U.S. Department of Commerce Carlos M. Gutierrez, Secretaiy Technology Administration Robert Cresanti, Under Secretaiy of Commerce for Technology National Institute ofStandards and Technolog}' William Jeffrey, Director Certain commercial entities, equipment, or materials may be identified in this document in order to describe an experimental procedure or concept adequately. Such identification does not imply recommendation or endorsement by the National Institute of Standards and Technology, nor does it imply that the materials or equipment used are necessarily the best available for the purpose. National Institute of Standards and Technology Special Publication 1052 Natl. Inst. Stand. Technol. Spec. Publ. 1052, 186 pages (August 2006) CODEN: NSPUE2 NIST Special Publication 1052 Accomplishments in Nanoteciinology Compiled and Edited by: Michael T. Postek, Assistant to the Director for Nanotechnology, Manufacturing Engineering Laboratory Joseph Kopanski, Program Office and David Wollman, Electronics and Electrical Engineering Laboratory U. S. Department of Commerce Technology Administration National Institute of Standards and Technology Gaithersburg, MD 20899 August 2006 National Institute of Standards and Teclinology • Technology Administration • U.S. Department of Commerce Acknowledgments Thanks go to the NIST technical staff for providing the information outlined on this report. Each of the investigators is identified with their contribution. Contact information can be obtained by going to: http ://www. nist.gov Acknowledged as well, is the invaluable assistance and support provided by Mark Bello of the NIST Public and Business Affairs Office, Thelma Allen, Douglas Smith and Anne Chaka of the NIST Program Office. Bessmarie (Beamie) Young is also thanked for her contribution to the design of the cover for this document. Mylene Ouimette and Use Putman of the NIST Information Services Division are thanked for their assistance in getting the document prepared for publishing and Geoff Holdridge of the National Nanotechnology Coordination Office and WTEC is thanked for his invaluable assistance in document formatting and preparation. Table of Contents Table of Contents Introduction 1 1 - Fundamental Nanoscale Phenomena and Processes Nanoscale Science, Joseph A. Stroscio and Daniel T. Pierce (PL) 5 Nanotechnology with atom optics, Jabez J. McClelland PL) 7 Nanoscale Characterization of Polymeric Materials Degradation, Tinh Nguyen, Xiaohong Gu, and Jon Martin (BFRL) 9 Nanomechanical Characterization of Nanoparticle-filled Polymeric Coatings and Composites, Stephanie Scierka and Peter Votruba-Drzal (BFRI.) 11 Creating Visual Models of Nanoworlds, Judith Devaney (ITL) 13 Brillouin Light Scattering, Ward Johnson, Sudook Kim, Colm Flarmery, and Pavel Kabos (MSEL) 15 Nanolithography: Next-Generation Polymer Photoresists, Vivek M. Prabhu (MSEL) 16 Modeling for Organic Conduction, Carlos A. Gonzalez (CSTL) 17 Spin Electronics, William H. Rippard and Matthew R. Pufall (EEEL) 19 Nanomagnetodynamics, Robert D. McMichael (MSEL) 21 Nanomagnetism, John Unguris and Mark Stiles (PL) 22 Synthesis, Characterization, and Manipulation of Magnetic Nanoparticles, Guangjun Cheng and Angela R. Hight Walker (PL) 24 Nanomagnetodynamics: Fundamental Properties, Thomas J. Silva, (EEEL) 25 Bioelectronics Michael Gaitan, Darwin Reyes-Hernandez, and Brian Polk, EEEL, Laurie Locascio, and Sam Forry CSTL 27 Single Molecule Nanovials, Michael Gaitan EEEL, and Laurie Locascio and Wyatt Vreeland, CSTL 29 Optical Manipulation of Nanocontainers and Nanotubes, William D. Phillips, Kristian Helmerson (PL) 31 NIST Accomplishments in Nanotechnology iii Table of Contents Fundamental Properties of Quantum Dots, Kevin Silverman (EEEL) 33 Multiscale Modeling of Nanostructures, Vinod Tewary and David Read (MSEL) 35 Designing the Nanoworld: Nanosystems and Nanooptics, Gamett W. Bryant (PL) 36 Precision Metrology for Nanoscale Quantum Technologies, John Lawall and Gamett W. Bryant (PL) 38 Control of Cold Quantum Gases for Atomic Clocks and Quantum Information Processing, Paul S. Julienne and Lite Tiesinga (PL) 40 Quantum Computing with Trapped Ions, David Wineland and Tom O'Brian (PL) 42 Neutral Atom Quantum Computation, William D. Phillips, James Porto (PL) 44 2 - Nanomaterials Polymer Miscibility of Imidazolium Compatibilized Nanotubes, Jeffrey Oilman (BFRL) 45 New Materials to Protect Firefighters from Bum Injuries, Jeffrey Oilman and Kuldeep Prasad (BFRL) 46 Characterization and Photoreactivity of Titanium Dioxide Nanostmctures, Stephanie Scierka and Joarmie Chin (BFRL) 47 Optical Properties of Carbon Nanotubes, John Lehman (EEEL) 49 Characterization of Single Walled Carbon Nanotubes, Angela R. Hight Walker (PL) 50 Stability of Nanowires, Geoffrey B. McFadden (ITL) 51 Semiconductor Quantum Dot Structure Metrology, Alexana Roshko (EEEL) 53 Chemistry and Stmcture of Nanomaterials, Daniel A. Fischer (MSEL) 55 Mechanical Metrology for Small-Scale Structures, Edwin R. Fuller, Jr. and George D. Quinn (MSEL) 56 Highly Charged Ion Modified Materials, Joshua M. Pomeroy and John D. Oillaspy (PL) 57 Nanoscale Metrology of Ill-Nitride Semiconductor Films and Nanowires, Norman Sanford and John Schlager (EEEL) 58 Mathematical Modeling of Nanomagnetism, Michael J. Donahue and Donald O. Porter (ITL) 60 Magnetic Materials For Nanoscale Sensors and Ultra-High Density Data Storage, William F. Egelhoff, Jr. (MSEL) 62 NIST Accomplishments in Nanotechnology iv Table of Contents 3 - Nanoscale Devices and Systems Evanescent Microwave Probing and High-resolution Microwave Power Imaging, Michael Janezic, James Baker-Jarvis, and Pavel Kabos (EEEL) 63 Chemical Sensing with Nanowires & Nanotubes, Richard E. Cavicchi (CSTL) 64 III -Nitride Semiconductor Nanowires: Growth and Characterization, Kris Bertness and Norman Sanford (EEEL) 65 Measuring & Understanding Charge Transport in Molecules, Roger van Zee, (CSTL) 66 MOS Device Characterization and Reliability Project, John S. Suehle and Eric M. Vogel (EEEL) 68 Nanoelectronic Device Metrology Project, Curt A. Richter and Eric M. Vogel (EEEL) 70 Nanomagnetodynamics: Devices, Stephen E. Russek, (EEEL) 72 Nanoscale Engineered Magnetic Sensors, David P. Pappas, (EEEL) 74 Single Photon Sources and Detectors, Richard Mirin (EEEL) 76 Terahertz Technology, Erich Grossman and Robert Schwall (EEEL) 78 Nanoscale Fabrication, James Beall (EEEL) 80 Johnson Noise Thermometry, Wes Tew, Sam Benz, Sae Woo Nam (EEEL) 82 Quantum Communications, Sae Woo Nam (EEEL) 84 Quantum Computing Using Superconducting Phase Qubits, Ray Simmonds (EEEL) 86 Quantum Sensors, Kent Irwin (EEEL) 88 Single Electronics for Standards and Metrology, Mark Keller and Neil Zimmerman (EEEL) 90 Quantum Voltage Metrology, Samuel Benz and Yi-hua Tang (EEEL) 92 Architectures for Fault-tolerant Quantum Computing, Emanuel Knill (ITL) 94 Synthesis of Quantum Logic Circuits, Stephen S. Bullock (ITL) 96 Quantitative single-molecular pair fluorescence resonance, Lori S. Goldner (PL) 98 Bacteriophage/Quantum-dot nanocomplex to detect biological target in clinical or environmental isolates, Jeeseong Hwang (PL) 100 NIST Accomplishments in Nanotechnology V Table of Contents 4- Instrumentation Research, Metrology and Standards for Nanotechnology Chemical Sensor Microscopy for Nanotechnology, Tinh Nguyen and Xiaohong Gu (BFRL) 101 Nanomechanical Properties of Polymer Thin Films, Christopher M. Stafford (MSEL) 103 Nanomechanical Metrology, Douglas T. Smith and Lyle E. Levine (MSEL) 104 Improving Image Resolution in Nanotechnology, Alfred Carasso (ITL) 105 Optical Metrology for Nanolithography, John H. Burnett, Simon G. Kaplan, and Eric L. Shirley (PL) 107 True Three-Dimensional Tomography Utilizing Bayesian Statistical Inference, Donald Malec and Juan Soto (ITL) 109 Structure and Dispersion Measurements of Polymeric Building Materials, Li-Piin Sung (BFRL) Ill Synthetic X-ray Spectrum Images for 3D Chemical Imaging at the Nanoscale, John Henry J. Scott and Nicholas Ritchie (CSTL) 113 Carbon Nanotube Metrology, Paul Rice and Tammy Oreskovic (MSEL) 115 Nanotribology and Surface Properties, Stephen Hsu (MSEL) 116 Neutron Reflectometry for Highly Accurate Nanometer Metrology, Joseph A. Dura (MSEL) 117 Gradient Reference Specimens for Advanced Scanned Probe Microscopy, Michael J. Fasolka and Duangrut Julthongpiput (MSEL) 118 Quantitative Nanomechanical Properties, Donna C. Hurley (MSEL) 119 Highly Charged Ions in EUV Lithography, John D. Gillaspy and Joshua M. Pomeroy (PL) 120 Electrical Test Structure Metrology, Michael Cresswell and Richard Allen (EEEL) 122 Molecular Nanomagnets, Brant Cage and Stephen E. Russek, (EEEL) 124 Nanomagnetic Measurements, John Moreland, (EEEL) 126 Nanoparticle Measurements for Biological Applications, John Moreland, (EEEL) 128 Imaging Methods for Nanoparticle and Cell Systems to Investigate Toxicity, Cynthia J. Zeissler and Peter E. Barker (CSTL) 130 NIST Accomplishments in Nanotechnology vi Table of Contents 5 - Nanomanufacturing Development of High-resolution Variable Pressure Reference Scanning Electron Microscope, Andras E. Vladar, Michael T. Postek and John S. Villarrubia (MEL) 133 Scanning Probe Microscopy for Nanoscale Measurements, Ronald Dixson, Joseph Fu, George Orji, and Theodore Vorburger (MEL) 135 Scanning Probe Microscopy for Nanoscale Measurements: Atom-Based Height Standards, Joseph Fu, Ronald Dixson, George Orji, and Theodore Vorburger (MEL) 137 Atom-Based Dimensional Metrology, Rick Silver (MEL) 139 Critical Dimension Metrology using Scanning Electron Microscopy and a