crystals Article “Seeing Is Believing”—In-Depth Analysis by Co-Imaging of Periodically-Poled X-Cut Lithium Niobate Thin Films Sven Reitzig 1,* , Michael Rüsing 1, Jie Zhao 2,†, Benjamin Kirbus 1, Shayan Mookherjea 2 and Lukas M. Eng 1,3 1 Institut für Angewandte Physik, Technische Universität Dresden, 01062 Dresden, Germany;
[email protected] (M.R.);
[email protected] (B.K.);
[email protected] (L.M.E.) 2 Department of Electrical and Computer Engineering, University of California, San Diego, CA 92161, USA;
[email protected] (J.Z.);
[email protected] (S.M.) 3 ct.qmat: Dresden-Würzburg Cluster of Excellence—EXC 2147, TU Dresden, 01062 Dresden, Germany * Correspondence:
[email protected]; Tel.: +49-351-463-43354 † Since February 2021 affiliated with Nokia Bell Labs, Murray Hill, NJ 07974, USA. Abstract: Nonlinear and quantum optical devices based on periodically-poled thin film lithium niobate (PP-TFLN) have gained considerable interest lately, due to their significantly improved performance as compared to their bulk counterparts. Nevertheless, performance parameters such as conversion efficiency, minimum pump power, and spectral bandwidth strongly depend on the quality of the domain structure in these PP-TFLN samples, e.g., their homogeneity and duty cycle, as well as on the overlap and penetration depth of domains with the waveguide mode. Hence, in order to propose improved fabrication protocols, a profound quality control of domain structures is needed that allows quantifying and thoroughly analyzing these parameters. In this paper, we Citation: Reitzig, S.; Rüsing, M.; propose to combine a set of nanometer-to-micrometer-scale imaging techniques, i.e., piezoresponse Zhao, J.; Kirbus, B.; Mookherjea, S.; force microscopy (PFM), second-harmonic generation (SHG), and Raman spectroscopy (RS), to access Eng, L.M.