Midwave-Infrared Laser Unequal Path Interferometer

TESTING Testing of optics and electro-optical imaging systems

PRODUCTS Precision optical metrology equipment

ENGINEERING System engineering for optical and metrology products The IR LUPI (Laser Unequal Path Interferometer) operates at a wavelength of 3.39 micrometers and features an internal He-Ne IR laser MANUFACTURING as well as an integral collinear visible alignment laser. The IR LUPI is the Prototyping and production of electro-optical systems ideal instrument for testing mid-wave infrared imaging systems of any size or complexity.

State-of-the-Art Designed to Maximize Resolution and Accuracy Your Productivity N Includes a 640x512 N Integrated zoom, , high-resolution cooled InSb and panning provide optimized viewing of the fringe pattern N Features Diffraction International’s Durango™ fringe analysis software N Optional objective lenses convert the output to a diverging beam for N System accuracy specified as 0.008 λ testing , lenses, and other RMS @ 3.39µm, with repeatability of Visit us at www.optikos.com imaging systems 0.001 λ RMS (Static Fringe Analysis) 107 Audubon Road N An optional Translation Base Building 3 provides extended 3-axis positioning Wakefield, MA 01880 travel offering unprecedented Phone: 617-354-7557 positioning flexibility Fax: 617-354-5946 N Email: [email protected] Internal reference mirror features selectable effective reflectivity values of 90%, 40%, and 4% to match the optics under test, available at the turn of a knob Accessories System Specifications

Objectives Specification Description Design Value Accuracy 0.008 λ RMS Wavefront Error (WFE) @ 3.39µm Objective extension tubes for System Mainframe

90˚extension tube elbow mirror Repeatability with Static Fringe Analysis 0.001 λ RMS 1 s @3.39µm Repeatability with Phase-Shifting Fringe Analysis 0.0003 λ RMS 1 s @3.39µm Output Aperture Size with Extension Tubes 25mm diameter and ± 3mm Panning Range Output Aperture Size, maximum 32mm diameter Spatial Sampling 640 x 512 Acquisition Mode Static Fringe Analysis standard; Phase Shifting optional Interferometer Laser Specifications Laser Type HeNe Controls Wavelength 3.39µm N Remote-control Reference Output Power ≥ 4mW Beam Ti p/ Beam Polarization Linear N Variable Attenuator for Camera Alignment Laser Specifications N Selectable Attenuator Laser Type HeNe for Reference Beam Wavelength 0.6328µm N Retroreflector In/Out Output Power ≥ 5mW N Zoom Selector Turret Beam Polarization Linear N Focus Adjustment Mainframe N Aperture Panning XY Envelope Dimensions (LWH) 1500mm x 470mm x 645mm N Reference Path Length Adjust System Optical Axis Height 318mm @ lowest position 641mm @ highest position Translation (with optional Translation Base) Along Optical Axis, coarse Infinite coarse positioning Along Optical Axis, fine ± 38mm via leadscrew Perpendicular to Optical Axis, coarse Infinite coarse positioning Perpendicular to Optical Axis, fine ± 25mm via leadscrew Vertical, fine 323mm total, via leadscrew Electrical Requirements 120 VAC, 60Hz The Optikos IR LUPI is available for immediate order placement Laser Safety CDRH Class IIIb Laser Product as a standard system, or can IEC Class 3B be customized for your unique Weight 175lbs (Mainframe alone) metrology requirements. Examples 350lbs (with optional Translation Base) of available customization would Software include optional positioning means, larger output aperture, and Interferometry Software Diffraction International Durango 10.6µm laser wavelength.

Contact Optikos today to discuss your lens measurement needs. 617-354-7557 [email protected] Sample Durango™ software www.optikos.com data acquisition screen