1.0 Revision 1.0 Page 2 of 41 RF Performance Test Guidelines White Paper Contents 1 Introduction ............................................................................................... 4 2 Output power............................................................................................. 5 2.1 Carrier wave output power ................................................................... 5 2.1.1 Test method and setup.................................................................... 5 2.1.2 Calibration of measurements........................................................... 6 2.2 Carrier wave sweep ............................................................................
    [Show full text]