<p>EE290G Hwk #1 Qing Xu 13760141</p><p>1. 1) IEEE/ASME Journal of MEMS Call number: TK153 J6 The recent issues are located on the first floor, near the northwest corner of the library. The bound back issues are located on the shelf on the second floor to the left of entrance, almost in the middle. The editor-in-chief of the journal is Richard Muller. Roger Howe is on the editorial board. </p><p>2) Sensors and Actuators A (Physical) Call Number: TJ 233 T7 S44 The current issues are put close to the J of MEMS close to the northwest corner of the library. The bounded back issues are also on the second floor to the left of the entrance of the library. They are much closer to the entrance than the latter. The editor-in-chief is S.Middelhoek of Netherland. Roger Howe and alumnus L-S Fan is on the editorial board. </p><p>2. One of other MEMS related journals is Microsystem Technologies. The call number is TK 7874.M4886. The recent issues are opposite to the recent issues of J. of MEMS. The back issues are located on the second floor to the left of the entrance, quite close to the stair to the first floor. The editor is H.Reichl. Roger Howe and Albert Pisano are on the editorial board.</p><p>There are far not enough journals related to MEMS in the library. 3. Among those researchers---- Mark Allen got his PhD from MIT and is working in Georgia Tech now. Miko Elwenspoek got PhD from Freie Universitat Berlin and is working in Enschede, Netherland. Hiroyuki Fujita got PhD from Tokyo University and is working in the same school now. Henry Beltes got PhD from ETH Zurich and is working there now.</p><p>Can’t find articles by Henry Guckel, Isao Shimoyama, Kurt Peterson and Toshio Fukuda without using computer. Are they still active in the research?</p><p>4. The article I found is, "Time-resolved measurement of optical MEMS, using stroboscopic interferometry," M. Hart, R. Conant, K.-Lau, R.S. Muller proc. Transducers '99, Sendai, Japan, June 1999, pp. 470-473. In this article the authors used a system based on stroboscopic interferometry to measure the out of plane displacement and deformation of micro-machined structure with nanometer accuracy and sub-micro second time resolution. 5. My favorite paper that I saw while preparing this homework is "Silicon Processed Microneedles," Liwei Lin and A.P. Pisano IEEE/ASME Journal of Microelectromechanical Systems, Vol. 8, pp.78-84, March, 1999.</p><p>6. The best place to read in the library is the cubicles overlooking the first floor where you can have both privacy and fresh air. </p>