Index A Constitutive relations, 14, 15, 20, 29, 52 Abbe diffraction limit, 137 Coordinate systems Absorption coefficient, 18, 19, 24, 31 Cartesian, 162–166 Ampere’s` law, 66 cylindrical, 163–165 Anderson localization, 72 spherical, 161, 166, 167 Anisotropic materials Coordinate transformation, 161–168, 172, 177, highly anisotropic material, 102, 118 188 Anti-resonance, 55, 88 Critical wavelength, 13, 14 Artificial dielectrics. 59–60, 65 Atomic force microscope (AFM), 47, 87 D Damping constant, 16, 18, 20, 21, 24, 31, 65, 67, 69, 70 B Depolarization factor, 35 Babinet principle, 112 Depolarization field, 28 Backward phase-matching, 131 Designs for optical cloaking Band gap high-order, 180–187 in dielectrics, 12–14, 16 non-magnetic, 171–176, 182–187 in photonic crystals, 117, 125 Dielectric constant, 8, 13, 16, 25, 29, 30, 32, in semiconductors, 12, 13 63, 64, 70, 89, 96, 142, 183 Beer’s law, 18 Dielectric function, 15–18, 20–24, Bianisotropic materials, 3 Diffraction limit, 40, 42, 138, 139, 149, 150, Birefringence, 19, 50, 118 152, 154 Bistability, 125, 126 Diffraction threshold, 92 Block-elimination (BE) method, 146 Dipole moment Bound electrons, 12, 21–23 electric, 29, 79, Bruggeman geometry, 26, 27, 33 magnetic, 79 Direct laser writing (DLW), 45, 46 Dispersion curve, 119, 151, 153 Dispersion relation, 117, 118, 168, 171 C Double-negative materials, 102 Camouflage, 159, 160 Drude model, 21, 23, 24, 30, 32, 65, 70, 94, Causality, 6, 32, 53, 103, 171 142, 143 Cavity model, 93, 94 Chiral materials, 102, 120 Chirality, 117, 120 E Clausius–Mossotti relation, 27, 29, 34 Effective parameters Clusters, 33, 71, 72 conductivity, 34, 68, 70 Complex permittivity plane, 63 damping constant, 16, 18, 20, 21, 24, 31, Conformal mapping, 187–189 65, 67, 69, 70 197 198 Index dielectric function, 15–18, 20–24, 26, 29, Electronic structure, 11–13 30, 32, 65, 66, 69, 70, 97, 98, 114, Ellipsometry, 51–53 184 Energy bands electron density, 66, 68, 69, 84 conduction band, 12, 13 electron mass, 66, 69 forbidden band, 12, 13 mean free path, 21, 24 valence band, 12, 13 permeability, 6–8, 14, 51, 52, 77, 79–81, Equivalent circuit model, 80, 84 83, 85, 89, 95–98, 101, 105–109, Evanescent waves, 117, 137–141, 149, 151, 112, 113, 116, 117, 123, 124, 154 161, 164–166, 168, 169, 177, 181, 184–188, 192 permittivity, 6–8, 13, 14, 16, 18–20, 24, 27, 29, 30, 32, 33, 36, 51, 52, 60–65, F 67–71, 89, 93, 94, 96–98, 106–108, Fermi level, 11, 20 113, 114, 117–119, 124, 140–147, Fermi velocity, 21 161–163, 165, 166, 172, 173, 175, Figure of merit (FOM) 177, 181, 183–185, 187–189, 191, for cloaking, 179 192 for negative-index materials, 113, 116 plasma frequency, 21, 60, 65–70, 77, 84 Filling factor/filling fraction, 30–34, 60, 61, refractive index, 6, 8, 14, 15, 18, 19, 23, 24, 63, 64, 70–72, 142–146, 173, 174, 43, 44, 51–54, 60, 72, 94, 103, 104, 182, 183, 189 107–109, 111, 112, 116–118, 120, Finite-difference time-domain method 127, 128, 137, 138, 151, 167, 171, (FDTD), 110 186, 187, 189, 191, 193 Finite-element method, 56 Effective medium theory (EMT) Fishnet structure, 41, 43, 110–116, 125 d-dimensional, 34 Focused-ion beam (FIB) milling, 40 shape-dependent, 35, 36, 63, 173 Form-invariance of Maxwell’s equations, Electric displacement, 14, 16, 87, 88, 114, 162 161 Electric field, 7, 11, 12, 14–20, 23, 27, 28, 35, Four-wave mixing, 73, 125, 126 61, 62, 64, 65, 70, 73, 77, 82, 83, 87, Fourier transform infrared spectroscopy 108, 124, 168, 170, 173, 181, 185 (FTIR), 49 Electric flux density, 61 Free electrons, 20–22, 24, 66–68 Electric permittivity, 51, 96, 97, 107, 118, 143, Fresnel equations, 15 161 Electric susceptibility, 14, 19, 29 Electromagnetic cloak H broadband, 190 Harmonic generation, 73, 124 carpet, 187–191 Helmholtz–Drude model, 15 cylindrical, 163–166, 168–172, 174, 177, High-permittivity materials, 185 178, 180, 182–187, 191 Hyperlens ground-plane, 189 cylindrical, 152 non-magnetic, 171–187 impedance-matched, 192, 193 spherical, 161, 166, 167, 187 planar, 192, 193 Electromagnetic response tapered waveguide, 190, 191 electric, 29, 60, 65, 71, 106, 107, 124, 128, 140 magnetic, 78–85, 88, 89, 95, 96, 105–108, I 118, 124, 153, 168, 169, 171, 173, Impedance, 52, 53, 109, 113, 139, 147, 153, 185 172, 176–179, 192, 193 Electron gas, 20, 21 Inhomogeneity scale, 3, 26 Electron mean free path, 21 Interband transitions, 21–23, 89 Electron transition, 16, 17, 89 Interference lithography (IL), 42 Electron-beam lithography, 40, 81, 86, 87, 107, Invisibility, 159–193 109 Isofrequency curves, 118, 151 Index 199 J Nanostrips Jacobian matrix, 163, 164, 177 array, 78 coupled/paired, 78, 86–93, 95, 114, 168, 185 K Near-field scanning optical microscopy Kinetic inductance, 84 (NSOM), 149 Kramers–Kronig relations, 133 Near-field superlens (NFSL) operational condition, 141 L tunable, 142, 143, 145, 148, 149 Lattice constant, 65, 68, 70, 97 Negative permeability, 77, 89, 113 Left-handed materials, 102–103 Negative permittivity, 70, 107, 113, 140 Lenz’s law, 66, 79 Negative refraction, 107, 117–120, 133 Light concentrator, 192 Negative-index materials (NIMs) Lorentz line shape, 16 double-negative, 102, 113, 114, 116 Lorentz local field, 27–29 microwave, 106, 107, 120, 139, Lorentz model, 20, 27, 107 optical, 107, 108, 112, 119, 120, 133 Lorentz sphere, 27, 28 single-negative, 113, 114, 116 Lorentz–Lorenz equation, 27 Non-magnetic materials, 7, 178, 180 Loss-compensation, 133 Nonlinear electric susceptibility, 126 Nonlinear optics, 26, 123–134 Nonlinear polarization, 127 M Nonlinear surface waves, 125 Macroscopic effective parameters, 5–8, Magnetic field, 7, 66–68, 78–85, 87, 88, 96, 97, 108, 109, 114, 124, 141, 171, O 175–177 Optical Kerr medium, 124 Magnetic flux density, 6 Optical anisotropy, 19 Magnetic moment, 80, 82, 87, 88 Optical magnetism, 77–78, 89, 95, 140, 171 Magnetic permeability, 51, 98, 105, 108, 112, Optical parametric amplifications, 126, 161, 168, 169, 181, 184 131–134 Magnetic susceptibility, 14 Optical transfer function (OTF), 145 Magnetoelectric coefficients, 7 Manley–Rowe relations, 126 Maxwell–Garnett geometry, 26, 27 P Maxwell–Garnett theory (MGT), 30–34 Parameter space, 7, 8 Maxwell’s equations, 5, 6, 8, 14, 61, 81, 101, Percolation threshold, 33–35, 71–73 103, 161–163, 168, 177, 193 Perfect conductor, 68, 70, 107 Meta-atoms, 3, 11, 19, 25, 39, 42, 43, 45, 54, Perfect lens, 102, 137–140, 145, 149 71, 78, 79, 85, 88, 116, 168, 189 Perfect metal, 90 Metal-dielectric composites Phase anisotropy, 50, 51, 110 layered/stratified, 60–64, 119, 141, 151 Phase measurement, 50, 51, 110, 111 periodic array of metallic wires, 64–71 Phase-matching random, 26, 71, 73, 148 phase-matching condition, 128, 129, 131 Metal-insulator phase transition, 30 phase mismatch, 129, 131 Metal-insulator-metals waveguides, 102 Photolithography, 39, 40, 42, 43 Mie resonances, 96, 185 Photon energy, 13, 20 Mixing rules, 25–36 Photonic crystals, 45, 46, 117, 118 Modulation transfer function (MTF), 145 Plasma frequency surface plasmon, 31, 140, 150 N volume, 21 Nanoimprint lithography (NIL), 42, Plasmonics, 25 Nanorods Polaritonic material, 97 array, 109 Polarizability, 29, 30, 34, 79 coupled/paired, 89, 108, 109 Polarization density, 14, 16, 20 200 Index Polarization interferometry, 50, 109 Solitons, 125 Poynting vector, 102–104, 107, 118, 125, 128, Spatial dispersion, 71 129, 139, 151, 180 Spectral representation, 36, 181 Propagating waves, 8, 138, 139, 145, 149–151, Spectrophotometers, 48, 49, 109 153 Split-ring resonators (SRRs) double, 78–81, 85 planar, 41, 43, 84, 85, 124 R scaling breakdown, 84 Reduced cloak parameters, 172, 173 single, 79, 82–84 Reflectance, 6, 47, 48, 106, 160 Stealth techniques, 159 Reflection Sub-diffraction-limited resolution, 149, 152 coefficient, 24, 52, 53 Sub-wavelength resolution, 138, 145, 149, 193 spectrum, 48, 49, 84, 90, 92 Subwavelength imaging, 5, 119, 154 Refractive index, 14, 15, 18, 19, 23, 24, 43, Super resolution, 117, 137–155 44, 51–54, 60, 92, 94, 101–104, Super-oscillation, 154 106–109, 111, 112, 116–118, 120, Superlens 127, 128, 137, 138, 151, 167, 171, far-field, 149–151 186–189, 191, 193 near-field, 140–147 Relative permeability, 14 tunable near-field, 142, 143, 145, 148, 149 Relative permittivity, 8, 14, 29 Surface plasmon, 30, 31, 72, 107, 119, 125, Resonance 140, 150, 153, 191 electric, 17, 55, 87, 88, 91, 113, 114, 124 Surface-enhanced Raman scattering (SERS), magnetic, 43, 55, 78, 80–91, 93–98, 105, 148 108, 109, 113, 114, 116, 169, 185 phonon, 16, 97, 140, 184 plasmon/plasmonic, 30, 72, 107, 109, 113, T 114, 125, 154 Third-harmonic generation (THG), 124, 125 polaritonic, 98 Transformation function Retrieval of effective parameters high-order, 176–180, 182, 183, 186, 187 retrieval process, 52–55 linear, 165, 166, 177–179, 181–182 retrieved effective parameters, 55, 83, 114 quadratic, 178–180, 183, 184, 186 Reversed Phenomena in negative-index Transformation matrix, 164 materials Transformation optics, 89, 153, 159–193 Cerenkov radiation, 104, 105 Transmission Doppler effect, 104 coefficient, 53, 145 Goos–Hanchen¨ shift, 104, 105 spectrum, 92 Snell law, 45, 104, 106, 116, 119 Transmittance, 47, 109, 111, 125, 175 Rodded medium, 60, 64–66, 70 Transverse wavevectors, 117, 137, 145, 146, 151 S Two-photon-photopolymerization (TPP), 45 Scanning electron microscope (SEM), 43, 45, 47, 87, 112, 114–116, 150, 190 Scattering radiation patterns, 180 V Screening parameter, 35, 173 Vector potential, 66, 67 Second-harmonic generation (SHG), 126–131 Veselago lens, 139 Self-assembly, 46, 47 Self-inductance, 66, 68, 84 Self-organization, 46, 47 W Sellmeier formula, 18, 32 Wave vector surface, 118 Semicontinuous metal films, 34, 71–73 Wiener bounds, 63, 64, 181, 182, 184 Silver-wire lens, 154 Wire grid/wire medium/wire mesh, 60, 64–71 Snell’s law, 45, 104, 106, 116, 119 Wood’s anomaly, 92.