T&MW Honors 2008 Award Winners

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T&MW honors 2008 award winners

Russ Pratt, publisher, and Rick Nelson, Editor in Chief, presented awards to the recipients of the Test Engineer of the Year award, the Best in Test awards, the Test Product of the Year award, and the Test of Time award -- Test & Measurement World, 4/2/2008 12:44:00 PM

In a ceremony held last evening in Las Vegas, NV, Test & Measurement World honored the winners of our 2008 test industry awards. Russ Pratt, publisher, and Rick Nelson, Editor in Chief, hosted the ceremony, during which we presented awards to the recipients of the Test Engineer of the Year award, the Best in Test awards, the Test Product of the Year award, and the Test of Time award.

Hung Nguyen, chief scientist at Raytheon Space and Airborne Systems in El Segundo, CA, accepted the 2008 Test Engineer of the Year award from Nelson. Hung, one of six finalists who we profiled in our October 2007 issue, was voted as the winner by T&MW 's readers. He was recognized for guiding the project team that integrated the various hardware and software components of Raytheon's APG-79 Active Electronically Scanned Array (AESA) radar for the US Navy's F/A-18 aircraft.

As part of his award, Nguyen will designate an engineering or science program to receive a $20,000 grant, courtesy of award sponsors Keithley Instruments and National Instruments. Keithley's Mike Stone and Kevin Hansen and NI's Luke Schreier, Eric Starkloff, and Jaideep Jhangian were on hand to offer Nguyen their congratulations. (You can read more about Nguyen's work in our April cover story, "

Putting teamwork on the radar

.")

Hung Nguyen Also in attendance were the winners of the 2008 Best in Test awards, which honor innovative new products in electronics test, measurement, and inspection. We announced the winning products in our December 2007/January 2008 issue. The following people accepted the awards on behalf of their companies:

• Aeroflex (SMART E Synthetic Test Environment): James E. DeBroeck and Amir Ghanouni • Agilent Technologies (N6705A DC Power Analyzer): Winfried Seipel and Robert Zollo • Cadence Design Systems (Encounter Test Architect GXL): Sanjiv Taneja and Tom Jackson • Dalsa (Falcon 1.4M100 Area Camera): Brad Finney • Fluke (8808A Digital Multimeter): Richard Roddis • Goepel Electronic (ScanAssist): Thomas Wenzel and Heiko Ehrenberg • Pico Technologies (PicoScope 5204 PC Oscilloscope): Mike Miller • Rohde & Schwarz (CMW270 WiMAX Tester): Justin Panzer and AK Emarievbe • Tektronix (DSA7000 Oscilloscope): Chris Martinez • The Fanfare Group (iTest Team): Tom Ryan and David Gehringer

Unfortunately, Advantest (Integrated T2000LS/M4841 SOC Test Cell) and Symmetricom (Q-400 IPTV Probe) were unable to send representatives to the ceremony:

After presenting plaques to the Best in Test winners, Pratt and Nelson announced the winner of the 2008 Test Product of the Year, as selected by a vote of our readers: Agilent's N6705A DC power analyzer. The N6705A combines four DC power-supply modules as well as digital multimeter, oscilloscope, arbitrary waveform generator, and datalogger functions, all in a single mainframe. (See " DC power analyzer wins 2008 honors .") Seipel, R&D project manager, and Zollo, product manager, accepted the Test Product of the Year award for Agilent.

Bob Zollo (left) and Win Seipel (right) of Agilent Technologies received the 2008 Test Product of the Year award from Russ Pratt. Finally, Pratt and Nelson presented the Test of Time award. First presented in 2005, the annual Test of Time award honors a test or inspection product that continues to provide state-of-the-art performance for at least five years after its introduction. Previous winners were Agilent Technologies' (now Verigy's) 93000 SOC tester, Keithley Instruments' 2400 SourceMeter, and National Instruments' LabView.

The winner of the 2008 Test of Time award is Yokogawa's DL750 ScopeCorder, an instrument that offers up to 16 analog inputs, 16 channels, and numerous I/O ports in a portable format. T&MW 's editors presented the award to the ScopeCorder because of its reliability and versatility. The instrument allows users to trigger and capture instantaneous electrical events or make prolonged trend measurements of physical sensors such as thermocouples or strain gages, and it is popular with engineers in a variety of industries. (See " TALKBACK Compact ScopeCorder packs just about everything

.") Yokogawa's Joseph Ting accepted the Test of Time award for his company.

Test & Measurement World inaugurated the awards program in 1991. We are accepting nominations for the 2009 Test Engineer of the Year now, and we will begin accepting nominations for the 2009 Best in Test and Test of Time awards in August 2008. For more information and to read about past winners, see T&MW Awards Programs .

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Russ Pratt presented the 2008 Test of Time award to Joseph Ting of Yokogawa.

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