Cold Mirror Based on High-Low-High Refractive Index Dielectric Materials
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Download Optical Coatings Datasheet
Optical Coatings The Fresnel reflection at the boundary of media with different 1.1. Protected Aluminum refractive indices and interference in thin films allow the optical 1.1.1. Aluminum mirrors with SiO2 and SiO protective coating are components reflecting and transmitting properties to be selectively among the most commonly used. This coating is mechanically strong and controllably changed. The reflection from the surface of the optical enough for most applications, but reduces a bit the reflection in the part in the selected spectral range can be escalated or suppressed by UV. In addition, it has some absorption by 3 μm (water) and by 9-11 μm applying special optical coatings. Additionally, the applied films can (Si-O bond). modify the physical properties of the optical component surface, for example, to increase its resistance to moisture and/or dust. Wavelength, μm Average reflectance, % Damage threshold, J/cm2, 50 ns pulse Tydex makes a wide range of optical coatings for our components 0.25-20.0 >90 0.25-0.3 from all processed materials. The spectrum is from near UV to far IR and millimeter range. The electron beam and resistive evaporation with ionic surface cleaning of parts and ion assisting are used at Balzers BAK-760 (Liechtenstein), VU-1AI and VU-2MI (Belarus) installations for depositing the optical coatings. Our coatings are not limited to a standard set of designs. On the contrary, we try our best to satisfy the customer’s requirements. Please contact us and we will do our best to solve your problem as fully as possible. -
Low-Loss Dielectric Mirror with Ion-Beam-Sputtered Tio2 Œsio2 Mixed Films
View metadata, citation and similar papers at core.ac.uk brought to you by CORE provided by National Tsing Hua University Institutional Repository Low-loss dielectric mirror with ion-beam-sputtered TiO2–SiO2 mixed films Shiuh Chao, Wen-Hsiang Wang, and Cheng-Chung Lee Ion-beam-sputtered TiO2–SiO2 mixed films with 17% SiO2 concentration were used as high-refractive- index layers in a multilayered-stack dielectric mirror. Experimental results indicated that total loss of the as-deposited mirror was 34% lower than that of the as-deposited conventional mirrors with pure TiO2 films used as high-refractive-index layers. In addition, annealing reduced total loss of the mirrors. Although decreasing with an increasing annealing temperature, total loss of the conventional mirrors dramatically increased above ϳ200 °C annealing temperature, owing to increased scattering from an amorphous-to-crystalline phase transition in the TiO2 films. In addition, total loss of the mirrors with the mixed films continuously decreased with an increasing annealing temperature up to 400 °C without the phase transition. Total loss was reduced 88% by means of decreasing absorption in the mixed films. Moreover, the annealed mirror with mixed films was better than both the as-deposited mirror and the conventional mirror with pure films in terms of laser-damage resistance. © 2001 Optical Society of America OCIS codes: 310.0310, 310.1620, 310.1860, 310.3840, 310.6860, 310.6870. 1. Introduction Ta2O5 are the conventionally used materials for high- Scattering loss and absorption loss of a dielectric mir- refractive-index thin films. In addition, SiO2 and ror can cause lock in and lock-in growth phenomena in Al2O3 are frequently used as low-refractive-index a ring-laser gyroscope. -
Antireflective Coatings
materials Review Antireflective Coatings: Conventional Stacking Layers and Ultrathin Plasmonic Metasurfaces, A Mini-Review Mehdi Keshavarz Hedayati 1,* and Mady Elbahri 1,2,3,* 1 Nanochemistry and Nanoengineering, Institute for Materials Science, Faculty of Engineering, Christian-Albrechts-Universität zu Kiel, Kiel 24143, Germany 2 Nanochemistry and Nanoengineering, Helmholtz-Zentrum Geesthacht, Geesthacht 21502, Germany 3 Nanochemistry and Nanoengineering, School of Chemical Technology, Aalto University, Kemistintie 1, Aalto 00076, Finland * Correspondence: [email protected] (M.K.H.); mady.elbahri@aalto.fi (M.E.); Tel.: +49-431-880-6148 (M.K.H.); +49-431-880-6230 (M.E.) Academic Editor: Lioz Etgar Received: 2 May 2016; Accepted: 15 June 2016; Published: 21 June 2016 Abstract: Reduction of unwanted light reflection from a surface of a substance is very essential for improvement of the performance of optical and photonic devices. Antireflective coatings (ARCs) made of single or stacking layers of dielectrics, nano/microstructures or a mixture of both are the conventional design geometry for suppression of reflection. Recent progress in theoretical nanophotonics and nanofabrication has enabled more flexibility in design and fabrication of miniaturized coatings which has in turn advanced the field of ARCs considerably. In particular, the emergence of plasmonic and metasurfaces allows for the realization of broadband and angular-insensitive ARC coatings at an order of magnitude thinner than the operational wavelengths. In this review, a short overview of the development of ARCs, with particular attention paid to the state-of-the-art plasmonic- and metasurface-based antireflective surfaces, is presented. Keywords: antireflective coating; plasmonic metasurface; absorbing antireflective coating; antireflection 1. -
Mirror That Does Not Change the Phase of Reflected Waves
APPLIED PHYSICS LETTERS 88, 091119 ͑2006͒ Mirror that does not change the phase of reflected waves ͒ V. A. Fedotov, A. V. Rogacheva, and N. I. Zheludeva EPSRC Nanophotonics Portfolio Centre, School of Physics and Astronomy, University of Southampton, SO17 1BJ, United Kingdom P. L. Mladyonov and S. L. Prosvirnin Institute of Radio Astronomy, National Academy of Sciences of Ukraine, Kharkov, 61002, Ukraine ͑Received 8 July 2005; accepted 16 January 2006; published online 3 March 2006͒ We report that electromagnetic wave reflected from a flat metallic mirror superimposed with a planar wavy metallic structure with subwavelength features that resemble “fish scales” reflects like a conventional mirror without diffraction, but shows no phase change with respect to the incident wave. Such unusual behavior resembles a reflection from a hypothetical zero refractive index material, or “magnetic wall”. We also discovered that the structure acts as a local field concentrator and a resonant “amplifier” of losses in the underlying dielectric. © 2006 American Institute of Physics. ͓DOI: 10.1063/1.2179615͔ Wavelength sensitive transmission and reflection of a this periodic structure does not diffract electromagnetic ra- structured thin metal layers in the optical and microwave diation for wavelengths longer than the translation cell size parts of the spectrum currently attract considerable attention. d, i.e., for frequencies lower than 20 GHz. Such selectivity results from patterning the interface on a Without a fish-scale structure on top, one would expect a subwavelength scale in a way that makes electromagnetic metallic sheet to be a very good reflector across the entire excitation couple with the structure in a resonant fashion.1–3 spectral range of interest, and that the reflected wave would In this letter, we report on the first experimental observation have the opposite phase to the incident wave. -
Negative Refractive Index in Artificial Metamaterials
1 Negative Refractive Index in Artificial Metamaterials A. N. Grigorenko Department of Physics and Astronomy, University of Manchester, Manchester, M13 9PL, UK We discuss optical constants in artificial metamaterials showing negative magnetic permeability and electric permittivity and suggest a simple formula for the refractive index of a general optical medium. Using effective field theory, we calculate effective permeability and the refractive index of nanofabricated media composed of pairs of identical gold nano-pillars with magnetic response in the visible spectrum. PACS: 73.20.Mf, 41.20.Jb, 42.70.Qs 2 The refractive index of an optical medium, n, can be found from the relation n2 = εμ , where ε is medium’s electric permittivity and μ is magnetic permeability.1 There are two branches of the square root producing n of different signs, but only one of these branches is actually permitted by causality.2 It was conventionally assumed that this branch coincides with the principal square root n = εμ .1,3 However, in 1968 Veselago4 suggested that there are materials in which the causal refractive index may be given by another branch of the root n =− εμ . These materials, referred to as left- handed (LHM) or negative index materials, possess unique electromagnetic properties and promise novel optical devices, including a perfect lens.4-6 The interest in LHM moved from theory to practice and attracted a great deal of attention after the first experimental realization of LHM by Smith et al.7, which was based on artificial metallic structures -
Dielectric Mirrors
Dielectric Mirrors Surface coatings with high reflection are generally produced with metals or with dielectric thin-film interference systems and also by a combination of metal/dielectric. Mirrors for scientific and technical applications are always surface mirrors. Metallic and dielectric mirrors differ in their reflectivity and spectral width, but also in hardness, abrasion resistance, laser damage threshold, etc. Dielectric interference mirrors are, in comparison Dielectric Mirrors with metal mirrors, spectrally less wide than metal mirrors and their reflection is angle- dependent. However, they can achieve reflection Mirror types values in the visible range of more than 99.9% at . Laser mirrors for one or more wavelengths, a vertical angle of incidence. from UV to IR This is possible because optically high-quality, . Laser mirrors with additional functions (e.g. low-loss interference layer systems are produced Rmax at 1064 nm and Tmax at 633 nm) from pure, absorption-free materials under clean- . Partially transparent mirrors, from UV to IR room conditions using state-of-the-art coating . Broadband laser mirrors with high technology. reflection . Broadband reflectors for stable lighting Applications systems . Highly reflective and semi-transparent . Cold light mirror reflectors for the optimal setup of various . Infrared reflectors with high transmission in laser systems the visible spectral range . Components for laser experiments in chemistry, physics and metrology Technical data . Various lighting equipment . Optical devices AOI: 0° to 45° Material: almost all types of mineral glass and Properties crystals suitable . Suitable for wide wavelength ranges Thickness: according to . Suitable for high laser power customer . High thermal resistance (up to 550°C with FILTROP GROUP – requirements, your supply chain quartz glass or sapphire substrates) standard = 1.0 mm . -
Chapter 19/ Optical Properties
Chapter 19 /Optical Properties The four notched and transpar- ent rods shown in this photograph demonstrate the phenomenon of photoelasticity. When elastically deformed, the optical properties (e.g., index of refraction) of a photoelastic specimen become anisotropic. Using a special optical system and polarized light, the stress distribution within the speci- men may be deduced from inter- ference fringes that are produced. These fringes within the four photoelastic specimens shown in the photograph indicate how the stress concentration and distribu- tion change with notch geometry for an axial tensile stress. (Photo- graph courtesy of Measurements Group, Inc., Raleigh, North Carolina.) Why Study the Optical Properties of Materials? When materials are exposed to electromagnetic radia- materials, we note that the performance of optical tion, it is sometimes important to be able to predict fibers is increased by introducing a gradual variation and alter their responses. This is possible when we are of the index of refraction (i.e., a graded index) at the familiar with their optical properties, and understand outer surface of the fiber. This is accomplished by the mechanisms responsible for their optical behaviors. the addition of specific impurities in controlled For example, in Section 19.14 on optical fiber concentrations. 766 Learning Objectives After careful study of this chapter you should be able to do the following: 1. Compute the energy of a photon given its fre- 5. Describe the mechanism of photon absorption quency and the value of Planck’s constant. for (a) high-purity insulators and semiconduc- 2. Briefly describe electronic polarization that re- tors, and (b) insulators and semiconductors that sults from electromagnetic radiation-atomic in- contain electrically active defects. -
Super-Resolution Imaging by Dielectric Superlenses: Tio2 Metamaterial Superlens Versus Batio3 Superlens
hv photonics Article Super-Resolution Imaging by Dielectric Superlenses: TiO2 Metamaterial Superlens versus BaTiO3 Superlens Rakesh Dhama, Bing Yan, Cristiano Palego and Zengbo Wang * School of Computer Science and Electronic Engineering, Bangor University, Bangor LL57 1UT, UK; [email protected] (R.D.); [email protected] (B.Y.); [email protected] (C.P.) * Correspondence: [email protected] Abstract: All-dielectric superlens made from micro and nano particles has emerged as a simple yet effective solution to label-free, super-resolution imaging. High-index BaTiO3 Glass (BTG) mi- crospheres are among the most widely used dielectric superlenses today but could potentially be replaced by a new class of TiO2 metamaterial (meta-TiO2) superlens made of TiO2 nanoparticles. In this work, we designed and fabricated TiO2 metamaterial superlens in full-sphere shape for the first time, which resembles BTG microsphere in terms of the physical shape, size, and effective refractive index. Super-resolution imaging performances were compared using the same sample, lighting, and imaging settings. The results show that TiO2 meta-superlens performs consistently better over BTG superlens in terms of imaging contrast, clarity, field of view, and resolution, which was further supported by theoretical simulation. This opens new possibilities in developing more powerful, robust, and reliable super-resolution lens and imaging systems. Keywords: super-resolution imaging; dielectric superlens; label-free imaging; titanium dioxide Citation: Dhama, R.; Yan, B.; Palego, 1. Introduction C.; Wang, Z. Super-Resolution The optical microscope is the most common imaging tool known for its simple de- Imaging by Dielectric Superlenses: sign, low cost, and great flexibility. -
Influence of a Back Side Dielectric Mirror on Thin Film Silicon Solar Cells Performance
Optica Applicata, Vol. XLIX, No. 1, 2019 DOI: 10.5277/oa190113 Influence of a back side dielectric mirror on thin film silicon solar cells performance 1* 2 2 KRYSTIAN CIESLAK , ALAIN FAVE , MUSTAPHA LEMITI 1Faculty of Environmental Engineering, Lublin University of Technology, ul. Nadbystrzycka 40B 20-618 Lublin, Poland 2Université de Lyon, Institut des Nanotechnologies de Lyon INL – UMR5270, CNRS, Ecole Centrale de Lyon, INSA Lyon, Villeurbanne, F-69621, France *Corresponding author: [email protected] Back side p+ emitter thin silicon solar cells have been constructed using vapor phase epitaxy. Double porous structure on a c-Si substrate was used as a seed substrate in order to enable active layer separation after vapor phase epitaxy growth. Structure of the back side emitter solar cell was obtained in situ during the epitaxy process. In order to enhance solar cell response to light from a range of 700–1200 nm wavelength, the back side dielectric mirror was developed and optimized by means of a computer simulation and deposited by plasma enhanced chemical vapor deposition. At the same time, a reference sample was fabricated. Comparison of solar cells performance with or without the back side mirror was performed and clearly shows that the quality of solar light con- version into the electricity by means of solar cells, can be improved by using the structure proposed in this article. Keywords: thin film silicon solar cells, back side emitter, back side mirror, vapor phase epitaxy, Bragg mirror, IMD optical properties simulation. 1. Introduction Increasing energy demand of the modern world and fossil fuels depletion have stimulated the world’s economy, industry and scientific centers to invest in alternative sources of energy development. -
Realization of an All-Dielectric Zero-Index Optical Metamaterial
Realization of an all-dielectric zero-index optical metamaterial Parikshit Moitra1†, Yuanmu Yang1†, Zachary Anderson2, Ivan I. Kravchenko3, Dayrl P. Briggs3, Jason Valentine4* 1Interdisciplinary Materials Science Program, Vanderbilt University, Nashville, Tennessee 37212, USA 2School for Science and Math at Vanderbilt, Nashville, TN 37232, USA 3Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA 4Department of Mechanical Engineering, Vanderbilt University, Nashville, Tennessee 37212, USA †these authors contributed equally to this work *email: [email protected] Metamaterials offer unprecedented flexibility for manipulating the optical properties of matter, including the ability to access negative index1–4, ultra-high index5 and chiral optical properties6–8. Recently, metamaterials with near-zero refractive index have drawn much attention9–13. Light inside such materials experiences no spatial phase change and extremely large phase velocity, properties that can be applied for realizing directional emission14–16, tunneling waveguides17, large area single mode devices18, and electromagnetic cloaks19. However, at optical frequencies previously demonstrated zero- or negative- refractive index metamaterials require the use of metallic inclusions, leading to large ohmic loss, a serious impediment to device applications20,21. Here, we experimentally demonstrate an impedance matched zero-index metamaterial at optical frequencies based on purely dielectric constituents. Formed from stacked silicon rod unit cells, the metamaterial possesses a nearly isotropic low-index response leading to angular selectivity of transmission and directive emission from quantum dots placed within the material. Over the past several years, most work aimed at achieving zero-index has been focused on epsilon-near-zero metamaterials (ENZs) which can be realized using diluted metals or metal waveguides operating below cut-off. -
Refractive Index and Dispersion of Liquid Hydrogen
&1 Bureau of Standards .ifcrary, M.W. Bldg OCT 11 B65 ^ecknlcciL ^iote 9?©. 323 REFRACTIVE INDEX AND DISPERSION OF LIQUID HYDROGEN R. J. CORRUCCINI U. S. DEPARTMENT OF COMMERCE NATIONAL BUREAU OF STANDARDS THE NATIONAL BUREAU OF STANDARDS The National Bureau of Standards is a principal focal point in the Federal Government for assuring maximum application of the physical and engineering sciences to the advancement of technology in industry and commerce. Its responsibilities include development and maintenance of the national stand- ards of measurement, and the provisions of means for making measurements consistent with those standards; determination of physical constants and properties of materials; development of methods for testing materials, mechanisms, and structures, and making such tests as may be necessary, particu- larly for government agencies; cooperation in the establishment of standard practices for incorpora- tion in codes and specifications; advisory service to government agencies on scientific and technical problems; invention and development of devices to serve special needs of the Government; assistance to industry, business, and consumers in the development and acceptance of commercial standards and simplified trade practice recommendations; administration of programs in cooperation with United States business groups and standards organizations for the development of international standards of practice; and maintenance of a clearinghouse for the collection and dissemination of scientific, tech- nical, and engineering information. The scope of the Bureau's activities is suggested in the following listing of its four Institutes and their organizational units. Institute for Basic Standards. Applied Mathematics. Electricity. Metrology. Mechanics. Heat. Atomic Physics. Physical Chemistry. Laboratory Astrophysics.* Radiation Physics. Radio Standards Laboratory:* Radio Standards Physics; Radio Standards Engineering. -
4.4 Total Internal Reflection
n 1:33 sin θ = water sin θ = sin 35◦ ; air n water 1:00 air i.e. ◦ θair = 49:7 : Thus, the height above the horizon is ◦ ◦ θ = 90 θair = 40:3 : (4.7) − Because the sun is far away from the fisherman and the diver, the fisherman will see the sun at the same angle above the horizon. 4.4 Total Internal Reflection Suppose that a light ray moves from a medium of refractive index n1 to one in which n1 > n2, e.g. glass-to-air, where n1 = 1:50 and n2 = 1:0003. ◦ If the angle of incidence θ1 = 10 , then by Snell's law, • n 1:50 θ = sin−1 1 sin θ = sin−1 sin 10◦ 2 n 1 1:0003 2 = sin−1 (0:2604) = 15:1◦ : ◦ If the angle of incidence is θ1 = 50 , then by Snell's law, • n 1:50 θ = sin−1 1 sin θ = sin−1 sin 50◦ 2 n 1 1:0003 2 = sin−1 (1:1487) =??? : ◦ So when θ1 = 50 , we have a problem: Mathematically: the angle θ2 cannot be computed since sin θ2 > 1. • 142 Physically: the ray is unable to refract through the boundary. Instead, • 100% of the light reflects from the boundary back into the prism. This process is known as total internal reflection (TIR). Figure 8672 shows several rays leaving a point source in a medium with re- fractive index n1. Figure 86: The refraction and reflection of light rays with increasing angle of incidence. The medium on the other side of the boundary has n2 < n1.