Optical Modeling of Organic Photovoltaic Solar Cells
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Solar Irradiance Changes and the Sunspot Cycle 27
Solar Irradiance Changes and the Sunspot Cycle 27 Irradiance (also called insolation) is a measure of the amount of sunlight power that falls upon one square meter of exposed surface, usually measured at the 'top' of Earth's atmosphere. This energy increases and decreases with the season and with your latitude on Earth, being lower in the winter and higher in the summer, and also lower at the poles and higher at the equator. But the sun's energy output also changes during the sunspot cycle! The figure above shows the solar irradiance and sunspot number since January 1979 according to NOAA's National Geophysical Data Center (NGDC). The thin lines indicate the daily irradiance (red) and sunspot number (blue), while the thick lines indicate the running annual average for these two parameters. The total variation in solar irradiance is about 1.3 watts per square meter during one sunspot cycle. This is a small change compared to the 100s of watts we experience during seasonal and latitude differences, but it may have an impact on our climate. The solar irradiance data obtained by the ACRIM satellite, measures the total number of watts of sunlight that strike Earth's upper atmosphere before being absorbed by the atmosphere and ground. Problem 1 - About what is the average value of the solar irradiance between 1978 and 2003? Problem 2 - What appears to be the relationship between sunspot number and solar irradiance? Problem 3 - A homeowner built a solar electricity (photovoltaic) system on his roof in 1985 that produced 3,000 kilowatts-hours of electricity that year. -
Characterization of an Active Metasurface Using Terahertz Ellipsometry Nicholas Karl, Martin S
Characterization of an active metasurface using terahertz ellipsometry Nicholas Karl, Martin S. Heimbeck, Henry O. Everitt, Hou-Tong Chen, Antoinette J. Taylor, Igal Brener, Alexander Benz, John L. Reno, Rajind Mendis, and Daniel M. Mittleman Citation: Appl. Phys. Lett. 111, 191101 (2017); View online: https://doi.org/10.1063/1.5004194 View Table of Contents: http://aip.scitation.org/toc/apl/111/19 Published by the American Institute of Physics APPLIED PHYSICS LETTERS 111, 191101 (2017) Characterization of an active metasurface using terahertz ellipsometry Nicholas Karl,1 Martin S. Heimbeck,2 Henry O. Everitt,2 Hou-Tong Chen,3 Antoinette J. Taylor,3 Igal Brener,4 Alexander Benz,4 John L. Reno,4 Rajind Mendis,1 and Daniel M. Mittleman1 1School of Engineering, Brown University, 184 Hope St., Providence, Rhode Island 02912, USA 2U.S. Army AMRDEC, Redstone Arsenal, Huntsville, Alabama 35808, USA 3Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA 4Center for Integrated Nanotechnologies, Sandia National Laboratories, Albuquerque, New Mexico 87185, USA (Received 11 September 2017; accepted 19 October 2017; published online 6 November 2017) Switchable metasurfaces fabricated on a doped epi-layer have become an important platform for developing techniques to control terahertz (THz) radiation, as a DC bias can modulate the transmis- sion characteristics of the metasurface. To model and understand this performance in new device configurations accurately, a quantitative understanding of the bias-dependent surface characteristics is required. We perform THz variable angle spectroscopic ellipsometry on a switchable metasur- face as a function of DC bias. By comparing these data with numerical simulations, we extract a model for the response of the metasurface at any bias value. -
Solar Irradiance Measurements Using Smart Devices: a Cost-Effective Technique for Estimation of Solar Irradiance for Sustainable Energy Systems
sustainability Article Solar Irradiance Measurements Using Smart Devices: A Cost-Effective Technique for Estimation of Solar Irradiance for Sustainable Energy Systems Hussein Al-Taani * ID and Sameer Arabasi ID School of Basic Sciences and Humanities, German Jordanian University, P.O. Box 35247, Amman 11180, Jordan; [email protected] * Correspondence: [email protected]; Tel.: +962-64-294-444 Received: 16 January 2018; Accepted: 7 February 2018; Published: 13 February 2018 Abstract: Solar irradiance measurement is a key component in estimating solar irradiation, which is necessary and essential to design sustainable energy systems such as photovoltaic (PV) systems. The measurement is typically done with sophisticated devices designed for this purpose. In this paper we propose a smartphone-aided setup to estimate the solar irradiance in a certain location. The setup is accessible, easy to use and cost-effective. The method we propose does not have the accuracy of an irradiance meter of high precision but has the advantage of being readily accessible on any smartphone. It could serve as a quick tool to estimate irradiance measurements in the preliminary stages of PV systems design. Furthermore, it could act as a cost-effective educational tool in sustainable energy courses where understanding solar radiation variations is an important aspect. Keywords: smartphone; solar irradiance; smart devices; photovoltaic; solar irradiation 1. Introduction Solar irradiation is the total amount of solar energy falling on a surface and it can be related to the solar irradiance by considering the area under solar irradiance versus time curve [1]. Measurements or estimation of the solar irradiation (solar energy in W·h/m2), in a specific location, is key to study the optimal design and to predict the performance and efficiency of photovoltaic (PV) systems; the measurements can be done based on the solar irradiance (solar power in W/m2) in that location [2–4]. -
Optical Characterization of Ultra-Thin Films of Azo-Dye-Doped Polymers Using Ellipsometry and Surface Plasmon Resonance Spectroscopy
hv photonics Article Optical Characterization of Ultra-Thin Films of Azo-Dye-Doped Polymers Using Ellipsometry and Surface Plasmon Resonance Spectroscopy Najat Andam 1,2 , Siham Refki 2, Hidekazu Ishitobi 3,4, Yasushi Inouye 3,4 and Zouheir Sekkat 1,2,4,* 1 Department of Chemistry, Faculty of Sciences, Mohammed V University, Rabat BP 1014, Morocco; [email protected] 2 Optics and Photonics Center, Moroccan Foundation for Advanced Science, Innovation and Research, Rabat BP 10100, Morocco; [email protected] 3 Frontiers Biosciences, Osaka University, Osaka 565-0871, Japan; [email protected] (H.I.); [email protected] (Y.I.) 4 Department of Applied Physics, Osaka University, Osaka 565-0871, Japan * Correspondence: [email protected] Abstract: The determination of optical constants (i.e., real and imaginary parts of the complex refractive index (nc) and thickness (d)) of ultrathin films is often required in photonics. It may be done by using, for example, surface plasmon resonance (SPR) spectroscopy combined with either profilometry or atomic force microscopy (AFM). SPR yields the optical thickness (i.e., the product of nc and d) of the film, while profilometry and AFM yield its thickness, thereby allowing for the separate determination of nc and d. In this paper, we use SPR and profilometry to determine the complex refractive index of very thin (i.e., 58 nm) films of dye-doped polymers at different dye/polymer concentrations (a feature which constitutes the originality of this work), and we compare the SPR results with those obtained by using spectroscopic ellipsometry measurements performed on the Citation: Andam, N.; Refki, S.; Ishitobi, H.; Inouye, Y.; Sekkat, Z. -
I OPTIMIZATION of ORGANIC SOLAR CELLS a DISSERTATION
OPTIMIZATION OF ORGANIC SOLAR CELLS A DISSERTATION SUBMITTED TO THE DEPARTMENT OF ELECTRICAL ENGINEERING AND THE COMMITTEE ON GRADUATE STUDIES OF STANFORD UNIVERSITY IN PARTIAL FULFILLMENT OF THE REQUIREMENTS FOR THE DEGREE OF DOCTOR OF PHILOSOPHY Seung Bum Rim March 2010 i © 2010 by Seung Bum Rim. All Rights Reserved. Re-distributed by Stanford University under license with the author. This work is licensed under a Creative Commons Attribution- Noncommercial 3.0 United States License. http://creativecommons.org/licenses/by-nc/3.0/us/ This dissertation is online at: http://purl.stanford.edu/yx656fs6181 ii I certify that I have read this dissertation and that, in my opinion, it is fully adequate in scope and quality as a dissertation for the degree of Doctor of Philosophy. Peter Peumans, Primary Adviser I certify that I have read this dissertation and that, in my opinion, it is fully adequate in scope and quality as a dissertation for the degree of Doctor of Philosophy. Michael McGehee I certify that I have read this dissertation and that, in my opinion, it is fully adequate in scope and quality as a dissertation for the degree of Doctor of Philosophy. Philip Wong Approved for the Stanford University Committee on Graduate Studies. Patricia J. Gumport, Vice Provost Graduate Education This signature page was generated electronically upon submission of this dissertation in electronic format. An original signed hard copy of the signature page is on file in University Archives. iii Abstract Organic solar cell is a promising technology because the versatility of organic materials in terms of the tunability of their electrical and optical properties and because of their relative insensitivity to film imperfections which potentially allows for very low-cost high-throughput roll-to-roll processing. -
Use of Spectroscopic Ellipsometry and Modeling in Determining Composition and Thickness of Barium Strontium Titanate Thin-Films
Use of Spectroscopic Ellipsometry and Modeling in Determining Composition and Thickness of Barium Strontium Titanate Thin-Films A Thesis Submitted to the Faculty of Drexel University by Dominic G. Bruzzese III in partial fulfillment of the requirements for the degree of MS in Materials Science and Engineering June 2010 c Copyright June 2010 Dominic G. Bruzzese III. All Rights Reserved. Acknowledgements I would like to acknowledge the guidance and motivation I received from my advi- sor Dr. Jonathan Spanier not just during my thesis but for my entire stay at Drexel University. Eric Gallo for his help as my graduate student mentor and always making himself available to help me with everything from performing an experiment to ana- lyzing some result, he has been an immeasurable resource. Keith Fahnestock and the Natural Polymers and Photonics Group under the direction of Dr. Caroline Schauer for allowing the use of their ellipsometer, without which this work would not have been possible. I would like to thank everyone in the MesoMaterials Laboratory, espe- cially Stephen Nonenmann, Stephanie Johnson, Guannan Chen, Christopher Hawley, Brian Beatty, Joan Burger, and Andrew Akbasheu for help with experiments, as well as Oren Leffer and Terrence McGuckin for enlightening discussions. Claire Weiss and Dr. Pamir Alpay at the University of Connecticut have both contributed much to the the field and I am grateful for their work; also Claire produced the MOSD samples on which much of the characterization and modeling was done. Dr. Melanie Cole and the Army Research Office and Dr. Marc Ulrich for funding the project under W911NF-08-0124 and W911NF-08-0067. -
Ellipsometry
AALBORG UNIVERSITY Institute of Physics and Nanotechnology Pontoppidanstræde 103 - 9220 Aalborg Øst - Telephone 96 35 92 15 TITLE: Ellipsometry SYNOPSIS: This project concerns measurement of the re- fractive index of various materials and mea- PROJECT PERIOD: surement of the thickness of thin films on sili- September 1st - December 21st 2004 con substrates by use of ellipsometry. The el- lipsometer used in the experiments is the SE 850 photometric rotating analyzer ellipsome- ter from Sentech. THEME: After an introduction to ellipsometry and a Detection of Nanostructures problem description, the subjects of polar- ization and essential ellipsometry theory are covered. PROJECT GROUP: The index of refraction for silicon, alu- 116 minum, copper and silver are modelled us- ing the Drude-Lorentz harmonic oscillator model and afterwards measured by ellipsom- etry. The results based on the measurements GROUP MEMBERS: show a tendency towards, but are not ade- Jesper Jung quately close to, the table values. The mate- Jakob Bork rials are therefore modelled with a thin layer of oxide, and the refractive indexes are com- Tobias Holmgaard puted. This model yields good results for the Niels Anker Kortbek refractive index of silicon and copper. For aluminum the result is improved whereas the result for silver is not. SUPERVISOR: The thickness of a thin film of SiO2 on a sub- strate of silicon is measured by use of ellip- Kjeld Pedersen sometry. The result is 22.9 nm which deviates from the provided information by 6.5 %. The thickness of two thick (multiple wave- NUMBERS PRINTED: 7 lengths) thin polymer films are measured. The polymer films have been spin coated on REPORT PAGE NUMBER: 70 substrates of silicon and the uniformities of the surfaces are investigated. -
A Dissertation Entitled Spectroscopic Ellipsometry Studies of Thin Film Si
A Dissertation entitled Spectroscopic Ellipsometry Studies of Thin Film Si:H Materials in Photovoltaic Applications from Infrared to Ultraviolet by Laxmi Karki Gautam Submitted to the Graduate Faculty as partial fulfillment of the requirements for the Doctor of Philosophy Degree in Physics _________________________________________ Dr. Nikolas J. Podraza, Committee Chair _________________________________________ Dr. Robert W. Collins, Committee Member _________________________________________ Dr. Randall Ellingson, Committee Member _________________________________________ Dr. Song Cheng, Committee Member _________________________________________ Dr. Rashmi Jha, Committee Member _________________________________________ Dr. Patricia R. Komuniecki, Dean College of Graduate Studies The University of Toledo May, 2016 Copyright 2016, Laxmi Karki Gautam This document is copyrighted material. Under copyright law, no parts of this document may be reproduced without the expressed permission of the author. An Abstract of Spectroscopic Ellipsometry Studies of Thin Film Si:H Materials in Photovoltaic Applications from Infrared to Ultraviolet by Laxmi Karki Gautam Submitted to the Graduate Faculty as partial fulfillment of the requirements for the Doctor of Philosophy Degree in Physics The University of Toledo May 2016 Optimization of thin film photovoltaics (PV) relies on the capability for characterizing the optoelectronic and structural properties of each layer in the device over large areas and correlating these properties with device performance. This work builds heavily upon that done previously by us, our collaborators, and other researchers. It provides the next step in data analyses, particularly that involving study of films in device configurations maintaining the utmost sensitivity within those same device structures. In this Dissertation, the component layers of thin film hydrogenated silicon (Si:H) solar cells on rigid substrate materials have been studied by real time spectroscopic ellipsometry (RTSE) and ex situ spectroscopic ellipsometry (SE). -
1. Introduction & Theory
1. Introduction & Theory Neha Singh October 2010 Course Overview Day 1: Day 2: Introduction and Theory Genosc Layer Transparent Films Absorbing Films Microstructure – EMA If time permits: – Surface roughness Non-idealities – Grading (Simple and Ultra thin films function-based ITO) Uniqueness test – Thickness non-uniformity UV Absorption Review – Point-by-point fit Actual Samples © 2010, All Rights Reserved 2 Introduction & Theory Light Materials (optical constants) Interaction between light and materials Ellipsometry Measurements Data Analysis © 2010, All Rights Reserved 3 Light Electromagnetic Plane Wave From Maxwell’s equations we can describe a plane wave ⎛ 2π ⎞ E(z,t) = E0 sin⎜ − (z − vt) + ξ ⎟ ⎝ λ ⎠ Amplitude Amplitude arbitraryarbitrary phase phase X Wavelength Wavelength VelocityVelocity λ Electric field E(z,t) Y Z Direction Magnetic field, B(z,t) of propagation © 2010, All Rights Reserved 4 Intensity and Polarization Intensity = “Size” of Electric field. I ∝ E 2 Polarization = “Shape” of Electric field travel. Different Size Y •Y E More Intense Less (Intensity) Intense E Same Shape! X (Polarization) •X © 2010, All Rights Reserved 5 What is Polarization? Describes how Electric Field travels through space and time. X wave1 Y E wave2 Z © 2010, All Rights Reserved 6 Describing Polarized Light Jones Vector Stokes Vector Describe polarized light Describe any light beam with amplitude & phase. as vector of intensity ⎡S ⎤ ⎡ E2 + E2 ⎤ iϕx 0 x0 y0 ⎡Ex ⎤ ⎡E0xe ⎤ ⎢ ⎥ ⎢ 2 2 ⎥ = S1 ⎢ Ex0 −Ey0 ⎥ ⎢ ⎥ ⎢ iϕy ⎥ ⎢ ⎥ = E E e ⎢ ⎥ ⎢ ⎥ ⎣ y ⎦ ⎣⎢ 0y ⎦⎥ S2 2Ex0Ey0 cosΔ ⎢ ⎥ ⎢ ⎥ ⎣S3 ⎦ ⎣⎢2Ex0Ey0 sinΔ⎦⎥ © 2010, All Rights Reserved 7 Light-Material Interaction velocity & c wavelength vary v = in different n materials n = 1 •n = 2 Frequency remains constant v υ = λ © 2010, All Rights Reserved What are Optical Constants n , k Describe how materials and light interact. -
Solar Radiation Modeling and Measurements for Renewable Energy Applications: Data and Model Quality
March 2003 • NREL/CP-560-33620 Solar Radiation Modeling and Measurements for Renewable Energy Applications: Data and Model Quality Preprint D.R. Myers To be presented at the International Expert Conference on Mathematical Modeling of Solar Radiation and Daylight—Challenges for the 21st Century Edinburgh, Scotland September 15–16, 2003 National Renewable Energy Laboratory 1617 Cole Boulevard Golden, Colorado 80401-3393 NREL is a U.S. Department of Energy Laboratory Operated by Midwest Research Institute • Battelle • Bechtel Contract No. DE-AC36-99-GO10337 NOTICE The submitted manuscript has been offered by an employee of the Midwest Research Institute (MRI), a contractor of the US Government under Contract No. DE-AC36-99GO10337. Accordingly, the US Government and MRI retain a nonexclusive royalty-free license to publish or reproduce the published form of this contribution, or allow others to do so, for US Government purposes. This report was prepared as an account of work sponsored by an agency of the United States government. Neither the United States government nor any agency thereof, nor any of their employees, makes any warranty, express or implied, or assumes any legal liability or responsibility for the accuracy, completeness, or usefulness of any information, apparatus, product, or process disclosed, or represents that its use would not infringe privately owned rights. Reference herein to any specific commercial product, process, or service by trade name, trademark, manufacturer, or otherwise does not necessarily constitute or imply its endorsement, recommendation, or favoring by the United States government or any agency thereof. The views and opinions of authors expressed herein do not necessarily state or reflect those of the United States government or any agency thereof. -
National Survey Report of PV Power Applications in Sweden 2015
National Survey Report of PV Power Applications in Sweden 2015 Prepared by Johan Lindahl Table of contents Table of contents .................................................................................................................. 1 Foreword ............................................................................................................................... 3 Introduction .......................................................................................................................... 4 1 Installation data .................................................................................................................... 5 1.1 Applications for Photovoltaics ................................................................................. 5 1.2 Total photovoltaic power installed .......................................................................... 5 1.2.1 Method ........................................................................................................ 5 1.2.2 The Swedish PV market ............................................................................... 5 1.2.3 Swedish PV market segments ..................................................................... 9 1.2.4 The geographical distribution of PV in Sweden .......................................... 10 1.2.5 PV in the broader Swedish energy market .................................................. 12 2 Competitiveness of PV electricity ......................................................................................... 13 2.1 Module -
Solar PV Technology Development Report 2020
EUR 30504 EN This publication is a Technical report by the Joint Research Centre (JRC), the European Commission’s science and knowledge service. It aims to provide evidence-based scientific support to the European policymaking process. The scientific output expressed does not imply a policy position of the European Commission. Neither the European Commission nor any person acting on behalf of the Commission is responsible for the use that might be made of this publication. For information on the methodology and quality underlying the data used in this publication for which the source is neither Eurostat nor other Commission services, users should contact the referenced source. The designations employed and the presentation of material on the maps do not imply the expression of any opinion whatsoever on the part of the European Union concerning the legal status of any country, territory, city or area or of its authorities, or concerning the delimitation of its frontiers or boundaries. Contact information Name: Nigel TAYLOR Address: European Commission, Joint Research Centre, Ispra, Italy Email: [email protected] Name: Maria GETSIOU Address: European Commission DG Research and Innovation, Brussels, Belgium Email: [email protected] EU Science Hub https://ec.europa.eu/jrc JRC123157 EUR 30504 EN ISSN 2600-0466 PDF ISBN 978-92-76-27274-8 doi:10.2760/827685 ISSN 1831-9424 (online collection) ISSN 2600-0458 Print ISBN 978-92-76-27275-5 doi:10.2760/215293 ISSN 1018-5593 (print collection) Luxembourg: Publications Office of the European Union, 2020 © European Union, 2020 The reuse policy of the European Commission is implemented by the Commission Decision 2011/833/EU of 12 December 2011 on the reuse of Commission documents (OJ L 330, 14.12.2011, p.