Possible Health Hazards Associated with the Use of Toxic Metals in Semiconductor Industries

Possible Health Hazards Associated with the Use of Toxic Metals in Semiconductor Industries

Journal of J Occup Health 2000; 42: 105–110 Occupational Health Review Possible Health Hazards Associated with the Use of Toxic Metals in Semiconductor Industries Swaran J.S. FLORA Division of Pharmacology and Toxicology, Defence Research and Development Establishment, Gwalior, India Abstract: Possible Health Hazards Associated with frequency devices, and photon emitters followed by the Use of Toxic Metals in Semiconductor gallium phosphide (GaP), indium phosphide (InP) and Industries: Swaran J.S. FLORA. Division of indium arsenide (InAs). These III–V intermetallic Pharmacology and Toxicology, Defence Research semiconductors are crystalline and intermetallic and Development Establishment, Gwalior, India— compounds. They are prepared by condensing vapours Gallium Arsenide (GaAs), Indium Arsenide (InAs) and of the elemental forms of the metalloids. They have found Indium Phosphide (InP) are the intermetallic compounds that are recognised as a potential health distinct and continually expanding application in the risk to workers occupationally exposed to their dust. semiconductor industry. Such a demand can be expected Exposure to these semiconductor compounds in the to result in an increase in the production and processing microelectronic industry can occur during the of ingots and wafers, which has the potential to expose preparation of material, cleaning and maintenance much of the semiconductors industry to these toxic operations for quartz glassware and during cleaning metals. The chemical from of the intermetallic does not of the reactor. The toxic effect of the intermetallic appear to be as important for toxicology as the chemical semiconductors appears to occur due to inhalation or forms of its dissolution products. In the manufacture of oral exposure and may result in poisoning. Assessment these semiconductors there are four major steps:crystal of risk to workers engaged in GaAs/InAs production is growth, wafer processing, epitaxy production and device difficult due to the lack of data on the toxicity of these fabrication. In future these compounds are going to be compounds. Their toxicity is mainly estimated on the basis of inorganic arsenic because it is now well known extensively used in the development of supercomputers, that GaAs and InAs dissociate into their constitute telecommunication systems, light emitting diodes and moieties and exert adverse effects on the semiconductor lasers1, 2). GaAs has a distinct advantage haematopoietic and immune systems. As their toxicity in electronic speed compared with silicon and is therefore is still not very well understood the treatment also increasingly used for satellite communication systems and remains to be elucidated. supercomputers. Several favourable properties as (J Occup Health 2000; 42: 105–110) compared with silicon based devices suggest that GaAs and such other intermetallic substrates may find Key words: Gallium arsenide, Indium arsenide, Indium applications in military, space, telecommunication and phosphide, Metal distribution, Biochemical changes, supercomputing systems. All these extensive uses of Experimental evidence, Chelation treatment GaAs will inevitably lead to an increase in the exposure of workers manufacturing these products. In the defence microelectronic industry, silicon was previously the substrate predominantly used, but in recent Possible Routes of Exposure times a number of other semiconductor materials Exposure to these intermetallic substrates (particularly III–V intermetallic semiconductors) have (semiconductors) may occur during cleaning and been introduced which have an increasing number of maintenance operations for quartz glassware and during applications. Gallium arsenide (GaAs) is one of the cleaning of the reactors. Exposure may also be expected substrates which have superior properties for making high during cropping, slicing, lapping, polishing, and backlapping and wafer-saving steps. Disposal of the Received Aug 17, 1999; Accepted Jan 8, 2000 waste products and recycling of these materials have also Correspondence to: S.J.S. Flora, Division of Pharmacology and not yet been discussed. Exposure to airborne particulate Toxicology, Defence Research and Development Establishment, of GaAs may therefore be potential health hazards in the Jhansi Road, Gwalior-474 002, India 106 J Occup Health, Vol. 42, 2000 semiconductor industry. The toxic effects of the accumulate in the body after InP exposure. Fecal intermetallic semiconductor materials appear to occur excretion is a major route for its elimination. Based on primarily after inhalation exposure, although oral the literature available it is now well known that GaAs exposure to high doses may also result in toxicity. produces a definite adverse effect on at least three major Assessment of the risk to these workers from GaAs body systems, i) pulmonary, ii) haematopoietic and iii) exposure is further complicated due to the lack of toxicity immune. data available for this compound and, as mentioned above, is mainly regulated on the basis of inorganic arsenic Pulmonary Effects toxicity. It is now well known that both GaAs and InAs Toxicity of inhaled gallium arsenide compounds has dissociate into its constitutive moieties both in vitro and been reported in a number of reports in the recent past12–15). in vivo3–6) and arsenic is a well-known toxic metal, so It has been suggested that particulate fractions with a that one should not take the toxicity of these intermetallic mean count and volume diameter of 8.3 and 12.67 µm semiconductors lightly. were soluble under physiologically relevant in vitro Bioavailability, metabolism and excretions of most of conditions12). The intratracheal administration of this the III–V intermetallic compounds are not well known. GaAs particulate fraction was relatively more toxic than Bioavailability may depend on their dissolution rates and equivalent doses given through the oral route and results chemical properties. The reported acute lethality of these in increased lung weight12). Webb et al.12) also evaluated III–V intermetallic compounds is of low order. The oral the toxicity of Ga2O3, As2O3 and GaAs after the LD50 of GaAs in mice and rats is more than 15 g/kg, intratracheal instillation of these particles in rats. They whereas the threshold for acute effects is around 7 g/ found that the toxicity ranking was GaAs>As2O3>Ga2O3 kg7). The threshold for acute effects (lowest published and suggested that the pathological responses observed lethal dose) of inhalation of GaAs aerosol for 4 hours in lungs were likely to be primarily due to arsenic. The 3 has been reported to be 152.5 mg/m . For Indium lesions in lungs due to Ga2O3 were not remarkable. 13) antimonide the reported LD50 is 3.7 g/kg by the Ohyama et al. observed severe lung lesions, and intraperitoneal route whereas that for indium arsenide it survival was also shortened significantly in animals 7) × is around 15 g/kg. For GaP the reported LD50 is 8 g/kg . intratracheally exposed to GaAs particle (0.25 mg 15 5) The oral LD50 of metallic indium was 4200 mg/kg for times/animals) compared to controls. Goering et al. also rats and that of intraperitoneal and oral LD50 of InP was reported histopathological changes characterised by reported to be more than 5000 mg/kg. multifocal granulomas and type II pneumocyte hyperplasia after single intratracheal instillation of GaAs Effects on Biological Systems (50, 100 or 200 mg/kg). Indium arsenide (InAs) and The absorption of GaAs and InAs appears to be indium phosphide (InP) were also reported to produce accompanied by the formation of arsenic oxide. histopathological changes in lungs of hamsters14, 15). The Numerous reports have indicated that pulmonary major changes include alveolar and bronchiolar cell exposure to GaAs and InAs dust represents a potential hyperplasia, pneumonia, and emphysema and metaplastic health hazard, but the degree of risk has not yet been ossification after InAs exposure in rats and hamsters. fully defined. Recent experiments have investigated the Kabe et al.14) using mice and oral and intraperitoneal (i.p.) acute toxicity of GaAs and InAs particulate fractions routes of exposure reported a dose dependent increase in which are soluble under physiologically relevant in vitro lung weight. Extramedullary granulopoiesis, conditions and produce a dose related increase in blood eosinophillic exudates and mononuclear cells were seen arsenic levels. When delivered to rats by either the oral in the pulmonary alveoli after i.p. administration. But or intratracheal route, exposure resulted in decreased body the p.o. administered mice showed no clear relationship weight as well as both quantitative and qualitative changes between the dose and biological effects. On the other in urinary porphyrin excretion7–9). In addition to the hand, InP is reported to cause pulmonary inflammation above, there have been a number of other studies and the particles remained in the lower airways for nearly demonstrating the solubility of GaAs particles in vivo seven days16, 17). A dose dependent increase in superoxide and the tissue distribution and excretion patterns of Ga dismutase (SOD) and the lactate dehydrogenase (LDH) and As over time after the administration of GaAs activity in the bronchioalveolar lavage fluid (BALF) was particles via a variety of routes10). These results lead to also found in InP exposed rats17), but these studies clearly the conclusion that particles of GaAs and InAs are indicate adverse effects of these semiconductor materials degraded

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