Plasmonics (2012) 7:191–199 DOI 10.1007/s11468-011-9293-5
Active Focal Length Control of Terahertz Slitted Plane Lenses by Magnetoplasmons
Bin Hu & Qi Jie Wang & Shaw Wei Kok & Ying Zhang
Received: 6 April 2011 /Accepted: 17 October 2011 /Published online: 3 November 2011 # Springer Science+Business Media, LLC 2011
Abstract Active plasmonic devices are mostly designed length. Various lenses, including one with two focal spots at visible frequencies. Here, we propose an active and a tunable lens for dipole source imaging, are realized terahertz (THz) plasmonic lens tuned by an external for the proposed structure, demonstrating the flexibility of magnetic field. Unlike other tunable devices where the the design approach. The proposed tunable THz plas- tuning is achieved by changing the plasma frequency of monic lenses may find applications in THz science and materials,theproposedactivelensistunedbychanging technology such as THz imaging. the cyclotron frequency through manipulating magneto- plasmons (MPs). We have theoretically investigated the Keywords Terahertz . Plasmonics . Lens . Magneto-optic dispersion relation of MPs of a semiconductor–insulator– systems semiconductor structure in the Voigt configuration and systematically designed several lenses realized with a doped semiconductor slab perforated with sub- Introduction wavelength slits. It is shown through finite–difference time–domain simulations that THz wave propagating Plasmonics has been enormously developed since the through the designed structure can be focused to a discovery of the extraordinary optical properties of surface small size spot via the control of MPs. The tuning plasmon polaritons (SPPs) [1, 2], coherent electron range of the focal length under the applied magnetic oscillations excited at the interface between a metal-like field(upto1T)is∼31, about 50% of the original focal material (real(εm)<0) and a dielectric (real(εd)>0), where ε represents the permittivity. Many plasmonic devices, such as lenses, collimators, waveguides, polarizers, and couplers were proposed and experimentally realized [3– B. Hu : Q. J. Wang (*) Division of Microelectronics, 11]. In recent years, in order to achieve ultra-miniaturized School of Electrical & Electronic Engineering, plasmonic circuits for high-speed computing and commu- Nanyang Technological University, nication, a range of active plasmonic devices have been 50 Nanyang Ave., investigated [12] in the visible range. The basic tuning Singapore 639798, Singapore e-mail: [email protected] mechanism of all these active tunable plasmonic devices is based on changing the permittivity of the dielectric Q. J. Wang material εd [12] through thermo-optic, electro-optic, and Division of Physics and Applied Physics, nonlinear optical effects [13–15] rather than changing ε . School of Physical and Mathematical Sciences, m ε ∼− w2 Nanyang Technological University, This is because m ne/ (ne is the free carrier density Singapore 637371, Singapore and w is the angular frequency of light) is difficult to be ∼ 22 −3 : modified due to the large ne ( 10 cm of metals), which S. W. Kok Y. Zhang makes the changes of the permittivity of a metal negligible Singapore Institute of Manufacturing Technology, 71 Nanyang Drive, by just varying the carrier density. However, it is Singapore 638075, Singapore interesting and desirable that εm of plasmonic devices 192 Plasmonics (2012) 7:191–199 can also be tuned so as to increase the design flexibility bifocal pattern and a tunable lens for dipole source imaging and device functionality. can also be realized by applying the external magnetic field With the increasing interests in the terahertz (THz) science to the proposed structure, demonstrating the flexibility and and technology [16–18], THz plasmonic devices have variety of the design approach. attracted a lot of attention recently. In these devices, highly doped semiconductors are often used as plasmonic materials to replace metals because they have similar dielectric Dispersion Relation of MPs in a SIS Waveguide properties (real(εm)<0, we use the same symbol εm to represent the permittivity of doped semiconductor) to those Before we compute the dispersion relation of MPs for SIS of metals in the visible [8, 19]. In addition, their dielectric structures, we first express the dielectric constant of a constant εm can be manipulated because the carrier density of doped semiconductor (in the THz regime, it functions as a 16 19 −3 doped semiconductors is relatively low (ne∼10 –10 cm ) metal) based on the Drude model in the Voigt configura- and can be easily tuned by changing temperature, doping, or tion, to see the effect of applying an external magnetic field. optical excitation [20]. Through these tuning schemes, some The 2D SIS structure is shown in Fig. 1a. We assume that active THz plasmonic devices have been proposed [21–23]. the structure is invariant in the y-direction, and the spatial However, all of these methods are based on modifying and temporal dependence of the fields is in the form of the carrier density ne, in other words, the plasma ∼exp[i(k·r-wt)]. The thickness of the insulator layer is w. 2 frequency wp (wp ∼ne). Another possible means of The propagation modes are TM polarized (i.e., with the changing εm is to vary the cyclotron frequency wc (as εm magnetic field component parallel to the y-direction) and is also a function of wc) by applying an external magnetic the magnetic field B is applied along the y-axis. Thus, the field B (wc ∼B)[24]. In this situation, the magneto- dielectric constant of the semiconductor can be expressed plasmons (MPs) are excited, which have different disper- as a tensor [24]: sion relations as compared to those of SPPs. For example, 2 3 "xx 0 "xz magnetic field modification can cause the semiconductor 6 7 " ¼ " : ð Þ material to become anisotropic in the Voigt and Faraday m 4 0 yy 0 5 1 configurations. Thus, MPs have several unique properties, "xz 0 "xx such as the non-reciprocal effect [25] and two propagation bands [27] for doped semiconductors in the Voigt If we do not consider the effects of holes and phonons, configuration. Although several structures including the which are negligible in the proposed structures, the single semiconductor–dielectric interface, thin film, and elements in the matrix can be calculated as: 2 3 periodic structures based on MPs have been studied [25– w 2ðÞw þ u 28], active devices are rarely reported. In addition, to the 4 hip i 5 "xx ¼ "1 1 ð2Þ 2 2 best of our knowledge, theoretical derivation of the wwðÞþ iu wc dispersion relation of MPs in a metal–insulator–metal (MIM) structure [or semiconductor–insulator–semiconductor (SIS) structure], an important and widely used configuration w 2w 2 hip c for various plasmonic devices [29–31], has not been "xz ¼ i"1 ð3Þ wwðÞþ u 2 w 2 obtained yet. i c In this paper, we first theoretically investigate the dispersion relation of MPs in a SIS waveguide structure in 2 the Voigt configuration. As a design example, the derived wp " ¼ "1 1 ð4Þ dispersion relation is then applied to design an active THz yy wwðÞþ iu device—a slitted THz plasmonic lens—the focal length of which can be actively tuned by an external magnetic field. where w is the angular frequency of the incident wave, and 2 2 The lens is designed based on the diffraction theory by wp is the plasma frequency, evaluated by wp =nee / * * phase control of slits with different widths [32–34]. (m ε∞ε0), in which ne, e, and m are the density, the However, the phase retardation of each slit is modified by effective charge, and the effective mass of electrons, respec- manipulating MPs rather than SPPs in the proposed tively. ε∞ and ε0 are the high-frequency permittivity and devices. We find out through finite–difference time–domain vacuum permittivity, respectively. υ is the collision frequency (FDTD) numerical simulations that the focal length of the of free electrons, given by e/(μm*), and μ is the carrier * proposed lens can be tuned, the maximum tuning range of mobility. wc=eB/m is the cyclotron frequency, which can be which is ∼31 for a lens with a focal length of ∼61.A tuned by the applied external magnetic field B. Plasmonics (2012) 7:191–199 193
1
(a) Insulator (b) Vacuum c=0
Semiconductor Semiconductor 0.8 d =0.5 k c p m m 0.6 c=1 p p 0.56
0.5 Ex 0.4 0.4
BBHy p 0.3 z 0.2 0.2 I 0.1 II III 0 0 0.5 1 1.5 y /kp w w 0 x x x 0 0.5 1 1.5 2 2.5 3 2 2 /kp
Fig. 1 a A semiconductor–insulator–semiconductor structure in a Electromagnetic wave in vacuum and magnetoplasmons (MPs) under Voigt configuration. The propagation mode is TM polarized, and the the magnetic field of wc=0, wc=0.5wp, and wc=1wp are denoted by the magnetic field B is applied along the y-axis. The thickness of the green, black, blue, and red lines, respectively. The inset shows the insulator is denoted by w. b Dispersion relation of MPs in the structure enlarged view of the low-frequency region. The insulator width is set for InSb–air–InSb material. The electronic dissipation is considered. as w=0.11p
For an SIS structure, we can express the magnetic and In region (III), (x>w/2) electric field components Hy and Ex in the semiconductor − and insulator as follows: In region (I) ( w/2