https://ntrs.nasa.gov/search.jsp?R=20100031727 2019-08-29T18:28:05+00:00Z

Source of Acquisition NASA Johnson Space Center

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International Space Station External Contamination Status [4096-101]

Presented at the Conference on Optical Systems Contamination and Degradation II : Effects, Measurements, and Control SPIE's 45th Annual Meeting San Diego, California August 3, 2000 Ron Mikatarian Carlos Soares

l_ ~ , I

International Space Station " ~

Ron Mikatarian (281) 336-4747 Ronald. Mikatarian @sw.boeing.com Page 2 June 2000

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~ II.~~ ' i"~ ~"~.j i: ,'- '* .~'.--":-~-'" • /' '\ rtJ.--BOEINO" :' \, ~t!\'-\ .·' ./11 External Contamination Requirements - ~ ,~ ' iF .j..l~~ .J~

Requirements • Contami'nant Releases:

11 11. At the ISS system level, molecular deposition onto ISS sensitive surfaces, from all contamination sources, is limited to 130 Aiyear.

11 11+ For active vacuum vents, the design and operation shall. meet the requirement that the molecular column density shall be less than 10+14 molecules/cm2 when viewed from selected ISS locations.

Ron Mikatarian (281) 336-4747 Ronald. Mikatarian @sw.boeing.com Page 3 June 2000 ------~-. ;

.~ ~OEING · External Contamination Requirements

Requirements (continued) • Contaminant Releases (at the ISS system level):

111 1. Total molecular deposition: 130 Aiyear

111 1. Quiescent molecular deposition: 30 Aiyear II." Materials outgassing ,,,''' Venting

'''-+ Leakage

11 11 . Non-quiescent molecular deposition: 100 A/year

'''-+ Proximity Operations

'''-+ Mated Operations ,,,,. Reboost and Attitude Control • Molecular Column Density: 14 11 11" Quiescent periods: 10+ molecules/cm2 (along line-ot-sight)

11 11 . No requirement during non,-quiescent periods

Ron Mikatarian (281) 336-4747 Ronald. Mikatarian @sw.boeing.com Page 4 June 2000

jl ------.-.-~ -'------~ -. --I,

I ~I.NG ® External Contamination Requirements ~

Requirements (concluded) • "Design-To" Requirement:

11 11+ All vehicle hardware suppliers and all users must design to the external contamination environment stated in the previous chart; e.g., "'-Solar arrays "," Radiators (active and passive) "'- Sensors '''- Payloads ("design-to" requirement not imposed on Attached Payloads)

Ron Mikatarian (281) 336-4747 Ronald. Mikatarian @sw.boeing.com Page 5 June 2000

------._ ------~------Sl ~I~G ® ~ : . rlt· ~·· ~..:" ' .> External Contamination Requirements ~ ~"

140 "Oesign-toll Level 130 Alyear 120 rJs~l;r ;r~aYs~r;dia~';,Q;yi;;d;~t~. de~lg~dtQ thi;l;v;l) ~

100 -- ~ Space Sh~tt e prox ops _ ~ _Space Sh~tt e mateq ops a- 80 ctS ~ Russian Sp ment reboost (1) > and attitudjB ontrol o~ 60 ---- _ ~ ~ ~ Materials outgassi ng 100 ~ Active vacuum vents ~ ESA ATV 40 ~ -Leakage -~-NASDA H-t 'v ~ U.S. PropljJlSion Module ~ leM 20 30 I~ Requirement ~

o T Quiescent Sources Non-Quiescent Sources

------Ron Mikatarian (281) 336-474 Ronald. Mikatarian @sw.boeing.com Page 6 June 2000

- ---_.-- - MIMI... ®

. ~... ,..~ .. ' ., .. ,~ . ISS External Contamination Sources , .\~ •'" • Materials outgassing (vacuum exposed materials) • Vacuum venting • Leakage • Propellant purging • ISS reboost and attitude control:

1111. Russian thrusters on Service Module and SPP I II I~ ESA Automated Transfer Vehicle (ATV) as part of the Russian Segment

1111. U.S. Propulsion Module

11 11. U.S. Interim Control Module (ICM) • Proximity operations: I I II~

1111. ESAATV

11 11. NASDA H-2 Transfer Vehicle (HTV)

11 11. Russian Progress

11 11. Russian Soyuz • Space Shuttle mated operations:

11 11. Fuel cell and waste water dumping • Attached and pressurized payloads Ron Mikatarian (281) 336-4747 Ronald. Mikatarian @sw.boeing.com Page 7 June 2000 _.11f:! Ell ISS External Contamination Q!I U Sensitive Surfaces "

• Debris shields • Solar arrays • Radiators (active and passive) • Viewing ports/windows • Vehicle optical sensors, cameras, etc. • Transmitters • Paylo'ad locations:

11 11'" S3 Truss

11 11. JEM EF and ELM

, 1111 . Columbus external payload facility

111 1. Service Module and SPP

111 1. Lab window

Ron Mikatarian (281) 336-4 747 Ronald.Mikatarian @sw.boeing.com Page 8 June 2000

L ISS External Contamination ..G® Sensitive Surfaces "

Solar Arrays

Active Radiata's

Passive Radiatcrs

•• Windo\\8 t ~I Payloods .JL; Presslll'ized Jvbdules

Ron Mikatarian (281) 336-4747 Ronald. Mikatarian @s w.boeing.com Page 9 June 2000 -~~------, I

~I•. ~~ . r ~ i";-i ' :.;,~._ * '~.... <:~"'" * ~EIA'G ® .:/~ . ' \ ~ ',..I, ISS External Contamination Contr"ol "'-I\t'a'~~.'.' .' - ct!:' ~.)~ ,~ .~

Pre-Launch Verifi cation On-Orbit • Analyses for Verification • Inspection of hardware • Laboratory testing • Flight imaging (flight-by­

11 11. Materials outgassing flight)

1111 . Water venting • ISS flight data:

1111" Optical degradation due to 11 11" Vehicle performance

induced external 11 11 + Payloads environmental contamination and data environmental exposure

11 11'" Plume measurements • Flight Experiments and observations

11 11+ Space Shuttle flight experiments

11 111., Mir flight experiments

1111" Shuttle-Mir (Phase 1) Risk Mitigation Experiments Ron Mikatarian (281) 336-4747 Ronald. Mikatarian @sw.boeing.com Page 10 June 2000 ISS External Contamination ~BOEIM ® Control for Pre-launch Verificatio'n

ISS Configuration Assembly Sequence Traffic Model Outgassing Testing

Vacuum Identification Materials Flight/Laboratory Exposed Usage Post-Processing Test Data : . Materials Operating Temperatures (If Necessary)

Plume Models Proximity Operations Jet Firing Histories External Contamination Aeboost and Analyses Flight Experiments Attitude Control PIC/SPIFEX

Operational Mated Configuration Laboratory Tests Master Database Constraints • Operations (Water Dumping) • Source-by Source '. Materials Outgassing \1------.... • Stage-by-Stage • Sensitive Surfaces \ • Induced Optical Venting Properties • Propellant Purging Degradation • Active Vacuum Vent Ron Mikatarian (281) 336-4747 Ronald. Mikatarian @sw.boeing.com Page 11 June 2000 -----

Flight Experiments ~OE"ND · and Observations " • Mir • Space Shuttle

1111. Docking Collar Camera Bracket 1111. SPIFEX (ST8-64)

(U.S.) 11 11 . PIC (STS-74)

1111. ICA (ESA Euro-Mir '95) 11 11. Water Dump (STS-29)

11 11 . Astra-II (Russian) 1111 . IECM (8TS-2, ST8-3,

1111. Comes-Aragatz (French) ST8-4)

1111. Mir Imaging (U.S.) 11 11 . IOCM (STS-34, ST8-44)

11 11. TREK (U.S.) 11 11 . HST 8M2 (STS-82)

1111. Phase 1 Risk Mitigation 1111" EOIM-III (STS-46)

Experiments (U.S.): 11 11. AMS (8TS-91) 01 .... Mir Environmental Effects Payload • Long Duration Exposure (MEEP) Facility (LDEF) 01. -+ Optical Properties Monitor (OPM) • 01'''' Space Portable (HST) SpectroReflectrometer (SPSR) ,,, ... Mir Solar Array Return Experiment (SARE)

Ron Mikatarian (281) 336-4747 [email protected] Page 12 June 2000 ~-l I ~f'~~; i ~~ ,"ti i;) '- ' . .~...' .. /" '''\ I . } ro® , I Example Flight Observation: rti--a. \In:.'' .. ' ://1 .) 1.1\', . t.F "~..)~ . ~, c Space Shuttle Orbiter Waste Water 'Dump

Ron Mikatarian (281) 336-4747 Ronald. [email protected] Page 13 June 2000

I J --l

~I.:\~. i -.~ j";'j;:) '\ .'~"-".;;:>", • .. l \~ 'OEIA'G® I I Materials Outgassing , ~ ',''-',',,.,\6" "' ',yf'r!./ ""..l~.,,!. ,

• All materials which are possible sources of contamination undergo outgassing rate testing. • Condensable materials outgassing rates are obtained by long duration ASTM E 1559 testing.

IIII*, Material sample (emitter) is tested over the on-orbit operational temperature range identified by the ISS system level thermal model.

1111 '" Temperature-Controlled Quartz Crystal Microbalances ' (TQCMs), or receivers, are held at different temperatures covering the typical range of operational temperatures of ISS contamination sensitive hardware, such as the Active Thermal Control System (ATCS) and passive radiators.

1111'" Testing is of long duration, typically 144 hours. • ASTM E 595 testing is used as an initial screen.

Ron Mikatarian (281) 336-4747 Ronald. Mikatarian @sw.boeing.com Page 14 June 2000 ------l 1

~OEING · Active Vacuum Vents "

• The current ISS vent database identifies 33 active vacuum vents on the International Space Station. • Vacuum v"enting must comply with molecular column density and molecular deposition requirements.

111 1. ISS vents are considered quiescent sources (with exception of the U.S. Lab condensate water vent which is considered non­ quiescent until assembly complete).

11 11. Most ISS vents do not produce molecular deposits on ISS surfaces. Typical exhaust composition for these vents include air, carbon dioxide and hydrogen.

IIII*" Molecular column density (MCO) requirements limit mass flow rates for ISS vents. Scheduling of venting events may be required for vacuum exhaust systems on U.S. Lab, ESA Columbus module and JEM Pressurized Module due to their high flow rate capacities to accommodate internal payloads.

Ron Mikatarian (281) 336-4747 Ronald. Mikatarian @sw.boeing.com Page 15 June 2000 ___ 0 _o_o_~_------, I

z;® Example of ~~ Molecular Column Density Profile

View from Starboard Upper Payload Position Looking in the Wake Direction

BUW view - log10(#/cm~~2) Location : 0,75, - 10 D ir e ct i 0 h : - 1, 0 , 0 LABl VEB "T " combustion Facility

_ > 15.5

= >15. 3 5

> 15.2

>15.05

> 14.9

> 14 .75

> 14.6

_ > 14.45

> 14. 3

> 14 . 15

> 14

Ron Mikatarian (281) 336-4747 Ronald.Mikatarian @sw.boeing.com Page 16 June 2000 ~

_~~s ''', .. " I '/t l;;~' *~,/ - > . • ;' . ,"" 0-.BOEINO° ,. ' [ - .• 'I"' .! ,!a' \, Modeling and Analysis Tools " ~~} " ·, ~tt ~ • . ,(,.i? . • The NASAN program is used to model external contamination for the ISS program.

1111. Evolved from the MOLFLUX program, previously used during the Space Station Freedom program.

1111..- NASAN can model up to 100,000 surface elements, with variable geometry and multi-spacecraft interactions. MOLFLUX was limited to about 3,000 to 4,000 surfaces, with fixed geometry.

11 11..- NASAN produces output in graphical format, condensing hundreds of pages of information in a single color plot.

I • Dir~ct Simulation Monte Carlo (DSMC) methods have been employed to model return flux and small features of specific problems encountered during ISS design activities.

• A Smooth Parti~le Hydrodynamics (SPH) code is being used to examine parti1cle impacts to ensure no damage to ISS structures.

Ron Mikatarian (281) 336-4747 Ronald. Mikatarian @sw.boeing.com Page 17 June 2000

I

~~-~~--~~~~----~~~-- -,~---" ~ .~~~~ .. ". , , '. I I " { . , Sources of Outgassing Induced t~_ .. " Con~amination Analyzed To Date ~:.l:~~'"~ .... &"

Note: Elements analyzed shown in color.

Ron Mikatarian (281) 336-4747 RonaJd.Mikatarian @sw.boeing.com Page 18 June 2000 Example of Outgassing Induced ~OE'NG · Contamination Analysis '-.

SO Truss Element Outgassing

Ron Mikatarian (281) 336-4747 Page 19 Ronald. Mikatarian @sw.boeing.com June 2000 ~L7~.I.AttrtC - Decem ber 14, 1999 ISS E xternal Contamination: Quiescent Sources Sou ree s: FG B ,N 0 d e l , P MAl ,P M A 2 ,S e r vi ee Mod u le , P ro g re S S ,Z-l Tru S S , Ku & S - ba n d An t ennas ,PM A3,S o yuzl,P6 IEA , P6 LongSpaeer,S 6 lEA (PH),S6 LongSpaeer(PH),S4 lEA (PH ),P4 lEA (PH ),S o y u Z 2 ,U S La b,A irl 0 ck ,S O, H a b ( PH ),PD G F,O rbi te r Assemb ly Complete Tota l Yearly Depositio n (!../ye ar) o 5 10 15 2 0 25 30 35 40

PM A I M D M R A D (. Z I S T TO P (+ Y I I I I I PM A I M D M R A D (. ZI P T TO P (. Y I - - I I I PMAI M D M RA D (+ Z ) S TLWR (~Y) I I I I P M AI MDM RAD (+ZI PT LWR (.YI I RSASMP VA RRA VS ST fRO NT(· Z I ~ ~FGB R A S M P V A R R AYS P T F"R 0 N T (. Z I I . Node 1 ~ . 'PMA 1 RSASMPVARRAYS ST BA CK(+ZI ~ OPMA2 R SAS MPVARRAYS PTBACK (+ Z ) ~ III Service Modul e P6 PVARR AY S PANELA F RO N T l· Z ) p ~Pro ¥ess .Z-l russ P6 P VA RRA YS PANE LB FRONT ( ·Z I ~ I .Ku & S -band P6 P VA RR AYS PA NEL A BACK (+ Z ) p OPMA3 I D Soyuz 1 (FGB) I P6PVARRAYS PA NELBB AC K (+ Z I b I - OP6 lEA EA / Ae R A D1ATOR S P 6 S T / FRONT (+ Y ) -- ... - I I l I3P6 Long S~cer E A / AC RAD I AT OR S P6 PT / BA CK (-Y) .. I .S 6 lEA *P .. I EA / AC RADIATOR S S 4 FRONT (+ X I •••••••• 'N ....., ..... I IES6 Lon~S ~cer *P.H. I I IBS 4 lEA P . . .;-: EA I AC R A DIAT OR S S 4 BA CK ( ·X I ...... "' .. .• ... ·,· .... _·N.~ I mJP4 lEA *P.H. I EA I AC RADIATORS S 6 P T I FRONT (.y) "." .... 1m! Soyuz 2 (Res earch Mod.) I/) I I I O DS Lab EA I AC RADI A TORS S 6 S T I B AC K (+ Y I "'/~'. fl I I o Airlock I LAB WINDOW NA DIR S IDE (+ZI . SO Truss ~ I I I I I Jl SOTBE RM AL R AD SOT R USS BA C K (-XI O PDGF (FGB /Lab) ElHab *P.H. RSA MA S T A RR A Y S STF RO NT (· Z I Cl I II 00 rbiter R SA M AS TAR RA YS P T FRO N T (. ZI ~ R SAM AS TAR RA YS S T B A C K (+ Z I ~ I R SAMASTARRAYS PTBACK (+ Z I p!IJ III I I MAS T RADIATORS FRONT (+ Xl ~ -- -- :g I I ~ MASTRADIATORS BACK (· X I - ~ P 3 I P 4 P V A R RAY S PANEL A FRONT (· Z I p III I ~ P 3 I P 4 P V A R R AYS PAN EL B FRO N T (. ZI p P3 1 P4 PVA RR AYS PANELABACK(+Z I p j P3 1 P4 PVARRAYS PANELBBACK (+ZI 0

P4 TCS P V R A D IATO R P4 FRONT (+XI ..,,,, ...... , .,·. ..,.".·~A I I P 4 T C S P v R A D I.A TO R P 4 B A C K (- x I ,Vi:-»:.!««-: :-.... ~•.. "'" I ATCS R ADIATO R S STPANELA ( +YI ". I I A T C S RADIATORS PTPANELA ( +YI ,. I I ATCS R A D JA TO R S ST P ANELB (. YI < I I ATCS RAD I ATORS PTPANELB (·YI ,'" I I / S 3 I S' PVARRAYS PA N EL A FRONT (·ZI P , S 3 I S .4 PVARRAYS PAN EL B FRONT ( ·Z) ~ - - S3 1 S4 PVARRAYS PANELA BACK (+Z I p I I I S3 1 S' PVARRAYS PANELB BACK (+ZI ID I CUPOLA WINDOWS PTSIDE (- Y ) S6 PVARRAYS PANELA FRONT (· Z ) b S 6 P " A R RAYS PAN E L B FRO N T (- Z) 0 S6 PVARRAYS PANELA BACK (+ Z I 0 I S6 PVARRAYS PANELB BACK (+ Z I 0 I I Prepared by : Approved by:

.9_~ igJ!!_ C!. L§ _i9J!_ ~ ~_ !! y ____ _ Q Cig)!!JJ _ L§ _i9-"_ ~ ~_ !! L __ _ Carlos Soare s and John Alred Ron M ikatarian John Alred February 4, 2000 ISS External Contamination: Non-Quiescent Sources Sources : Progress, Soyuz, Russian Segment Reboost & Attitude Control, HTV, Orbiter Assembly Complete Total Yearly Deposition (A/year) o ~ ~ W 00 100

PMA1 MDM RAD (-Z) STTOP (+Y) 10 Progress PMA1 MDMRAD (-Z) PTTOP (-y) Soyuz PMA1 MDM RAD (+Z) ST LWR (+Y) o I III RS Reboost & AC (wI updated Plume Model) PMA1 MDM RAD (+Z) PT LWR (-Y) • HTV Prox. Ops. (Preliminary) RSA SM PV ARRAYS ST FRONT (-Z) I • Orbiter Prox. Ops. RSA SM PV ARRAYS PT FRONT (-Z)

RSA SM PV ARRAYS ST BACK (+Z)

RSA SM PV ARRAYS PT BACK (+Z)

P6PV ARRAYS PANEL A FRONT (-Z)

P6PV ARRAYS PANEL B FRONT (-Z)

P6PV ARRAYS PANEL A BACK (+l)

P6PV ARRAYS PANEL B BACK (+Z)

EAlAC RADIATORS P6 STIFRONT (+Y)

EAlAC RADIATORS P6 PT/BACK (-Y)

EAlAC RADIATORS 54 FRONT (+X}

EAlAC RADIATORS 54 BACK (-X}

III EAlAC RADIATORS 56 PT/FRONT (-Y) (1) o EAlAC RADIATORS S6 ST/BACK (+Y) C1:S 1: LAB WINDOW NADIR SIDE (+Z) ~ en SO THERMAL RAD SO TRUSS BACK (-X} (1) RSA MAST ARRAYS ST FRONT (-Z) .~ ~ RSA MAST ARRAYS PT FRONT (-Z) III s::: RSA MAST ARRAYS ST BACK (+Z) (1) en RSA MAST ARRAYS PT BACK (+Z)

MAST RADIATORS FRONT (+X}

.~ MAST RADIATORS BACK (-X} ~ (1) P:YP4 PV ARRAYS PANEL A FRONT (-Z) > en P3IP4 PV ARRAYS PANEL B FRONT (-Z) en P:YP4 PV ARRAYS PANEL A BACK (+Z)

P:YP4 PV ARRAYS PANEL B BACK (+Z)

P4 TCS PV RADIATOR P4 FRONT (+X}

P4 TCS PV RADIATOR P4 BACK (-X}

ATCS RADIATORS ST PANEL A (+Y) /

ATCS RADIATORS PT PANEL A (+Y)

ATCS RADIATORS ST PANEL B (-Y)

ATCS RADIATORS PT PANEL B (-Y)

S:YS4 PV ARRAYS PANEL A FRONT (-Z)

S:YS4 PV ARRAYS PANEL B FRONT (-Z)

S:YS4 PV ARRAYS PANEL A BACK (+Z)

S:YS4 PV ARRAYS PANEL B BACK (+Z)

CUPOLA WINDOWS PT SIDE (-Y)

S6 PV ARRAYS PANEL A FRONT (-Z)

S6PV ARRAYS PANEL B FRONT (-Z)

S6PV ARRAYS PANEL A BACK (+Z)

S6 PV ARRAYS PANEL B BACK (+Z) ~-l .• =. , '

s;·~~ ' §~ • ..~1- -""""-. '.. ~EIIVG ® . . I I , Observations on Optical Degradation ~ (,~'~t#'.. _ • ! , :;{ "" d "'~-'-'b, ...- ~_tY due to Induced External Contamination in LEO

• Organic silicones typically convert to silicates (SiOx) on-orbit due to AONUV exposure.

• Hydrocarbon contaminants usually erode on-orbit due to AO exposure.

• On orbit, silicone contaminants deposit on surface. In the laboratory, silicone and hydrocarbon contaminants diffuse into the porous structure of the substrates.

• Optical degradation on samples pre-contaminated with hydrocarbons observed to recover on-orbit.

• On-orbit induced contamination optical degradation depends on contaminant flux, AO flux, 'and VUV exposure.

Ron Mikatarian (281) 336-4747 Ronald. Mikatarian @s w.boeing.com Page 22 June 2000

J .""l .' I

Example of Typical ~ ® Contaminant Profile "

Sample AZC027: Pre-contaminated Z93 White Ceramic Paint - Ground Control

80 ~, ------~

---.- Carbon .. 'V .. Oxygen C -0-- Potassium

o~ ~~--u--~-u l o 500 1000 1500 2000 Depth, Angstroms Ron Mikatarian (281) 336-4747 Ronald. Mikatarian @sw.boeing.com Page 23 June 2000 I . ,I

~iK1 ~G ®

~ . . :- ~".. ':I. Examples of Contaminant . ' ·~i(.; • Depth Profile "

Clad Aluminum Substrate . 00,0 .r------,

90,0 .-

80,0

70.0

C 60,0 ---Oxygen ~ ___ Carbon 8. 500 Silcon .~ Aluminum ~ 40,0 AI,

30,0

20,0 " . Sulfuric Acid Anodized Aluminum Substrate

.00 . 00,0 'r------,

o.ok .. :,, & .. ;;--. :4:.. .. · . s==: 90,0 . ----- .000 2000 3000 4000 5000 6000 7000 anostroms sputtered 80.0 ·

70.0

C 60,0 - - oxygen ~ -~-- Call>Oo ~ 50.0 ,,­ -__ S~ICOO E -I.-Alwninum -+- A((JC)n ~ 40,0 t

30,0

20,0 .o,ot - ~ ---- I

0,0 "'" ~~ : -~ I 5000 • 0000 ' 5000 20000 25000 30000 35000 40000 45000 50000 angstroms sputtered

Ron Mikatarian (281) 336-4747 Ronald.Mikatarian @s w.boeing.com Page 24 June 2000 -~-•... ---- .. ~ . I ~ ___M""_ .

STATUS , j

ISS System • System Level Requirements will be met. Material Outgassing • Process in place working effectively with US and IP hardware producers to control external contamination. Thruster Plumes • New activity in place for developing updated plume contamination model.

1111" Laboratory tests being conducted.

11 11., Space Shuttle flight test in 2001 (STS-108). Optical Degradation • Activity in place for developing updated LEO external contamination optical degradation model. • Laboratory tests being conducted.

Ron Mikatarian (281) 336-4747 Ronald. Mikatarian @sw.boeing.com Page 25 June 2000