DOCSLIB.ORG

Dielectric Spectroscopy of Solid Insulators

Total Page：16

File Type：pdf, Size：1020Kb

Download full-text PDF Read full-text
Dielectric Spectroscopy of Solid Insulators Dielectric Spectroscopy of Solid Insulators OMICRON Lab Webinar Series 2020 2020-05-04 Britta Lang (former Pfeiffer) • Studied electrical engineering at University of Applied Sciences Dortmund, Germany • Working at OMICRON electronics since 2007 • Working at OMICRON Lab since 2014 − Application expert − Project management • Contact − [email protected] − https://meet-omicron.webex.com/meet/britta.lang Smart Measurement Solutions® Page 2 Markus Pfitscher • Completed electrical engineering college in 1993 • Working at OMICRON Lab since 2013 focusing on: − Sales & Business Development − Product Management • Contact: − [email protected] − https://meet-omicron.webex.com/meet/markus.pfitscher Smart Measurement Solutions® Page 3 Tobias Schuster • Completed electrical engineering college in 2013 • Studied Industrial Engineering and Management • Working at OMICRON Lab since 2015 focusing on: − Technical Support − Applications − Sales • Contact: − [email protected] − https://meet-omicron.webex.com/meet/tobias.schuster Smart Measurement Solutions® Page 4 Agenda • Theory and measurement methods • Introduction dielectric sample holder – DSH 100 • Measurement example using the DSH 100 Smart Measurement Solutions® Page 5 Dielectric Spectroscopy of Solid Insulators Theory and measurement methods Dielectric Analysis Basics Smart Measurement Solutions® Page 7 Dielectric Material Analysis: Definitions • There are lot of terms used for the description of a dielectric material: ′ 휺풓 tan(δ) Permittivity ′′ Dielectric Losses 휺풓 Dissipation Factor ? Permeability Dielectric Constant Smart Measurement Solutions® Page 8 Permittivity ε “Permittivity is a measure of how an electric field effects and is effected by a dielectric material.” (in simple words) • ε − Permittivity of material − Describes the interaction of a material with an external electrical field • ε0 − Permittivity of space − Constant value 8.85x10-12 F/m − Describes the electrical field generated in vacuum Smart Measurement Solutions® Page 9 Relative Permittivity εr • The absolute material permittivity εr is relative to the permittivity of free space ε0 휀 κ = 휺 = = 휺′ − 푗휺′′ ε 풓 휀 풓 풓 r 0 εr‘‘ δ Not Constant! εr‘ • εr’ indicates how much energy from an external electric field is stored in a dielectric material • εr’’ indicates the losses within the dielectric material when an external electric field is applied. • εr” is usually much smaller than εr’ and includes the effects of both dielectric loss and conductivity. Smart Measurement Solutions® Page 10 Dielectric Losses tan(δ) • The ratio of lost energy (εr’’) to stored energy (εr’) is the relative losses of a dielectric material ′′ 휀푟 1 퐸푛푒푟푔푦 푙표푠푡 푝푒푟 푐푦푐푙푒 tan(훿) = 퐷 = ′ = = 휀푟 푄 퐸푛푒푟푔푦 푠푡표푟푒푑 푝푒푟 푐푦푐푙푒 • Q is the quality factor • Used terms for the relative losses of a dielectric material are: − Dissipation factor D − Dielectric losses tan(δ) Smart Measurement Solutions® Page 11 Dielectric Spectroscopy Techniques • The measurement technique for dielectric material analysis depends on the frequency range to measure • For a frequency range from 10-6 Hz to 108 Hz the following two measurement techniques can be used: − Time Domain Spectroscopy 10-6 10-4 100 104 108 − Frequency Domain Spectroscopy Time Domain − etc. Frequency Domain ... AC-bridges Smart Measurement Solutions® Page 12 Frequency Domain Spectroscopy (FDS) Imag FDS Principle: IR (f) • Measures tan() at different frequencies: IC (f) I (f) 퐼 (푓) − Apply sinusoidal voltage of different frequencies f1, f2, ... tan(훿, 푓) = 푅 to a dielectric material e.g. located in a (f) 퐼퐶(푓) parallel electrodes test cell − Determine tan( ) at the frequencies f , f , ... 1 2 U Real U, I U(t) I(t) U ~ Dielectric material t A I 90°- Smart Measurement Solutions® Page 13 Frequency Domain Spectroscopy (FDS) • Advantage of FDS Frequency Duration of 1 sine − Fast and accurate at high frequencies wave 5000 Hz 0,2 ms − Resistant to disturbances 1000 Hz 1 ms 50 Hz 20 ms • Disadvantage of FDS 1 Hz 1 s − Very slow at low frequencies 0.1 Hz 10 s 10 mHz 100 s 1 mHz 16,7 min 0.1 mHz 2,7 h 10 µHz 27 h Smart Measurement Solutions® Page 14 Time Domain Spectroscopy • The time domain spectroscopy used in the SPECTANO 100 is called PDC measurement (Polarization Depolarization Current) • PDC Principle − Apply a voltage step to a dielectric material e.g. Polarization Depolarization located in a parallel electrodes test cell U, I − Measure the charge current at times t1, t2, ... U(t) − Calculate the dielectric properties like ε, c, tan() 1 1 at the corresponding 푓1 = ; 푓2 = … 푡1 푡2 I(t) using the Fourier transformation t t1 t2 t3 t4 t5 t6 U Dielectric material A I Smart Measurement Solutions® Page 15 Time Domain Spectroscopy • Advantage of PDC − Fast and accurate at low frequencies • Disadvantage of PDC − Inaccurate at high frequencies Advantages Disadvantages ☺ Fast and accurate at low Inaccurate at high PDC frequencies frequencies FDS ☺ Fast and accurate at high Very slow at low frequencies frequencies Smart Measurement Solutions® Page 16 Combination of FDS and PDC 100 1 Fourier Current nA in Transformation 1 1 1000 tan(δ) Time in s 1 0,001 0,001 Frequency in Hz 1000 tan(δ) 0,001 0,1 1000 Frequency in Hz Smart Measurement Solutions® Page 17 Dielectric Polarization • When a dielectric material is placed in an external electrical field charged particles are displaced. This process is called dielectric polarization. Bound charge Free charge + + + + + + + + + + + - + + + + + Capacitor plate Capacitor + plate Capacitor + + + Electrical field (E) Smart Measurement Solutions® Page 18 Polarization processes • Depending on the frequency different polarization types occur • Einkreisen welchen Bereich wir haben 퐸 퐸 퐸 = 퐸 푒푗휔푡 - + +퐸0 + + + - --+ -- +- + + - +c - + - +-- + +- - +- + - ++ - + + - + +- ++ - + - +- - +--+++ o + - - + + + -+ - - + + - + - + - +-- -++--- ++- + - + -+ - + - + - + - ++ - -++- +- + - +-x + + c o ퟏ 풇 = displayed in the time domain 풕 Smart Measurement Solutions® Page 19 Why is dielectric material analysis in comparison to common analysis methods as tan(δ) 50 Hz so important? Smart Measurement Solutions® Page 20 IOur will...and customercheck will the said,compareprobe we with have it with our bad goodbestmaterials! and 50 Hzbad Analyzer...materials 50 Hz Analysis Tan(δ) 50 Hz Analysis = Common “type” of insulation material measurement MhhAgain, our tan(δ), C at 50 Hz: I everythingwill control materialit again! is looksnot bad. fine! • Bad material • Good material • Probe NO, NO, NO! I can’t find the error!! Smart Measurement Solutions® Page 22 What is the problem of Professor X? Importance of Dielectric Material Analysis Smart Measurement Solutions® Page 24 Importance of Dielectric Material Analysis (cont.) Smart Measurement Solutions® Page 25 Importance of Dielectric Material Analysis (cont.) Dielectric response: (tan(δ), C, ε at kHz...µHz) red: bad material = aged blue: good material = normal (dry) green: probe = wet and thus inaccurate/faulty • Separation of effects due to large frequency range • Detailed analysis possible Smart Measurement Solutions® Page 26 Factors influencing the dielectric response tan(δ) Possible influence factors: aging • Temperature % ↑byprod. ↑ homogeneity • Humidity or moisture 1 viscosity • Homogeneity aging • Conductivity e.g. oil 0.1 % ↓ byprod. ↓ ϑ ↓ ϑ ↑ • Aging byproducts 0.01 conduct. ↓ conduct. ↑ Viscosity e.g. during curing • aging byprod. ↓ aging byprod. ↑ • Structure homogeneity aging 0.001 % ↑ byprod. ↑ ! kind of influences depend on material 0.0001 homogeneity aging % ↓ byprod. ↓ 0.001 0.01 0.1 1 10 100 f (in Hz) Smart Measurement Solutions® Page 27 Typical Dielectric Material Curves Pressboard disk before & after Epoxy resin curing process pressing with 10kg weights for 2 month Smart Measurement Solutions® Page 28 Why are C and ε dielectric material properties? Tanδ for new and aged pressboard Permittivity of aged pressboard with with similar moisture content at 20°C different moisture content at 20°C Smart Measurement Solutions® Page 29 Importance of dielectric analysis • To detect aging or changes of dielectric material structure / composition before material is used in the field • Aging or changes of the dielectric material can lead into − Wrong electrical behavior − Changes of electrical specification − Reduction of dielectric strength − Reduction of longevity − Avoid short circuits e.g. in high voltage equipment and thus faster aging − Reduction of humidity or temperature stability Smart Measurement Solutions® Page 30 Dielectric Material Analysis: Applications Measures dielectric parameters like losses (tanδ), relative permittivity (ε) or capacitance (C) to characterize easily Nanomaterial and material composites Dielectrics used as insulations in cables and high voltage assets Polymers, epoxy, insulation paper/cellulose, glasses or thin films Insulation liquids like mineral oil or silicone Smart Measurement Solutions® Page 31 Dielectric Spectroscopy of Solid Insulators Introduction dielectric sample holder – DSH 100 Typical Test Cell Types • The test cell type for the dielectric material analysis depends on − The used dielectric spectroscopy techniques − Material under test (liquid, powder, solid, granulate...) Parallel Plate with guard ring Transmission Line Coaxial Probe Cylindrical Smart Measurement Solutions® Page 33 Typical Test Cell Types TC12 Transformer Oil Test Cell (cylindrical) Disc electrode with guard ring by OMICRON electronics by TU Munich Smart Measurement Solutions® Page 34 DSH 100 – Dielectric Sample
Load more

Recommended publications
  • Electrochemical Impedance Spectroscopy, John Wiley and Sons, New York, 2008
    ElectrochemicalElectrochemical ImpedanceImpedance SpectroscopySpectroscopy Mark E. Orazem Department of Chemical Engineering University of Florida Gainesville, Florida 32611 [email protected] 352-392-6207 © Mark E. Orazem, 2000-2008. All rights reserved. ContentsContents • Chapter 1. Introduction • Chapter 2. Motivation • Chapter 3. Impedance Measurement • Chapter 4. Representations of Impedance Data • Chapter 5. Development of Process Models • Chapter 6. Regression Analysis • Chapter 7. Error Structure • Chapter 8. Kramers-Kronig Relations • Chapter 9. Use of Measurement Models • Chapter 10. Conclusions • Chapter 11. Suggested Reading • Chapter 12. Notation Chapter 1. Introduction page 1: 1 ElectrochemicalElectrochemical ImpedanceImpedance SpectroscopySpectroscopy Mark E. Orazem Department of Chemical Engineering University of Florida Gainesville, Florida 32611 [email protected] 352-392-6207 © Mark E. Orazem, 2000-2008. All rights reserved. Chapter 1. Introduction page 1: 2 ElectrochemicalElectrochemical ImpedanceImpedance SpectroscopySpectroscopy Chapter 1. Introduction • How to think about impedance spectroscopy • EIS as a generalized transfer function • Overview of applications of EIS • Objective and outline of course © Mark E. Orazem, 2000-2007. All rights reserved. Chapter 1. Introduction page 1: 3 1992 – no logo Chapter 1. Introduction page 1: 4 TheThe BlindBlind MenMen andand thethe ElephantElephant John Godfrey Saxe It was six men of Indostan To learning much inclined, Who went to see the Elephant (Though all of them were blind),
    [Show full text]
  • Dielectric Spectroscopy on Organic Charge-Transfer Salts
    Dielectric Spectroscopy on Organic Charge-Transfer Salts P. Lunkenheimer and A. Loidl Experimental Physics V, Center for Electronic Correlations and Magnetism, University of Augsburg, 86159 Augsburg, Germany E-mail: [email protected] Abstract This Topical Review provides an overview of the dielectric properties of a variety of organic charge- transfer salts, based on both, data reported in literature and our own experimental results. Moreover, we discuss in detail the different processes that can contribute to the dielectric response of these materials. We concentrate on the family of the one-dimensional (TMTTF)2X systems and the two-dimensional BEDT- TTF-based charge-transfer salts, which in recent years have attracted considerable interest due to their often intriguing dielectric properties. We will mainly focus on the occurrence of electronic ferroelectricity in these systems, which also includes examples of multiferroicity. Keywords: ferroelectricity, organic ferroelectrics, dielectric properties, multiferroicity, charge order ______________________________________________________________________________________ Contents 1. Introduction 2. Experimental techniques 3. Dielectric phenomena and analysis 3.1 Dielectric Relaxation 3.2 Hopping charge transport 3.3 Ferroelectricity 3.3.1 Displacive ferroelectrics 3.3.2 Order-disorder ferroelectrics 3.3.3 Relaxor ferroelectrics 3.3.4 Spin-driven and electronic ferroelectricity 3.4 Non-intrinsic effects 4. Experimental results and interpretation 4.1 One-dimensional ferroelectric charge-transfer salts 4.1.1 (TMTTF)2X 4.1.2 TTF-BA and TTF-CA 4.2 Two-dimensional charge-transfer salts 4.2.1 The relaxor ferroelectrics -(ET)2Cu2(CN)3 and '-(ET)2ICl2 4.2.2 -(ET)2I3, a relaxor ferroelectric? 4.2.3 Multiferroic κ-(ET)2Cu[N(CN)2]Cl 4.2.4 Other systems 5.
    [Show full text]
  • Multichannel Electrical Impedance Spectroscopy Analyzer with Microfluidic Sensors †
    Article Multichannel Electrical Impedance Spectroscopy Analyzer with Microfluidic Sensors † Jaan Ojarand * Mart Min and Ants Koel Thomas Johann Seebeck Department of Electronics, Tallinn University of Technology, 19086 Tallinn, Estonia; [email protected] (M.M.); [email protected] (A.K.) * Correspondence: [email protected]; Tel.: +372-502-4723 † This manuscript is extension version of the conference paper: Compact Multichannel Device for Differential Impedance Spectroscopy of Microfluidic Sensors. In Proceedings of the 16th Biennial Baltic Electronics Conference (BEC), Tallinn, Estonia, 8–10 October 2018. Received: 1 March 2019; Accepted: 17 April 2019; Published: 20 April 2019 Abstract: Impedance spectroscopy is a common approach in assessing passive electrical properties of biological matter. However, several problems appear in microfluidic devices in connection with the requirement for high sensitivity of signal acquisition from small volume sensors. The developed compact and inexpensive analyzer provides impedance spectroscopy measurement from three sensors, both connected in direct and differential modes. Measurement deficiencies are reduced with a novel design of sensors, measurement method, optimized electronics, signal processing, and mechanical design of the analyzer. Proposed solutions are targeted to the creation of reliable point-of-care (POC) diagnostic and monitoring appliances, including lab-on-a-chip type devices in the next steps of development. The test results show the good working ability of the developed analyzer; however, also limitations and problems that require attention and further improvement are appointed. Keywords: impedance spectroscopy; microfluidic sensor; non-faradaic; front-end electronics; differential measurement; calibration; label-free detection; lab-on-a-chip 1. Introduction The current article is an extended revision of the recent conference paper [1], in which impedimetric microfluidic devices target facilitation of dielectric and conductivity measurements of small fluidic volumes.
    [Show full text]
  • Method Development for Contactless Resonant Cavity Dielectric Spectroscopic Studies of Cellulosic Paper
    Journal of Visualized Experiments www.jove.com Video Article Method Development for Contactless Resonant Cavity Dielectric Spectroscopic Studies of Cellulosic Paper Mary Kombolias1, Jan Obrzut2, Michael T. Postek3,4, Dianne L. Poster2, Yaw S. Obeng3 1 Testing and Technical Services, Plant Operations, United States Government Publishing Office 2 Materials Measurement Laboratory, National Institute of Standards and Technology 3 Nanoscale Device Characterization Division, Physical Measurement Laboratory, National Institute of Standards and Technology 4 College of Pharmacy, University of South Florida Correspondence to: Mary Kombolias at [email protected], Yaw S. Obeng at [email protected] URL: https://www.jove.com/video/59991 DOI: doi:10.3791/59991 Keywords: Engineering, Issue 152, Resonant Cavity, dielectric spectroscopy, paper, fiber analysis, paper aging, recycled content Date Published: 10/4/2019 Citation: Kombolias, M., Obrzut, J., Postek, M.T., Poster, D.L., Obeng, Y.S. Method Development for Contactless Resonant Cavity Dielectric Spectroscopic Studies of Cellulosic Paper. J. Vis. Exp. (152), e59991, doi:10.3791/59991 (2019). Abstract The current analytical techniques for characterizing printing and graphic arts substrates are largely ex situ and destructive. This limits the amount of data that can be obtained from an individual sample and renders it difficult to produce statistically relevant data for unique and rare materials. Resonant cavity dielectric spectroscopy is a non-destructive, contactless technique which can simultaneously
    [Show full text]
  • Dielectric Spectroscopy of DNA Molecules in Solution
    Dielectric Spectroscopy of DNA molecules in solution Abstract With the abundance of genomic sequence data available nowadays, DNA plays a vital role in any scientific process in the field of biology, from gene therapy to drug discovery. A multitude of DNA binding proteins have been identified and their structures have been solved in complex with the DNA sequence they have preference for to bind. Yet, it remains still very hard to design a protein with engineered DNA binding preferences even when detailed knowledge of DNA– DNA and DNA–ligand structures can nowadays be obtained by high-resolution techniques (DNA structures down to 0.35 readily available in PDB). A good explanation of this situation, comes from the fact that energetic analysis of protein-DNA complexes, still remains experimentally and theoretically challenging, because it requires quantification of the different contributions to such interactions, in particular the electrostatic energy term. Electrostatic forces have long been recognized to inherently influence the DNA structure and interactions including DNA bending and folding and DNA–ligand recognition, owing to the high charge density of the DNA molecule backbone, as well as the polar associative interactions between the nucleotide bases. Standard dielectric characterization tools, such as impedance spectroscopy and dielectrophoresis, only yield average values of DNA polarizability in bulk solution that include major secondary structural contributions and DNA-solvent interfacial effects (shielding). Latest experiments, calculate a value of , which differs substantially both from values measured by the aforementioned techniques as well as from standard theoretical models ( typically assuming DNA to be a low-polarizable medium with ). This work, which is laid in the form of a self-imposed Problem Set, aims to understand frequency dependance of the dielectric constant of DNA in solutions, in order to inform modern computational and experimental DNA assays.
    [Show full text]
  • Dielectric Spectroscopy
    University of Potsdam, Institute of Physics Advanced lab experiments May 31, 2001 M6 Dielectric spectroscopy Tutor: Dr. Peter Frubing¨ 1 Contents 1 Introduction 2 1.1 Motivation . 2 1.2 Physical and mathematical concepts . 2 1.3 Equipment . 2 1.4 Tasks . 2 2 Theoretical background 3 2.1 Electric polarisation . 3 2.2 Debye relaxation . 6 2.3 Eqivalent-circuit analysis . 10 2.4 Temperature dependence of the relaxation time . 14 2.5 Dielectric relaxation in polymers . 14 3 Experiment 15 3.1 Setup . 15 3.2 Samples . 17 3.3 Running the experiment . 20 4 Bibliography 21 The computer programs were written by Mirko Krumpe, stud. phys. 1Tel.: (0331) 977-1456, Email: [email protected], Raum 1.19.2.16. 1 1 Introduction 1.1 Motivation Dielectric spectroscopy measures the dielectric permittivity as a function of frequency and temperature. It can be applied to all non-conducting materials. The frequency range ex- tends over nearly 18 orders in magnitude: from the µHz to the THz range close to the infrared region. Dielectric spectroscopy is sensitive to dipolar species as well as localised charges in a material, it determines their strength, their kinetics and their interactions. Thus, dielectric spectroscopy is a powerful tool for the electrical characterisation of non- conducting or semiconducting materials in relation to their structure and also of electronic or sensor devices. The lab experiment is an introduction into basic concepts and measure- ment practise of this widely used technique. It is highly recommended to study this manual in detail. It is already rather concise.
    [Show full text]
  • Simulation of the Impedance Response of Materials with More Than One Electrical Path
    Simulation of the Impedance Response of Materials with More than One Electrical Path Rosario A. Gerhardt* and Youngho Jin School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA 30332, USA *Corresponding author: [email protected] Abstract: Materials and devices can often build up or other effects[3]. However, because contain multiple interfaces that may or may not the properties of the boundaries are often very participate in the active function of a given different than that of the bulk grains, it is useful material or device. However, they are often only to consider treating them as if they were made up evaluated at the specific frequency of application of two different phases. Therefore, concepts or in dc mode, which essentially disregards the developed to explain composite materials, such rich information that the full frequency spectrum as effective media, connectivity of phases and can contain. This causes a lot of useful percolation [4] may be able to be used to derive information, which could be used to help better understanding of the properties of understand their electrical behaviour, either for polycrystalline materials as a function of grain quality control, life prediction, reliability or basic size, defect density or the presence of inadvertent understanding, to be lost. In this article, we impurities. utilize a combination of COMSOL Multiphysics Such a modeling effort becomes even more simulations and equivalent circuit modelling to important in the case of nanocrystalline materials demonstrate the advantages of considering which have comparable volume fraction of grain broadband ac measurements as a way to develop boundaries and bulk grains due to the high more detailed understanding of materials with surface areas these materials possess[5].
    [Show full text]
  • A Differential Dielectric Spectroscopy Setup to Measure the Electric Dipole Moment and Net Charge of Colloidal Quantum Dots R
    A differential dielectric spectroscopy setup to measure the electric dipole moment and net charge of colloidal quantum dots R. J. Kortschot, I. A. Bakelaar, B. H. Erné, and B. W. M. Kuipers Citation: Review of Scientific Instruments 85, 033903 (2014); doi: 10.1063/1.4867666 View online: http://dx.doi.org/10.1063/1.4867666 View Table of Contents: http://scitation.aip.org/content/aip/journal/rsi/85/3?ver=pdfcov Published by the AIP Publishing Articles you may be interested in Fluorescence resonance energy transfer measured by spatial photon migration in CdSe-ZnS quantum dots colloidal systems as a function of concentration Appl. Phys. Lett. 105, 203108 (2014); 10.1063/1.4902223 Effect of metal oxide morphology on electron injection from CdSe quantum dots to ZnO Appl. Phys. Lett. 102, 163119 (2013); 10.1063/1.4803173 Optical susceptibilities in singly charged ZnO colloidal quantum dots embedded in different dielectric matrices J. Appl. Phys. 113, 054303 (2013); 10.1063/1.4789363 Electrically driven light emission from single colloidal quantum dots at room temperature Appl. Phys. Lett. 90, 023110 (2007); 10.1063/1.2425043 Permanent dipole moment and charges in colloidal semiconductor quantum dots J. Chem. Phys. 111, 6955 (1999); 10.1063/1.479988 This article is copyrighted as indicated in the article. Reuse of AIP content is subject to the terms at: http://scitationnew.aip.org/termsconditions. Downloaded to IP: 131.211.104.187 On: Thu, 08 Jan 2015 14:01:16 REVIEW OF SCIENTIFIC INSTRUMENTS 85, 033903 (2014) A differential dielectric spectroscopy setup to measure the electric dipole moment and net charge of colloidal quantum dots R.
    [Show full text]
  • Dielectric Properties of Multilayer Polymer Films
    DIELECTRIC PROPERTIES OF MULTILAYER POLYMER FILMS FOR HIGH ENERGY DENSITY CAPACITORS & PREDICTING LONG-TERM CREEP FAILURE OF A BIMODAL POLYETHYLENE PIPE FROM SHORT-TERM FATIGUE TESTS by Zheng Zhou Submitted in partial fulfillment of the requirements For the degree of Doctor of Philosophy Dissertation Advisors: Prof. Eric Baer and Prof. Anne Hiltner Department of Macromolecular Science and Engineering CASE WESTERN RESERVE UNIVERSITY August, 2013 CASE WESTERN RESERVE UNIVERSITY SCHOOL OF GRADUATE STUDIES We hereby approve the thesis/dissertation of Zheng Zhou candidate for the Ph.D. degree *. (signed) Prof. Eric Baer (chair of the committee) Prof. Lei Zhu Prof. Donald Schuele Prof. Alex Jamieson (date) May 8, 2013 *We also certify that written approval has been obtained for any proprietary material contained therein. Copyright © 2013 by Zheng Zhou All rights reserved Dedication To my wife, Ying Chen, and my parents, Baihua, and Jieshui TABLE OF CONTENTS LIST OF TABLES iii LIST OF FIGURES iv ACKNOWLEDGEMENTS xi ABSTRACT xiii PART A 1 CHAPTER 1 2 INTERPHASE/INTERFACE MODIFICATION ON THE DIELECTRIC PROPERTIES OF PC/P(VDF-HFP) MULTILAYER FILMS FOR HIGH ENERGY DENSITY CAPACITORS CHAPTER 2 51 MULTILAYERED POLYCARBONATE/POLY(VINYLIDENE FLUORIDE-CO-HEXAFLUOROPROPYLENE) FOR HIGH ENERGY DENSITY CAPACITORS WITH ENHANCED LIFETIME CHAPTER 3 92 FRACTURE PHENOMENA IN MICRO- AND NANO-LAYERED POLYCARBONATE/POLY(VINYLIDENE FLUORIDE-CO- HEXAFLUOROPROPYLENE) FILMS UNDER ELECTRIC FIELD FOR HIGH ENERGY DENSITY CAPACITORS i PART B 131 CHAPTER 4 132 PREDICTING LONG-TERM CREEP FAILURE OF BIMODAL POLYETHYLENE PIPE FROM SHORT TERM FATIGUE TESTS BIBLIOGRAPHY 167 ii LIST OF TABLES CHAPTER 1 1.1 PC/tie/P(VDF-HFP) multilayer films under investigation 31 1.2 Maximum discharge energy density and hysteresis property values 44 at 500 kV/mm as a function of nominal tie layer thickness for the 65-layer 46/8/46 PC/tie/P(VDF-HFP) multilayer films.
    [Show full text]
  • IMPEDANCE SPECTROSCOPY Applications to Electrochemical and Dielectric Phenomena
    IMPEDANCE SPECTROSCOPY IMPEDANCE SPECTROSCOPY Applications to Electrochemical and Dielectric Phenomena Vadim F. Lvovich ) WILEY A JOHN WILEY & SONS, INC., PUBLICATION Copyright © 2012 by John Wiley & Sons, Inc. All rights reserved Published by John Wiley & Sons, Inc., Hoboken, New Jersey Published simultaneously in Canada No part of this publication may be reproduced, stored in a retrieval system, or transmitted in any form or by any means, electronic, mechanical, photocopying, recording, scanning, or otherwise, except as permitted under Section 107 or 108 of the 1976 United States Copyright Act, without either the prior written permission of the Publisher, or authorization through payment of the appropriate per-copy fee to the Copyright Clearance Center, Inc., 222 Rosewood Drive, Danvers, MA 01923, (978) 750-8400, fax (978) 750-4470, or on the web at www.copyright.com. Requests to the Publisher for permission should be addressed to the Permissions Department, John Wiley & Sons, Inc., 111 River Street, Hoboken, NJ 07030, (201) 748-6011, fax (201) 748-6008, or online at http://www.wiley.com/go/permission. Limit of Liability/Disclaimer of Warranty: While the publisher and author have used their best efforts in preparing this book, they make no representations or warranties with respect to the accuracy or completeness of the contents of this book and specifically disclaim any implied warranties of merchantability or fitness for a particular purpose. No warranty may be created or extended by sales representatives or written sales materials. The advice and strategies contained herein may not be suitable for your situation. You should consult with a professional where appropriate.
    [Show full text]
  • High Dielectric Constant Materials Containing Liquid Crystals
    HIGH DIELECTRIC CONSTANT MATERIALS CONTAINING LIQUID CRYSTALS A dissertation submitted to Kent State University in partial fulfillment of requirements for the degree of Doctor of Philosophy by Clinton Ignatius Braganza August 2009 Dissertation written by Clinton Ignatius Braganza B.A., College of Wooster, 2003 Ph.D., Kent State University, 2009 Approved by ________________________________, Chair, Doctoral Dissertation Committee Dr. L.C. Chien ________________________________, Members, Doctoral Dissertation Committee Dr. Michael Fisch ________________________________ Dr. Antal Jakli ________________________________ Dr. Dengke Yang ________________________________ Dr. Mikhail Chebotar Accepted by ______________________________, Chair, Chemical Physics Interdisciplinary Program Dr. Oleg Lavretovich ______________________________, Dean, College of Arts and Sciences Dr. Timothy Moerland ii TABLE OF CONTENTS LIST OF FIGURES .............................................................................................. V LIST OF TABLES............................................................................................. XIX ACKNOWLEDGEMENTS ...............................................................................XXV CHAPTER 1 MOTIVATION AND APPROACH....................................................1 1.1 Dielectric Materials in Electric Fields........................................................................................... 5 1.2 Dielectric Properties of Heterogeneous Systems.........................................................................
    [Show full text]
  • Dielectric Spectroscopy Studies of Low-Disorder and Low- Dimensional Materials
    Dielectric Spectroscopy Studies of Low-Disorder and Low- Dimensional Materials Thesis submitted by Pragya Tripathi Supervisors: Dr. Roberto Macovez Prof. Dr. Josep Lluis Tamarit Mur Group of Characterization of Materials Barcelona September, 2016 PhD Programme in Computational and applied Physics Departament de Física All the contents of this works are licensed under the creative commons Problems are not stop signs, They are guide lines Robert H. Schuller ABSTRACT In this thesis we employ dielectric spectroscopy (in different implementations) to study the dielectric properties of different materials ranging from completely disordered supercooled liquids to low-disorder solids with only ratcheting reorientational motions, to low-dimensional systems such as thin films or needle-like crystals. The probed material properties include the electrical conductivity, the space-charge processes due to sample heterogeneities, molecular dynamics, hydrogen-bond dynamics, and phase- transition temperature and kinetics. To study materials in thin film form, we implement silicon-based interdigital electrode devices, which we calibrate to obtain their equivalent capacity in vacuum. We also probe two-dimensional samples obtained by intercalating (sandwiching) organic molecules between parallel graphite oxide sheets. We study both organic and hybrid (organic-inorganic) films, and compared the results with the bulk counterpart of the same materials. Rhodamine films are deposited by two different procedures starting from rhodamine 6G chloride: solution-deposited films are ionic and ordered, while vacuum- deposited films consist of a different, neutral species, namely rhodamine19, due to decomposition of rhodamine 6G upon sublimation. Both types of films display variable-range hopping electronic conduction, and a conductivity- induced space-charge relaxation. Solution deposited films display a dipolar relaxation, absent in rhodamine 19 films.
    [Show full text]