AFM Probes Catalogue Quality meets Price Index: Silicon AFM Probes Diamond-Like-Carbon AFM Probes Tapping Mode Tap300-G / Tap300Al-G p. 2 Tapping Mode Tap300DLC p. 22 Tapping Mode (Long Cantilever) Tap190-G / Tap190Al-G p. 3 Tapping Mode (Long Cantilever) Tap190DLC p. 23 Soft Tapping Mode Tap150-G / Tap150Al-G p. 4 Soft Tapping Mode Tap150DLC p. 24 Force Modulation Mode Multi75-G / Multi75Al-G p. 5 Force Modulation Mode Multi75DLC p. 25 Contact Mode Contact-G / ContAl-G p. 6 Contact Mode ContDLC p. 26 Conductive AFM Probes Silicon Nitride AFM Probes SiNi p. 28 Tapping Mode ElectriTap300-G p. 8 Tapping Mode (Long Cantilever) ElectriTap190-G p. 9 All In One - Silicon AFM Probes Soft Tapping Mode ElectriTap150-G p.10 AIO with 4 different cantilevers All-In-One / All-In-OneAI p. 31 Force Modulation Mode ElectriMulti75-G p.11 4 tipless cantilevers Tipless-All-In-One / Tipless-All-In-OneAl p. 32 Contact Mode ElectriCont-G p.12 4 conductive cantilevers ElectriAll-In-One p. 33 4 DLC coated cantilevers All-In-One-DLC p. 34 GOLD Series 4 diamond coated cantilevers All-In-One-DD p. 35 Tapping Mode and special applications Tap300GD-G / Tap300GB-G p. 14 Tapping Mode (Long Cantilever) Tap190GD-G / Tap190GB-G p. 15 Мixed box of AFM Probes BudgetComboBox p. 36 and special applications Soft Tapping Mode and special applications Tap150GD-G / Tap150GB-G p. 16 Single Hi-Res AFM Probes SHR300 p. 39 Force Modulation and special applications Multi75GD-G / Multi75GB-G p. 17 SHR150 p. 40 Contact Mode and special applications ContGD-G / ContGB-G p. 18 SHR75 p. 41 Calibration Standards Magnetic AFM Probes Multi75M-G p.20 AFM Tip Characterizer TipCheck p. 43 Height Calibration Standards HS-20MG / HS-100MG / HS-500MG p. 44 XYZ Calibration Nanogrid CS-20NG p. 45 Image Gallery Gallery of application images p. 46 WWW.BUDGETSENSORS.COM Silicon AFM Probes WWW.BUDGETSENSORS.COM -2- Tap300-G Tap300Al-G Tapping Mode Tap300-G-10 Tap300Al-G-10 probes Tip Height Tap300-G-50 Tap300Al-G-50 probes Tip Setback Tap300-G-380 Tap300Al-G-380 probes Tap300Al-G Coating: Technical Data: VALUE RANGE Application: Tapping Mode, Intermittent Contact Mode Resonance Frequency 300 kHz ± 100 kHz Force Constant 40 N/m 20 to 75 N/m Coating: None (Tap300-G) or 30nm thick Aluminum reflex Length 125 µm ± 10 µm coating (Tap300Al-G) Mean Width 30 µm ± 5 µm Thickness 4 µm ± 1 µm The AFM Probe is micromachined, made of monolithic The AFM Probe Holder Chip has alignment grooves on Tip Height 17 µm ± 2 µm Silicon, exhibiting excellent uniformity and a sharp tip radius. the backside and fits most commercial AFMs as it is industry Tip Setback 15 µm ± 5 µm The consistent tip radius of less than 10 nm gives good standard size. resolution and reproducibility. Tip Radius <10 nm Chip size: 3.4 x 1.6 x 0.3 mm This probe uses an “on scan angle” symmetric tip to provide a 20°-25° along cantilever axis more symmetric representation of features over 200 nm. Half Cone Angles 25°-30° from side 10° at the apex View image gallery for application images taken with this product! WWW.BUDGETSENSORS.COM -3- Tapping Mode Tap190-G Tap190Al-G Tap190-G-10 Tap190Al-G-10 probes Tip Height Tap190-G-50 Tap190Al-G-50 Tip Setback probes Tap190-G-380 Tap190Al-G-380 probes Technical Data: VALUE RANGE Application: Tapping Mode, Intermittent Contact Mode Resonance Frequency 190 kHz ± 30 kHz Coating: None (Tap190-G) or 30nm thick Aluminum reflex Force Constant 48 N/m 28 to 75 N/m coating (Tap190Al-G) Length 225 µm ± 10 µm Mean Width 38 µm ± 5 µm Thickness 7 µm ± 1 µm The AFM Probe is micromachined, made of monolithic The AFM Probe Holder Chip has alignment grooves on Silicon, exhibiting excellent uniformity and a sharp tip radius. the backside and fits most commercial AFMs as it is industry Tip Height 17 µm ± 2 µm The consistent tip radius of less than 10 nm gives good standard size. Tip Setback 15 µm ± 5 µm resolution and reproducibility. Chip size: 3.4 x 1.6 x 0.3 mm Tip Radius <10 nm This probe uses an “on scan angle” symmetric tip to provide a 20°-25° along cantilever axis more symmetric representation of features over 200 nm. Half Cone Angles 25°-30° from side 10° at the apex WWW.BUDGETSENSORS.COM -4- Tap150-G Tap150Al-G Soft Tapping Mode Tap150-G-10 Tap150Al-G-10 probes Tip Height Tap150-G-50 Tap150Al-G-50 probes Tip Setback Tap150-G-380 Tap150Al-G-380 probes Technical Data: VALUE RANGE Application: Soft Tapping Mode, Intermittent Contact Mode Resonance Frequency 150 kHz ± 75 kHz Force Constant 5 N/m 1.5 to 15 N/m Coating: None (Tap150-G) or 30nm thick Aluminum reflex Length 125 µm ± 10 µm coating (Tap150Al-G) Mean Width 25 µm ± 5 µm Thickness 2.1 µm ± 1 µm The AFM Probe is micromachined, made of monolithic The AFM Probe Holder Chip has alignment grooves on Tip Height 17 µm ± 2 µm Silicon, exhibiting excellent uniformity and a sharp tip radius. the backside and fits most commercial AFMs as it is industry Tip Setback 15 µm ± 5 µm The consistent tip radius of less than 10 nm gives good standard size. resolution and reproducibility. Tip Radius <10 nm Chip size: 3.4 x 1.6 x 0.3 mm This probe uses an “on scan angle” symmetric tip to provide a 20°-25° along cantilever axis more symmetric representation of features over 200 nm. Half Cone Angles 25°-30° from side 10° at the apex WWW.BUDGETSENSORS.COM -5- Force Modulation Multi75-G Multi75Al-G Multi75-G-10 Multi75Al-G-10 probes Tip Height Multi75-G-50 Multi75Al-G-50 Tip Setback probes Multi75-G-380 Multi75Al-G-380 probes Technical Data: VALUE RANGE Application: Force Modulation Mode, Light Tapping Mode, Pulsed Force Mode (PFM) Resonance Frequency 75 kHz ± 15 kHz Force Constant 3 N/m 1 to 7 N/m Coating: None (Multi75-G) or 30nm thick Aluminum reflex Length 225 µm ± 10 µm coating (Multi75Al-G) Mean Width 28 µm ± 5 µm Thickness 3 µm ± 1 µm The AFM Probe is micromachined, made of monolithic The AFM Probe Holder Chip has alignment grooves on Silicon, exhibiting excellent uniformity and a sharp tip radius. the backside and fits most commercial AFMs as it is industry Tip Height 17 µm ± 2 µm The consistent tip radius of less than 10 nm gives good standard size. Tip Setback 15 µm ± 5 µm resolution and reproducibility. Chip size: 3.4 x 1.6 x 0.3 mm Tip Radius <10 nm This probe uses an “on scan angle” symmetric tip to provide a 20°-25° along cantilever axis more symmetric representation of features over 200 nm. Half Cone Angles 25°-30° from side 10° at the apex WWW.BUDGETSENSORS.COM -6- Contact-G ContAl-G Contact Mode Contact-G-10 ContAl-G-10 probes Tip Height Contact-G-50 ContAl-G-50 Tip Setback probes Contact-G-380 ContAl-G-380 probes Technical Data: VALUE RANGE Application: Contact Mode Resonance Frequency 13 kHz ± 4 kHz Force Constant 0.2 N/m 0.07 to 0.4 N/m Coating: None (Cont-G) or 30nm thick Aluminum reflex Length 450 µm ± 10 µm coating (ContAl-G) Mean Width 50 µm ± 5 µm Thickness 2 µm ± 1 µm The AFM Probe is micromachined, made of monolithic The AFM Probe Holder Chip has alignment grooves on Tip Height 17 µm ± 2 µm Silicon, exhibiting excellent uniformity and a sharp tip radius. the backside and fits most commercial AFMs as it is industry Tip Setback 15 µm ± 5 µm The consistent tip radius of less than 10 nm gives good standard size. resolution and reproducibility. Tip Radius < 10 nm Chip size: 3.4 x 1.6 x 0.3 mm This probe uses an “on scan angle” symmetric tip to provide 20°-25° along cantilever axis a more symmetric representation of features over 200 nm. Half Cone Angles 25°-30° from side 10° at the apex WWW.BUDGETSENSORS.COM Conductive AFM Probes WWW.BUDGETSENSORS.COM -8- ElectriTap300-G Conductive AFM Probes Tap300E-G-10 The AFM Probe Holder Chip has alignment grooves probes on the backside and fits most commercial AFMs as it is industry standard size. Tip Height Tap300E-G-50 probes Chip size: 3.4 x 1.6 x 0.3 mm Tip Setback The AFM Probe is micromachined, made of monolithic Silicon, exhibiting excellent uniformity and a sharp tip radius. The consistent tip radius of less than 25 nm gives good resolution and reproducibility. This probe uses an “on scan angle” symmetric tip to provide a more symmetric representation of features over 200 nm. Technical Data: VALUE RANGE Resonance Frequency 300 kHz ± 100 kHz Force Constant 40 N/m 20 to 75 N/m Application: Tapping, Intermittent Contact and electric modes such as: Length 125 µm ± 10 µm • Scanning Capacitance Microscopy (SCM) Mean Width 30 µm ± 5 µm • Electrostatic Force Microscopy (EFM) Thickness 4 µm ± 1 µm • Kelvin Probe Force Microscopy (KPFM) Tip Height 17 µm ± 2 µm Tip Setback 15 µm ± 5 µm Tip Radius <25 nm Coating: Electrically conductive coating of 5 nm Chromium and 20°-25° along cantilever axis 25 nm Platinum on both sides of the cantilever. Half Cone Angles 25°-30° from side This coating also enhances the laser reflectivity 10° at the apex of the cantilever. Contact Resistance 300 Ohm on Platinum thin film surface WWW.BUDGETSENSORS.COM -9- Conductive AFM Probes ElectriTap190-G The AFM Probe is micromachined, made of monolithic Tap190E-G-10 Silicon, exhibiting excellent uniformity and a sharp probes Tip Height tip radius.