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10/7/2019

DIGITAL SCHEDULE THIS WEEK SYSTEM DESIGN

FALL 2019  Jiwon Choe will be covering my lecture this Wednesday PROF. IRIS BAHAR  Introduction to sequential OCTOBER 7, 2019  McKenna Cisler will be holding a tutorial this LECTURE 10: CMOS TRANSIENT BEHAVIOR THURSDAY from 5-7pm in the fishbowl  He will be swapping his usual Wednesday hours with Andrew

NMOS I-V SUMMARY CMOS INVERTER VTC

NMOS off PMOS res Taking those intersection  Shockley 1st order models NMOS sat points from the load curves, PMOS res we obtain the voltage- transfer characteristic 0 𝑉 𝑉 cutoff 𝑉 2.5 NMOS sat (V) PMOS sat β 𝑉 𝑉 𝑉 𝑉 𝑉 linear 2 𝐼 2 out V 1.5 𝛽 1 NMOS res 𝑉 𝑉 𝑉 𝑉 saturation PMOS sat NMOS res 2 0.5 PMOS off

0 00.511.522.5 𝑊 where C is the capacitance per unit area of SiO 𝛽𝜇𝐶 ox 2 𝐿 Vin (V)

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SWITCHING THRESHOLD MOS STRUCTURE RESISTANCE

 Define VM to be the point where Vin = Vout (both PMOS and  The simplest model assumes the transistor is a with an NMOS in saturation since VDS = VGS) infinite “off” resistance and a finite “on” resistance Ron  If VM = VDD/2, then this implies symmetric rise/fall behavior for the CMOS gate VGS VT 2 Ron  Recall at saturation, ID=(k’/2)(W/L) (VGS-Vth) , S D

 where k’n= nCox= nox/tox 𝑘 𝑊 𝑘 𝑊  However Ron is nonlinear, time-varying, and dependent on the  Setting IDp= -IDn 𝑉 𝑉 𝑉 𝑉 operation point of the transistor 2 𝐿 2 𝐿  How can we determine an equivalent (constant and linear) resistance 𝑊 to use instead? 𝐿 𝑘 𝜇 𝜇 , if 𝐿𝐿 , 𝑊𝑊 ·  Assuming Vthn=-Vthp 𝑊 𝑘 𝜇 𝜇 𝐿

EQUIVALENT MOS STRUCTURE MOS STRUCTURE RESISTANCE RESISTANCE

 Approximate Ron as the resistance  3 VDD x105 found during linear operation 6 Req  5 4 IDSAT (for VGS = VDD, V = V V /2) 4 where DS DD DD  Simple to calculate but limited accuracy 7 3 2 6 2 Cox W  VDSAT   Instead use the average value of the IDSAT  (VDD VT )VDSAT   5 1  2 L 2 4   3 0 resistances, Req, at the end-points of 2 00.511.522.5 so, the transition (i.e., V and V /2) 1 DD DD 3 L V 0 DD 0.511.522.5 Req  2 ID 2 Cox W VDSAT  DD T DSAT 1 VGS = VDD (V V )V  R  (R (t )  R (t )) 2 VDD (V) eq 2 on 1 on 2 L L Rmid R  , R  1  VDD VDD / 2  eqNMOS eqPMOS     nW  pW 2  I I   DSAT DSAT  R0

3 VDD  VDS Req is essentially independent of VDD as long as VDD >> VT+VDSAT/2 4 I DSAT VDD/2 VDD

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CMOS INVERTER: DYNAMIC BEHAVIOR SOURCES OF CAPACITANCE

Vout Vin VDD Vout2  Transient, or dynamic, CL response determines the maximum speed at which a CG4 Rp M2 device can be operated. M4 CDB2 V V V out out2 in C GD12 Cw Vout = 0 CDB1 t = f(R , C ) M M3 pHL n L 1 C CL G3 Rn  intrinsic MOS transistor capacitances  extrinsic MOS transistor (fanout) capacitances

Vin = V DD  wiring (interconnect) capacitance

SOURCES OF CAPACITANCE DEFINITIONS

Vout Vin V V V out2 Vin in out CL Propagation delay input 50% tp = (tpHL + tpLH)/2 CG4 waveform M2 M4 CDB2 t Vout Vout2 Vin tpHL tpLH C L Vout CDB1 M M3 90% 1 C G3 output slopes waveform 50% 10% t  CL ≈ CDB2+CDB1+CG4+CG3 tf tr

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INVERTER PROPAGATION DELAY MODELING PROPAGATION DELAY

 Propagation delay proportional to time-constant of network formed by ON and the load capacitance.  Model circuit as first-order RC network v (t) = (1 – e–t/)V VDD t = f(R , C ) out in pHL n L R where  = RC vout Rp 3 𝑉 C 𝑅𝑅 Time to reach 50% point is 4 𝐼 vin t = ln(2)  = 0.69  𝐶 𝐶 𝐶 Vout = 0 Time to reach 90% point is CL Rn Want to have equal rise/fall delays t = ln(9)  = 2.2 

make Rn=Rp t p  (t pHL  t pLH ) / 2  0.69CL (Rn  Rp ) / 2 Vin = V DD

SWITCH DELAY MODEL INPUT PATTERN EFFECTS ON DELAY

A Req  Delay is dependent on the pattern of A R R Rp p p Rp Rp inputs B A B A B st Rp  1 order approximation of delay:

R Rn A p C CL ≈ R int tp 0.69 Reff CL n CL A A R A n CL Rn A R R Cint  Reff depends on the input pattern R n n CL n C B int A B B INVERTER

NOR NAND

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INPUT PATTERN EFFECTS ON DELAY TRANSISTOR SIZING

 01 transition on output: 2 possibilities  How should NMOS and PMOS devices be sized relative to an

 one input goes low: what is Reff ? inverter with equal rise/fall times? Rp Rp  delay is 0.69 Rp CL A B  both inputs go low: what is R ? Rp Rp Rp eff 11 2 A B B R  delay is 0.69 Rp/2 CL since 2 p- on in parallel n CL A  10 transition on output: 1 possibility R 2 Rp C n CL int  both inputs go high 2 R A n C A int  delay is 0.69 2R C B n L 2 Rn Rn Rn C Cint 1 L B A B 1 tp ≈ 0.69 Reff CL  Adding in series (without sizing) slows down the circuit

TRANSISTOR SIZING A COMPLEX GATE TRANSISTOR SIZING A COMPLEX GATE

B 4 8 B 3 6 A 2 4 • Size the shortest A 1.5 3 • Alternate sizing: C 4 8 path first C 3 6 size the longest • Numbers in black path first D 2 4 are relative to an D 3 6 inverter • Numbers in green A 2 A 2 are relative to a D D 1 minimum width 1 BC22device BC22

OUT = !(D + A • (B + C)) OUT = !(D + A • (B + C))

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