LITHOLOGIC MCIPPING of SILICATE ROCKS USING TIMS Common Rock

LITHOLOGIC MCIPPING of SILICATE ROCKS USING TIMS Common Rock

LITHOLOGIC MCIPPING OF SILICATE ROCKS USING TIMS f4.F:. Gillespie Geclogy Group Jet Propulsion Laboratory Cali+ornia Institute of Technology F'asadena, California 91109 ABSTRACT Common rock-forning ninerals have therral infrared spectral features that are measured in the laboratory to infer composition, NASA nu# operates an airborne Oaedalus scanner (TlHSI that collects six channels of theraal infrared radiance data (0 to 12 un) that may be used to neasure these same features for rock identification. Previously, false-color composite pictures lade fror ihaiiitels 1,3, and J and enittance spectra fnr srall areas OR these iBages have been used to nake lithologic maps. In this article, central wavelength, standard deviation and aaplitude of norral curves repressed on the erittance spectra are related to compositional infornation fur crystrfffnr fpnraus silicate rocks. As expected, the central wavelength varies systenatically Nith silica content and with nodal quartz content. Standard deviation is less sensitive to compositional changes, but large values aay result froa aixed rock types within a pixel. Aaplitude varies with quartz content and also with adnixture of vegetation. Compression of the six TXHS channels to three irage channels nade fror the regressed parameters aay be effective in inproving geologic mapping fror TINS data, and these synthetic iaaqes nay fora a basis for the remote assessaent of rock conposition. INTRODUCTION Common rock-forming minerals have thermal infrared spectral characteristics khat can be used to infer rock compositions and construct lithologic maps from remotely sensed images. The strongest spectral features lie between 8 and 10 m and are attributed to the fundamental vibrations of Si-0 [e.g., Hunt and Saiisbury, 1974; iiunt, i9iiOj. These ~eststrahlei,bands are most pronounced in quartz. Partial substitution of 41, Mg or other elements for Si in a wide range of silicate minerals results in changes in the width, depth and wavelength of the band, as well as changes in its fine structure Ce.g., Lyon, 19653. For example, reststrahfen bands for quartz (SiO,) are centered near 8.6-9.2 m; for albite cNaGISinB=i !at about 8.7-9.9 ram; and far olivine ( (Mg,Fe)2Si04) at about 10.0-10.5 m. Although rock spectra are not simple mixtures of mineral spectra, systematic dif+erences in the emittance spectra of rocks do correspond to features in the spectra of the major constituent minerals. These dif+erences are sufficient to produce distinct differences in the apparent temperatures measured remotely, at different wave- lengths. Thus multispectral thermal measurement.5 are a means of 29 4 assess;ing rock composition, and multichannel thermal. infrared image-s are a mean5 of extending this information regionally, to form a basis for lithologic maps Ce.gb, Vincent et al., i972; Khhle and Rowan, i9eOI. F:ecentl y , NASA has acqui red a Thermal Infrared Mu1 ti spectral Scanner [TINS) that measures six channels of photon flux data in the spectral region 8-12 m CFalfuconi and Meeks, 19851. Previously, TIMS data have been displayed as false-color pictures made .from three of the six image channels, enhanced to emphasize emittance information CSoha and Schwar-tz, 1978; Gillespie et al., 19867. This approach does not make use od information from the discarded image channels. In a different approach, thermal emittances may be calculated from each of the image channels and displayed ac, spectra CKahle and Walker, 19841. Although in this approach no data are discarded, the obvious advantages of photo- interpretation cannat be expfnited tiecause the data are no longer displayed 35 pictures. If the emittance images themselve5 are displayed as false-color pict~res,then three channels must still be di scar-ded. This paper discct5ses a method that combines the virtues of both the pictorial and spectral analyses. I model the calculated emittance spectra with Gaussian functicns, which have only three parameters: a central wavelength, a standard deviation and an amp1 i tude. In principle, these may be displayed using cslor p i ct Ltr e5. Because the displayed parameters are calculated frum all six measured valuer, mure informatian is displayed than in false-calor pictures made from the acquired data. In this paper, I attempt to show that significant lithologic information is contained in these calculated parameters, and that they vary systematically with conventional measures of composition. The three parameters thus form a basis for quantitative photo- interpretaticn and lithologic mapping. DATA 4CPUISITION TIMS Data TIMS is a Eaedaluc, airborne line-scanner operated by NMA on its NSTL Lear jet. TfMS acquires 5ix channels of radiance (photon flux) data in spectral bands having peak. sensitivities at 8.3, 8.7, 9.1, 9.8, lG.4, and 11.3 m, respectively. Details of the instrument are available in Fallucuni and Meeks C19851. During the summpr of 1?82 TIMS was flown over granitic rock5 in the Sierra Nevada batholith, California, and again over the Josephine ophictlite in northern California and southern Oregon, acquiring data for a wide range of crystalline igneous silicate rocks. TIMS data acquired over Death Valley, California CKahle and Walker, 13841 were used ta augment these data. TIMS was flcjwn near DGO~ta maximize the thermal radiance and hence the 5ignaf/naise ratio. Data were provided to JF'L by NASA/NSTL as computer-compatible tapes. 30 A,!?, Gillespie: napping Silicate Rucks,. , Ancillary Data Thermal reflectance spectra were measured fot- representative rock samples collected in the field, c1n freshly broken and natural weathered surfaces. This was done at JPL using an Analect Fourier Transform Infrared Spectrometer. Spectra were averaged far roughly 25 locations OR each rock sampl?, depending on grain size, to ensure that they represented the brtlk rock composition and could be related to TIMS data collected nver outcrop areas of “400 mz. Estimates were made of the modal mineral abundances in selected samples by point counts of thin sectians CGillespie and Abbutt, 19843. Si& content was measured by electron microprobs analpis of glass beads fused from powdered rock sample5 Ce.g., Nash, 1964; Ealdridge, 19797. Results were checked against values calculated from the modal mineral abundances for the same ;amp1 es. DATA PROCESSING TIMS Data Calibration and Correction.., The TIMS images were corrected for systematic panoramic distortions using a nearest-neighbor algo-- rithrn (not interpolation), to avoid further spectral mising than was inherent in the data as acquired. The data were converted ta units of photon flux, using the line-by-line internal blackbody reference or calibration values. Some additional aspects af required image processing are found in a companion paper CGillespie, 19867. After the data were corrected for instrurnent effects, emittance values were calculated for the sis image channels, using a variation of the method of Kahle et al. L-19807. Calculating Emittances From TIUS Data, . In order to calculate emittances fram TIMS data, it is necessary to as5urr;e an smittance for one channel because there are seven unknowns (six emittances and the temperature) but only six radiance measurements. Eased on this assumption, a model ground temperature tan be calculated far each point in the image. Emittances for the other charrneis are then found from the measured photon flux ratioed tc. the flt-ix predicted by Pianck’s Law for a blackbody at the madel tempera- ture. In this way, emittance images +or all six cbanfiels were constructed fram the acquired radiance images. Kahle et al. C19801 assumed the emittance in channel h was always 0.93. This is valid for granites, but not for maSic and ultra- mafic rocks, which have low emittances neir 11 m. Fsr these rocks the reststrahlen band lies at longer wavelengths than channel 1, and the emittance in channel 1 is more-or-less constant. Therefare, for granitic rocks ths assumption of Kahle et al. C19603 was used, but for mafic and ultrarnz.fic rocks the 31 emiktance in channel 1 war, taken to be 0.98, a value that was measured +or several. sasples on the Flnalect spectrometer. In ths future a more elegant solution would be to calculate the apparent blackbody temperature for each TIMS channel; the channel for which the maximu.. temperature t4as found would be assigned XIarbitrary emittance <e.g., 0.951, and the remaining emittances would be calculated as described above. It would be useful to create an image that reported the channel which had the may i mu= temperature, a1 so. For this study, however, the simplified scheme in which either channel 1 or b was fixed was iised. Atmospheric €ffects-.* The method of calculating emittances described above does not correct for atmospheric effects such as absarption and radiatior! by water vapor. While model corrections have been applied tKahle et al., 19811, these depend on some kcowledge of the air ma55 above the scene at the time of data acquisition. For the images used in this study, that vital information was lacking. However, recent. investigations with JFL’s Portable Field Emission Spectrometer have shown that vegetation is spectrally flat in the 8-12 ,xm region. Any observed structure in the TIMS emittance spectra of vegetation is thus a measure of actual atmospheric effects. Therefore, atmospheric efSects were reduced by normal- izing the ralrtllated emittance5 to values found for vegetation in the same scene. This approach is valid for multiplicative mixing (e.g., translucent atmosphere) but ntst for additive mixing (e.g., radiating atmosphere!. It is valid only for a similar optical path through a single air mass; thus the target and the vegeta- tion mu5t be at similar scan angles and elevations, and must be viewed through the same mass of air. Water vapor affects primarily TIMS channel 1, whereas atmaspheric ozone affect5 channel 4. The effect OR channel 1 appears to be stronger and more variable than for channel 4.

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