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PATTERN RECOGNITION LETTERS an Official Publication of the International Association for Pattern Recognition PATTERN RECOGNITION LETTERS An official publication of the International Association for Pattern Recognition AUTHOR INFORMATION PACK TABLE OF CONTENTS XXX . • Description p.1 • Audience p.2 • Impact Factor p.2 • Abstracting and Indexing p.2 • Editorial Board p.2 • Guide for Authors p.5 ISSN: 0167-8655 DESCRIPTION . Pattern Recognition Letters aims at rapid publication of concise articles of a broad interest in pattern recognition. Subject areas include all the current fields of interest represented by the Technical Committees of the International Association of Pattern Recognition, and other developing themes involving learning and recognition. Examples include: • Statistical, structural, syntactic pattern recognition; • Neural networks, machine learning, data mining; • Discrete geometry, algebraic, graph-based techniques for pattern recognition; • Signal analysis, image coding and processing, shape and texture analysis; • Computer vision, robotics, remote sensing; • Document processing, text and graphics recognition, digital libraries; • Speech recognition, music analysis, multimedia systems; • Natural language analysis, information retrieval; • Biometrics, biomedical pattern analysis and information systems; • Special hardware architectures, software packages for pattern recognition. We invite contributions as research reports or commentaries. Research reports should be concise summaries of methodological inventions and findings, with strong potential of wide applications. Alternatively, they can describe significant and novel applications of an established technique that are of high reference value to the same application area and other similar areas. Commentaries can be lecture notes, subject reviews, reports on a conference, or debates on critical issues that are of wide interests. To serve the interests of a diverse readership, the introduction should provide a concise summary of the background of the work in an accepted terminology in pattern recognition, state the unique contributions, and discuss broader impacts of the work outside the immediate subject area. All contributions are reviewed on the basis of scientific merits and breadth of potential interests. AUTHOR INFORMATION PACK 24 Sep 2021 www.elsevier.com/locate/patrec 1 AUDIENCE . Researchers and practitioners in Pattern Recognition, Computer Science, Electrical and Electronic Engineering, Mathematics and Statisticians, and any areas of science and engineering where automatic pattern recognition is applicable. IMPACT FACTOR . 2020: 3.756 © Clarivate Analytics Journal Citation Reports 2021 ABSTRACTING AND INDEXING . ACM Computing Reviews CompuScience Zentralblatt MATH Science Citation Index Web of Science Cambridge Scientific Abstracts Computer Abstracts Current Contents - Engineering, Computing & Technology Engineering Index Geographical Abstracts INSPEC Scopus EDITORIAL BOARD . Editors-in-Chief M. De Marsico, University of Rome La Sapienza Department of Computer Science, Rome, Italy J. Lu, Tsinghua University, Beijing, China S. Sarkar, University of South Florida, Tampa, Florida, United States of America Deputy Editor F. Malmberg, Uppsala University, Uppsala, Sweden Area Editors A. S. Chowdhury, Jadavpur University, Electronics and Telecommunication Engineering, Kolkata, India E.R. Davies, Royal Holloway University of London Department of Physics, Egham, United Kingdom A. Kumar, The Hong Kong Polytechnic University Department of Computing, Hong Kong, Hong Kong Y. Liu, Edge Hill University Department of Computing, Ormskirk, United Kingdom E. Michaelsen, Fraunhofer Institute of Optronics System Technologies and Image Exploitation IOSB Ettlingen Branch, Ettlingen, Germany S. Wang, University of South Carolina College of Engineering and Computing, Columbia, South Carolina, United States of America Associate Editors A. F. Abate, University of Salerno, Fisciano, Italy F. Alonso-Fernandez, Halmstad University, Halmstad, Sweden G. Azzopardi, University of Groningen, Bernoulli Institute for Mathematics, Computer Science and Artificial Intelligence, Groningen, Netherlands L. Baraldi, University of Modena and Reggio Emilia Department of Engineering Enzo Ferrari, Modena, Italy Computer vision, Deep learning, Multimedia, Video understanding, Visual-semantic understanding E. Benetos, Queen Mary University of London, London, United Kingdom S. Biswas, Indian Institute of Science, Bengaluru, India M. Castrillon Santana, University of Las Palmas de Gran Canaria School of Engineering, Las Palmas de Gran Canaria, Spain S. Chen, Nanjing University of Aeronautics and Astronautics, Nanjing, China W.-H. Cheng, National Yang Ming Chiao Tung University, Hsinchu, Taiwan multimedia, artificial intelligence, computer vision, machine learning, social media, and financial technology. M. Cristani, University of Verona Department of Computer Science, Verona, Italy AUTHOR INFORMATION PACK 24 Sep 2021 www.elsevier.com/locate/patrec 2 R. Da Silva Torres, Norwegian University of Science and Technology, Trondheim, Norway Multimedia retrieval, Multimedia analysis, Pattern recognition, Machine learning, E-Science C. De Stefano, University of Cassino and Southern Lazio, Cassino, Italy J. Debayle, National Graduate School of Mines Saint-Etienne, St Etienne, France Adaptive Image Processing, Mathematical Morphology, Pattern Analysis, Stochastic Geometry D. Dembélé, Institut of Genetics and Molecular and Cellular Biology, Illkirch Graffenstaden, France C. Deng, Xidian University School of Mechano-Electronic Engineering, Xian, China Cross-modal Retrieval; Mulit-modal Representation Learning; Text-to-Image Synthesis; Cross-modal Knowledge Learning; Adversarial Example Attack and Defense S. Dutta Roy, Indian Institute of Technology Delhi, New Delhi, India A. Fernández-Caballero, University of Castilla-La Mancha Albacete Research Institute of Informatics, Albacete, Spain L. Gallo, National Research Council, Roma, Italy J. Han, Northwestern Polytechnical University, Xi’an, China L. Heutte, University of Rouen Laboratory of Computer Science Information Processing and Systems, Saint- Etienne-du-Rouvray, France G. Jiang, Ningbo University, Ningbo, China L. Jin, South China University of Technology, Guangzhou, China Y. Kenmochi, Gaspard-Monge Computer Science Laboratory, Marne La Vallee, France L. Liu, University of Oulu, Oulu, Finland Computer Vision, Deep Learning, Texture analysis, object detection, deep learning, scene understanding, network compression, few shot learning, domain adaptation, image retrieval, 3D point cloud X. Liu, Michigan State University, East Lansing, Michigan, United States of America Facial analysis, face alignment, face recognition, face reconstruction B. Luo, Anhui University School of Computer Science and Technology, Hefei, China Pattern Recognition, Digital Image Processing, Graph Representation, Graph Matching, Graph Embedding A. Marcelli, University of Salerno, Fisciano, Italy S. Mattoccia, University of Bologna, Bologna, Italy computer vision, machine-learning, 3D vision, depth and scene flow estimation from monocular and stereo images, domain adaptation, embedded computer vision H. Méndez-Vázquez, Advanced Technologies Application Centre, La Habana, Cuba Computer vision, Image processing, Biometrics, Face recognition J. Mukhopadhyay, Indian Institute of Technology Kharagpur, Kharagpur, India M. Nappi, University of Salerno, Fisciano, Italy U. Pal, Indian Statistical Institute Computer Vision and Pattern Recognition Unit, Kolkata, India N. Passat, Reims Champagne-Ardenne University, Reims, France Y. Peng, Peking University, Beijing, China X. Qian, Texas A&M University, College Station, Texas, United States of America D. Riccio, University of Naples Federico II Department of Electrical Engineering and Information Technology, Napoli, Italy S. Rossi, University of Naples Federico II Department of Electrical Engineering and Information Technology, Napoli, Italy J. Ruiz-Shulcloper, Advanced Technologies Application Centre, La Habana, Cuba P.K. Saha, The University of Iowa, Iowa City, Iowa, United States of America S. Shan, Chinese Academy of Sciences, Beijing, China A. Shokoufandeh, Drexel University College of Computer and Informatics, Philadelphia, Pennsylvania, United States of America N. Strisciuglio, University of Twente, Enschede, Netherlands J. Su, Harbin Institute of Technology Shenzhen School of Computer Science and Technology, Shenzhen, China A. C. Telea, Utrecht University, Utrecht, Netherlands K.A. Toh, Yonsei University, Seoul, South Korea A. Torsello, Ca' Foscari University Department of Environmental Sciences Informatics and Statistics, Venezia, Italy F. Tortorella, University of Salerno, Fisciano, Italy X.J. Wu, Jiangnan University School of Artificial Intelligence and Computer Science, Wuxi, China H. Yan, Beijing University of Posts and Telecommunications, Beijing, China J. Yang, Nanjing University of Science and Technology, Nanjing, China L. Yin, Binghamton University, Binghamton, New York, United States of America W, Zhang, Shandong University, Jinan, China J. Zou, National Library of Medicine, Bethesda, Maryland, United States of America Advisory Editors S. Dickinson, University of Toronto, Toronto, Ontario, Canada R.P.W. Duin, Delft University of Technology, Delft, Netherlands AUTHOR INFORMATION PACK 24 Sep 2021 www.elsevier.com/locate/patrec 3 J.V. Kittler, University of Surrey, Guildford, United Kingdom W.G. Kropatsch, TU Wien University, Vienna, Austria Mark S. Nixon, University of Southampton, Southampton, United Kingdom T. Tan, Chinese Academy of Science
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