Structural and Electronic Properties of InN Surfaces and Interfaces
L. Fishwick Surface, Interface and Thin Film Group
Post-grad Seminar 12 February 2009
Mismatched Highly ompounds@warwick C Structure and Electronic properties of InN Surfaces and Interfaces – 1 / 14 Introduction
Introduction The Highly Mismatched Compounds group: Techniques Academics: XPS CAICISS
Future Research
Prof. Chris McConville Dr. Tim Veal Supervisor EPSRC career acceleration fellow
PhD students:
Mr. Philip D. C. King Ms. Louise R. Bailey Mr. Liam Fishwick Mr. Wojciech Linhart rd nd st 3 year 2 year 1 year
Mismatched I also work closely with Dr. Marc Walker and Mr. Matthew Brown Highly performing ion scattering experiments. ompounds@warwick C Structure and Electronic properties of InN Surfaces and Interfaces – 2 / 14 Highly Mismatched compounds
Introduction A highly mismatched compound is compound with a distinct cation/anion Techniques size and electronegativity mismatch. The particular branch of HMC that is XPS CAICISS the focus of research in the group at warwick are SCAMS. Future Research SCAMS: Significantly Cation-Anion Mismatched Semiconductors. The cation is much larger and less electronegative than the anion, e.g. InN, ZnO, CdO.
Mismatched Highly ompounds@warwick C Structure and Electronic properties of InN Surfaces and Interfaces – 3 / 14 Importance of indium nitride
Introduction Indium nitride is a narrow band gap semiconductor with a band gap of ∼ Techniques 0.64 eV. XPS CAICISS
Future Research Exhibits an electron accumulation layer at the surface
InGaN ternary alloy is known now to have a band gap spanning from the near IR for InN to the UV for GaN.
Branch point energy is well above the conduction band minimum (∼ 1.5 eV).
Mahboob et al., Phys. Rev. Lett., 92, 036804, 2004 King et al.. Phys. Rev. B., 77, 045316, 2008
Mismatched Highly ompounds@warwick C Structure and Electronic properties of InN Surfaces and Interfaces – 4 / 14 Importance of scandium nitride
Introduction Scandium nitride was initially thought to be a semi-metal, but after more Techniques careful calculation was found to be a semiconductor with a direct transition XPS CAICISS at the Γ point of ∼ 2.1 eV. Future Research Interest in use as buffer layers in III-N compounds, e.g. GaN/InN.
Demonstrates downwards band bending at the surface.
May exhibit interesting electronic properties.
Lambrecht, Phys. Rev. B, 62, 20, (2000)
Mismatched Highly ompounds@warwick C Structure and Electronic properties of InN Surfaces and Interfaces – 5 / 14 Techniques
Introduction Important techniques for this project: Techniques XPS X-ray photoelectron spectroscopy CAICISS
Future Research Co-axial impact collision ion scattering spectroscopy
Low energy electron diffraction
Some complementary techniques that will also be utilised:
Scanning electron microscopy
Hall measurements
Mismatched Highly ompounds@warwick C Structure and Electronic properties of InN Surfaces and Interfaces – 6 / 14 X-ray photoelectron spectroscopy
Introduction An incident x-ray photon causes the ejection of a core level electron, which Techniques is then accelerated towards an electron energy analyser. XPS X-ray Source Hemispherical Analyser CAICISS
Future Research γ e-
Sample
The binding energy of the detected electron is:
EB = Eγ − Ek − φanalyser
Each element produces a characteristic set of peaks in the spectra at specfic binding energies directly identifying that species (usually!)
Mismatched Highly ompounds@warwick C Structure and Electronic properties of InN Surfaces and Interfaces – 7 / 14 X-ray photoelectron spectroscopy
Introduction An incident x-ray photon causes the ejection of a core level electron, which Techniques is then accelerated towards an electron energy analyser. XPS X-ray Source Hemispherical Analyser CAICISS γ Future Research γ e-
Sample
The binding energy of the detected electron is:
EB = Eγ − Ek − φanalyser
Each element produces a characteristic set of peaks in the spectra at specfic binding energies directly identifying that species (usually!)
Mismatched Highly ompounds@warwick C Structure and Electronic properties of InN Surfaces and Interfaces – 7 / 14 X-ray photoelectron spectroscopy
Introduction An incident x-ray photon causes the ejection of a core level electron, which Techniques is then accelerated towards an electron energy analyser. XPS X-ray Source Hemispherical Analyser CAICISS γ Future Research γ e- Εk
Sample
The binding energy of the detected electron is:
EB = Eγ − Ek − φanalyser
Each element produces a characteristic set of peaks in the spectra at specfic binding energies directly identifying that species (usually!)
Mismatched Highly ompounds@warwick C Structure and Electronic properties of InN Surfaces and Interfaces – 7 / 14 XPS Data
Introduction Sample XPS spectra for a Sc2p region. Fitted for different surface Techniques preparations and take off angles. XPS
CAICISS
o
o
JH35 As l oaded 30 T OA
JH35 As l oaded 90 T OA Data Future Research Data
Sum of Peaks Sum of Peaks
Sc2p Components Sc2p Components
N1s Component N1s Component
Extra component
for shoulder
o o
JH35 2x2hr Anneal . 30 T OA Data JH35 2x2hr Anneal . 90 T OA Data
Sum of Peaks Sum of Peaks Intensity (arb. units) Sc2p Components Sc2p Components
N1s Components N1s Component
Mismatched Highly 408 406 404 402 400 398 396 394 408 406 404 402 400 398 396 394
ompounds@warwick Binding Energy (eV) C Structure and Electronic properties of InN Surfaces and Interfaces – 8 / 14 Co-axial impact collision ion scattering spectroscopy
Introduction Ion scattering can be illustrated as a simple collision between hard Techniques spheres. Incident ions scatter off atoms in the near surface region. XPS CAICISS
Future Research
CAICISS is a novel low energy ion scattering technique, where ions with ◦ incident energy of 1 – 5 keV are incident on the surface and 180 backscattering geometry is utilised for detection. Mismatched Highly ompounds@warwick C Structure and Electronic properties of InN Surfaces and Interfaces – 9 / 14 Co-axial impact collision ion scattering spectroscopy
Introduction Techniques
XPS CAICISS
Future Research
At Warwick we have the only CAICISS chamber in the country. Mismatched Highly ompounds@warwick C Structure and Electronic properties of InN Surfaces and Interfaces – 10 / 14 Co-axial impact collision ion scattering spectroscopy
Introduction The data is compared with simulations such as those created by the FAN Techniques package XPS CAICISS
Future Research
Mismatched Figure 1: FAN trajectory cones from the near surface region of Au/Cu Highly ompounds@warwick C Structure and Electronic properties of InN Surfaces and Interfaces – 11 / 14 In-adlayers in InN
Introduction Previous CAICISS work performed by the group has led to a model for Techniques wurtzite InN to be formed with In adlayers at the surface of In terminated XPS CAICISS InN. Future Research
Figure 3: InN adlayer schematic, top view and side view shown
Figure 2: Idealised bulk terminated
Mismatched InN and In adlayer model shown Highly ompounds@warwick with experimental result below C Structure and Electronic properties of InN Surfaces and Interfaces – 12 / 14 Future Research
Introduction Techniques Further investigation into the structural and electronic properties of XPS InN and ScN. CAICISS Future Research Study other HMC’s.
Develop cleaning techniques for InN.
Mismatched Highly ompounds@warwick C Structure and Electronic properties of InN Surfaces and Interfaces – 13 / 14 Cleaning InN
Introduction Some issues faced when cleaning InN are: Techniques XPS ◦ Low non-congruent temperature ∼ 450 C. CAICISS
Future Research Preferentially sputter N from surface.
Weak material so cannot withstand Ar+ ion bombardment.
Need to develop cleaning methods that maintain both the electronic and structural properties of the surface, without introducing many defects. Currently atomic hydrogen cleaning is performed, however, hydrogen acts as a donor defect altering the electronic properties.
Mismatched Highly ompounds@warwick C Structure and Electronic properties of InN Surfaces and Interfaces – 14 / 14