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- Scanning Gate Spectroscopy and Its Application to Carbon Nanotube Defects Steven R
- J. Chae , SY Jung , SJ Woo , HJ Yang , H. Baek , J. Ha , YJ Song , Y
- Combination of Infrared Synchrotron Radiation with Optical Near-Eld Microscopy Techniques Miguel Silveira
- Slac-Pub-15364.Pdf
- Atomic Force Microscopy Studies on the Electrostatic Environment and Energy Levels of Self-Assembled Quantum Dots
- Characterization of Scanning Gate Technique and Transport in Nanostructured Graphene
- Stanford University Center for Probing the Nanoscale NSF NSEC Grant 0830228 Director: David Goldhaber-Gordon, Deputy Director: Nicholas Melosh Stanford University
- SCANNING PROBE MICROSCOPY NANOS-E3 SCHOOL – 29/09/2015 an Introduction to Surface Microscopy Probes SPM Is Ubiquitous in Modern Research
- Scanning-Gate Microscopy of Semiconductor Nanostructures: an Overview
- Scanning Probe Microscopy
- High Resolution Scanning Gate Microscopy Measurements on Inas/Gasb Nanowire Esaki Diode Devices James L
- Scanning Tunneling Microscopy and Spectroscopy of Graphene Layers on Graphite, Solid State Communications, 149 (2009) 1151-1156
- Nano-Sized SQUID-On-Tip for Scanning Probe Microscopy Scanning Gate
- Scanning Probe Characterization of Electronic Scattering in a One-Dimensional Conductor
- Imaging Viscous Flow of the Dirac Fluid in Graphene
- Cryogen-Free Scanning Probe Microscopy in Silicon Device Physics at Milli-Kelvin Temperatures
- Nanoscale Thermal Imaging of Dissipation in Quantum Systems