Frequency Hopping Waveform. Detected Output from the RF Output of the HP E6432A Microwave

Frequency hopping waveform. Detected output from the RF output of the HP E6432A Microwave Synthesizer using an Agilent 8474B microwave detector with matching load resistor and measured on a LeCroy WavePro 940 Oscilloscope. View showing an entire burst of 9 pulses per hopping frequency, 100 hopping frequencies, with 1 frequency hop per 3ms. =

Frequency hopping waveform. Detected output from the RF output of the HP E6432A Microwave Synthesizer using an Agilent 8474B microwave detector with matching load resistor and measured on a LeCroy WavePro 940 Oscilloscope. Detailed view showing the timing relationship between the 9 pulses and the frequency hops of the burst of 9 pulses per hopping frequency, 100 hopping frequencies, with 1 frequency hop per 3ms. Frequency hopping waveform. Detected output from the RF output of the HP E6432A Microwave Synthesizer using an Agilent 8474B microwave detector with matching load resistor and measured on a LeCroy WavePro 940 Oscilloscope. Detailed view of the pulse repetition interval of the burst of 9 pulses per hopping frequency, 100 hopping frequencies, with 1 frequency hop per 3ms. Frequency hopping waveform. Downconverted output of the HP E6432A Microwave Synthesizer using the IF output from the DFS Test Box and measured on a LeCroy WavePro 940 Oscilloscope. Detailed view showing the pulse width of the first pulse in the burst of 9 pulses per hopping frequency, 100 hopping frequencies, with 1 frequency hop per 3ms. Bin 5 waveform (Bin5001). RF output of the Agilent E8267C Vector Signal Generator using the RF output from the DFS Test Box and measured on the Agilent E4440A Spectrum Analyzer in zero span mode with a 15 second sweep time. View showing the entire waveform (triggered on the occurrence of the first burst). Bin 5 waveform (Bin5001). Downconverted output of the Agilent E8267C Vector Signal Generator using the IF output from the DFS Test Box and measured on a LeCroy WavePro 940 Oscilloscope. View showing Burst 1 out of 18 bursts with the pri randomly chosen but the same between pulses 1 and 2 and between pulses 2 and 3. This will be changed. Bin 5 waveform (Bin5001). Downconverted output of the Agilent E8267C Vector Signal Generator using the IF output from the DFS Test Box and measured on a LeCroy WavePro 940 Oscilloscope. View showing the pulse width of the first pulse of Burst 1. Bin 5 waveform (Bin5001). RF output of the Agilent E8267C Vector Signal Generator using the RF output from the DFS Test Box and measured on the Agilent 89641A Vector Signal Analyzer. View showing the pulse width and demodulated chirp of Burst 5 out of 18 with the pri randomly chosen but the same between pulses 1 and 2 and between pulses 2 and 3. This will be changed. Bin 4 waveform (Bin4002). RF output of the Agilent E8267C Vector Signal Generator using the RF output from the DFS Test Box and measured on the Agilent E4440A Spectrum Analyzer in zero span mode with a 1ms sweep time. View showing the pulse repetition interval. Bin 4 waveform (Bin4002). RF output of the Agilent E8267C Vector Signal Generator using the RF output from the DFS Test Box and measured on the Agilent E4440A Spectrum Analyzer in zero span mode with a 10ms sweep time. View showing the total number of pulses in the burst. Bin 4 waveform (Bin4002). Downconverted output of the Agilent E8267C Vector Signal Generator using the IF output from the DFS Test Box and measured on a LeCroy WavePro 940 Oscilloscope. View showing the pulse width of the first pulse. Bin 3 waveform (Bin3001). RF output of the Agilent E8267C Vector Signal Generator using the RF output from the DFS Test Box and measured on the Agilent E4440A Spectrum Analyzer in zero span mode with a 500 microsecond sweep time. View showing the pulse repetition interval. Bin 3 waveform (Bin3001). RF output of the Agilent E8267C Vector Signal Generator using the RF output from the DFS Test Box and measured on the Agilent E4440A Spectrum Analyzer in zero span mode with a 10ms sweep time. View showing the total number of pulses in the burst. Bin 3 waveform (Bin3001). Downconverted output of the Agilent E8267C Vector Signal Generator using the IF output from the DFS Test Box and measured on a LeCroy WavePro 940 Oscilloscope. View showing the pulse width of the first pulse. Bin 2 waveform (Bin2002). RF output of the Agilent E8267C Vector Signal Generator using the RF output from the DFS Test Box and measured on the Agilent E4440A Spectrum Analyzer in zero span mode with a 300 microsecond sweep time. View showing the pulse repetition interval. Bin 2 waveform (Bin2002). RF output of the Agilent E8267C Vector Signal Generator using the RF output from the DFS Test Box and measured on the Agilent E4440A Spectrum Analyzer in zero span mode with a 10ms sweep time. View showing the total number of pulses in the burst. Bin 2 waveform (Bin2002). Downconverted output of the Agilent E8267C Vector Signal Generator using the IF output from the DFS Test Box and measured on a LeCroy WavePro 940 Oscilloscope. View showing the pulse width of the first pulse. Bin 1 waveform (Bin1001). RF output of the Agilent E8267C Vector Signal Generator using the RF output from the DFS Test Box and measured on the Agilent E4440A Spectrum Analyzer in zero span mode with a 2ms sweep time. View showing the pulse repetition interval. Bin 1 waveform (Bin1001). RF output of the Agilent E8267C Vector Signal Generator using the RF output from the DFS Test Box and measured on the Agilent E4440A Spectrum Analyzer in zero span mode with a 30ms Sweep time. View showing the total number of pulses in the burst. Bin 1 waveform (Bin1001). Downconverted output of the Agilent E8267C Vector Signal Generator using the IF output from the DFS Test Box and measured on a LeCroy WavePro 940 Oscilloscope. View showing the pulse width of the first pulse.