2018 48th European Microwave Conference (EuMC 2018) Madrid, Spain 23-27 September 2018 Pages 757-1584 IEEE Catalog Number: CFP18455-POD ISBN: 978-1-5386-5285-5 2/2 Copyright © 2018, European Microwave Association (EuMa) All Rights Reserved *** This is a print representation of what appears in the IEEE Digital Library. Some format issues inherent in the e-media version may also appear in this print version. IEEE Catalog Number: CFP18455-POD ISBN (Print-On-Demand): 978-1-5386-5285-5 ISBN (Online): 978-2-87487-051-4 Additional Copies of This Publication Are Available From: Curran Associates, Inc 57 Morehouse Lane Red Hook, NY 12571 USA Phone: (845) 758-0400 Fax: (845) 758-2633 E-mail:
[email protected] Web: www.proceedings.com EuMC 2018 Table of Contents [Page1/81] EuMC01 : Power Amplifier Architectures for High Efficiency and Linearity Chair: Georg Fischer, FAU Erlangen-Nürnberg, Germany Co-Chair: Paolo Colantonio, Università di Roma “Tor Vergata”, Italy Time 08:30–10:10, 25 Sept 2018, N101 + N102 1 A High-Efficiency GaN Transistor Module with Thick-Film BST-Based Tunable Matching Network Sebastian Preis 1, Alex Wiens 2, Enrico Lia 3, Wolfgang Heinrich 1, Rolf Jakoby 2, Holger Maune 2, Olof Bengtsson 1 1FBH, Germany; 2Technische Universität Darmstadt, Germany; 3ESA-ESTEC, The Netherlands 5 Dynamic Load Modulated Low-Voltage GaN PA Using Novel Low-Loss GaN Varactors Raul Amirpour, Sebastian Krause, Rüdiger Quay, Oliver Ambacher, Fraunhofer IAF, Germany 9 Band-Limited Digital Predistortion with Band-Switching Feedback Architecture for 5G mmWave Power Amplifiers Soubhik Deb, Masaaki Tanio, Shinichi Hori, Noriaki Tawa, Yasushi Wada, Kazuaki Kunihiro, NEC, Japan 13 Novel DC-Biasing Circuits with Arbitrary Harmonic-Control Capability for Compact High-Efficiency Power Amplifiers Shinichi Tanaka, Tomoya Oda, Kento Saiki, Shibaura Institute of Technology, Japan 17 Practical Load Compensation Networks in Chireix Outphasing Amplifiers Using Offset Transmission Lines Aleksander Bogusz 1, Jonathan Lees 1, Roberto Quaglia 1, Gavin T.