Studies of Dielectric Breakdown Under Pulsed Power Conditions Palmarin Castro Jr
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Role of Dielectric Materials in Electrical Engineering B D Bhagat
ISSN: 2319-5967 ISO 9001:2008 Certified International Journal of Engineering Science and Innovative Technology (IJESIT) Volume 2, Issue 5, September 2013 Role of Dielectric Materials in Electrical Engineering B D Bhagat Abstract- In India commercially industrial consumer consume more quantity of electrical energy which is inductive load has lagging power factor. Drawback is that more current and power required. Capacitor improves the power factor. Commercially manufactured capacitors typically used solid dielectric materials with high permittivity .The most obvious advantages to using such dielectric materials is that it prevents the conducting plates the charges are stored on from coming into direct electrical contact. I. INTRODUCTION Dielectric materials are those which are used in condensers to store electrical energy e.g. for power factor improvement in single phase motors, in tube lights etc. Dielectric materials are essentially insulating materials. The function of an insulating material is to obstruct the flow of electric current while the function of dielectric is to store electrical energy. Thus, insulating materials and dielectric materials differ in their function. A. Electric Field Strength in a Dielectric Thus electric field strength in a dielectric is defined as the potential drop per unit length measured in volts/m. Electric field strength is also called as electric force. If a potential difference of V volts is maintained across the two metal plates say A1 and A2, held l meters apart, then Electric field strength= E= volts/m. B. Electric Flux in Dielectric It is assumed that one line of electric flux comes out from a positive charge of one coulomb and enters a negative charge of one coulombs. -
Methodology for Analysis of Electrical Breakdown in Micrometer Gaps In
Methodology for Analysis of Electrical Breakdown In Micrometer gaps in Tip-To-Plane Configuration Kemas Tofani, Jean-Pascal Cambronne, Sorin Dinculescu, Ngapuli Sinisuka, Kremena Makasheva To cite this version: Kemas Tofani, Jean-Pascal Cambronne, Sorin Dinculescu, Ngapuli Sinisuka, Kremena Makasheva. Methodology for Analysis of Electrical Breakdown In Micrometer gaps in Tip-To-Plane Configuration. 2018 IEEE 13th Nanotechnology Materials and Devices Conference (NMDC), Oct 2018, Portland, United States. pp.1-4, 10.1109/NMDC.2018.8605855. hal-02324370 HAL Id: hal-02324370 https://hal.archives-ouvertes.fr/hal-02324370 Submitted on 1 Nov 2019 HAL is a multi-disciplinary open access L’archive ouverte pluridisciplinaire HAL, est archive for the deposit and dissemination of sci- destinée au dépôt et à la diffusion de documents entific research documents, whether they are pub- scientifiques de niveau recherche, publiés ou non, lished or not. The documents may come from émanant des établissements d’enseignement et de teaching and research institutions in France or recherche français ou étrangers, des laboratoires abroad, or from public or private research centers. publics ou privés. Methodology for analysis of electrical breakdown in micrometer gaps in tip-to-plane configuration Kemas M Tofani LAPLACE, Université de Toulouse, Jean-Pascal Cambronne Sorin Dinculescu CNRS LAPLACE, Université de Toulouse, LAPLACE, Université de Toulouse, Toulouse, France CNRS CNRS Bandung Institute of Technology Toulouse, France Toulouse, France Bandung, Indonesia [email protected] [email protected] PT. PLN Jakarta, Indonesia Kremena Makasheva [email protected] LAPLACE, Université de Toulouse, CNRS Ngapuli I. Sinisuka Toulouse, France Bandung Institute of Technology [email protected] Bandung, Indonesia [email protected] Abstract—Better understanding of the electrical behavior of electron emission process by ions bombardment on the miniaturized electrical devices is largely supported by the need cathode. -
The Pennsylvania State University
The Pennsylvania State University The Graduate School Department of Materials Science and Engineering TEMPERATURE DEPENDENCE OF DIELECTRIC BREAKDOWN IN POLYMERS A Thesis in Materials Science and Engineering by Cheolhong Min © 2008 Cheolhong Min Submitted in Partial Fulfillment of the Requirements for the Degree of Master of Science August 2008 ii The thesis of Cheolhong Min was reviewed and approved* by the following: Thomas R. Shrout Professor of Materials Science Thesis Co-Advisor Michael T. Lanagan Associate Professor of Engineering Science and Mechanics Thesis Co-Advisor Shujun Zhang Research Associate and Assistant Professor of Materials Science and Engineering Joan Redwing Professor of Materials Science and Engineering Chair, Intercollege Graduate Degree Program in Materials Science and Engineering *Signatures are on file in the Graduate School iii ABSTRACT Capacitors possess high-power densities and have the ability to deliver energy with short discharge times, which are in the micro-second to nano-second range. Both energy and power density are related to the dielectric materials used in the capacitor. One of the main challenges for capacitors is achieving high energy density as determined by the relative permittivity and dielectric breakdown strength of a material. Polymers are some of the most important dielectric materials for high-power capacitors because polymer films show high breakdown strength. A general trend in polymers is that the breakdown strength increases with decreasing temperature. An understanding of the temperature dependence relationships among electrical properties, polymer chemistry, and crystalline structure may lead to improved energy storage for polymer-based capacitors—this is the basis of the thesis. Various polymers including polypropylene (PP), polyimide (PI), polymethyl methacrylate (PMMA), poly(vinylidene fluoride-trifluoroethylene- chlorotrifluoroethylene) terpolymer (p(VDF-TrFE-CTFE)) were investigated in this study. -
Download Technical Paper
TECHNICAL PAPER Thermal and Electrical Breakdown Versus Reliability of Ta2O5 under Both – Bipolar Biasing Conditions P. Vašina, T. Zedníček, Z. Sita AVX Czech Republic, s.r.o., Dvorakova 328, 563 01 Lanskroun, Czech Republic J. Sikula and J. Pavelka CNRL TU Brno, Technicka 8, 602 00 Brno, Czech Republic Abstract: Our investigation of breakdown is mainly oriented to find a basic parameters describing the phenomena as well as its impact on reliability and quality of the final product that is “GOOD” tantalum capacitor. Basically, breakdown can be produced by a number of successive processes: thermal breakdown because of increasing conductance by Joule heating, avalanche and field emission break, an electromechanical collapse due to the attractive forces between electrodes electrochemical deterioration, dendrite formation and so on. Breakdown causes destruction in the insulator and across the electrodes mainly by melting and evaporation, sometimes followed by ignition. An identification of breakdown nature can be achieved from VA characteristics. Therefore, we have investigated the operating parameters both in the normal mode, Ta is a positive electrode, as well as in the reverse mode with Ta as a negative one. In the reverse mode we have reported that the thermal breakdown is initiated by an increase of the electrical conductance by Joule heating. Consequently followed in a feedback cycle consisting of temperature - conductivity - current - Joule heat - temperature. In normal mode an electrical breakdown can be stimulated by an increase of the electrical conductance in a channel by an electrical pulse and stored charge leads to the sample destruction. Both of these breakdowns have got a stochastic behaviour and could be hardly localized in advance. -
Capacitive Power Transfer Through Rotational and Sliding Bearings
CAPACITIVE POWER TRANSFER THROUGH ROTATIONAL AND SLIDING BEARINGS by Skyler S. Hagen A thesis submitted in partial fulfillment of the requirements for the degree of: Master of Science (Electrical Engineering) at the UNIVERSITY OF WISCONSIN – MADISON 2016 i Abstract Throughout the history of electrification, applications have existed for the transmission of electrical energy from stationary sources to moving loads. Electrical equipment which is expected to move along tracks, or in cyclical, pivoting, or rotational patterns of motion often requires externally-supplied electrical power to operate. Various techniques have been used with success in the past such as brushes with sliding contacts [1], cable connections (when practical), and various inductive and capacitive contactless power transfer strategies [2],[3],[4],[5]; however, each has its own limitations in longevity and/or complexity. Applications for power transfer to moving loads proliferate in the automotive and traction industries, as well as automation and manufacturing. Both of these categories have strict requirements on reliability. Failure in operation can be hazardous to human life and property in the case of transportation and heavy equipment traction. In the case of manufacturing, the reliability requirement is justified by the large opportunity cost incurred by machine down time. The following is a proposition for a technology which is well suited for many key modern applications. Using the nanofarad-scale capacitance already present in a variety of rotational and linear journal bearings, along with a simple soft-switching high frequency power converter circuit, power levels in the 102-103 watt range have successfully been transferred capacitively from stationary power sources to moving loads. -
Chapter 5 Capacitance and Dielectrics
Chapter 5 Capacitance and Dielectrics 5.1 Introduction...........................................................................................................5-3 5.2 Calculation of Capacitance ...................................................................................5-4 Example 5.1: Parallel-Plate Capacitor ....................................................................5-4 Interactive Simulation 5.1: Parallel-Plate Capacitor ...........................................5-6 Example 5.2: Cylindrical Capacitor........................................................................5-6 Example 5.3: Spherical Capacitor...........................................................................5-8 5.3 Capacitors in Electric Circuits ..............................................................................5-9 5.3.1 Parallel Connection......................................................................................5-10 5.3.2 Series Connection ........................................................................................5-11 Example 5.4: Equivalent Capacitance ..................................................................5-12 5.4 Storing Energy in a Capacitor.............................................................................5-13 5.4.1 Energy Density of the Electric Field............................................................5-14 Interactive Simulation 5.2: Charge Placed between Capacitor Plates..............5-14 Example 5.5: Electric Energy Density of Dry Air................................................5-15 -
Super-Resolution Imaging by Dielectric Superlenses: Tio2 Metamaterial Superlens Versus Batio3 Superlens
hv photonics Article Super-Resolution Imaging by Dielectric Superlenses: TiO2 Metamaterial Superlens versus BaTiO3 Superlens Rakesh Dhama, Bing Yan, Cristiano Palego and Zengbo Wang * School of Computer Science and Electronic Engineering, Bangor University, Bangor LL57 1UT, UK; [email protected] (R.D.); [email protected] (B.Y.); [email protected] (C.P.) * Correspondence: [email protected] Abstract: All-dielectric superlens made from micro and nano particles has emerged as a simple yet effective solution to label-free, super-resolution imaging. High-index BaTiO3 Glass (BTG) mi- crospheres are among the most widely used dielectric superlenses today but could potentially be replaced by a new class of TiO2 metamaterial (meta-TiO2) superlens made of TiO2 nanoparticles. In this work, we designed and fabricated TiO2 metamaterial superlens in full-sphere shape for the first time, which resembles BTG microsphere in terms of the physical shape, size, and effective refractive index. Super-resolution imaging performances were compared using the same sample, lighting, and imaging settings. The results show that TiO2 meta-superlens performs consistently better over BTG superlens in terms of imaging contrast, clarity, field of view, and resolution, which was further supported by theoretical simulation. This opens new possibilities in developing more powerful, robust, and reliable super-resolution lens and imaging systems. Keywords: super-resolution imaging; dielectric superlens; label-free imaging; titanium dioxide Citation: Dhama, R.; Yan, B.; Palego, 1. Introduction C.; Wang, Z. Super-Resolution The optical microscope is the most common imaging tool known for its simple de- Imaging by Dielectric Superlenses: sign, low cost, and great flexibility. -
Measurement of Dielectric Material Properties Application Note
with examples examples with solutions testing practical to show written properties. dielectric to the s-parameters converting for methods shows Italso analyzer. a network using materials of properties dielectric the measure to methods the describes note The application | | | | Products: Note Application Properties Material of Dielectric Measurement R&S R&S R&S R&S ZNB ZNB ZVT ZVA ZNC ZNC Another application note will be will note application Another <Application Note> Kuek Chee Yaw 04.2012- RAC0607-0019_1_4E Table of Contents Table of Contents 1 Overview ................................................................................. 3 2 Measurement Methods .......................................................... 3 Transmission/Reflection Line method ....................................................... 5 Open ended coaxial probe method ............................................................ 7 Free space method ....................................................................................... 8 Resonant method ......................................................................................... 9 3 Measurement Procedure ..................................................... 11 4 Conversion Methods ............................................................ 11 Nicholson-Ross-Weir (NRW) .....................................................................12 NIST Iterative...............................................................................................13 New non-iterative .......................................................................................14 -
Electrical Breakdown in Vacuum 1
ELECTRICAL B RE AKDOWN IN VACUUM G.P. BEUKEMA Stellingen behorende bij het prdefschrift ELECTRICAL BREAKDOWN IN VACUUM 1. De door Coolen en Van Schaik opgemeten profielen van de D2~absorptielijn van z3Na in neon worden bepaald door een combinatie van de overgangswaar- schijnlijkheden tussen de niveaus en van het laservermogen. Zij hadden een uitspraak kunnen doen over de invloed van beide effekten als zij de profielen niet alleen bij verschillende laservermogens hadden opgemeten, maar ook bij verschillende dichtheden van het neongas. F.C.M. Coolen en N. van Schaik, Physica 93 C, (1978) 261 - 6. 2. De uitspraak, gedaan in "Structure of Physics" door G.R. Noakes, dat inter- ferentie van fotonen bij de proef van Young plaatsvindt nadat deze de twee spleten gepasseerd zijn, of dat een bepaald foton geen wisselwerking heeft met elk van de spleten, is onjuist. • G.R. Noakes, Structure of Physics, Mac Millan (1977), blz. 468 en 502. 3. Voor het waarnemen van het ontstaan en de groei van interne disrupties in Tokamak plasma's verdienen cyclotron-stralingsmetingen de voorkeur boven röntgen-metingen. 4. De door Knudson en Nimrod voorgestelde exacte vergelijking voor de bereke- ning van titratiecurven voor twee-basische zouten is niet exact. G.E. Knudson en D. Nimrod, J. Chem. Educ. _54_ (1977) 351. 5. Plasma's kunnen de 5 aggregatietoestand van de materie genoemd worden, niet de 4 , zoals te doen gebruikelijk is. 6. De term "desorption cross section", zoals ingevoerd door Taglauer et al. kan aanleiding geven tot misverstand. E. Taglauer, U. Beitat, G. Marin en W. Heiland, J. -
Frequency Dependence of the Permittivity
Frequency dependence of the permittivity February 7, 2016 In materials, the dielectric “constant” and permeability are actually frequency dependent. This does not affect our results for single frequency modes, but when we have a superposition of frequencies it leads to dispersion. We begin with a simple model for this behavior. The variation of the permeability is often quite weak, and we may take µ = µ0. 1 Frequency dependence of the permittivity 1.1 Permittivity produced by a static field The electrostatic treatment of the dielectric constant begins with the electric dipole moment produced by 2 an electron in a static electric field E. The electron experiences a linear restoring force, F = −m!0x, 2 eE = m!0x where !0 characterizes the strength of the atom’s restoring potential. The resulting displacement of charge, eE x = 2 , produces a molecular polarization m!0 pmol = ex eE = 2 m!0 Then, if there are N molecules per unit volume with Z electrons per molecule, the dipole moment per unit volume is P = NZpmol ≡ 0χeE so that NZe2 0χe = 2 m!0 Next, using D = 0E + P E = 0E + 0χeE the relative dielectric constant is = = 1 + χe 0 NZe2 = 1 + 2 m!00 This result changes when there is time dependence to the electric field, with the dielectric constant showing frequency dependence. 1 1.2 Permittivity in the presence of an oscillating electric field Suppose the material is sufficiently diffuse that the applied electric field is about equal to the electric field at each atom, and that the response of the atomic electrons may be modeled as harmonic. -
9705: Measuring Electrical Breakdown of a Dielectric-Filled
ZYVEX APPLICATION NOTE 9705 Measuring Electrical Breakdown of a Dielectric-Filled Trench Used for Electrical Isolation of Semiconductor Devices By Rishi Gupta and Phil Foster, Zyvex Corporation Introduction Semiconductor devices employ insulating dielectric materials contribute to breakdown include occluded particles, surface for electrical isolation between active elements and layers that and material contamination, and water vapor. Each can are susceptible to electrical breakdown. The breakdown voltage influence breakdown; actions must be taken to eliminate is the level at which the insulating dielectric begins to allow their contribution to breakdown voltage measurements. charge flow. Unlike conducting materials, this charge flow Humidity, for example, reduces the resistance of most tends to be non-linear. That means that below a threshold dielectrics, thus increasing the return current (the current voltage no charge will flow, and at or above that voltage a that opposes a charge build-up).3 Contamination can rush of charge will flow. This rush is termed “avalanche contribute to leakage currents and charge mobility across breakdown,” which is a runaway process resulting in a current isolation areas. Occluded particles such as alkalis or halides spike. Once the charge begins to flow, the dielectric material can act to increase the breakdown strength.2 properties become unpredictable. To properly characterize a given film, breakdown voltages must be repeated over different The S100 Nanomanipulation System (Figure 1) can function samples. as a nano- and microprobe and is an ideal tool for dielectric breakdown voltage measurements. When operated inside a Several mechanisms give rise to electron avalanche, one of scanning electron microscope (SEM), the vacuum environ- which is by impact ionization.1 Impact ionization occurs ment minimizes moisture. -
The Prevention of Electrical Breakdown and Electrostatic Voltage Problems in the Space Shuttle and Its Paylaods
1980022937 THE PREVENTION OF ELECTRICAL BREAKDOWN AND ELECTROSTATIC VOLTAGE PROBLEMS IN THE SPACE SHUTTLE AND ITS PAYLAODS PAR; I - THEORY AND PHENOMENA PART II - DESIGN GUIDES AND OPERATIONAL CONSIDERATIONS ABSTRACT A two volume manual was prepared that will hopefully prevent workers on the Space Shuttle from having the same sort of problems with electrical dlscharg_ phenomena that otheres in the space program have had. The manual contains an introduction to the theory of Y corona discharge and electrostatic phenome-,a. The theory is mainly qualitative so that workers in the field should not have to go outside this manual for an understanding of the relevant phenomena. Some of the problems that may occur vith the Space Shuttle in regards to electrical discharge are discussed in the final sections. (NA3A-T_I-8||37) l'llEi'z_gVZNIlUN 0_. NSd-31_43 EL,':CT_iCAL BEEAKDOWN A.r_DE_EC'[_OSrATIC VOLTAGE i_ROBLB15 xN TdE 5_ACI_ 5:IUTTLE ANO IF:_ PA/LOADS. PAEI' I: THEuhY AND PtlENOdENA O[_cla_ Final l{eport (NASA) 110 t) HC AOO/_F A01 G J/16 30997 ? 1980022937-002 THE PREVENTION OF ELECTRICAL BREAKDOWN AND ELECTROSTATIC VOLTAGE PROBLEMS IN THE SPACE SHUTTLE AND ITS PAYLOADS SYNOPSIS PART I - THEORY AND PHENOMENA 1.0 Introduction. Throughout the aerospace program high potentials at low gas pressures have caused myriad problems. Many of our scientific satellites have been disabled partially or completely due to electrical breakdown. The genesis of this problem, however, did not occur within the space program. In fact, electrical breakdown of high voltage supplies was a problem in high altitude aircraft during World War II.