Application Note An25

1250 Rene-Levesque W Bureau 1400 Montréal, (Québec) H3B 5E9

APPLICATION NOTE AN25

In-System programming Capabilities

Being a leader in the Test business, i-Test has developed many programming tools and algorithms, in order to program nearly every kind of programmable devices, already soldered on the PCB, within an In- Circuit Test platform (ICT) or a Stand-Alone Functional Test platform. Any type of data can be programmed: MAC Address, Serial Number, configuration data, dynamic data, static data, firmware, bootloader, etc.

DEVICE TYPES: DEVICE MANUFACTURERS

 NOR Flash  Altera  ISII  ROHM  NAND Flash  AMD  Lattice  Samsung  SPI devices  Atmel  Macronix  Sanyo  I2C devices  Cinterion  Melexis  Seiko  1Wire devices  Cypress  Microchip  Silicon Labs  CPLD  Elmos  Micron  Spansion  FPGA  Ember  Motorola  SST  Microcontrollers  Freescale  NEC  STMicro  Modbus devices  Holtek  Numonyx  TI  Zigbee devices  Infineon  NXP  Windbond  CAN devices  Intel  Renesas  Xilinx

For more information visit www.i-test.ca 1250 Rene-Levesque W Bureau 1400 Montréal, (Québec) H3B 5E9

[email protected] tel. : 514.334.7333

Supported communication protocols Programming files format

 1WIRE  MODBUS  BIN  JAM  POF  BDM  RS232  CDF  JBC  S19  CAN  RS485  EXO  JCF  SREC  GPIB  SPI  FCF  JED  SVF  I2C  SWD  HEX  JIC  JTAG  TCP/IP  ISC  MCS  LONWORKS  USB

Programming Pods

 Agilent 3070  Ember ISA3  ST-LINK  ULINK2  Genrad  JTAG Technologies  UART interface  Cyclone Pro  Teradyne  Corelis  Segger Flasher ARM  SoftLog ICP2 (HC)  SofTec Flashrunner  Goepel  USB2Demon  NU-LINK  Algocraft WriteNow!  Cinterion PTC-04  USB2Wiggler

Devices Part Number overview CINTERION: EMBER:  EGS5  EM35x

ALTERA: ATMEL:  MAX II FREESCALE:  AT24 Memories CYPRESS:  MAX V  56800E  AT25 Memories  PSoC  MAX 3000A  HC08  AT45 Memories  MAX 7000  iMx21 (ARM9)  AT90 (AVR8)  ColdFire V2  AT91 (ARM7) ELMOS:  MPC(Power Arch.)  ATMEGA (AVR8)  EL16 AMD:  RS08  ATTINY (AVR8)  78K0S  29Fxxx Flash family  S08  ATXMEGA (AVR8)  V850  S12 For more information visit www.i-test.ca 1250 Rene-Levesque W Bureau 1400 Montréal, (Québec) H3B 5E9

[email protected] tel. : 514.334.7333

Devices Part Number overview

HOLTEK: HT24 Memories INTEL:  ISSI:  HT93 Memories  28Fxxx Flash family  IS24 Memories  IS25 Memories  IS93 Memories MICROCHIP:  24 Memories LATTICE:  25 Memories  LFECP2 FPGA family  93 Memories  LFXP FPGA family  dsPIC30 INFINEON:  ispXPGA family MACRONIX:  dsPIC33  C166  MachXO family  MX25 Memories  PIC10  XC166  ispXLD family  PIC12  XC800  ispMACH family  PIC16  XC2000  ispCLOCK family  PIC18  TriCore  Power Manager MELEXIS:  PIC24  ispGDX family  MLX90316  MCP250XX  ispGAL family  ispLSI family

NXP: NEC: RENESAS: MICRON:  LPC (ARM7)  78KO  H8  M26 Memories  LPC1100L  78K0S  H8S  M45 Memories  PCF85 Memories  H8SX  78K0R  HN58X24 Memories  V850  HN58X25 Memories  M16C ROHM: NUMONIX:  M32C  BR24 Memories  M25PX Memories R8C   BR25 Memories SuperH   BR93 Memories For more information visit www.i-test.ca 1250 Rene-Levesque W Bureau 1400 Montréal, (Québec) H3B 5E9

[email protected] tel. : 514.334.7333

Devices Part Number overview SILICON LABS: SANYO:  C8051F  LE24 Memories  LE25 Memories SAMSUNG: SST:  SAM8  SST25 Memories

XILINX: STMicroelectronics:  XC1700E/EL(X)  M24 Memories SPANSION:  XC17512L  M25 Memories  GL Memories  XC1701/L  M45 Memories  AL Memories  XC1702L  M93 Memories  CD/CL Memories  XC1704L  M95 Memories  F Memories  XC17S00  ST10  JL Memories  XC17S00XL  ST7C  PL Memories  XC17S00A  ST7F  NS/VS/XS Memories  XC17V01  STM32 (cortex M3)  WS Memories  XC17V02  STM8  S25 Memories  XC17V04  STR7 (ARM7)  XC17V08  STR9 (ARM9)  XC17V16  XC9500 Texas Instrument:  XC9500XL  MSP430F SEIKO: WINDBOND:  XC9500XV  TMS470 (ARM7)  S-24C  W25X Series  XCR3000XL  TMS320  XC2C0000

About i-Test: i-Test provides cutting-edge standard and customized pre-functional and functional test solutions. We offer prod- ucts and professional services that are adapted to markets such as telecoms, automotive, medical, avionics, rail- ways, manufacturing, automation and military.

We take pride in our team of engineer experts, our highly competitive prices and our delivery on a global scale.

For more information visit www.i-test.ca