XICANAS JZAOT--. Conference on Analytical Atomic Spectroscopy with International Participation Moscaw,USSR July 29 August 4,1990 Abstracts USSR Academy of Sciences XICANAS XI Conference on Analytical Atomic Spectroscopy with International Participation Moscew,USSR July 28 JUNjust 4,1990 Abstracts e UDC 543.42 XI CAHAS Conference on Analytical Atoaie -Spectroscopy with international participation COHFEKEHCE ABSTRACTS Plenary lecture» (Р1Л) Atomic-absorption spectroscopy (AAS) Atomic-emission spectroscopy (ABB) Atoaic laser apactroacopy (ALS) X-Ray apectroacopy (XRS) Miscellaneous spectroscopic techniquea and lata abstracts (HISC) © V.I.Varnaiaky Institute of Geochemistry *nd Analytioal мм ч-о2_оп?9вп_х CneUtry of the USSR Aead«B} IBB» 5-02-0Q7280-X ^ ^Хвинш, 19*> PREFACE Analytical atonic spectroscopy includes a number of highly important methods of analysis, which play an essential part for analysis of environmental objects, mineral raw materials, metals and alloys, other inorganic substances and materials, different organic substances and biological objects. The theory of the atomic spectroscopy methods is a highly interesting field of research, which is connected with many branches of science. A great number of first class scientists and engineers work in the field of analytical atomic spectroscopy. They know works of one another quite well, often and useful work together, including the conferences, seminars and symposiums. The problems of the development of the theory and practice of the methods are regularly discussed at the Conferences on Analytical Atomic Spectroscopy ( CANAS ). The previous conference toak place in Torun, Poland, in 1988. The present book contains the abstracts of the presentations, contributed to the Conference of the 1990 < Moscow, July 29 - August 4, 1990 ). They were classified according to the sections. There is an x-ray spectroscopy section except the methods of the analytical atomic spectroscopy in the book. This method of analysis has been included in the program of the Conference due to the initiative of the country-organizer. As a rule in the section the abstracts connected with the development of the theory of a method are presented firet, and applied papers are presented thereafter. There is an alphabetic order within the subsection. The number presentation corresponds to its number in the program of the Conference for convenience of use. All the papers are reproduced in the original form, except small linguistic editing. The choice of papers was done by the Organizing Committee. The Editorial Board included E.P. shumilova, Д.В. Volynsky and other collaborators from V.I. Vernadsky Institute of Geochemistry and Analytical Chemistry of the USSR Academy of Sciences, which took over the functions of the base institution of the Conference. We take the chance to extend our gratitude to the administration of the Institute ( Acad. V.L. Barsukov, Prof. B.F. Myasoedov ) and all above mentioned and not mentioned here colleagues. Professor N.M. Kuz'min Doctor Е.И. Sedykh Conference Vice-chairman Scientific Secretary CONFERENCE COMHITTEE Acad. Zolotov Yu.A Co-chairman prof. Myasoedov B.F Co-chairman Prof. Kuz'nin N.H Vice-chairman Dr. Sedykh Е.И Scientific Secretary Dr. Belyanin v.B. Prof. Muzgin v.H. Prof. Letokhov V.s. Prof. Karpov vu.A. Or. Ostroumov S.V. Dr. BolBhov H.A. Prof. Киг'тепко N.E. Dr. Baranov S.V. Prof, zil'berstein Kh. Prof. Nedler V.V. Dr. Zaaaraev V.P. Dr. Mogilevsky A.N. Prof. Korovin Vu.I. Prof. Nikolsky A.P. Dr. chekalin N.V. Prof. L'vov B.v. Prof. Ginelfarb F.A. Dr. Koloshnikov v.G. CONFERENCE SECRETARIAT v.i.vernadsky Institute of eeochemistry and Analytical Chemistry of the USSR Academy of sciences 117975 GSP-i, Kosygin str. 19 Moscow V-334, USSR. Tel. 137-86-56. PLENARY LECTURES i Х-ВЛХ SPECTHOHBTHY ANALYSIS: ADVANCE AND OUTLOOK PLH-1 FOB IBS DBVSLOHBNT V.P. Afonin Institute of Geochemistry, Siberian Branch of the USSR Academy of Sciences, Irkutsk, USSR DM contribution provides an appreciation of present-day state in X-ray spectrometry analysis.Some general features of instruments and theory development are discussed. At present, the following X-ray spectrometry analysis methods (XBF, SHU, PHI, SEHB, TXBP) are available. The 1^ intensity of one of strong lines of characteristic X-ray spectrum of i element to be determined is used as an ana­ lytical signal in XES analysis. The I, dependence on 0^ concentration of the element to be determined is written as: I.* co»s& C^fi, (D where ?<-function,depending on excitation conditions and chemical composition of the temple analysed. In exciting the analytical signs! by X-ray tube radistien: Г*4Ъс/А ' (2> НъЛ%^/&ь.р1-/и/ £*р In exciting by electron beam: о The physical and mathematical models,which are used for calculating functions (2) and (5) are discussed in the report. №• possibility of approximation of F-function by eC -correction method is evaluated. • ATOHIC-EUXSSIOB SPBCTROMBTRY IH SOVIET UHIOIf НЛ-2 V.B.Belyanin, Yu.I.Korovln, V.V.Ifedler Moeoow, USSR Some aspects of development of spectral analysis CSA) in SU. Statistic and specifity of papers and monographics in SA in SU. Some problems in organisation structure of SA in SU. Mostly original papers and ideas in SA the last vears. AASA-ETA and related methods of atomisation.new methods, of compensation of interferences,scintillation methods. ESA -arcs and spares sourses.plasmatrons.lCP.combination of chemical and spectroscopy methods. Laser SA -photoionisation,fluorescences,absorption and emission methods. Application of hollow cathods lamps. Methods of SA with time resolution - analysis of inclusions, analysis of minerals. Some iastrumentation development. Metrology and standard samples. LOOKING IN A BIRDS EYE VIEW AT SOME RECENT AND CURRENT DEVELOPMENTS IN OPTICAL AND X-RAY ATOMIC I h"~J SPECTROSCOPY P.WJ.M. Boumans Philips Research Laboratories P.O. Box 80.000, 5600 JA Eindhoven. The Netherlands One of the purposes of research in Philips Research Laboratories is to develop "reservoirs of knowledge" filled with the results of fundamental and applied investigations and serving as sources and resources for the development departments of the Product Divisions of the Philips Concern. This entails that part of the research is directed toward the development of science in genera] and is conducted in much the same way as in academic institutions. Research in the field of analytical atomic spectroscopy in the past years is an example of such an academic approach. The results of this work have become known worldwide through publications and lectures, and have contributed to the development of spectroscopy in general. The present lecture will deal with some topics of universal interest, gleaned from recent and current work. An attempt to look in a birds eye view at recent and current work must inevitably be a compromise between a tutorial overview and a critical evaluation. As happens in both history and science, the significance of developments cannot be properly judged at the points that events unroll themselves. Digestion as well as fusion into a broader context are needed before develop­ ments can be assessed in the proper perspective. It is this philosophy which will form the background of this lecture. The author will look partly at his own work, partly at external work, and present some views based on today's insights. In the field of optical atomic spectrometry, topics such as high resolution emission spectroscopy and spectrometers, detection limits under ideal and real-life conditions, analysis and simulation of emission spectra, and, possibly, glow discharges as sources for atomic emission spectroscopy or atom reservoirs for atomic absorption spectroscopy will pass in review. At the point that this abstract is released it is still too early to specify the details of the lecture. Therefore further information is limited here to overall specifications of and references to topics which are likely to be explicitly эг implicitly covered in the lecture, but cannot yet be assumed to belong in the field of common knowledge. The recent explorations of high-resolution emission spectroscopy in connection with the inductively coupled plasma (ICP) may be featured by the following survey of topics covered. (1) Evaluation of the optical and characteristics of spectrometers, in particular eche»je spectrometers, in connection with noise sources [1—3]. (2) Detection limits for flat background ("pure water conditions'): trade-off between (i) the effect of spectral bandwidth on the background radiant flux, which dictates the shot noise component of the relative standard deviation of the background signal (RSDB), and (ii) the effect of spectral bandwidth on the signal-to-background ratio (SBR) Г2]. (3) The contribution of line wings to the background in line-rich spectra [4]. (4) The measurement of the physical widths and shapes of 350 prominent ICP lines of 65 elements [3]. (5) The transfer function which describes the modification of source SBRs by the spectroscopic equipment, in other words, the dependence of SBRs, and therefore detection limits, on the spectral bandwidth and the physical widths of the relevant spectral lines [5—7]. (6) The effect of spectral resolution on analytical performance, in particular the detection limit, in the case of line interference Г7—10]. This question has been quantified by defining the quantity "true detection limit" in such a way that a 'selectivity term" accounts for the reduction in selectivity caused by line interference [9, 10]. (7) The "true detection