DOCSLIB.ORG

NIST MEASUREMENT SERVICES: Spectral Reflectance

Total Page：16

File Type：pdf, Size：1020Kb

Download full-text PDF Read full-text
NIST MEASUREMENT SERVICES: Spectral Reflectance NIST Measurement Services: NATL INST. OF STAND & TECH R.I.C. M!ST REFERENCE FUBUCATIONSlj AlllDS M7blb7 Spectral Reflectance NIST Special Publication 250-48 P. Yvonne Barnes Edward A. Early Albert C. Parr Optical Properties of Materials: Bidirectional Reflectance Distribution Function Directional - Hemispherical Reflectance Factor Reflectance Standards: First Surface Mirrors Tiles and Polished Glasses Diffusers and Pressed Powders Wavelength Standards: Rare-Earth Mixture U.S. Department of Commerce QC Technology Administration National Institute of Standards and Technology jl OQ U57 0.250-48 998 rhe National Institute of Standards and Technology was established in 1988 by Congress to "assist industry in the development of technology . needed to improve product quality, to modernize manufacturing processes, to ensure product reliability . and to facilitate rapid commercialization ... of products based on new scientific discoveries." NIST, originally founded as the National Bureau of Standards in 1901, works to strengthen U.S. industry's competitiveness; advance science and engineering; and improve public health, safety, and the environment. One of the agency's basic functions is to develop, maintain, and retain custody of the national standards of measurement, and provide the means and methods for comparing standards used in science, engineering, manufacturing, commerce, industry, and education with the standards adopted or recognized by the Federal Government. As an agency of the U.S. Commerce Department's Technology Administration, NIST conducts basic and applied research in the physical sciences and engineering, and develops measurement techniques, test methods, standards, and related services. The Institute does generic and precompetitive work on new and advanced technologies. NIST's research facilities are located at Gaithersburg, MD 20899, and at Boulder, CO 80303. Major technical operating units and their principal activities are listed below. For more information contact the Publications and Program Inquiries Desk, 301-975-3058. Office of the Director Physics Laboratory • National Quality Program • Electron and Optical Physics • International and Academic Affairs • Atomic Physics • Optical Technology Technology Services • Ionizing Radiation • Standards Services • Time and Frequency' • Technology Partnerships • Quantum Physics' " • Measurement Services • Technology Innovation Materials Science and Engineering • Information Services Laboratory • Intelligent Processing of Materials Advanced Technology Program • Ceramics • Economic Assessment • Materials Reliability' • Information Technology and Applications • Polymers • Chemical and Biomedical Technology • Metallurgy • Materials and Manufacturing Technology • NIST Center for Neutron Research • Electronics and Photonics Technology Manufacturing Engineering Manufacturing Extension Partnership Laboratory Program • Precision Engineering • Regional Programs • Automated Production Technology • National Programs • Intelligent Systems • Program Development • Fabrication Technology • Manufacturing Systems Integration Electronics and Electrical Engineering Laboratory Building and Fire Research • Microelectronics Laboratory • Law Enforcement Standards • Structures • Electricity • Building Materials • Semiconductor Electronics • Building Environment • Electromagnetic Fields' • Fire Safety Engineering • Electromagnetic Technology' • Fire Science • Optoelectronics' Information Technology Laboratory Chemical Science and Technology • Mathematical and Computational Sciences^ Laboratory • Advanced Network Technologies • Biotechnology • Computer Security • Physical and Chemical Properties^ • Information Access and User Interfaces • Analytical Chemistry • High Performance Systems and Services • Process Measurements • Distributed Computing and Information Services • Surface and Microanalysis Science • Software Diagnostics and Conformance Testing 'At Boulder, CO 80303. ^Some elements at Boulder, CO. NIST MEASUREMENT SERVICES: Spectral Reflectance p. Yvonne Barnes Edward A. Early Albert C. Parr Optical Technology Division Physics Laboratory National Institute of Standards and Technology Gaithersburg, MD 20899-0001 March 1998 U.S. DEPARTMENT OF COMMERCE William M. Daley, Secretary Technology Administration Gary R. Bachula, Acting Under Secretary for Technology National Institute of Standards and Technology Raymond G. Kammer, Director / National Institute of Standards and Technology Special Publication 250-48 Natl. Inst. Stand. Techno!. Spec. Publ. 250-48, 153 pages (Mar. 1998) CODEN: NSPUE2 U.S. GOVERNMENT PRINTING OFFICE WASHINGTON: 1998 For sale by the Superintendent of Documents, U.S. Government Printing Office, Washington, DC 20402-9325 PREFACE The calibration and related measurement services of the National Institute of Standards and Technology are intended to assist the makers and users of precision measuring instruments in achieving the highest possible levels of accuracy, quality, and productivity. NIST offers over 300 different calibrations, special tests, and measurement assurance services. These services allow customers to directly link their measurement systems to measurement systems and standards maintained by NIST. These services are offered to the public and private organizations alike. They are described in NIST Special Publication (SP) 250, NIST Calibration Services Users Guide. The Users Guide is supplemented by a number of Special Publications (designated as the "SP250 Series") that provide detailed descriptions of the important features of specific NIST calibration services. These documents provide a description of the: (1) specifications for the services; (2) design philosophy and theory; (3) NIST measurement services; (4) NIST operational procedures; (5) assessment of the measurement uncertainty including random and systematic errors and an error budget; and (6) internal quality control procedures used by NIST. These documents will present more detail than can be given in NIST calibration reports, or than is generally allowed in articles in scientific journals. In the past, NIST has published such information in a variety of ways. This series will make this type of information more readily available to the user. This document, SP250-48 (1998), NIST Measurement Services: Spectral Reflectance, is a revision of SP250-8 (1987). It describes the instrumentation, standards, and techniques used to measure spectral reflectance over the ultraviolet, visible, and near infrared wavelengths for Standard Reference Materials 2003, 2011, 2015, 2016, 2023, 2026, and 2044 and for Special Test 38060S. Inquiries concerning the technical content of this document or the specifications for these services should be directed to the authors or to one of the technical contacts cited in SP250. NIST welcomes suggestions on how publications such as this might be made more useful. Suggestions are also welcome concerning the need for new calibration services, special tests, and measurement assurance programs. Peter L.M. Heydemann Katharine B. Gebbie Director Director Measurement Services Physics Laboratory iii ABSTRACT This document describes the instrumentation, standards, and techniques used at the National Institute of Standards and Technology to measure spectral reflectance over the ultraviolet, visible, and near infrared wavelength ranges. The organization is as follows. Part I describes the motivation for maintaining reference and transfer spectrophotometers for spectral reflectance measurements, the basics of reflection, and the standards and services that are available from NIST. Part II develops the necessary theory of reflection, beginning with basic definitions and equations and ending with the relevant measurement equations for the experiments described in this documentation. The NIST Spectral Tri-function Automated Reference Reflectometer is described in Part III. This instrument provides the basis for the development of absolute NIST standards of diffuse and specular reflectance. Part IV describes the NIST transfer spectrophotometers, high precision commercial instruments used for calibrating Standard Reference Materials such as diffuse reflectance and specular reflectance standards. The transfer instruments rely on master standards that are periodically calibrated on the high accuracy reference reflectometer described in Part III. References containing details are reproduced in the appendices. Key words: bidirectional; diffuse reflectance; reflectance; spectrophotometer; spectrophotometry; spectral reflectance, specular reflectance iv TABLE OF CONTENTS Abstract iv 1. Introduction 1 2. Theory 4 2.1 Basic Definitions and Equations 4 2.2 Measurement Equations 8 2.2.1 Bidirectional Reflectance Distribution Function 8 2.2.2 Directional - Hemispherical Reflectance 10 3. Reference Instrument - STARR 12 3.1 Description 12 3.1.1 Basic Instrument 12 3.1.2 Source System 14 3.1.3 Goniometer 16 3.1.4 Integrating Spheres 18 3.2 Calibration 20 3.2.1 Source System 20 3.2.2 Goniometer 21 3.2.3 Integrating Spheres 22 3.2.4 Detectors 22 3.3 Operation 22 3.3.1 Source System 23 3.3.2 Bidirectional Reflectance 23 3.3.3 Directional - Hemispherical Reflectance 28 3.4 Uncertainties 30 3.4.1 Introduction 30 3.4.2 Bidirectional Reflectance 31 3.4.3 Directional - Hemispherical Reflectance 37 4. Transfer Instruments - Spectrophotometers 40 4.1 Description 40 4.2 Calibration 42 4.3 Operation 44 4.4 Uncertainties 45 Acknowledgments 46 References 47 V Appendix A: Sample Report of Test for Bidirectional Reflectance
Load more

Recommended publications
  • Determination of Sensors Characteristics of Curb
    DETERMINATION OF SENSORS CHARACTERISTICS OF CURB AND DEVELOPMENT OF SURROGATE CURB FOR THE EVALUATION OF VEHICLE ACTIVE SAFETY SYSTEMS A Thesis Submitted to the Faculty of Purdue University by Seeta Ram Pandey In Partial Fulfillment of the Requirements for the Degree of Master of Science in Electrical and Computer Engineering May 2020 Purdue University Indianapolis, Indiana ii THE PURDUE UNIVERSITY GRADUATE SCHOOL STATEMENT OF THESIS APPROVAL Dr. Stanley Yung-Ping Chien, Chair Department of Electrical and Computer Engineering Dr. Yaobin Chen Department of Electrical and Computer Engineering Dr. Brian King Department of Electrical and Computer Engineering Approved by: Dr. Brian King Head of the Graduate Program iii ACKNOWLEDGMENTS Completing a Master of Science in Electrical and Computer Engineering program from a country like the USA is an achievement on which one should always be proud. It was challenging for a person like me who was in the corporate industry for the last thirteen years. The education industry has evolved drastically from the days of my undergraduate completion year 2005 and I was totally unaware of the nitty-gritty of advanced education courses and systems. I am thankful to IUPUI for embracing me in their coveted program and encouraging me to explore and triumph the unseen. I would like to use this platform to express my sincere appreciation to my supervisor, Professor Stanley Chien. He absorbed my weaknesses and persistently steered and inspired me to be professional and raise the standards. He is an epitome of patience and I am sincerely thankful to him for trusting me to pull off the work.
    [Show full text]
  • SPECTRALON BRDF and DHR MEASUREMENTS in SUPPORT of SATELLITE INSTRUMENTS OPERATING THROUGH SHORTWAVE INFRARED Georgi T
    SPECTRALON BRDF AND DHR MEASUREMENTS IN SUPPORT OF SATELLITE INSTRUMENTS OPERATING THROUGH SHORTWAVE INFRARED Georgi T. Georgieva, James J. Butlerb, Kurt Thomeb, Catherine Cookseyc, Leibo Dingd aNASA Langley Research Center, Hampton, VA23666, e-mail: [email protected] bNASA Goddard Space Flight Center, Greenbelt, MD 20771 cNational Institute of Standards and Technology, Gaithersburg, MD 20899 dScience Systems and Applications, Lanham, MD 20706 ABSTRACT Satellite instruments operating in the reflective solar wavelength region require accurate and precise determination of the Bidirectional Reflectance Distribution Functions (BRDFs) of the laboratory and flight diffusers used in their pre-flight and on-orbit calibrations. This paper advances that initial work and presents a comparison of spectral Bidirectional Reflectance Distribution Function (BRDF) and Directional Hemispherical Reflectance (DHR) of Spectralon*, a common material for laboratory and on- orbit flight diffusers. A new measurement setup for BRDF measurements from 900 nm to 2500 nm located at NASA Goddard Space Flight Center (GSFC) is described. The GSFC setup employs an extended indium gallium arsenide detector, bandpass filters, and a supercontinuum light source. Comparisons of the GSFC BRDF measurements in the ShortWave InfraRed (SWIR) with those made by the NIST Spectral Tri- function Automated Reference Reflectometer (STARR) are presented. The Spectralon sample used in this study was 2 inch diameter, 99% white pressed and sintered Polytetrafluoroethylene (PTFE) target. The NASA/NIST BRDF comparison measurements were made at an incident angle of 0o and viewing angle of 45o. Additional BRDF data not compared to NIST were measured at additional incident and viewing angle geometries and are not presented here The total combined uncertainty for the measurement of BRDF in the SWIR range made by the GSFC scatterometer is less than 1% (k=1).
    [Show full text]
  • Hemispherical and Diffuse Reflectance Measurements Using an FTIR and a Commercial Integrating Sphere
    432 Vol. 57, No. 3 / January 20 2018 / Applied Optics Research Article Methods for quantitative infrared directional- hemispherical and diffuse reflectance measurements using an FTIR and a commercial integrating sphere 1, 1 1 1,2 THOMAS A. BLAKE, *TIMOTHY J. JOHNSON, RUSSELL G. TONKYN, BRENDA M. FORLAND, 1 1 1 1 TANYA L. MYERS, CAROLYN S. BRAUER, YIN-FONG SU, BRUCE E. BERNACKI, 3 4 LEONARD HANSSEN, AND GERARDO GONZALEZ 1Pacific Northwest National Laboratory, 902 Battelle Blvd., Richland, Washington 99354, USA 2Current address: Red Rocks Community College, 13300 West 6th Avenue, Lakewood, Colorado 80228, USA 3Optical Technology Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA 4Alecam FTIR Services and Consulting, The Woodlands, Texas 77381, USA *Corresponding author: [email protected] Received 27 September 2017; revised 7 December 2017; accepted 7 December 2017; posted 13 December 2017 (Doc. ID 307361); published 17 January 2018 We have developed methods to measure the directional-hemispherical (ρ) and diffuse (ρd ) reflectances of pow- ders, liquids, and disks of powders and solid materials using a commercially available, matte gold-coated inte- grating sphere and Fourier transform infrared spectrometer. To determine how well the sphere and protocols produce quantitative reflectance data, measurements were made of three diffuse and two specular standards pre- pared by the National Institute of Standards and Technology (NIST), LabSphere Infragold and Spectralon stan- dards, hand-loaded sulfur and talc powder samples, and water. Relative to the NIST measurements of the NIST standards, our directional hemispherical reflectance values are within 4% for four of the standards and within 7% for a low reflectance diffuse standard.
    [Show full text]
  • Directional Degradation of Spectralon Diffuser Under Ionizing Radiation for Calibration of Space-Based Sensors
    DIRECTIONAL DEGRADATION OF SPECTRALON DIFFUSER UNDER IONIZING RADIATION FOR CALIBRATION OF SPACE-BASED SENSORS G.T. Georgieva, J.J. Butlerb, M.G. Kowalewskic, L. Dinga a Sigma Space Corp., Lanham, MD 20706, e-mail: [email protected] b NASA Goddard Space Flight Center, Greenbelt, MD 20771 c Universities Space Research Association, Columbia, MD 21044 ABSTRACT from space-grade carbon-loaded Spectralon is shown in Fig.1.a. Assessment of the effect of Vacuum Ultra Violet (VUV) irradiation on the Bidirectional Reflectance 2. MEASUREMENTS Distribution Function (BRDF) of Spectralon is presented in this paper. The sample was a 99% white Spectralon The Spectralon, which is one of the trademarks of calibration standard irradiated with VUV source polytetrafluoroethylene (PTFE), is not a perfect positioned at 60o off the irradiation direction for a total of Lambertian diffuser but it is a best known material used 20 hours. The BRDF before and after VUV irradiation as a reflectance standard in the UV-VIS-NIR spectral was measured and compared at number of wavelengths in range for remote sensing instrument calibration. The data the UV, VIS and IR. Non-isotropic directional was obtained at Goddard Space Flight Center’s degradation of Spectralon diffuser under ionizing Radiometric Calibration Facility, a secondary calibration radiation was detected at different BRDF measurement facility with reflectance measurements traceable to those geometries primarily at UV spectral range. The 8o made by the Spectral Tri-function Automated Reference directional/hemispherical reflectance of the same sample Reflectometer (STARR) facility at the National Institute was also measured and compared from 200nm to of Standards and Technology (NIST).
    [Show full text]
  • Integrating Sphere Theory and Applications
    TECHNICAL GUIDE Integrating Sphere Theory and Applications [email protected] www.labsphere.com Integrating Sphere Theory and Applications TABLE OF CONTENTS 1.0 Integrating Sphere Theory 1-4 1.1 Radiation Exchange Within a Spherical Enclosure 1 1.2 The Integrating Sphere Radiance Equation 2 1.2.1 The Sphere Multiplier 3 1.2.2 The Average Reflectance 3 1.3 Spatial Integration 3 1.4 Temporal Response of an Integrating Sphere 4 2.0 Integrating Sphere Design 5-8 2.1 Integrating Sphere Diameter 5 2.2 Integrating Sphere Coating Selection 5 2.3 Baffles and Detector Field-of-View 6 2.4 Flux on the Photodetector 7 2.5 Fiberoptic Coupling 8 3.0 Integrating Sphere Applications 9-16 3.1 Radiometers and Photometers 9 3.1.1 The Sphere Photometer 9 3.1.2 Laser Power Meters 10 3.1.3 Cosine Receptor 10 3.2 Reflectance and Transmittance of Materials 11 3.2.1 Substitution vs. Comparison Spheres 12 3.2.2 Measurement Geometry 0°/d vs. d/0° 13 3.3 Uniform Sources 14 3.3.1 Modifying the Source Radiance 15 3.3.2 Irradiance Uniformity 15-16 Guide To Optical Units 17 © 2017 Labsphere, Inc. All Rights Reserved Integrating Sphere Theory and Applications 1.0 INTEGRATING SPHERE THEORY The fraction of energy leaving dA1 and arriving at dA2 is known as the exchange factor dFd1-d2 . It is given by: The integrating sphere is a simple, yet often misunderstood device for measuring optical EQ. 1 radiation. The function of an integrating sphere is to spatially integrate radiant flux.
    [Show full text]
  • Labsphere Al- Low the Use of Integrating Sphere Radiometers in Outerspace, Vacuum Chambers, Outdoors and in Water (Including Sea Water) for Extended Periods of Time
    TECHNICAL GUIDE Integrating Sphere Radiometry and Photometry Integrating Sphere Radiometry and Photometry TABLE OF CONTENTS 1.0 Introduction to Sphere Measurements 1 2.0 Terms and Units 2 3.0 The Science of the Integrating Sphere 3 3.1 Integrating Sphere Theory 3 3.2 Radiation Exchange within a Spherical Enclosure 3 3.3 The Integrating Sphere Radiance Equation 4 3.4 The Sphere Multiplier 5 3.5 The Average Reflectance 5 3.6 Spatial Integration 5 3.7 Temporal Response of an Integrating Sphere 6 4.0 Integrating Sphere Design 7 4.1 Integrating Sphere Diameter 7 4.2 Integrating Sphere Coatings 7 4.3 Available Sphere Coatings 8 4.4 Flux on the Detector 9 4.5 Fiberoptic Coupling 9 4.6 Integrating Sphere Baffles 10 4.7 Geometric Considerations of Sphere Design 10 4.8 Detectors 11 4.9 Detector Field-of-View 12 5.0 Calibrations 12 5.1 Sphere Detector Combination 12 5.2 Source Based Calibrations 12 5.3 Frequency of Calibration 12 5.4 Wavelength Considerations in Calibration 13 5.5 Calibration Considerations in the Design 13 6.0 Sphere-based Radiometer/Photometer Applications 14 7.0 Lamp measurement Photometry and Radiometry 16 7.1 Light Detection 17 7.2 Measurement Equations 18 7.3 Electrical Considerations 19 7.4 Standards 19 7.5 Sources of Error 19 APPENDICES Appendix A Comparative Properties of Sphere Coatings 22 Appendix B Lamp Standards Screening Procedure 23 Appendix C References and Recommended Reading 24 Integrating Sphere Radiometry and Photometry 1.0 Introduction to Sphere Measurements Photometers incorporate detector assemblies filtered to approximate the response of the human eye, as exhibited This technical guide presents design considerations for by the CIE luminous efficiency function.
    [Show full text]
  • Guide to Reflectance Coatings and Materials
    A Guide to Reflectance Coatings and Materials Leadership in Reflectance Technology TECH GUIDE A GUIDE TO REFLECTANCE COATINGS AND MATERIALS TABLE OF CONTENTS Introduction ..................................................................................................................................................... 3 Section 1: Diffuse Reflectance Coatings ............................................................................................................. 4-8 1.1 Spectraflect Reflectance Coating ............................................................................................. 4 1.2 Duraflect Reflectance Coating ................................................................................................ 5 1.3 Duraflect-II Reflectance Coating ............................................................................................5 1.4 Infragold NIR-MIR Reflectance Coating ............................................................................... 5 1.5 Infragold-LF MIR-FIR Reflectance Coating ........................................................................... 5 1.6 Optoblack Reflectance Coating .............................................................................................. 5 1.7 Reflectance Data of Labsphere Reflectance Coatings .............................................................. 6-8 Section 2: Spectralon Reflectance Material ......................................................................................................... 9-23 2.1 Reflectance Data of Optical,
    [Show full text]
  • Spectralon Collimated Beam Integrating Spheres
    Spectralon Collimated Beam Integrating Spheres 819C SERIES Product Features • 4-Port Integrating sphere designed for collimated input beam • Spectralon (PTFE) diffuse material for demanding environments • Sphere provides for total collection of light and spatial integration • Signal attenuation through multiple bounces in high reflectance coating • Power measurements are insensitive to exact Our Spectralon (PTFE) diffuse material integrating detector positioning sphere bodies are desigend for collimated input beams. PTFE based integrating spheres can be used in more demanding environments, including underwater and high or low temperature processes. Models 819C-SL-2 819C-SL-3.3 819C-IS-5.3 Spectral Range 250 nm to 2.5µm 250 nm to 2.5µm 250 nm to 2.5µm Sphere Size 2 in. 3.3 in. 5.3 in. North Pole Port Size 0.5 in. 1.0 in. 1.0 in. 0 Degree Port Size 1.0 in. (w/ 819M-PP-1.0) 1.5 in. (w/ 819M-PP-SL-1.5) 2.5 in. (w/ 819M-PP-2.5) 90 Degree Port Size 0.5 in. 1.0 in. 1.0 in. 180 Degree Port Size 0.5 in. 1.0 in. 1.0 in. Thermal Limit 350°C 350°C 350°C Material Spectralon Spectralon Spectralon Spectralon Collimated Beam Integrating Spheres 819C SERIES Features Four Port Integrating Sphere for Collimated Beams 819C Series modular integrating sphere bodies feature four ports located at 0, 90 and 180 degrees, as well as at the 180° 90° north pole, to provide a diffuse reflectance/transmittance measurement capability. The baffle is located between the 0- and the 90-degree ports.
    [Show full text]