Fundamentals of Astronomical Optical Interferometry
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Interferometric Spectrometers
LBNL-40663 UC-410 . ERNEST ORLANDO LAWRENCE BERKELEY NATIONAL LABORATORY Interferometric Spectrometers Anne Thome and Malcolm Howells Accelerator and Fusion Research Division June 1997 To be published as a chapter in Techniques ofVacuum Ultraviolet Physics, J~A-. Samson and D A. Ederer, eds.-, ·..-:~-:.:-':.::;:::;;;;r,;-:·.::~:~~:.::~-~~'*-~~,~~~;.=;t,ffl;.H;~:;;$,'~.~:~~::;;.:~< :.:,:::·.;:~·:..~.,·,;;;~.· l.t..•.-J.' "'"-""···,:·.:·· \ '-· . _ .....::' .~..... .:"~·~-!r.r;.e,.,...;. 17"'JC.(.; .• ,'~..: .••, ..._i;.·;~~(.:j. ... ..,.~1\;i:;.~ ...... J:' Academic Press, ....... ·.. ·... :.: ·..... ~ · ··: ·... · . .. .. .. - • 0 • ···...::; •• 0 ·.. • •• • •• ••• , •• •• •• ••• •••••• , 0 •• 0 .............. -·- " DISCLAIMER. This document was prepared as an account of work sponsored by the United States Government. While this document is believed to contain cmTect information, neither the United States Government nor any agency thereof, nor the Regents of the University of California, nor any of their employees, makes any warranty, express or implied, or assumes any legahesponsibility for the accuracy, completeness, or usefulness of any information, apparatus, product, or process disclosed, or represents that its use would not infringe privately owned rights. Reference herein to any specific commercial product, process, or service by its trade name, trademark, manufacturer, or otherwise, does not necessarily constitute or imply its endorsement, recommendation, or favoring by the United States Government or any agency thereof, or the -
Journal of Interdisciplinary Science Topics Determining Distance Or
Journal of Interdisciplinary Science Topics Determining Distance or Object Size from a Photograph Chuqiao Huang The Centre for Interdisciplinary Science, University of Leicester 19/02/2014 Abstract The purpose of this paper is to create an equation relating the distance and width of an object in a photograph to a constant when the conditions under which the photograph was taken are known. These conditions are the sensor size of the camera and the resolution and focal length of the picture. The paper will highlight when such an equation would be an accurate prediction of reality, and will conclude with an example calculation. Introduction may be expressed as a tan (opposite/adjacent) In addition to displaying visual information relationship: such as colour, texture, and shape, a photograph (1.0) may provide size and distance information on (1.1) subjects. The purpose of this paper is to develop such an equation from basic trigonometric principles when given certain parameters about the photo. Picture Angular Resolution With the image dimensions, we can make an Picture Field of View equation for one-dimensional angular resolution. First, we will determine an equation for the Since l2 describes sensor width and not height, we horizontal field of view of a photograph when given will calculate horizontal instead of vertical angular the focal length and width of the sensor. resolution: Consider the top down view of the camera (2.0) system below (figure 1), consisting of an object (left), lens (centre), and sensor (right). Let d be the (2.1) 1 distance of object to the lens, d2 be the focal length, Here, αhPixel is the average horizontal field of l1 be the width of the object, l2 be the width of the view for a single pixel, and nhPixel is the number of sensor, and α be the horizontal field of view of the pixels that make up a row of the picture. -
Sub-Airy Disk Angular Resolution with High Dynamic Range in the Near-Infrared A
EPJ Web of Conferences 16, 03002 (2011) DOI: 10.1051/epjconf/20111603002 C Owned by the authors, published by EDP Sciences, 2011 Sub-Airy disk angular resolution with high dynamic range in the near-infrared A. Richichi European Southern Observatory,Karl-Schwarzschildstr. 2, 85748 Garching, Germany Abstract. Lunar occultations (LO) are a simple and effective high angular resolution method, with minimum requirements in instrumentation and telescope time. They rely on the analysis of the diffraction fringes created by the lunar limb. The diffraction phenomen occurs in space, and as a result LO are highly insensitive to most of the degrading effects that limit the performance of traditional single telescope and long-baseline interferometric techniques used for direct detection of faint, close companions to bright stars. We present very recent results obtained with the technique of lunar occultations in the near-IR, showing the detection of companions with very high dynamic range as close as few milliarcseconds to the primary star. We discuss the potential improvements that could be made, to increase further the current performance. Of course, LO are fixed-time events applicable only to sources which happen to lie on the Moon’s apparent orbit. However, with the continuously increasing numbers of potential exoplanets and brown dwarfs beign discovered, the frequency of such events is not negligible. I will list some of the most favorable potential LO in the near future, to be observed from major observatories. 1. THE METHOD The geometry of a lunar occultation (LO) event is sketched in Figure 1. The lunar limb acts as a straight diffracting edge, moving across the source with an angular speed that is the product of the lunar motion vector VM and the cosine of the contact angle CA. -
The Methods and Experiments of Shape Measurement for Off-Axis
materials Article The Methods and Experiments of Shape Measurement for Off-Axis Conic Aspheric Surface Shijie Li 1,2,*, Jin Zhang 1,2, Weiguo Liu 1,2, Haifeng Liang 1,2, Yi Xie 3 and Xiaoqin Li 4 1 Shaanxi Province Key Laboratory of Thin Film Technology and Optical Test, Xi’an Technological University, Xi’an 710021, China; [email protected] (J.Z.); [email protected] (W.L.); hfl[email protected] (H.L.) 2 School of Optoelectronic Engineering, Xi’an Technological University, Xi’an 710021, China 3 Display Technology Department, Luoyang Institute of Electro-optical Equipment, AVIC, Luoyang 471009, China; [email protected] 4 Library of Xi’an Technological University, Xi’an Technological University, Xi’an 710021, China; [email protected] * Correspondence: [email protected] Received: 26 March 2020; Accepted: 27 April 2020; Published: 1 May 2020 Abstract: The off-axis conic aspheric surface is widely used as a component in modern optical systems. It is critical for this kind of surface to obtain the real accuracy of the shape during optical processing. As is widely known, the null test is an effective method to measure the shape accuracy with high precision. Therefore, three shape measurement methods of null test including auto-collimation, single computer-generated hologram (CGH), and hybrid compensation are presented in detail in this research. Although the various methods have their own advantages and disadvantages, all methods need a special auxiliary component to accomplish the measurement. In the paper, an off-axis paraboloid (OAP) was chosen to be measured using the three methods along with auxiliary components of their own and it was shown that the experimental results involved in peak-to-valley (PV), root-mean-square (RMS), and shape distribution from three methods were consistent. -
The Most Important Equation in Astronomy! 50
The Most Important Equation in Astronomy! 50 There are many equations that astronomers use L to describe the physical world, but none is more R 1.22 important and fundamental to the research that we = conduct than the one to the left! You cannot design a D telescope, or a satellite sensor, without paying attention to the relationship that it describes. In optics, the best focused spot of light that a perfect lens with a circular aperture can make, limited by the diffraction of light. The diffraction pattern has a bright region in the center called the Airy Disk. The diameter of the Airy Disk is related to the wavelength of the illuminating light, L, and the size of the circular aperture (mirror, lens), given by D. When L and D are expressed in the same units (e.g. centimeters, meters), R will be in units of angular measure called radians ( 1 radian = 57.3 degrees). You cannot see details with your eye, with a camera, or with a telescope, that are smaller than the Airy Disk size for your particular optical system. The formula also says that larger telescopes (making D bigger) allow you to see much finer details. For example, compare the top image of the Apollo-15 landing area taken by the Japanese Kaguya Satellite (10 meters/pixel at 100 km orbit elevation: aperture = about 15cm ) with the lower image taken by the LRO satellite (0.5 meters/pixel at a 50km orbit elevation: aperture = ). The Apollo-15 Lunar Module (LM) can be seen by its 'horizontal shadow' near the center of the image. -
Optical Low-Coherence Interferometry for Selected Technical Applications
BULLETIN OF THE POLISH ACADEMY OF SCIENCES TECHNICAL SCIENCES Vol. 56, No. 2, 2008 Optical low-coherence interferometry for selected technical applications J. PLUCIŃSKI∗, R. HYPSZER, P. WIERZBA, M. STRĄKOWSKI, M. JĘDRZEJEWSKA-SZCZERSKA, M. MACIEJEWSKI, and B.B. KOSMOWSKI Faculty of Electronics, Telecommunications and Informatics, Gdańsk University of Technology, 11/12 Narutowicza St., 80-952 Gdańsk, Poland Abstract. Optical low-coherence interferometry is one of the most rapidly advancing measurement techniques. This technique is capable of performing non-contact and non-destructive measurement and can be used not only to measure several quantities, such as temperature, pressure, refractive index, but also for investigation of inner structure of a broad range of technical materials. We present theoretical description of low-coherence interferometry and discuss its unique properties. We describe an OCT system developed in our Department for investigation of the structure of technical materials. In order to provide a better insight into the structure of investigated objects, our system was enhanced to include polarization state analysis capability. Measurement results of highly scattering materials e.g. PLZT ceramics and polymer composites are presented. Moreover, we present measurement setups for temperature, displacement and refractive index measurement using low coherence interferometry. Finally, some advanced detection setups, providing unique benefits, such as noise reduction or extended measurement range, are discussed. Key words: low-coherence interferometry (LCI), optical coherence tomography (OCT), polarization-sensitive OCT (PS-OCT). 1. Introduction 2. Analysis of two-beam interference Low-coherence interferometry (LCI), also known as white- 2.1. Two-beam interference – time domain description. light interferometry (WLI), is an attractive measurement Let us consider interference of two beams emitted from method offering high measurement resolution, high sensi- a quasi-monochromatic light source located at a point P, i.e. -
Understanding Resolution Diffraction and the Airy Disk, Dawes Limit & Rayleigh Criterion by Ed Zarenski [email protected]
Understanding Resolution Diffraction and The Airy Disk, Dawes Limit & Rayleigh Criterion by Ed Zarenski [email protected] These explanations of terms are based on my understanding and application of published data and measurement criteria with specific notation from the credited sources. Noted paragraphs are not necessarily quoted but may be summarized directly from the source stated. All information if not noted from a specific source is mine. I have attempted to be as clear and accurate as possible in my presentation of all the data and applications put forth here. Although this article utilizes much information from the sources noted, it represents my opinion and my understanding of optical theory. Any errors are mine. Comments and discussion are welcome. Clear Skies, and if not, Cloudy Nights. EdZ November 2003, Introduction: Diffraction and Resolution Common Diffraction Limit Criteria The Airy Disk Understanding Rayleigh and Dawes Limits Seeing a Black Space Between Components Affects of Magnitude and Color Affects of Central Obstruction Affect of Exit Pupil on Resolution Resolving Power Resolving Power in Extended Objects Extended Object Resolution Criteria Diffraction Fringes Interfere with Resolution Magnification is Necessary to See Acuity Determines Magnification Summary / Conclusions Credits 1 Introduction: Diffraction and Resolution All lenses or mirrors cause diffraction of light. Assuming a circular aperture, the image of a point source formed by the lens shows a small disk of light surrounded by a number of alternating dark and bright rings. This is known as the diffraction pattern or the Airy pattern. At the center of this pattern is the Airy disk. As the diameter of the aperture increases, the size of the Airy disk decreases. -
Phase Tomography by X-Ray Talbot Interferometry
Phase Tomography by X-ray Talbot Interferometry X-ray phase imaging is attractive for the beamline of NewSUBARU, SPring-8. A SEM observation of weakly absorbing materials, such as (scanning electron microscope) image of the grating soft materials and biological tissues. In the past is shown in Fig. 1. The pitch and pattern height were decade, several techniques of X-ray phase imaging 8 µm and 30 µm, respectively. were reported and demonstrated [1]. Recently, we Through the quantitative measurement of the have developed an X-ray Talbot interferometer differential phase shift by the sample, extremely high- for novel X-ray phase imaging, including phase sensitive three-dimensional imaging, that is, X-ray tomography. This method is unique in that phase tomography, is attainable by X-ray Talbot transmission gratings are used to generate differential interferometry [3]. We demonstrated this with phase contrast (Fig. 1). Two gratings are aligned biological samples using monochromatic undulator along the optical axis with a specific distance X-rays at beamline BL20XU. Figure 2 shows a rabbit determined by the X-ray wavelength λ and the grating liver tissue with VX2 cancer observed by X-ray phase pitch d. The influence of refraction on the sample tomography using a CCD-based X-ray image detector placed in front of the first grating is observed just whose effective pixel size was 3.14 µm [4]. The behind the second grating. The detailed principle of cancerous lesion is depicted with a darker gray level the contrast generation is described in Refs. [2,3]. than the surrounding normal liver tissue. -
Resolution Limits of Extrinsic Fabry-Perot Interferometric Displacement Sensors Utilizing Wavelength Scanning Interrogation
Resolution limits of extrinsic Fabry-Perot interferometric displacement sensors utilizing wavelength scanning interrogation Nikolai Ushakov,1 * Leonid Liokumovich,1 1 Department of Radiophysics, St. Petersburg State Polytechnical University, Polytechnicheskaya, 29, 195251, St. Petersburg, Russia *Corresponding author: [email protected] The factors limiting the resolution of displacement sensor based on extrinsic Fabry-Perot interferometer were studied. An analytical model giving the dependency of EFPI resolution on the parameters of an optical setup and a sensor interrogator was developed. The proposed model enables one to either estimate the limit of possible resolution achievable with a given setup, or to derive the requirements for optical elements and/or a sensor interrogator necessary for attaining the desired sensor resolution. An experiment supporting the analytical derivations was performed, demonstrating a large dynamic measurement range (with cavity length from tens microns to 5 mm), a high baseline resolution (from 14 pm) and a good agreement with the model. © 2014 Optical Society of America OCIS Codes: (060.2370) Fiber optics sensors, (120.3180) Interferometry, (120.2230) Fabry-Perot, (120.3940) Metrology. 1. Introduction description of their resolution limits is of a great interest. Considering the wavelength scanning interrogation, an analysis Fiber-optic sensors based on the fiber extrinsic Fabry-Perot of errors provoked by instabilities of the laser frequency tuning is interferometers (EFPI) [1] are drawing an increasing attention present in [18], still only slow and large instabilities are from a great amount of academic research groups and several considered. companies, which have already started commercial distribution In this Paper, a mathematical model considering the main of such devices. -
Increasing the Sensitivity of the Michelson Interferometer Through Multiple Reflection Woonghee Youn
Rose-Hulman Institute of Technology Rose-Hulman Scholar Graduate Theses - Physics and Optical Engineering Graduate Theses Summer 8-2015 Increasing the Sensitivity of the Michelson Interferometer through Multiple Reflection Woonghee Youn Follow this and additional works at: http://scholar.rose-hulman.edu/optics_grad_theses Part of the Engineering Commons, and the Optics Commons Recommended Citation Youn, Woonghee, "Increasing the Sensitivity of the Michelson Interferometer through Multiple Reflection" (2015). Graduate Theses - Physics and Optical Engineering. Paper 7. This Thesis is brought to you for free and open access by the Graduate Theses at Rose-Hulman Scholar. It has been accepted for inclusion in Graduate Theses - Physics and Optical Engineering by an authorized administrator of Rose-Hulman Scholar. For more information, please contact bernier@rose- hulman.edu. Increasing the Sensitivity of the Michelson Interferometer through Multiple Reflection A Thesis Submitted to the Faculty of Rose-Hulman Institute of Technology by Woonghee Youn In Partial Fulfillment of the Requirements for the Degree of Master of Science in Optical Engineering August 2015 © 2015 Woonghee Youn 2 ABSTRACT Youn, Woonghee M.S.O.E Rose-Hulman Institute of Technology August 2015 Increase a sensitivity of the Michelson interferometer through the multiple reflection Dr. Charles Joenathan Michelson interferometry has been one of the most famous and popular optical interference system for analyzing optical components and measuring optical metrology properties. Typical Michelson interferometer can measure object displacement with wavefront shapes to one half of the laser wavelength. As testing components and devices size reduce to micro and nano dimension, Michelson interferometer sensitivity is not suitable. The purpose of this study is to design and develop the Michelson interferometer using the concept of multiple reflections. -
Moiré Interferometry
Moiré Interferometry Wei-Chih Wang ME557 Department of Mechanical Engineering University of Washington W.Wang 1 Interference When two or more optical waves are present simultaneously in the same region of space, the total wave function is the sum of the individual wave functions W.Wang 2 Optical Interferometer Criteria for interferometer: (1) Mono Chromatic light source- narrow bandwidth (2) Coherent length: Most sources of light keep the same phase for only a few oscillations. After a few oscillations, the phase will skip randomly. The distance between these skips is called the coherence length. normally, coherent length for a regular 5mW HeNe laser is around few cm, 2 lc = λ /∆λ , (3) Collimate- Collimated light is unidirectional and originates from a single source optically located at an infinite distance so call plane wave (4) Polarization dependent W.Wang 3 Interference of two waves When two monochromatic waves of complex amplitudes U1(r) and U2(r) are superposed, the result is a monochromatic wave of the Same frequency and complex amplitude, U(r) = U1(r) + U2 (r) (1) 2 2 Let Intensity I1= |U1| and I2=| |U2| then the intensity of total waves is 2 2 2 2 * * I=|U| = |U1+U2| = |U1| +|U2| + U1 U2 + U1U2 (2) W.Wang 4 Basic Interference Equation 0.5 jφ1 0.5 jφ2 Let U1 = I1 e and U2 = I2 e Then 0.5 I= I1_+I2 + 2(I1 I2) COSφ(3) Where φ = φ2 −φ1 (phase difference between two wave) Ripple tank Interference pattern created by phase Difference φ W.Wang 5 Interferometers •Mach-Zehnder •Michelson •Sagnac Interferometer •Fabry-Perot Interferometer -
High Resolution Radio Astronomy Using Very Long Baseline Interferometry
IOP PUBLISHING REPORTS ON PROGRESS IN PHYSICS Rep. Prog. Phys. 71 (2008) 066901 (32pp) doi:10.1088/0034-4885/71/6/066901 High resolution radio astronomy using very long baseline interferometry Enno Middelberg1 and Uwe Bach2 1 Astronomisches Institut, Universitat¨ Bochum, 44801 Bochum, Germany 2 Max-Planck-Institut fur¨ Radioastronomie, Auf dem Hugel¨ 69, 53121 Bonn, Germany E-mail: [email protected] and [email protected] Received 3 December 2007, in final form 11 March 2008 Published 2 May 2008 Online at stacks.iop.org/RoPP/71/066901 Abstract Very long baseline interferometry, or VLBI, is the observing technique yielding the highest-resolution images today. Whilst a traditionally large fraction of VLBI observations is concentrating on active galactic nuclei, the number of observations concerned with other astronomical objects such as stars and masers, and with astrometric applications, is significant. In the last decade, much progress has been made in all of these fields. We give a brief introduction to the technique of radio interferometry, focusing on the particularities of VLBI observations, and review recent results which would not have been possible without VLBI observations. This article was invited by Professor J Silk. Contents 1. Introduction 1 2.9. The future of VLBI: eVLBI, VLBI in space and 2. The theory of interferometry and aperture the SKA 10 synthesis 2 2.10. VLBI arrays around the world and their 2.1. Fundamentals 2 capabilities 10 2.2. Sources of error in VLBI observations 7 3. Astrophysical applications 11 2.3. The problem of phase calibration: 3.1. Active galactic nuclei and their jets 12 self-calibration 7 2.4.