Data Integrity
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Hybrid Drowsy SRAM and STT-RAM Buffer Designs for Dark-Silicon
This article has been accepted for inclusion in a future issue of this journal. Content is final as presented, with the exception of pagination. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS 1 Hybrid Drowsy SRAM and STT-RAM Buffer Designs for Dark-Silicon-Aware NoC Jia Zhan, Student Member, IEEE, Jin Ouyang, Member, IEEE,FenGe,Member, IEEE, Jishen Zhao, Member, IEEE, and Yuan Xie, Fellow, IEEE Abstract— The breakdown of Dennard scaling prevents us MCMC MC from powering all transistors simultaneously, leaving a large fraction of dark silicon. This crisis has led to innovative work on Tile link power-efficient core and memory architecture designs. However, link link RouterRouter the research for addressing dark silicon challenges with network- To router on-chip (NoC), which is a major contributor to the total chip NI power consumption, is largely unexplored. In this paper, we Core link comprehensively examine the network power consumers and L1-I$ L2 L1-D$ the drawbacks of the conventional power-gating techniques. To overcome the dark silicon issue from the NoC’s perspective, we MCMC MC propose DimNoC, a dim silicon scheme, which leverages recent drowsy SRAM design and spin-transfer torque RAM (STT-RAM) Fig. 1. 4 × 4 NoC-based multicore architecture. In each node, the local technology to replace pure SRAM-based NoC buffers. processing elements (core, L1, L2 caches, and so on) are attached to a router In particular, we propose two novel hybrid buffer architectures: through an NI. Routers are interconnected through links to form an NoC. 1) a hierarchical buffer architecture, which divides the input Four memory controllers are attached at the four corners, which will be used buffers into a set of levels with different power states and 2) a for off-chip memory access. -
Z/OS ICSF Overview How to Send Your Comments to IBM
z/OS Version 2 Release 3 Cryptographic Services Integrated Cryptographic Service Facility Overview IBM SC14-7505-08 Note Before using this information and the product it supports, read the information in “Notices” on page 81. This edition applies to ICSF FMID HCR77D0 and Version 2 Release 3 of z/OS (5650-ZOS) and to all subsequent releases and modifications until otherwise indicated in new editions. Last updated: 2020-05-25 © Copyright International Business Machines Corporation 1996, 2020. US Government Users Restricted Rights – Use, duplication or disclosure restricted by GSA ADP Schedule Contract with IBM Corp. Contents Figures................................................................................................................ vii Tables.................................................................................................................. ix About this information.......................................................................................... xi ICSF features...............................................................................................................................................xi Who should use this information................................................................................................................ xi How to use this information........................................................................................................................ xi Where to find more information.................................................................................................................xii -
An Analysis of Data Corruption in the Storage Stack
An Analysis of Data Corruption in the Storage Stack Lakshmi N. Bairavasundaram∗, Garth R. Goodson†, Bianca Schroeder‡ Andrea C. Arpaci-Dusseau∗, Remzi H. Arpaci-Dusseau∗ ∗University of Wisconsin-Madison †Network Appliance, Inc. ‡University of Toronto {laksh, dusseau, remzi}@cs.wisc.edu, [email protected], [email protected] Abstract latent sector errors, within disk drives [18]. Latent sector errors are detected by a drive’s internal error-correcting An important threat to reliable storage of data is silent codes (ECC) and are reported to the storage system. data corruption. In order to develop suitable protection Less well-known, however, is that current hard drives mechanisms against data corruption, it is essential to un- and controllers consist of hundreds-of-thousandsof lines derstand its characteristics. In this paper, we present the of low-level firmware code. This firmware code, along first large-scale study of data corruption. We analyze cor- with higher-level system software, has the potential for ruption instances recorded in production storage systems harboring bugs that can cause a more insidious type of containing a total of 1.53 million disk drives, over a pe- disk error – silent data corruption, where the data is riod of 41 months. We study three classes of corruption: silently corrupted with no indication from the drive that checksum mismatches, identity discrepancies, and par- an error has occurred. ity inconsistencies. We focus on checksum mismatches since they occur the most. Silent data corruptionscould lead to data loss more of- We find more than 400,000 instances of checksum ten than latent sector errors, since, unlike latent sector er- mismatches over the 41-month period. -
Detection Method of Data Integrity in Network Storage Based on Symmetrical Difference
S S symmetry Article Detection Method of Data Integrity in Network Storage Based on Symmetrical Difference Xiaona Ding School of Electronics and Information Engineering, Sias University of Zhengzhou, Xinzheng 451150, China; [email protected] Received: 15 November 2019; Accepted: 26 December 2019; Published: 3 February 2020 Abstract: In order to enhance the recall and the precision performance of data integrity detection, a method to detect the network storage data integrity based on symmetric difference was proposed. Through the complete automatic image annotation system, the crawler technology was used to capture the image and related text information. According to the automatic word segmentation, pos tagging and Chinese word segmentation, the feature analysis of text data was achieved. Based on the symmetrical difference algorithm and the background subtraction, the feature extraction of image data was realized. On the basis of data collection and feature extraction, the sentry data segment was introduced, and then the sentry data segment was randomly selected to detect the data integrity. Combined with the accountability scheme of data security of the trusted third party, the trusted third party was taken as the core. The online state judgment was made for each user operation. Meanwhile, credentials that cannot be denied by both parties were generated, and thus to prevent the verifier from providing false validation results. Experimental results prove that the proposed method has high precision rate, high recall rate, and strong reliability. Keywords: symmetric difference; network; data integrity; detection 1. Introduction In recent years, the cloud computing becomes a new shared infrastructure based on the network. Based on Internet, virtualization, and other technologies, a large number of system pools and other resources are combined to provide users with a series of convenient services [1]. -
Linux Data Integrity Extensions
Linux Data Integrity Extensions Martin K. Petersen Oracle [email protected] Abstract The software stack, however, is rapidly growing in com- plexity. This implies an increasing failure potential: Many databases and filesystems feature checksums on Harddrive firmware, RAID controller firmware, host their logical blocks, enabling detection of corrupted adapter firmware, operating system code, system li- data. The scenario most people are familiar with in- braries, and application errors. There are many things volves bad sectors which develop while data is stored that can go wrong from the time data is generated in on disk. However, many corruptions are actually a re- host memory until it is stored physically on disk. sult of errors that occurred when the data was originally written. While a database or filesystem can detect the Most storage devices feature extensive checking to pre- corruption when data is eventually read back, the good vent errors. However, these protective measures are al- data may have been lost forever. most exclusively being deployed internally to the de- vice in a proprietary fashion. So far, there have been A recent addition to SCSI allows extra protection infor- no means for collaboration between the layers in the I/O mation to be exchanged between controller and disk. We stack to ensure data integrity. have extended this capability up into Linux, allowing filesystems (and eventually applications) to be able to at- An extension to the SCSI family of protocols tries to tach integrity metadata to I/O requests. Controllers and remedy this by defining a way to check the integrity of disks can then verify the integrity of an I/O before com- an request as it traverses the I/O stack. -
Understanding Real World Data Corruptions in Cloud Systems
Understanding Real World Data Corruptions in Cloud Systems Peipei Wang, Daniel J. Dean, Xiaohui Gu Department of Computer Science North Carolina State University Raleigh, North Carolina {pwang7,djdean2}@ncsu.edu, [email protected] Abstract—Big data processing is one of the killer applications enough to require attention, little research has been done to for cloud systems. MapReduce systems such as Hadoop are the understand software-induced data corruption problems. most popular big data processing platforms used in the cloud system. Data corruption is one of the most critical problems in In this paper, we present a comprehensive study on the cloud data processing, which not only has serious impact on characteristics of the real world data corruption problems the integrity of individual application results but also affects the caused by software bugs in cloud systems. We examined 138 performance and availability of the whole data processing system. data corruption incidents reported in the bug repositories of In this paper, we present a comprehensive study on 138 real world four Hadoop projects (i.e., Hadoop-common, HDFS, MapRe- data corruption incidents reported in Hadoop bug repositories. duce, YARN [17]). Although Hadoop provides fault tolerance, We characterize those data corruption problems in four aspects: our study has shown that data corruptions still seriously affect 1) what impact can data corruption have on the application and system? 2) how is data corruption detected? 3) what are the the integrity, performance, and availability -
Data & Computer Recovery Guidelines
Data & Computer Recovery Guidelines Data & Computer Recovery Guidelines This document contains general guidelines for restoring computer operating following certain types of disasters. It should be noted these guidelines will not fit every type of disaster or every organization and that you may need to seek outside help to recover and restore your operations. This document is divided into five parts. The first part provides general guidelines which are independent of the type of disaster, the next three sections deal with issues surrounding specific disaster types (flood/water damage, power surge, and physical damage). The final section deals with general recommendations to prepare for the next disaster. General Guidelines 2. Your first step is to restore the computing equipment. These are general guidelines for recovering after any type If you do try to power on the existing equipment, it of disaster or computer failure. If you have a disaster is best to remove the hard drive(s) first to make sure recovery plan, then you should be prepared; however, the system will power on. Once you have determined there may be things that were not covered to help the system powers on, you can reinstall the hard drive you recover. This section is divided into two sections and power the system back on. Hopefully, everything (computer system recovery, data recovery) works at that point. Note: this should not be tried in the case of a water or extreme heat damage. Computer System Recovery 3. If the computer will not power on then you can either The first step is to get your physical computer systems try to fix the computer or in many cases it is easier, running again. -
Data Remanence in Non-Volatile Semiconductor Memory (Part I)
Data remanence in non-volatile semiconductor memory (Part I) Security Group Sergei Skorobogatov Web: www.cl.cam.ac.uk/~sps32/ Email: [email protected] Introduction Data remanence is the residual physical representation of data that has UV EPROM EEPROM Flash EEPROM been erased or overwritten. In non-volatile programmable devices, such as UV EPROM, EEPROM or Flash, bits are stored as charge in the floating gate of a transistor. After each erase operation, some of this charge remains. It shifts the threshold voltage (VTH) of the transistor which can be detected by the sense amplifier while reading data. Microcontrollers use a ‘protection fuse’ bit that restricts unauthorized access to on-chip memory if activated. Very often, this fuse is embedded in the main memory array. In this case, it is erased simultaneously with the memory. Better protection can be achieved if the fuse is located close to the memory but has a separate control circuit. This allows it to be permanently monitored as well as hardware protected from being erased too early, thus making sure that by the time the fuse is reset no data is left inside the memory. In some smartcards and microcontrollers, a password-protected boot- Structure, cross-section and operation modes for different memory types loader restricts firmware updates and data access to authorized users only. Usually, the on-chip operating system erases both code and data How much residual charge is left inside the memory cells memory before uploading new code, thus preventing any new after a standard erase operation? Is it possible to recover data application from accessing previously stored secrets. -
Databridge ETL Solution Datasheet
DATASHEET Extract and Transform MCP Host Data for Improved KEY FEATURES Client configuration tool for Analysis and Decision Support easy customization of table layout. Fast, well-informed business decisions require access to your organization’s key performance Dynamic before-and-after indicators residing on critical database systems. But the prospect of exposing those systems images (BI-AI) based on inevitably raises concerns around security, data integrity, cost, and performance. key change. 64-bit clients. For organizations using the Unisys ClearPath MCP server and its non-relational DMSII • Client-side management database, there’s an additional challenge: Most business intelligence tools support only console. relational databases. • Ability to run the client as a service or a daemon. The Only True ETL Solution for DMSII Data • Multi-threaded clients to That’s why businesses like yours are turning to Attachmate® DATABridge™. It’s the only increase processing speed. true Extract, Transform, Load (ETL) solution that securely integrates Unisys MCP DMSII • Support for Windows Server and non-DMSII data into a secondary system. 2012. • Secure automation of Unisys With DATABridge, you can easily integrate production data into a relational database or MCP data replication. another DMSII database located on an entirely different Unisys host system. And because • Seamless integration of DATABridge clients for Oracle and Microsoft SQL Server support a breadth of operating both DMSII and non-DMSII environments (including Windows 7, Windows Server 2012, Windows Server 2008, UNIX, data with Oracle, Microsoft SQL, and other relational AIX, SUSE Linux, and Red Hat Linux), DATABridge solutions fit seamlessly into your existing databases. infrastructure. -
Nasdeluxe Z-Series
NASdeluxe Z-Series Benefit from scalable ZFS data storage By partnering with Starline and with Starline Computer’s NASdeluxe Open-E, you receive highly efficient Z-series and Open-E JovianDSS. This and reliable storage solutions that software-defined storage solution is offer: Enhanced Storage Performance well-suited for a wide range of applica- tions. It caters perfectly to the needs • Great adaptability Tiered RAM and SSD cache of enterprises that are looking to de- • Tiered and all-flash storage Data integrity check ploy a flexible storage configuration systems which can be expanded to a high avail- Data compression and in-line • High IOPS through RAM and SSD ability cluster. Starline and Open-E can data deduplication caching look back on a strategic partnership of Thin provisioning and unlimited • Superb expandability with more than 10 years. As the first part- number of snapshots and clones ner with a Gold partnership level, Star- Starline’s high-density JBODs – line has always been working hand in without downtime Simplified management hand with Open-E to develop and de- Flexible scalability liver innovative data storage solutions. Starline’s NASdeluxe Z-Series offers In fact, Starline supports worldwide not only great features, but also great Hardware independence enterprises in managing and pro- flexibility – thanks to its modular archi- tecting their storage, with over 2,800 tecture. Open-E installations to date. www.starline.de Z-Series But even with a standard configuration with nearline HDDs IOPS and SSDs for caching, you will be able to achieve high IOPS 250 000 at a reasonable cost. -
MRAM Technology Status
National Aeronautics and Space Administration MRAM Technology Status Jason Heidecker Jet Propulsion Laboratory Pasadena, California Jet Propulsion Laboratory California Institute of Technology Pasadena, California JPL Publication 13-3 2/13 National Aeronautics and Space Administration MRAM Technology Status NASA Electronic Parts and Packaging (NEPP) Program Office of Safety and Mission Assurance Jason Heidecker Jet Propulsion Laboratory Pasadena, California NASA WBS: 104593 JPL Project Number: 104593 Task Number: 40.49.01.09 Jet Propulsion Laboratory 4800 Oak Grove Drive Pasadena, CA 91109 http://nepp.nasa.gov i This research was carried out at the Jet Propulsion Laboratory, California Institute of Technology, and was sponsored by the National Aeronautics and Space Administration Electronic Parts and Packaging (NEPP) Program. Reference herein to any specific commercial product, process, or service by trade name, trademark, manufacturer, or otherwise, does not constitute or imply its endorsement by the United States Government or the Jet Propulsion Laboratory, California Institute of Technology. ©2013. California Institute of Technology. Government sponsorship acknowledged. ii TABLE OF CONTENTS 1.0 Introduction ............................................................................................................................................................ 1 2.0 MRAM Technology ................................................................................................................................................ 2 2.1 -
The Effects of Repeated Refresh Cycles on the Oxide Integrity of EEPROM Memories at High Temperature by Lynn Reed and Vema Reddy Tekmos, Inc
The Effects of Repeated Refresh Cycles on the Oxide Integrity of EEPROM Memories at High Temperature By Lynn Reed and Vema Reddy Tekmos, Inc. 4120 Commercial Center Drive, #400, Austin, TX 78744 [email protected], [email protected] Abstract Data retention in stored-charge based memories, such as Flash and EEPROMs, decreases with increasing temperature. Compensation for this shortening of retention time can be accomplished by refreshing the data using periodic erase-write refresh cycles, although the number of these cycles is limited by oxide integrity. An alternate approach is to use refresh cycles consisting of a rewrite only cycles, without the prior erase cycle. The viability of this approach requires that this refresh cycle induces less damage than an erase-write cycle. This paper studies the effects of repeated refresh cycles on oxide integrity in a high temperature environment and makes comparisons to the damage caused by erase-write cycles. The experiment consisted of running a large number of refresh cycles on a selected byte. The control group was other bytes which were not subjected to refresh only cycles. The oxide integrity was checked by performing repeated erase-write cycles on each of the two groups to determine if the refresh cycles decreased the number of erase-write cycles before failure. Data was collected from multiple parts, with different numbers of refresh cycles, and at temperatures ranging from 25C to 190C. The experiment was conducted on microcontrollers containing embedded EEPROM memories. The microcontrollers were programmed to test and measure their own memories, and to report the results to an external controller.