ISTFA™ 2002: Conference Proceedings from the 28th Copyright © 2002 ASM International® International Symposium for Testing and Failure Analysis All rights reserved. November 03–November 07, 2002, Phoenix, Arizona, USA www.asminternational.org DOI: 10.31399/asm.cp.istfa2002fm01 ISTFA 2002 Organizing Committee Christian Boit General Chair University of Technology Berlin Berlin, Germany Thomas M. Moore Vice General Chair Omniprobe, Inc. Dallas, TX Richard J. Ross Past General Chair IBM Microelectronics Essex Junction, VT Matt Thayer Symposium Technical Program Chair Advanced Micro Devices Austin, TX Cheryl Hartfield Audio / Visual Chair Texas Instruments Dallas, TX Lee Knauss Publicity Chair Neocera Beltsville, MD Anu Barman Exposition Chair Foveon, Inc. Santa Clara, CA Ingrid DeWolf Panel Discussion & User Group Chair IMECvzw Leuven, Belgium Jerry M. Soden Seminar Chair Sandia National Laboratories Albuquerque, NM iii Downloaded from http://dl.asminternational.org/istfa/proceedings-pdf/ISTFA2002/30774/iii/419327/istfa2002fm01.pdf by guest on 25 September 2021 EDFAS 2002 - 2003 Board of Directors Richard J. Ross Christian Boit EDFAS President Director-At-Large IBM Microelectronics Division University of Technology Berlin Essex Junction, VT Berlin, Germany Edward I. Cole, Jr. Sandra Delgado EDFAS Immediate Past President Director-At-Large Sandia National Laboratories Accurel Systems International Albuquerque, NM Sunny vale, CA Gary F. Shade Jim Erickson EDFAS Vice President Director-At-Large Intel Colorado Springs Design Center Boeing Satellite Systems Colorado Springs, CO Los Angeles, CA Daniel L. Barton Charles F. Hawkins EDFAS Secretary Director-At-Large Sandia National Laboratories University of New Mexico Albuquerque, NM Albuquerque, NM Glen P. Gilfeather Jacob C. H. Phang EDFAS Financial Officer Director-At-Large Advanced Micro Devices National University of Singapore Austin, TX Singapore EDFAS 2002 - 2003 Committee Chairs ASM Board of Trustees Liaison EDFAS Website Committee Reza Abbaschian Jerry Soden, Chair University of Florida Sandia National Laboratories Gainsville, FL Albuquerque, NM EDFAS Membership Committee EDFAS Events Committee Seshu Pabbisetty, Chair Christian Boit, Chair Texas Instruments University of Technology Berlin Stafford, TX Berlin, Germany EDFAS Nominations Committee EDFAS Education Committee Edward I. Cole, Jr., Chair Gary Shade, Acting Chair Sandia National Laboratories Intel Colorado Springs Design Center Albuquerque, NM Colorado Springs, CO EDFAS Publications Committee EDFA Magazine Committee Terence Kane, Chair Chuck Hawkins, Chair IBM Microelectronics Division University of New Mexico Hopewell Junction, NY Albuquerque, NM iv Downloaded from http://dl.asminternational.org/istfa/proceedings-pdf/ISTFA2002/30774/iii/419327/istfa2002fm01.pdf by guest on 25 September 2021 ISTFA 2002 COMMITTEE MEMBERS AV Committee Cheryl Hartfield, Chair Texas Instruments, Dallas, TX Ed Keyes, Co-Chair Semiconductor Insights, Ottawa, Ontario, Canada Mikel Miller Intel Corporation, Chandler, AZ Zhiyong Wang Intel Corporation, Chandler, AZ Todd McMullin Texas Instruments, Dallas, TX Jim Colvin Jim Colvin ConSUlting Services, Newark, CA Tom Moore Omniprobe, Inc., Dallas, TX Panel Discussion Committee Ingrid DeWolf, Chair IMECvzw, Leuven, Belgium Steve Ferrier Metatech Corporation, Corvallis, OR Joseph Bernstein University of Maryland, College Park, MD Chuck Hawkins University of New Mexico, Albuquerque, NM Gay Samuelson Intel Corporation, Chandler, AZ Christian Boit University of Technology Berlin, Berlin, Germany Seminar Committee Jerry M. Soden, Chair Sandia National Laboratories, Albuquerque, NM Kendall Scott Wills, Co-Chair Texas Instruments, Stafford, TX Susan Li Advanced Micro Devices, Sunnyvale, CA Catherine Marcey Intel Corporation, Folsom, CA Brent Wahl Agilent Technologies, San Jose, CA Jeremy A. Walraven Sandia National Laboratories, Albuquerque, NM Brad Waterson Analog Devices, Cambridge, MA William E. Vanderlinde Laboratory for Physical Sciences, College Park, MD User Group Committee Ingrid DeWolf, Chair IMECvzw, Leuven, Belgium Paiboon Tangyunyong Sandia National Laboratories, Albuquerque, NM Alan Street Integrated Reliability, San Diego, CA Tom Paquette Insight Analytical Labs, Inc., Colorado Springs, CO Kartik Ramanujchar Texas Instruments, Stafford, TX Seshu Pabbisetty Texas Instruments, Stafford, TX K.N (Bobby) Hooghan Agere Systems, Allentown, PA William Vanderlinde Laboratory for Physical Sciences, College Park, MD Jim Colvin Jim Colvin Consulting Services, Newark, CA Andy Erickson Multiprobe Inc., Santa Barbara, CA Advanced Techniques Committee Lee Knauss, Chair Neocera, Inc., Beltsville, MD Kendall Scott Wills, Vice Chair Texas Instruments, Stafford, TX Ted Levin IBM, Essex Junction, VT Tony Peterson Intel Corporation, Hillsboro, OR Jan Gaudestad Neocera, Inc., Beltsville, MD Zhiyong Wang Intel Corporation, Chandler, AZ Edward I. Cole, Jr. Sandia National Laboratories, Albuquerque, NM Charles Zhang Advanced Micro Devices, Austin, TX v Downloaded from http://dl.asminternational.org/istfa/proceedings-pdf/ISTFA2002/30774/iii/419327/istfa2002fm01.pdf by guest on 25 September 2021 ISTFA 2002 COMMITTEE MEMBERS Die Level Fault Isolation Dave Vallett, Chair IBM Microelectronics Division, Essex Junction, VT Ted Hasegawa, Co-Chair National Semiconductor, Santa Clara, CA Jim Cargo Agere, Allentown, PA Moyra McManus IBM, Yorktown Heights, NY Travis Eiles Intel Corporation, Santa Clara, CA Aaron Falk Optometrix, Inc., Renton, WA Jerry Soden Sandia National Laboratories, Albuquerque, NM Tam Le ST Microelectronics Inc., Carrollton, TX Siva Kolachina Texas Instruments, Stafford, TX Rama Goruganthu Advanced Micro Devices, Austin, TX Discretes, Passive Jim Erickson, Chair Boeing Satellite Systems, Inc, Los Angeles, CA Stan Silvus Southwest Research Institute, San Antonio, TX Gary Molle Kaiser Electronics, San Jose, CA Mike Cozzolino Boeing Satellite Systems, Los Angeles, CA Gary Ewell The Aerospace Corporation, Los Angeles, CA Massimo Vanzi Universita' di Cagliari, Cagliari, Italy Failure Analysis Process Christopher Henderson, Chair Sandia National Laboratories, Albuquerque, NM Steve Ferrier, Co-Chair Metatech Corporation, Corvallis, OR Tom Libbey National Semiconductor, Arlington, TX Hei-Ruey Harry Jen MIA-COM Tyco Electronics, Lowell, MA George Gaut Conexant Systems, Inc., Newport Beach, CA Edward Keyes Semiconductor Insights, Inc., Ottawa, Ontario, Canada MEMS Jeremy Walraven, Chair Sandia National Laboratories, Albuquerque, NM Roland Muller-Fiedler Robert Bosche GmbH, Stuttgart, Germany Susanne Arney Bell Labs, Lucent Technologies, Murray Hill, NJ Ingrid De Wolf IMECvzw, Leuven, Belgium Francis Pressecq CNES, Toulouse, France Brad Waterson Analog Devices, Cambridge, MA Ted Lundquist Schlumberger Probe Systems, San Jose, CA Metrology & Materials Analysis Alain Diebold, Chair International SEMATECH, Austin, TX Syd Wilson Motorola Semiconductor Products Sector, Tempe, AZ Bryan Tracy Advanced Micro Devices, Sunnyvale, CA Dale Sheu International SEMATECH, Austin, TX William Vanderlinde DoD Laboratory for Physical Sciences, College Park, MD Military Dave Dylis, Chair liT Research Institute, Reliability Analysis Center, Rome, NY Joe Buben Defense Supply Center Columbus, Columbus, OH George Slenski US Air Force, Wright Patterson AFB, OH Jack Henderson Naval Surface Warfare Center, Crane, IN Perry Martin Martin Testing Labs, McClennan, CA vi Downloaded from http://dl.asminternational.org/istfa/proceedings-pdf/ISTFA2002/30774/iii/419327/istfa2002fm01.pdf by guest on 25 September 2021 ISTFA 2002 COMMITTEE MEMBERS Optical Probing Dan Bodoh, Chair Motorola, Austin, TX Ken WiIsher, Co-Chair Schlumberger TT, San Jose, CA Loon Ming Micron Semiconductor Asia, Singapore Brennan Davis Advanced Micro Devices, Austin, TX Moyra McManus IBM, Yorktown Heights, NY Package Level Analysis Rajen Dias, Chair Intel Corporation, Chandler, AZ Rama Goruganthu, Co-Chair Advanced Micro Devices, Austin, TX Cheryl Hartfield Texas Instruments, Dallas, TX Thomas Moore Omniprobe, Inc., Dallas, TX Deepak Goyal Intel Corporation, Chandler, AZ Poster Sandra Delgado, Chair Accurel Systems International, Sunnyvale, CA David Su TSMC, Hsinchu City, Taiwan Joe Buben Defense Supply Center Columbus, Columbus, OH Perry Martin Martin Testing Labs, McClellan, CA Jack Henderson Naval Surface Warfare Center, Crane, IN Dave Dylis liT Research Institute, Reliability Analysis Center, Rome, NY Sample Preparation Kei-Wean Yang, Chair Tektronix Inc., Beaverton, OR Mark Kimball, Co-Chair Maxim Integrated Products, Beaverton, OR Michael Ruprecht Infineon Technologies, Williston, VT Victoria Bruce Advanced Micro Devices, Austin, TX SPM Techniques Jim Colvin, Chair Jim Colvin Consulting Services, Newark, CA Andy Erickson Multiprobe Inc., Santa Barbara, CA Peter Harris Digital Instruments, Santa Barbara, CA Michael Bruce Advanced Micro Devices, Austin, TX Jeffery McMurray IBM Microelectronics, Hopewell Jct., NY Bernd Ebersberger Infineon Technologies AG, Munich, Germany System Level Analysis Jie Xue, Chair Cisco Systems, Inc., Salem, NH Jeff Birdsley, Co-Chair Dell Computer Corporation, Round Rock, TX Ernest Sirois Motorola, Personal Communication Sector, Libertyville, IL Sridhar Canumalla Nokia, Irving, TX Charlie Zhia Advanced Micro Devices, Sunnyvale, CA Robert Knoell Visteon Corporation, Dearborn, MI Test Jerry Soden, Chair Sandia National Laboratories, Albuquerque, NM Rob Aitken Agilent Technologies, Santa Clara, CA Anne Gattiker IBM Corporation, Austin, TX Chuck Hawkins University of New Mexico, Albuquerque, NM Anjali Kinra Texas Instruments, Inc., Stafford, TX PKOng Advanced Micro Devices, Austin, TX Vll Downloaded from http://dl.asminternational.org/istfa/proceedings-pdf/ISTFA2002/30774/iii/419327/istfa2002fm01.pdf by guest on 25 September 2021 ISTFA 2002 COMMITTEE MEMBERS Yield Enhancement Tom Taylor, Chair Infineon Technologies, Sandston, VA Cary Gloor LSI Logic Corporation, Ft. Collins, CO Sam Subramanian Motorola, SPS, Austin, TX Alfredo Herrera Advanced Micro Devices, Austin, TX viii Downloaded from http://dl.asminternational.org/istfa/proceedings-pdf/ISTFA2002/30774/iii/419327/istfa2002fm01.pdf by guest on 25 September 2021.