University of Central Florida STARS Electronic Theses and Dissertations, 2004-2019 2019 Semiconductor Device Modeling, Simulation, and Failure Prediction for Electrostatic Discharge Conditions Hang Li University of Central Florida Part of the Electrical and Electronics Commons Find similar works at: https://stars.library.ucf.edu/etd University of Central Florida Libraries http://library.ucf.edu This Doctoral Dissertation (Open Access) is brought to you for free and open access by STARS. It has been accepted for inclusion in Electronic Theses and Dissertations, 2004-2019 by an authorized administrator of STARS. For more information, please contact
[email protected]. STARS Citation Li, Hang, "Semiconductor Device Modeling, Simulation, and Failure Prediction for Electrostatic Discharge Conditions" (2019). Electronic Theses and Dissertations, 2004-2019. 6522. https://stars.library.ucf.edu/etd/6522 SEMICONDUCTOR DEVICE MODELING, SIMULATION AND FAILURE PREDICTION FOR ELECTROSTATIC DISCHARGE CONDITIONS by HANG LI B.S. Sichuan University, 2013 M.S. University of Central Florida, 2018 A dissertation submitted in partial fulfillment of the requirements for the degree of Doctor of Philosophy in the Department of Electrical and Computer Engineering in the College of Engineering and Computer Science at the University of Central Florida Orlando, Florida Summer Term 2019 Major Professor: Kalpathy B. Sundaram © 2019 Hang Li ii ABSTRACT Electrostatic Discharge (ESD) caused failures are major reliability issues in IC industry. Device modeling for ESD conditions is necessary to evaluate ESD robustness in simulation. Although SPICE model is accurate and efficient for circuit simulations in most cases, devices under ESD conditions operate in abnormal status. SPICE model cannot cover the device operating region beyond normal operation.