Principles of Different X-Ray Phase-Contrast Imaging: a Review
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Interferometric Spectrometers
LBNL-40663 UC-410 . ERNEST ORLANDO LAWRENCE BERKELEY NATIONAL LABORATORY Interferometric Spectrometers Anne Thome and Malcolm Howells Accelerator and Fusion Research Division June 1997 To be published as a chapter in Techniques ofVacuum Ultraviolet Physics, J~A-. Samson and D A. Ederer, eds.-, ·..-:~-:.:-':.::;:::;;;;r,;-:·.::~:~~:.::~-~~'*-~~,~~~;.=;t,ffl;.H;~:;;$,'~.~:~~::;;.:~< :.:,:::·.;:~·:..~.,·,;;;~.· l.t..•.-J.' "'"-""···,:·.:·· \ '-· . _ .....::' .~..... .:"~·~-!r.r;.e,.,...;. 17"'JC.(.; .• ,'~..: .••, ..._i;.·;~~(.:j. ... ..,.~1\;i:;.~ ...... J:' Academic Press, ....... ·.. ·... :.: ·..... ~ · ··: ·... · . .. .. .. - • 0 • ···...::; •• 0 ·.. • •• • •• ••• , •• •• •• ••• •••••• , 0 •• 0 .............. -·- " DISCLAIMER. This document was prepared as an account of work sponsored by the United States Government. While this document is believed to contain cmTect information, neither the United States Government nor any agency thereof, nor the Regents of the University of California, nor any of their employees, makes any warranty, express or implied, or assumes any legahesponsibility for the accuracy, completeness, or usefulness of any information, apparatus, product, or process disclosed, or represents that its use would not infringe privately owned rights. Reference herein to any specific commercial product, process, or service by its trade name, trademark, manufacturer, or otherwise, does not necessarily constitute or imply its endorsement, recommendation, or favoring by the United States Government or any agency thereof, or the -
The Methods and Experiments of Shape Measurement for Off-Axis
materials Article The Methods and Experiments of Shape Measurement for Off-Axis Conic Aspheric Surface Shijie Li 1,2,*, Jin Zhang 1,2, Weiguo Liu 1,2, Haifeng Liang 1,2, Yi Xie 3 and Xiaoqin Li 4 1 Shaanxi Province Key Laboratory of Thin Film Technology and Optical Test, Xi’an Technological University, Xi’an 710021, China; [email protected] (J.Z.); [email protected] (W.L.); hfl[email protected] (H.L.) 2 School of Optoelectronic Engineering, Xi’an Technological University, Xi’an 710021, China 3 Display Technology Department, Luoyang Institute of Electro-optical Equipment, AVIC, Luoyang 471009, China; [email protected] 4 Library of Xi’an Technological University, Xi’an Technological University, Xi’an 710021, China; [email protected] * Correspondence: [email protected] Received: 26 March 2020; Accepted: 27 April 2020; Published: 1 May 2020 Abstract: The off-axis conic aspheric surface is widely used as a component in modern optical systems. It is critical for this kind of surface to obtain the real accuracy of the shape during optical processing. As is widely known, the null test is an effective method to measure the shape accuracy with high precision. Therefore, three shape measurement methods of null test including auto-collimation, single computer-generated hologram (CGH), and hybrid compensation are presented in detail in this research. Although the various methods have their own advantages and disadvantages, all methods need a special auxiliary component to accomplish the measurement. In the paper, an off-axis paraboloid (OAP) was chosen to be measured using the three methods along with auxiliary components of their own and it was shown that the experimental results involved in peak-to-valley (PV), root-mean-square (RMS), and shape distribution from three methods were consistent. -
Recent Progress in X-Ray and Neutron Phase Imaging with Gratings
Review Recent Progress in X-Ray and Neutron Phase Imaging with Gratings Atsushi Momose 1,*, Hidekazu Takano 1, Yanlin Wu 1 , Koh Hashimoto 1, Tetsuo Samoto 1, Masato Hoshino 2, Yoshichika Seki 3 and Takenao Shinohara 3 1 Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai, Miyagi 980-8577, Japan; [email protected] (H.T.); [email protected] (Y.W.); [email protected] (K.H.); [email protected] (T.S.) 2 JASRI, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan; [email protected] 3 J-PARC Center, Japan Atomic Energy Agency, 2-4 Shirakata, Tokai-mura, Naka-gun, Ibaraki 319-1195, Japan; [email protected] (Y.S.); [email protected] (T.S.) * Correspondence: [email protected] Received: 29 December 2019; Accepted: 4 February 2020; Published: 10 February 2020 Abstract: Under the JST-ERATO project in progress to develop X-ray and neutron phase-imaging methods together, recent achievements have been selected and reviewed after describing the merit and the principle of the phase imaging method. For X-ray phase imaging, recent developments of four-dimensional phase tomography and phase microscopy at SPring-8, Japan are mainly presented. For neutron phase imaging, an approach in combination with the time-of-flight method developed at J-PARC, Japan is described with the description of new Gd grating fabrication. Keywords: phase imaging; phase tomography; grating; interferometry; synchrotron radiation; neutron; X-ray; microscopy; radiography 1. -
Optical Low-Coherence Interferometry for Selected Technical Applications
BULLETIN OF THE POLISH ACADEMY OF SCIENCES TECHNICAL SCIENCES Vol. 56, No. 2, 2008 Optical low-coherence interferometry for selected technical applications J. PLUCIŃSKI∗, R. HYPSZER, P. WIERZBA, M. STRĄKOWSKI, M. JĘDRZEJEWSKA-SZCZERSKA, M. MACIEJEWSKI, and B.B. KOSMOWSKI Faculty of Electronics, Telecommunications and Informatics, Gdańsk University of Technology, 11/12 Narutowicza St., 80-952 Gdańsk, Poland Abstract. Optical low-coherence interferometry is one of the most rapidly advancing measurement techniques. This technique is capable of performing non-contact and non-destructive measurement and can be used not only to measure several quantities, such as temperature, pressure, refractive index, but also for investigation of inner structure of a broad range of technical materials. We present theoretical description of low-coherence interferometry and discuss its unique properties. We describe an OCT system developed in our Department for investigation of the structure of technical materials. In order to provide a better insight into the structure of investigated objects, our system was enhanced to include polarization state analysis capability. Measurement results of highly scattering materials e.g. PLZT ceramics and polymer composites are presented. Moreover, we present measurement setups for temperature, displacement and refractive index measurement using low coherence interferometry. Finally, some advanced detection setups, providing unique benefits, such as noise reduction or extended measurement range, are discussed. Key words: low-coherence interferometry (LCI), optical coherence tomography (OCT), polarization-sensitive OCT (PS-OCT). 1. Introduction 2. Analysis of two-beam interference Low-coherence interferometry (LCI), also known as white- 2.1. Two-beam interference – time domain description. light interferometry (WLI), is an attractive measurement Let us consider interference of two beams emitted from method offering high measurement resolution, high sensi- a quasi-monochromatic light source located at a point P, i.e. -
Phase Tomography by X-Ray Talbot Interferometry
Phase Tomography by X-ray Talbot Interferometry X-ray phase imaging is attractive for the beamline of NewSUBARU, SPring-8. A SEM observation of weakly absorbing materials, such as (scanning electron microscope) image of the grating soft materials and biological tissues. In the past is shown in Fig. 1. The pitch and pattern height were decade, several techniques of X-ray phase imaging 8 µm and 30 µm, respectively. were reported and demonstrated [1]. Recently, we Through the quantitative measurement of the have developed an X-ray Talbot interferometer differential phase shift by the sample, extremely high- for novel X-ray phase imaging, including phase sensitive three-dimensional imaging, that is, X-ray tomography. This method is unique in that phase tomography, is attainable by X-ray Talbot transmission gratings are used to generate differential interferometry [3]. We demonstrated this with phase contrast (Fig. 1). Two gratings are aligned biological samples using monochromatic undulator along the optical axis with a specific distance X-rays at beamline BL20XU. Figure 2 shows a rabbit determined by the X-ray wavelength λ and the grating liver tissue with VX2 cancer observed by X-ray phase pitch d. The influence of refraction on the sample tomography using a CCD-based X-ray image detector placed in front of the first grating is observed just whose effective pixel size was 3.14 µm [4]. The behind the second grating. The detailed principle of cancerous lesion is depicted with a darker gray level the contrast generation is described in Refs. [2,3]. than the surrounding normal liver tissue. -
Resolution Limits of Extrinsic Fabry-Perot Interferometric Displacement Sensors Utilizing Wavelength Scanning Interrogation
Resolution limits of extrinsic Fabry-Perot interferometric displacement sensors utilizing wavelength scanning interrogation Nikolai Ushakov,1 * Leonid Liokumovich,1 1 Department of Radiophysics, St. Petersburg State Polytechnical University, Polytechnicheskaya, 29, 195251, St. Petersburg, Russia *Corresponding author: [email protected] The factors limiting the resolution of displacement sensor based on extrinsic Fabry-Perot interferometer were studied. An analytical model giving the dependency of EFPI resolution on the parameters of an optical setup and a sensor interrogator was developed. The proposed model enables one to either estimate the limit of possible resolution achievable with a given setup, or to derive the requirements for optical elements and/or a sensor interrogator necessary for attaining the desired sensor resolution. An experiment supporting the analytical derivations was performed, demonstrating a large dynamic measurement range (with cavity length from tens microns to 5 mm), a high baseline resolution (from 14 pm) and a good agreement with the model. © 2014 Optical Society of America OCIS Codes: (060.2370) Fiber optics sensors, (120.3180) Interferometry, (120.2230) Fabry-Perot, (120.3940) Metrology. 1. Introduction description of their resolution limits is of a great interest. Considering the wavelength scanning interrogation, an analysis Fiber-optic sensors based on the fiber extrinsic Fabry-Perot of errors provoked by instabilities of the laser frequency tuning is interferometers (EFPI) [1] are drawing an increasing attention present in [18], still only slow and large instabilities are from a great amount of academic research groups and several considered. companies, which have already started commercial distribution In this Paper, a mathematical model considering the main of such devices. -
Increasing the Sensitivity of the Michelson Interferometer Through Multiple Reflection Woonghee Youn
Rose-Hulman Institute of Technology Rose-Hulman Scholar Graduate Theses - Physics and Optical Engineering Graduate Theses Summer 8-2015 Increasing the Sensitivity of the Michelson Interferometer through Multiple Reflection Woonghee Youn Follow this and additional works at: http://scholar.rose-hulman.edu/optics_grad_theses Part of the Engineering Commons, and the Optics Commons Recommended Citation Youn, Woonghee, "Increasing the Sensitivity of the Michelson Interferometer through Multiple Reflection" (2015). Graduate Theses - Physics and Optical Engineering. Paper 7. This Thesis is brought to you for free and open access by the Graduate Theses at Rose-Hulman Scholar. It has been accepted for inclusion in Graduate Theses - Physics and Optical Engineering by an authorized administrator of Rose-Hulman Scholar. For more information, please contact bernier@rose- hulman.edu. Increasing the Sensitivity of the Michelson Interferometer through Multiple Reflection A Thesis Submitted to the Faculty of Rose-Hulman Institute of Technology by Woonghee Youn In Partial Fulfillment of the Requirements for the Degree of Master of Science in Optical Engineering August 2015 © 2015 Woonghee Youn 2 ABSTRACT Youn, Woonghee M.S.O.E Rose-Hulman Institute of Technology August 2015 Increase a sensitivity of the Michelson interferometer through the multiple reflection Dr. Charles Joenathan Michelson interferometry has been one of the most famous and popular optical interference system for analyzing optical components and measuring optical metrology properties. Typical Michelson interferometer can measure object displacement with wavefront shapes to one half of the laser wavelength. As testing components and devices size reduce to micro and nano dimension, Michelson interferometer sensitivity is not suitable. The purpose of this study is to design and develop the Michelson interferometer using the concept of multiple reflections. -
Moiré Interferometry
Moiré Interferometry Wei-Chih Wang ME557 Department of Mechanical Engineering University of Washington W.Wang 1 Interference When two or more optical waves are present simultaneously in the same region of space, the total wave function is the sum of the individual wave functions W.Wang 2 Optical Interferometer Criteria for interferometer: (1) Mono Chromatic light source- narrow bandwidth (2) Coherent length: Most sources of light keep the same phase for only a few oscillations. After a few oscillations, the phase will skip randomly. The distance between these skips is called the coherence length. normally, coherent length for a regular 5mW HeNe laser is around few cm, 2 lc = λ /∆λ , (3) Collimate- Collimated light is unidirectional and originates from a single source optically located at an infinite distance so call plane wave (4) Polarization dependent W.Wang 3 Interference of two waves When two monochromatic waves of complex amplitudes U1(r) and U2(r) are superposed, the result is a monochromatic wave of the Same frequency and complex amplitude, U(r) = U1(r) + U2 (r) (1) 2 2 Let Intensity I1= |U1| and I2=| |U2| then the intensity of total waves is 2 2 2 2 * * I=|U| = |U1+U2| = |U1| +|U2| + U1 U2 + U1U2 (2) W.Wang 4 Basic Interference Equation 0.5 jφ1 0.5 jφ2 Let U1 = I1 e and U2 = I2 e Then 0.5 I= I1_+I2 + 2(I1 I2) COSφ(3) Where φ = φ2 −φ1 (phase difference between two wave) Ripple tank Interference pattern created by phase Difference φ W.Wang 5 Interferometers •Mach-Zehnder •Michelson •Sagnac Interferometer •Fabry-Perot Interferometer -
High Resolution Radio Astronomy Using Very Long Baseline Interferometry
IOP PUBLISHING REPORTS ON PROGRESS IN PHYSICS Rep. Prog. Phys. 71 (2008) 066901 (32pp) doi:10.1088/0034-4885/71/6/066901 High resolution radio astronomy using very long baseline interferometry Enno Middelberg1 and Uwe Bach2 1 Astronomisches Institut, Universitat¨ Bochum, 44801 Bochum, Germany 2 Max-Planck-Institut fur¨ Radioastronomie, Auf dem Hugel¨ 69, 53121 Bonn, Germany E-mail: [email protected] and [email protected] Received 3 December 2007, in final form 11 March 2008 Published 2 May 2008 Online at stacks.iop.org/RoPP/71/066901 Abstract Very long baseline interferometry, or VLBI, is the observing technique yielding the highest-resolution images today. Whilst a traditionally large fraction of VLBI observations is concentrating on active galactic nuclei, the number of observations concerned with other astronomical objects such as stars and masers, and with astrometric applications, is significant. In the last decade, much progress has been made in all of these fields. We give a brief introduction to the technique of radio interferometry, focusing on the particularities of VLBI observations, and review recent results which would not have been possible without VLBI observations. This article was invited by Professor J Silk. Contents 1. Introduction 1 2.9. The future of VLBI: eVLBI, VLBI in space and 2. The theory of interferometry and aperture the SKA 10 synthesis 2 2.10. VLBI arrays around the world and their 2.1. Fundamentals 2 capabilities 10 2.2. Sources of error in VLBI observations 7 3. Astrophysical applications 11 2.3. The problem of phase calibration: 3.1. Active galactic nuclei and their jets 12 self-calibration 7 2.4. -
Experimental Research on the Feature of an X-Ray Talbot-Lau Interferometer Vs
Experimental research on the feature of an X-ray Talbot-Lau interferometer vs. tube accelerating voltage WANG Sheng-Hao (王圣浩)1, Margie P. Olbinado2, Atsushi Momose2, HAN Hua-Jie (韩华杰) 1, HU Ren- Fang (胡仁芳)1, WANG Zhi-Li (王志立)1, GAO Kun (高 昆)1, ZHANG Kai (张 凯)3, ZHU Pei-Ping (朱佩平)3, WU Zi-Yu (吴自玉)1,3;† 1National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230027, China 2Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1Katahira, Aoba-ku, Sendai, Miyagi 980-8577, Japan 3Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China Abstract: X-ray Talbot-Lau interferometer has been used most widely to perform X-ray phase- contrast imaging with a conventional low-brilliance X-ray source, it yields high-sensitivity phase and dark-field images of sample producing low absorption contrast, thus bearing tremendous potential for future clinical diagnosis. In this manuscript, while changing accelerating voltage of the X-ray tube from 35KV to 45KV, X-ray phase-contrast imaging of a test sample were performed at each integer KV position to investigate the characteristic of an X-ray Talbot-Lau interferometer (located in the Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Japan) vs. tube voltage. Experimental results and data analysis show that this X-ray Talbot-Lau interferometer is insensitive to the tube accelerating voltage within a certain range, fringe visibility around 44% is maintained in the aforementioned tube voltage range. This experimental research implies that potential new dual energy phase-contrast X-ray imaging strategy and rough refraction spectrum measurement is feasible with this X-ray Talbot-Lau interferometer. -
The Geometry of the Phase Retrieval Problem Charles L
The Geometry of the Phase Retrieval Problem Charles L. Epstein The Geometry of the Phase Retrieval Problem Introduction Operator Splitting Methods in Data Analysis Workshop Discrete Problem Torus Geometry Reconstruction Charles L. Epstein Algorithms Numerical Examples CCM at the Flatiron Institute University of Pennsylvania Other Conditions History of CDI March 20, 2019 Bibliography Acknowledgment The Geometry of the Phase Retrieval Problem Charles L. Epstein I want to thank Christian and Patrick for inviting me to speak. Introduction What I will discuss today is somewhat unconventional, ongoing Discrete Problem work, at the intersection of pure mathematics, numerical analysis Torus Geometry and mathematical physics. Reconstruction Algorithms This work was done jointly with Alex Barnett, Leslie Greengard, Numerical and Jeremy Magland and supported by the Centers for Examples Computational Biology and Mathematics at the Flatiron Institute Other Conditions of the Simons Foundation, New York, NY. History of CDI Bibliography Outline The Geometry of the Phase Retrieval Problem 1 Introduction Charles L. Epstein 2 The Discrete Phase Retrieval Problem Introduction 3 Geometry of the Torus Discrete Problem Torus Geometry 4 Reconstruction Algorithms Reconstruction Algorithms 5 Numerical Examples in Phase Retrieval Numerical Examples 6 Other Auxiliary Conditions Other Conditions History of CDI 7 Short History of CDI Bibliography 8 Bibliography High Resolution Imaging The Geometry of the Phase Retrieval Problem Charles L. Epstein Introduction Today I will speak about inverse problems that arise in Coherent Discrete Problem Diffraction Imaging. This is a technique that uses very high Torus Geometry energy, monochromatic light, either electrons or x-rays, to form Reconstruction high resolution images of animate and inanimate materials. -
Aspects of Phase Retrieval in X-Ray Crystallography
Aspects of Phase Retrieval in X-ray Crystallography Romain Arnal A thesis presented for the degree of Doctor of Philosophy in Electrical and Computer Engineering at the University of Canterbury, Christchurch, New Zealand. June 2019 Deputy Vice-Chancellor’s Office Postgraduate Office Co-Authorship Form This form is to accompany the submission of any thesis that contains research reported in co- authored work that has been published, accepted for publication, or submitted for publication. A copy of this form should be included for each co-authored work that is included in the thesis. Completed forms should be included at the front (after the thesis abstract) of each copy of the thesis submitted for examination and library deposit. Please indicate the chapter/section/pages of this thesis that are extracted from co-authored work and provide details of the publication or submission from the extract comes: Chapter 2 describes work by the candidate that is reported in “Millane and Arnal, Uniqueness of the macromolecular crystallographic phase problem, Acta Cryst., A71, 592-598, 2015.” Please detail the nature and extent (%) of contribution by the candidate: This publication describes joint work by the candidate and Millane. The theory was derived jointly by the candidate and Millane. The simulations, the required software development, and presentation of the results were conducted by the candidate. Writing was a joint effort. Certification by Co-authors: If there is more than one co-author then a single co-author can sign on behalf of all The