EG0800259 Plasma Ion Sources
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Characterization of a Glow Discharge Ion Source for the Mass Spectrometric Analysis of Organic Compounds
Characterization of a Glow Discharge Ion Source for the Mass Spectrometric Analysis of Organic Compounds D. Carazzato and M. J. Bertrand Regional Center for Mass Spectrometry, Department of Chemistry, University of Montreal, Montreal, Canada A glow discharge ion source has been constructed for the mass spectrometric analysis of organic compounds. Characterization of the source has been made by studying the effect of pressure and discharge current on ionic distributions by anodic ion sampling along the discharge axis. Ion and electron densities and electronic temperatures have been calculated by using the single Langmuir probe technique to correlate the extraction efficiency with measured ion distributions and gain some insight into the ionization of organic molecules. The spectra obtained for several classes of organic compounds show that formation of parent-molecular ions by proton transfer, resulting partly from the background water molecules, is a major low energy process while charge transfer, Penning ionization, and electron ionization are probably responsible for the fragmentation observed. The spectra result from the simultaneous occurrence of high and low energy reactions, and their structural information content is very high, yielding both molecular and extensive fragment ion information. The glow discharge ion source has proved to be essentially maintenance-free, easy to operate, stable, and can be used at reasonable mass resolution (up to 7000). The source also provides picogram range detection limits and has a linear response range of about six orders of magnitude, which makes it an interesting ion source for routine analysis. Preliminary work conducted with chromatographic interfaces indicates that its use can be easily extended to both gas and liquid chromatography. -
Calibration Factors for Fast Flow Glow Discharge Mass Spectrometry (FF-GD-MS) in Continuous and Pulsed Mode
POSTER NOTE 30687 Calibration factors for Fast Flow Glow Discharge Mass Spectrometry (FF-GD-MS) in continuous and pulsed mode Authors: Torsten Lindemann, Joachim Hinrichs, Nicholas Lloyd, Thermo Fisher Scientific, Bremen, Germany Abstract The Thermo Scientific™ Element GD Plus™ GD-MS was used to measure a set of 13 iron based certified reference materials. Calibration factors for 29 elements were obtained in continuous and pulsed mode. In continuous mode operation, the calibration factors obtained confirm most of those factors previously used for semiquantitative analyses. However, significantly improved Introduction accuracy can be expected for Ti, V, Cr, and Zr with the Sector field glow discharge mass spectrometry is data obtained during this study. applied for the analysis of high purity bulk metals and alloys, semiconductors and ceramics, especially by the In pulsed mode operation, the calibration factors for many aerospace, electronics and photovoltaic industries. elements are similar to the ones in continuous mode. In detail though, some elements show lower calibration The Element GD Plus GD-MS features a fast flow glow factors. Therefore, a dedicated RSF table for pulsed mode discharge source that can be operated in continuous is recommended to support accurate routine operation for or pulsed mode. Continuous mode operation offers the semiquantitative analyses. advantage of high sputter rates to remove contaminated surface layers quickly. Also, the widely applied set of Most elements are analyzed within the accuracy range calibration factors (Standard RSF = general Relative of ±30 %, considered to be typical for semiquantitative Sensitivity Factors) is based on continuous mode operation. GD-MS analyses. For improved accuracy, the use of a dedicated set of calibration factors is advisable. -
The Use of Dc Glow Discharges As Undergraduate Educational Tools Stephanie A
The use of dc glow discharges as undergraduate educational tools Stephanie A. Wissel, Andrew Zwicker, Jerry Ross, and Sophia Gershman Citation: American Journal of Physics 81, 663 (2013); doi: 10.1119/1.4811435 View online: http://dx.doi.org/10.1119/1.4811435 View Table of Contents: http://scitation.aip.org/content/aapt/journal/ajp/81/9?ver=pdfcov Published by the American Association of Physics Teachers Articles you may be interested in Motivating Students to Do Homework Phys. Teach. 52, 295 (2014); 10.1119/1.4872413 Measuring the Effectiveness of Simulations in Preparing Students for the Laboratory Phys. Teach. 51, 113 (2013); 10.1119/1.4775536 New insights into student understanding of complete circuits and the conservation of current Am. J. Phys. 81, 134 (2013); 10.1119/1.4773293 Conductance quantization: A laboratory experiment in a senior-level nanoscale science and technology course Am. J. Phys. 81, 14 (2013); 10.1119/1.4765331 A low-cost spatial light modulator for use in undergraduate and graduate optics labs Am. J. Phys. 80, 211 (2012); 10.1119/1.3666834 This article is copyrighted as indicated in the article. Reuse of AAPT content is subject to the terms at: http://scitation.aip.org/termsconditions. Downloaded to IP: 198.35.1.48 On: Fri, 20 Jun 2014 16:13:40 The use of dc glow discharges as undergraduate educational tools Stephanie A. Wissela) and Andrew Zwickerb) Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543 Jerry Ross Shawnee State University, Portsmouth, Ohio 45662 Sophia Gershman Advanced Research Innovation in Science Education (ARISE), Scotch Plains, New Jersey 07076 (Received 12 October 2012; accepted 4 June 2013) Plasmas have a beguiling way of getting students interested in physics. -
The Use of Glow Discharge Optical Emission Spectroscopy to Quantify Internal Carburization in Supercritical CO2
The 6th International Supercritical CO2 Power Cycles Symposium March 27 - 29, 2018, Pittsburgh, Pennsylvania The Use of Glow Discharge Optical Emission Spectroscopy to Quantify Internal Carburization in Supercritical CO2 Michael J. Lance Donovan N. Leonard Bruce A. Pint Senior R&D Staff Member R&D Staff Member Group Leader Oak Ridge National Laboratory Oak Ridge National Laboratory Oak Ridge National Laboratory Oak Ridge, TN 37831-6068 Oak Ridge, TN 37831-6064 Oak Ridge, TN 37831-6156 [email protected] [email protected] [email protected] Michael J. Lance is a Senior Research and Development Staff Member in Oak Ridge National Laboratory’s Materials Science and Technology Division. He received a B.S. in 1992 from Alfred University and an M.S. and PhD from Rutgers University in 1998 in Ceramic Science and Technology. He joined Oak Ridge National Laboratory as a staff member in 1998 and has been active in several research areas including emissions control technologies for diesel engines, high- temperature oxidation and heat exchanger fouling. Donovan N. Leonard is a Senior Technical Staff Member in the Materials Science & Technology Division at Oak Ridge National Laboratory. He received his Ph.D. in Materials Science & Engineering from North Carolina State University in 2002 and joined ORNL in 2007. Currently his research involves applying advanced microscopy and microanalysis methods to energy related materials at length scales from the atomic level to the macro scale. More specifically, aberration corrected STEM/EELS of quantum materials in addition to EPMA/WDS, EBSD and EDS analysis of materials for fossil, fusion and solar applications. Bruce A. -
Modern Real Mass Spectrometry
“Real” (Modern) Mass Spectrometry (Part I) Alex J. Roche 1 MS is fundamentally important • If you want to publish a new compound, 3 pieces of data are required: – relevant NMR (H, C, F, P, Pt, N, D, B, ...) – Mass Spectrometry (low resolution) – Elemental Analysis (CHN) or HRMS • Confirmation of a compound usually requires the 1st two • Industrially, GCMS / HPLCMS is the most common general Chemical Identification / Characterization tool • ACS accreditation guidelines state “instruments and equipment in a good undergraduate chemistry program include …gas chromatography mass spectrometry (GC-MS), and apparatus or instruments for Mass Spectrometry”. 2 Mass Spectrometry “What do you know about that ?” • Basic concept ? (what is it?) • What’s the point ? (what information does it provide?) • Underlying physics ? (why does it work?) • Underlying mechanics ? (how does it work?) 3 What we (I) teach Ions are generated, bent by magnetic field, and separated according to m/z ratio. → molecular weight information, and 4 structural information Agilent Quote (After significant bartering) $228,000 = Agilent Technologies Triple Quad HPLCMS with Multimode Source Instrument. MOST COMMON MODERN STANDARD MS INSTRUMENT 5 • Where is the triple quad ? • Where is the ESI or APCI? 6 • “...This type of ionization is compatible with triple quadrupole and ion-trap analyzers. Not so much with magnetic sector instruments (if you can still find one)...” 7 Photographic Mass Spec Trivia plate • 1803 Dalton “Mass consists of atoms...” • 1911 Thompson 1st mass spectrometer • 1940 Berry Electron Impact Ionization for organics • 1980 ESI, FAB, MALDI • Up to current day, MS fundamental characterization tool. • 2002 Nobel Prize MALDI / ESI (Tanaka / Fenn) •(4th MS area Nobel Prize) • Mass is measured in a.m.u. -
Practical Comparisons Between RF-GD-OES and SIMS
Glow Discharge Optical Emission Spectroscopy TECHNICAL NOTE 23 Practical Comparisons Between RF-GD-OES and SIMS Patrick Chapon, Jobin Yvon S.A.S., Horiba Group, Longjumeau, France Keywords: method comparison Secondary ion mass spectrometry (SIMS) has mine the appropriateness of the two methods. been a very valuable tool for the analysis of bulk These differences are described below. materials, particularly in the cases where very high sensitivity is required (e.g. precious metals, 1 Analysis time catalysts and semiconductor materials). SIMS relies on high energy (2-5 keV) bombardment Because of the need for extremely low pressures (sputtering) of the sample using an ion beam for SIMS analysis, extensive pump down times (gun) in high vacuum (<10-7 Torr) as its means are required. For many analyses, pump down of removing material from the solid surface and times of more than 1 hour are common. It is mass analysis of those species which are ejected important to realize that the presence of residual as charged species (ions). gases (N or O) on the sample surface greatly effect the performance of the SIMS experiment, Radio frequency glow discharge atomic emission both in terms of absolute sensitivity and in the spectrometry (RF-GD-OES) is similar to SIMS in relative sensitivity between the elements. For that sputtering is the means of removing materi- this reason, sample carousels containing many al from the sample surface. In contrast, though, samples are usually loaded in the source volume the glow discharge is a reduced-pressure (10 at a single time. On the other hand, even in the Torr) plasma that generates the sputtering ions in case of gaseous element analysis, the RF-GD- situ from a low flow of argon. -
Glow Discharge Optical Spectroscopy and Mass Spectrometry
QIT; Fourier transform ion cyclotron resonance, FTICR; Glow Discharge Optical and time-of-flight, TOF) instrumentation are well suited Spectroscopy and Mass for coupling to the glow discharge (GD). The GD is a relatively simple device. A potential gradient Spectrometry (500–1500 V) is applied between an anode and a cathode. In most cases, the sample is also the cathode. A noble gas (mostly Ar) is introduced into the discharge region before Annemie Bogaerts power initiation. When a potential is applied, electrons are Research group PLASMANT, University of accelerated toward the anode. As these electrons accelerate, Antwerp, Wilrijk-Antwerp, Belgium they collide with gas atoms. A fraction of these collisions are of sufficient energy to remove an electron from a support gas atom, forming an ion. These ions are, in 1 Introduction 1 turn, accelerated toward the cathode. These ions impinge 2 The Glow Discharge 2 on the surface of the cathode, sputtering sample atoms from the surface. Sputtered atoms that do not redeposit 2.1 Fundamental Glow Discharge Processes 2 on the surface diffuse into the excitation/ionization regions 2.2 Radiofrequency-Powered Glow Discharge of the plasma where they can undergo excitation and/or Operation 6 ionization via a number of collisional processes, and the 2.3 Pulsed Operation of the Glow Discharge 6 photons or ions created in this way can be detected with 2.4 Applications 8 optical emission spectroscopy or mass spectrometry. 3 Spectrochemical Methods of Analysis 11 GD sources offer a number of distinct advantages that 3.1 Basic Requirements Necessary to Obtain make them well suited for specific types of analyses. -
Molecular Ion Sources for Low Energy Semiconductor Ion Implantation
BNL-112215-2016-CP Molecular ion sources for low energy semiconductor ion implantation 1 2 3 A. I. Hershcovitch , V. I. Gushenets , D. N. Seleznev , 2 4 2 3 B. A. S. Bugaev , S. Dugin , E. M. Oks , T. V. Kulevoy , 4 3 3 C. O. Alexeyenko , A. Kozlov , G. N. Kropachev , 3 3 2 2 D. R. P. Kuibeda , S. Minaev , A. Vizir , G. Y. Yushkov 1Brookhaven National Laboratory, Upton, NY 11973 USA 2High Current Electronics Institute, Siberian Branch of Russian Academy of Sciences, Tomsk 634055 Russia 3Institute for Theoretical and Experimental Physics, Moscow 117218 Russia 4State Scientific Center of the Russian Federation State Research Institute for Chemistry and Technology of Organoelement Compounds, Moscow Russia Presented at the 16th International Conference on Ion Sources New York Marriott Marquis Hotel, New York, NY August 23 – 28, 2015 May 2016 Collider-Accelerator Department Brookhaven National Laboratory U.S. Department of Energy Office of Science, Office of Nuclear Physics Notice: This manuscript has been authored by employees of Brookhaven Science Associates, LLC under Contract No. DE-SC0012704 with the U.S. Department of Energy. The publisher by accepting the manuscript for publication acknowledges that the United States Government retains a non-exclusive, paid-up, irrevocable, world-wide license to publish or reproduce the published form of this manuscript, or allow others to do so, for United States Government purposes. DISCLAIMER This report was prepared as an account of work sponsored by an agency of the United States Government. Neither the United States Government nor any agency thereof, nor any of their employees, nor any of their contractors, subcontractors, or their employees, makes any warranty, express or implied, or assumes any legal liability or responsibility for the accuracy, completeness, or any third party’s use or the results of such use of any information, apparatus, product, or process disclosed, or represents that its use would not infringe privately owned rights. -
Mini RF-Driven Ion Source for Focused Ion Beam System
Mini RF-driven ion sources for focused ion beam systems X. Jiang a), Q. Ji, A. Chang, and K. N. Leung. Lawrence Berkeley National Laboratory, University of California, Berkeley, California 94720 Abstract Mini RF-driven ion sources with 1.2 cm and 1.5 cm inner chamber diameter have been developed at Lawrence Berkeley National Laboratory. Several gas species have been tested including argon, krypton and hydrogen. These mini ion sources operate in inductively coupled mode and are capable of generating high current density ion beams at tens of watts. Since the plasma potential is relatively low in the plasma chamber, these mini ion sources can function reliably without any perceptible sputtering damage. The mini RF-driven ion sources will be combined with ele ctrostatic focusing columns, and are capable of producing nano focused ion beams for micro machining and semiconductor fabrications. INTRODUCTION: Recently focused ion beam (FIB) systems have been used for circuit inspection, mask repair, micro machining, ion doping, and direct resistless writing. Most FIB systems employ a liquid metal ion source (LMIS). LMIS has a very low current yield and very high angular divergence. The gallium ion generated by liquid metal ion source can cause contamination in many FIB applications. For example, when LMIS is used for sputtering of copper, a Cu3Ga phase alloy can be formed, which is particularly resistant to milling and contributes to the uneven profiles [1]. L. Scipioni and coworkers[2] have demonstrated that when gallium ion beam is used for photo mask repair, implanted gallium ions can absorb 73% of incident 248 and 193 nm ultraviolet light. -
Methods of Ion Generation
Chem. Rev. 2001, 101, 361−375 361 Methods of Ion Generation Marvin L. Vestal PE Biosystems, Framingham, Massachusetts 01701 Received May 24, 2000 Contents I. Introduction 361 II. Atomic Ions 362 A. Thermal Ionization 362 B. Spark Source 362 C. Plasma Sources 362 D. Glow Discharge 362 E. Inductively Coupled Plasma (ICP) 363 III. Molecular Ions from Volatile Samples. 364 A. Electron Ionization (EI) 364 B. Chemical Ionization (CI) 365 C. Photoionization (PI) 367 D. Field Ionization (FI) 367 IV. Molecular Ions from Nonvolatile Samples 367 Marvin L. Vestal received his B.S. and M.S. degrees, 1958 and 1960, A. Spray Techniques 367 respectively, in Engineering Sciences from Purdue Univesity, Layfayette, IN. In 1975 he received his Ph.D. degree in Chemical Physics from the B. Electrospray 367 University of Utah, Salt Lake City. From 1958 to 1960 he was a Scientist C. Desorption from Surfaces 369 at Johnston Laboratories, Inc., in Layfayette, IN. From 1960 to 1967 he D. High-Energy Particle Impact 369 became Senior Scientist at Johnston Laboratories, Inc., in Baltimore, MD. E. Low-Energy Particle Impact 370 From 1960 to 1962 he was a Graduate Student in the Department of Physics at John Hopkins University. From 1967 to 1970 he was Vice F. Low-Energy Impact with Liquid Surfaces 371 President at Scientific Research Instruments, Corp. in Baltimore, MD. From G. Flow FAB 371 1970 to 1975 he was a Graduate Student and Research Instructor at the H. Laser Ionization−MALDI 371 University of Utah, Salt Lake City. From 1976 to 1981 he became I. -
Contact Glow Discharge Electrolysis: Effect of Electrolyte Conductivity on Discharge Voltage
catalysts Article Contact Glow Discharge Electrolysis: Effect of Electrolyte Conductivity on Discharge Voltage Giovanni Battista Alteri 1, Matteo Bonomo 1,2,* , Franco Decker 1 and Danilo Dini 1,* 1 Department of Chemistry, University of Rome “La Sapienza”, 00185 Piazzale Aldo Moro 5, 00178 Rome, Italy; [email protected] (G.B.A.); [email protected] (F.D.) 2 Department of Chemistry, University of Turin, Via Pietro Giuria 7, 10125 Turin, Italy * Correspondence: [email protected] (M.B.); [email protected] (D.D.) Received: 29 August 2020; Accepted: 21 September 2020; Published: 24 September 2020 Abstract: Contact glow discharge electrolysis (CGDE) can be exploited in environmental chemistry for the degradation of pollutants in wastewater. This study focuses on the employment of cheap materials (e.g., steel and tungsten) as electrodes for experiments of CGDE conducted in electrochemical cells with variable electrolytic composition. A clear correlation between breakdown voltage (VB)/discharge (or midpoint) voltage (VD) and the conductivity of the electrolyte is shown. Regardless of the chemical nature of the ionogenic species (acid, base or salt), the higher the conductivity of the solution, the lower the applied potential required for the onset of the glow discharge. Concerning practical application, these salts could be added to poorly conductive wastewaters to increase their conductivity and thus reduce the ignition potential necessary for the development of the CGDE. Such an effect could render the process of chemical waste disposal from wastewaters more economical. Moreover, it is evidenced that both VB and VD are practically independent on the ratio anode area to cathode area if highly conductive solutions are employed. -
Fundamental Studies and Applications of Ambient Plasma Ionization Sources for Mass Spectrometry Wade C
Brigham Young University BYU ScholarsArchive All Theses and Dissertations 2017-07-01 Fundamental Studies and Applications of Ambient Plasma Ionization Sources for Mass Spectrometry Wade C. Ellis Brigham Young University Follow this and additional works at: https://scholarsarchive.byu.edu/etd Part of the Chemistry Commons BYU ScholarsArchive Citation Ellis, Wade C., "Fundamental Studies and Applications of Ambient Plasma Ionization Sources for Mass Spectrometry" (2017). All Theses and Dissertations. 6484. https://scholarsarchive.byu.edu/etd/6484 This Dissertation is brought to you for free and open access by BYU ScholarsArchive. It has been accepted for inclusion in All Theses and Dissertations by an authorized administrator of BYU ScholarsArchive. For more information, please contact [email protected], [email protected]. Fundamental Studies and Applications of Ambient Plasma Ionization Sources for Mass Spectrometry Wade C. Ellis A dissertation submitted to the faculty of Brigham Young University in partial fulfillment of the requirements for the degree of Doctor of Philosophy Paul Burton Farnsworth, Chair Daniel E. Austin David V. Dearden Jaron C. Hansen Eric T. Sevy Department of Chemistry and Biochemistry Brigham Young University Copyright © 2017 Wade C. Ellis All Rights Reserved ABSTRACT Fundamental Studies and Applications of Ambient Plasma Ionization Sources for Mass Spectrometry Wade C. Ellis Department of Chemistry and Biochemistry, BYU Doctor of Philosophy The field of ambient desorption/ionization mass spectrometry (ADI-MS) has existed for over a decade. ADI-MS is a technique that offers benefits including fast analysis time, simple ionization sources that are easily constructed, and little to no required sample preparation. The research presented here describes efforts to better understand plasma-based ADI-MS sources and to explore the use of hydrogen-doped plasma gases with these sources.