650 V, 33 Mohm Gallium Nitride (Gan) FET in a CCPAK1212 Package 19 April 2021 Objective Data Sheet

650 V, 33 Mohm Gallium Nitride (Gan) FET in a CCPAK1212 Package 19 April 2021 Objective Data Sheet

GAN039-650NBB 650 V, 33 mOhm Gallium Nitride (GaN) FET in a CCPAK1212 package 19 April 2021 Objective data sheet 1. General description The GAN039-650NBB is a 650 V, 33 mΩ Gallium Nitride (GaN) FET in a CCPAK1212 package. It is a normally-off device that combines Nexperia’s latest high-voltage GaN HEMT H2 technology and low-voltage silicon MOSFET technologies — offering superior reliability and performance. 2. Features and benefits • Simplified driver design as standard level MOSFET gate drivers can be used: • 0 V to 12 V drive voltage • Gate threshold voltage VGSth of 4 V • Robust gate oxide with ±20 V VGS rating • High gate threshold voltage of 4 V for gate bounce immunity • Low body diode Vf for reduced losses and simplified dead-time adjustments • Transient over-voltage capability for increased robustness • CCPAK package technology: • Improved reliability, with reduced Rth(j-mb) for optimal cooling • Lower inductances for lower switching losses and EMI • 175 °C maximum junction temperature • High Board Level Reliability absorbing mechanical stress during thermal cycling, unlike traditional QFN packages • Visual (AOI) soldering inspection, no need for expensive x-ray equipment • Easy solder wetting for good mechanical solder joints 3. Applications • Hard and soft switching converters for industrial and datacom power • Bridgeless totempole PFC • PV and UPS inverters • Servo motor drives 4. Quick reference data Table 1. Quick reference data Symbol Parameter Conditions Min Typ Max Unit VDS drain-source voltage -55 °C ≤ Tj ≤ 175 °C - - 650 V ID drain current VGS = 10 V; Tmb = 25 °C - - 60 A Ptot total power dissipation Tmb = 25 °C; Fig. 1 - - 300 W Tj junction temperature -55 - 175 °C Static characteristics RDSon drain-source on-state VGS = 10 V; ID = 32 A; Tj = 25 °C - 33 39 mΩ resistance Nexperia GAN039-650NBB 650 V, 33 mOhm Gallium Nitride (GaN) FET in a CCPAK1212 package Symbol Parameter Conditions Min Typ Max Unit Dynamic characteristics QGD gate-drain charge ID = 32 A; VDS = 400 V; VGS = 10 V; - 5 - nC Tj = 25 °C QG(tot) total gate charge - 30 - nC Source-drain diode Qr recovered charge IS = 32 A; dIS/dt = -1000 A/µs; - 150 - nC VGS = 0 V; VDS = 400 V; Fig. 3 5. Pinning information Table 2. Pinning information Pin Symbol Description Simplified outline Graphic symbol 1 G gate 1 2 3 4 5 6 D 2 S source 3 S source 4 S source 5 S source G 6 S source 12 11 10 9 8 7 S 7 D drain CCPAK (SOT8000) 8 D drain aaa-028116 9 D drain 10 D drain 11 D drain 12 D drain mb S mounting base; connected to source 6. Ordering information Table 3. Ordering information Type number Package Name Description Version GAN039-650NBB CCPAK Plastic, surface mounted copper clip package SOT8000 (CCPAK1212); 13 terminals; 2.0 mm pitch, 12 mm x 12 mm x 2.5 mm body 7. Marking Table 4. Marking codes Type number Marking code GAN039-650NBB 039INBBX GAN039-650NBB All information provided in this document is subject to legal disclaimers. © Nexperia B.V. 2021. All rights reserved Objective data sheet 19 April 2021 2 / 10 Nexperia GAN039-650NBB 650 V, 33 mOhm Gallium Nitride (GaN) FET in a CCPAK1212 package 8. Limiting values Table 5. Limiting values In accordance with the Absolute Maximum Rating System (IEC 60134). Symbol Parameter Conditions Min Max Unit VDS drain-source voltage -55 °C ≤ Tj ≤ 175 °C - 650 V VTDS transient drain to source pulsed; tp = 1 µs; δfactor = 0.01 - [tbd] V voltage VGS gate-source voltage -20 20 V Ptot total power dissipation Tmb = 25 °C; Fig. 1 - 300 W ID drain current VGS = 10 V; Tmb = 25 °C - 60 A VGS = 10 V; Tmb = 100 °C - 42 A IDM peak drain current pulsed; tp ≤ 10 µs; Tmb = 25 °C - 240 A Tstg storage temperature -55 175 °C Tj junction temperature -55 175 °C Tsld(M) peak soldering - 260 °C temperature Source-drain diode IS source current Tmb = 25 °C; VGS = 0 V - 55 A ISM peak source current pulsed; tp ≤ 10 µs; Tmb = 25 °C - 240 A 03aa16 120 Pder (%) 80 40 0 0 50 100 150 200 Tmb (°C) Fig. 1. Normalized total power dissipation as a function of mounting base temperature 9. Thermal characteristics Table 6. Thermal characteristics Symbol Parameter Conditions Min Typ Max Unit Rth(j-mb) thermal resistance from - - 0.5 K/W junction to mounting base GAN039-650NBB All information provided in this document is subject to legal disclaimers. © Nexperia B.V. 2021. All rights reserved Objective data sheet 19 April 2021 3 / 10 Nexperia GAN039-650NBB 650 V, 33 mOhm Gallium Nitride (GaN) FET in a CCPAK1212 package 10. Characteristics Table 7. Characteristics Symbol Parameter Conditions Min Typ Max Unit Static characteristics VGS(th) gate-source threshold ID = 1 mA; VDS=VGS; Tj = 25 °C 3.3 4 4.8 V voltage IDSS drain leakage current VDS = 650 V; VGS = 0 V; Tj = 25 °C - 3 30 µA VDS = 650 V; VGS = 0 V; Tj = 150 °C - 20 - µA IGSS gate leakage current VGS = -20 V; VDS = 0 V; Tj = 25 °C - 10 400 nA VGS = 20 V; VDS = 0 V; Tj = 25 °C - 10 400 nA RDSon drain-source on-state VGS = 10 V; ID = 32 A; Tj = 25 °C - 33 39 mΩ resistance VGS = 10 V; ID = 32 A; Tj = 175 °C; - 80 - mΩ Fig. 2 RG gate resistance f = 1 MHz; Fig 4 0.2 0.5 1.25 Ω Dynamic characteristics QG(tot) total gate charge ID = 32 A; VDS = 400 V; VGS = 10 V; - 30 - nC Tj = 25 °C QGS gate-source charge - 9 - nC QGD gate-drain charge - 5 - nC Ciss input capacitance VDS = 400 V; VGS = 0 V; f = 1 MHz; - 1500 - pF Tj = 25 °C Coss output capacitance - 147 - pF Crss reverse transfer - 5 - pF capacitance Co(er) effective output 0 V ≤ VDS ≤ 400 V; VGS = 0 V; - 220 - pF capacitance, energy f = 1 MHz; Tj = 25 °C related Co(tr) effective output - 380 - pF capacitance, time related td(on) turn-on delay time VDS = 400 V; RL = 12.5 Ω; VGS = 12 V; - [tbd] - ns RG(ext) = 30 Ω tr rise time - [tbd] - ns td(off) turn-off delay time - [tbd] - ns tf fall time - [tbd] - ns Qoss output charge VGS = 0 V; VDS = 400 V - 150 - nC Source-drain diode VSD source-drain voltage IS = 32 A; VGS = 0 V; Tj = 25 °C - 1.8 2.5 V IS = 16 A; VGS = 0 V; Tj = 25 °C - 1.3 - V trr reverse recovery time IS = 32 A; dIS/dt = -1000 A/µs; - [tbd] - ns VGS = 0 V; VDS = 400 V; Fig. 3 Qr recovered charge - 150 - nC GAN039-650NBB All information provided in this document is subject to legal disclaimers. © Nexperia B.V. 2021. All rights reserved Objective data sheet 19 April 2021 4 / 10 Nexperia GAN039-650NBB 650 V, 33 mOhm Gallium Nitride (GaN) FET in a CCPAK1212 package aaa-027810 3 a 2.5 2 1.5 1 0.5 0 -60 -30 0 30 60 90 120 150 180 Tj (°C) Fig. 2. Normalized drain-source on-state resistance factor as a function of junction temperature I, V dlS/dt IS trr t 0.25 IRM Qr IRM A VRRM DUT - VSD + aaa-029277 Fig. 3. Diode reverse recovery test circuit and waveform 11. Application information A Ferrite bead must be fitted in series with the gate of the GaN FET and should be located as close as possible to the gate pin, (see figure below). Keeping the gate-source loop as compact as possible minimizes the gate loop inductance. The Ferrite bead damps the resonant circuit made up of the gate source loop inductance and the GaN FET input capacitance, thus providing fast switching stability. It is recommended that the impedance of the ferrite bead should be 30 Ω @ 100 MHz, (recommended p/n BLM18PG300SN1D). A series resistance (RG) of 10 - 15 Ω is also recommended. GAN039-650NBB All information provided in this document is subject to legal disclaimers. © Nexperia B.V. 2021. All rights reserved Objective data sheet 19 April 2021 5 / 10 Nexperia GAN039-650NBB 650 V, 33 mOhm Gallium Nitride (GaN) FET in a CCPAK1212 package DC bus VBUS driver Q2 RCDCL RG FB1 (place as close as possible to drain pin) VS Vo driver Q1 RG FB1 RSN RCSN CSN aaa-030816 Fig. 4. Ferrite bead and RC snubber A DC-link snubber is recommended in all cases. Optimal is 20 nF in series with 4 Ω, most easily achieved with parallel combination 10 nF and 8 Ω. This snubber lowers the Q factor of any resonance in the bus. That resonance will act as a load on the high gain amplifier that is the GaN FET and can lead to instability. GAN039-650NBB All information provided in this document is subject to legal disclaimers. © Nexperia B.V. 2021. All rights reserved Objective data sheet 19 April 2021 6 / 10 Nexperia GAN039-650NBB 650 V, 33 mOhm Gallium Nitride (GaN) FET in a CCPAK1212 package 12. Package outline Plastic, surface mounted copper clip package (CCPAK1212); 13 terminals; 2.0 mm pitch, 12 mm x 12 mm x 2.5 mm body SOT8000 L1 D y C A3 A1 A A2 Gauge plane Seating plane θ C L detail X (View rotated 90° CCW) A b w C A-B D e2 Exposed 1 6 6 1 thermal pad area E1 H E F 12 7 7 12 D B c e X D1 0 5 10 mm scale Dimensions (mm are the original dimensions) Unit A A1 A2 A3 b c D D1 E E1 F e H L L1 w y θ max 2.8 0.15 2.65 1.15 0.30 12.2 11.1 9.6 5.7 12.3 1.0 8° mm nom 0.25 (3.6) 2.0 12.0 1.3 0.25 0.1 min 2.4 0 2.35 0.9 0.24 11.8 10.5 9.2 5.15 11.7 0.6 0° Note 1.

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