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ECE 425 CLASS NOTES – 2000

DIFFRACTION

Physical basis

• Considers the wave nature of , unlike geometrical optics

• Optical system limit the extent of the wavefronts

• Even a “perfect” system, from a geometrical optics viewpoint, will not form a point image of a

• Such a system is called -limited Diffraction as a linear system

• Without proof here, we state that the impulse response of diffraction is the (squared) of the exit pupil of the optical system (see Gaskill for derivation)

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ECE 425 CLASS NOTES – 2000

• impulse response called the (PSF)

• image of a point source

• The transfer function of diffraction is the Fourier transform of the PSF • called the Optical Transfer Function (OTF) Diffraction-Limited PSF

• Incoherent light, circular

()2 J1 r' PSF() r' = 2------r'

where J1 is the of the first kind and the normalized radius r’ is given by,

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ECE 425 CLASS NOTES – 2000

D = aperture diameter πD πr f = r' ==------r ------where λf λN N = f-number λ = of light

λf • The first zero occurs at r = 1.22 ------= 1.22λN , or r'= 1.22π D Compare to the course notes on 2-D Fourier transforms

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ECE 425 CLASS NOTES – 2000

2-D view (contrast-enhanced)

“Airy pattern”

central bright region, to first- zero ring, is called the “

1

0.8

0.6 PSF 0.4 radial profile 0.2

0 0246810 normalized radius r'

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax)

ECE 425 CLASS NOTES – 2000

• Example calculation of PSF size • system specs: D = 1cm f = 50mm N = f/D = 5 λ = 0.55µm (green)

• radius of PSF = 1.22λN = 3.36µm

• very small!

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax)

ECE 425 CLASS NOTES – 2000

Diffraction-Limited OTF

• Incoherent light, circular aperture

()ρ 2 ()ρ ρ ρ 2 OTF ' = π--- acos ' – '1– '

where the normalized radial spatial frequency is given by, ρ ρρ⁄ ' = c

and the cutoff frequency is given by,

D = aperture diameter D 1 f = focal length ρ ==------where c λf λN N = f-number λ = wavelength of light

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax)

ECE 425 CLASS NOTES – 2000

1

0.8

0.6 OTF 0.4

0.2

0 0 0.2 0.4 0.6 0.8 1 ρ/ρ normalized spatial frequency ( c)

In 2-D spatial frequency space, the OTF is nearly a “cone” function

OTF OTF is a low-pass filter of spatial frequencies

v

ρ ρ u = c

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax)

ECE 425 CLASS NOTES – 2000

Example calculation of OTF cutoff frequency

• system specs: D = 1cm f = 50mm N = f/D = 5 λ = 0.55µm (green)

• cutoff frequency = 1/λN = 0.363cycles/µm = 363cycles/mm

• very high! (the human vision system has a cutoff frequency of about 10cycles/mm (object scale) at normal viewing distance)

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax)

ECE 425 CLASS NOTES – 2000

Modulation Transfer Function (MTF)

• Amplitude part of complex OTF output signal modulation MTF() u, v ==OTF() u, v ------input signal modulation

• signal modulation max– min signal modulation = ------max+ min

• modulation is a measure of signal contrast

()π • for sinewave, AB+ sin 2 uox , modulation = B/A

• Use MTF to predict image contrast, given object and system • output modulation(u,v) = input modulation(u,v) x MTF(u,v)

() ()π • for sinewave input (object) to LSI system input x = AB+ sin 2 uox

() () ()π the output (image) is output x = A+ MTF uo Bsin 2 uox 215

DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

B and the image modulation at spatial frequency u is image modulation = MTF() u ⋅ --- o o A

MTF

1 “typical” MTF 0.8 for imaging system 0.5

0.1 u

u0 2u0 4u0

u = u0 u = 2u0 u = 4u0

input

output

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

DIFFRACTION IMAGING EXAMPLES

Sine-wave imaged by circular aperture, diffraction- limited

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

optics spatial frequency, u

Input pattern (object)

System response (PSF)

Output pattern (image)

cutoff-frequency, uc

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

Square-wave imaged by circular aperture, diffraction-

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

limited optics spatial frequency, u

Input pattern (object)

System response convolution (PSF)

Output pattern (image)

cutoff-frequency, uc

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

Line and Edge Spread Functions

• PSF is often difficult to measure because of insufficient energy

• Use a line source (slit) to increase energy –>

Line Spread Function (LSF)

• Integrate PSF along direction of the line source

∞ () (), LSFx x = ∫ PSF x y dy –∞ ∞ () (), LSFy y = ∫ PSF x y dx –∞

• Use edge source (knife edge) to further increase energy –>

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

Edge Spread Function (ESF)

• Integrate LSF up to position of ESF measurement

x () ()αα ESFx x = ∫ LSFx d –∞ y () ()αα ESFy y = ∫ LSFy d –∞

• Equivalent to step response in electronic system

• ESF is a monotonic function of position

• LSF is the derivative of the ESF,

d LSF ()x = ESF ()x x dx x

• Both LSF and ESF are orientation-dependent, if the PSF is not isotropic

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

• Must measure LSF and ESF at multiple orientations to reconstruct full 2-D PSF

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

RELATIONSHIPS BETWEEN PSF, LSF, ESF AND OTF

• For example, the relationships in the x-direction are:

PSF(x,y) ESFx(x) one-sided 1-D integration

one-sided 2-D 1-D 1-D integration Fourier derivative Transform 1-D integration

OTF(u,v) OTF(u,0) LSFx(x) profile 1-D Fourier Transform

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000 SECTION III – INTEGRATED IMAGING SYSTEM ANALYSIS

Scanning Image Quality System Simulation

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SCANNING

Instantaneous image on focal plane detector(s) Scan the field-of-view

• Object-space scanning (mirror moves) θ detector

object

Show that the object-space scan angle is twice that of the mirror scan angle

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

• Image-space scanning (detector moves) detector

object

• Translation scanning ( or object moves) detector

object

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

Examples from airborne or satellite remote sensing systems whiskbroom scanner 1-D array line scanner pushbroom scanner

in-track FOV cross-track

GFOV FOV: Field-Of-View (radians) 2-D array wavelength dispersion pushbroom scanner GFOV: Ground- projected FOV (km) (aka “swath width”)

What types of scanning are these examples?

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

Scanning is equivalent to convolution

• At each instant, the detector integrates a small area of the image

• Integration time at each sample determines number of photons collected

• Generally, a scanned image is sampled at an interval equal to detector size • undersampled Why is one sample/detector element undersampled?

• PSF of scanning detector is rect(x/W,y/W), where W is the detector size

• If sample integration time is not negligible, there is also image smear 229

DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

• PSF of linear image smear is rect(x/S), where S is the amount of smear during the integration time: S = image velocity x integration time

= vimgtint

• Image smear sometimes used to increase integration time/ pixel, and therefore SNR (even though image is blurred)

• Total scanning PSF • Combine scanning detector and image smear during pixel integration (normalize by volume PSF) rect() x⁄ W, yW⁄ * rect() x⁄ S PSF ()xy, = ------scan volumePSF []rect() x⁄ W * rect() x⁄ S rect() y⁄ W = ------volumePSF

• if S = W, i.e. image smear is equal to one detector width:

tri() x⁄ W rect() y⁄ W PSF ()xy, = ------scan volumePSF

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

IMAGE QUALITY

An imaging system consists of several subsystems

image light transmission display human scene acquisition vision source subsystem subsystem* subsystem subsystem

coder decoder optics neural network optics detector* electronics

retina* brain

* points of signal transduction, optical <—> electronic Want to maintain the highest possible image quality through this process

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

Spatial Resolution

• “Resolution” refers to the ability to detect two closely spaced objects in an image

• Many different ways to measure resolution • Rayleigh Criterion

• quantitative; does not depend on visual examination

• appropriate for diffraction-limited optical image

• two point sources —> two Airy patterns

• resolution is the separation of the two images when the first zero of one pattern coincides with the peak of the other pattern

• does not incorporate noise into resolution measure

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

Airy Airy pattern pattern 1 2

λ R Rayleigh = 1.22 N

• Target-Specific Criteria

• separation of two particular objects when they are just “resolved”

• depends on visual examination

• incorporates noise into resolution measure

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

imaging system PSF and resulting imagery target

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

• Usually have fixed system PSF; vary target frequency to evaluate resolution

target

1234 5 6

imaging system PSF

image of target

123456

profile of image

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

• Define a line pair = one dark bar & one white bar • Define resolution to be measured by the target which is “just resolved” (correct number of bars can be visually distinguished along their entire length)

• Rbar = 1/d4 (line pairs/mm)

where d4 = mm/line pair for target 4

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

• image noise lowers resolution

123456

• Rbar = 1/d3 (line pairs/mm)

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

SENSOR SIMULATION

Landsat Thematic Mapper (TM) satellite system Whiskbroom scanner

• side-to-side scanning, cross-track

whiskbroom scanner • satellite orbit motion, in- track

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

• Three major spatial cross-track 30m GIFOV response components

optics detector electronics in-track cross-track only

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

• Simulate input scene with high resolution aerial photography

rotated to align with TM orbit and scan direction - 2m pixels

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

• Apply each component PSF at 2m and downsample to 30m

optics optics and detector

downsample 2m —> 30m GSI

optics, detector and electronics

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

Compare to real TM of same area, acquired 4 months later

simulated TM real TM (magnified) (magnified)

real TM (contrast-adjusted)

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

PHOTOGRAPHIC GRANULARITY

• photographic density is aggregated “grains” of silver halide in developed film

• causes random noise at every pixel in scanned image

• Ex: aerial photograph of Dulles Airport, Virginia

enlargement

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

• Signal-dependent noise • Standard deviation in Digital Numbers (DNs) versus DN

16

14

12 DN σ 10

8

6 0 50 100 150 200 µ DN

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

ELECTRO-OPTICAL SCANNER NOISE

• Due to • line scan calibration (gain and offset) changes • detector-to-detector calibration differences • interference with other electronics • saturation hysteresis

• Common problem

• Can be removed effectively by image processing

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

aerial video aperiodic scanline noise Landsat–4 MSS coherent noise

Landsat–1 MSS bad scanline noise AVIRIS scanline and random pixel noise

Landsat–4 TM banding noise

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

Signal-to-Noise Ratio (SNR)

• Measure of image quality

• Several common definitions: σ signal SNRstd = ------σ noise σ2 SNR = ------signal var σ2 noise () SNRdB = 10log SNR

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

• Generally correlated with visual quality

SNR = 2 SNRstd = 1 std SNR = 4 SNRvar = 1 var SNR = 6 SNRdB = 0 dB

SNR = 5 std SNRstd = 10 SNR = 25 var SNRvar = 100 SNR = 14 dB SNRdB = 20

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax) ECE 425 CLASS NOTES – 2000

• Visual quality depends on noise type

noiseless

global random noise detector striping noise

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DR. ROBERT A. SCHOWENGERDT [email protected] 520 621-2706 (voice), 520 621-8076 (fax)